CN1947025A - 直流测试装置 - Google Patents

直流测试装置 Download PDF

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Publication number
CN1947025A
CN1947025A CNA2005800134594A CN200580013459A CN1947025A CN 1947025 A CN1947025 A CN 1947025A CN A2005800134594 A CNA2005800134594 A CN A2005800134594A CN 200580013459 A CN200580013459 A CN 200580013459A CN 1947025 A CN1947025 A CN 1947025A
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CN
China
Prior art keywords
mentioned
current
voltage
resistance
current sense
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2005800134594A
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English (en)
Chinese (zh)
Inventor
田中宏典
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
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Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of CN1947025A publication Critical patent/CN1947025A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32—Compensating for temperature change

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
CNA2005800134594A 2004-04-28 2005-04-26 直流测试装置 Pending CN1947025A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP133955/2004 2004-04-28
JP2004133955A JP2005315729A (ja) 2004-04-28 2004-04-28 直流試験装置

Publications (1)

Publication Number Publication Date
CN1947025A true CN1947025A (zh) 2007-04-11

Family

ID=35241802

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2005800134594A Pending CN1947025A (zh) 2004-04-28 2005-04-26 直流测试装置

Country Status (6)

Country Link
US (1) US20070103174A1 (enExample)
JP (1) JP2005315729A (enExample)
KR (1) KR20070013314A (enExample)
CN (1) CN1947025A (enExample)
DE (1) DE112005000986T5 (enExample)
WO (1) WO2005106513A1 (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101957402A (zh) * 2010-08-31 2011-01-26 上海华岭集成电路技术股份有限公司 瞬时电流的测试系统与方法
CN101923124B (zh) * 2009-06-17 2012-06-20 上海华虹Nec电子有限公司 确定em测试结构中加速因子的方法
CN103257275A (zh) * 2012-02-10 2013-08-21 横河电机株式会社 电极评价装置和电极评价方法
CN109564262A (zh) * 2016-08-12 2019-04-02 东京毅力科创株式会社 器件检查电路、器件检查装置和探针卡
CN114878033A (zh) * 2022-03-29 2022-08-09 深圳国微感知技术有限公司 一种矩阵式压力分布测量系统及方法
CN114924109A (zh) * 2022-07-20 2022-08-19 深圳市英特瑞半导体科技有限公司 低功耗芯片电流的测试方法、电路及其装置
CN116034283A (zh) * 2020-09-16 2023-04-28 欧姆龙株式会社 电压检测装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI474710B (zh) * 2007-10-18 2015-02-21 Ind Tech Res Inst 行動通訊設備於離線使用數位內容之收費方法及其系統
JP2010054314A (ja) * 2008-08-28 2010-03-11 Yokogawa Electric Corp 半導体試験装置
EP2169412A1 (en) * 2008-09-25 2010-03-31 Ilumab AB Electrical current measurement arrangement
US8779777B2 (en) * 2010-06-04 2014-07-15 Linear Technology Corporation Dynamic compensation of aging drift in current sense resistor
JP5720259B2 (ja) * 2011-01-18 2015-05-20 トヨタ自動車株式会社 電流検出回路
CN111638480B (zh) * 2020-06-09 2022-10-11 广东省计量科学研究院（华南国家计量测试中心） 一种基于温度补偿的电流传感器校准系统及方法
DE102021214606A1 (de) 2021-12-16 2023-06-22 Vitesco Technologies GmbH Stromerfassungssystem

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3430130A (en) * 1966-05-20 1969-02-25 Carl A Schneider Conductivity measuring circuit utilizing conductivity cell as input resistance of an operational amplifier
US4000643A (en) * 1976-03-29 1977-01-04 Honeywell Inc. Apparatus for producing a compensating voltage
US4438411A (en) * 1981-07-20 1984-03-20 Ford Aerospace & Communications Corporation Temperature compensating method and apparatus for thermally stabilizing amplifier devices
JPS5939105A (ja) * 1982-08-27 1984-03-03 Fujitsu Ltd 制御電圧発生回路
FR2659177B1 (fr) * 1990-03-01 1992-09-04 Merlin Gerin Capteur de courant pour un declencheur electronique d'un disjoncteur electrique.
JP3218106B2 (ja) * 1992-12-28 2001-10-15 日本電波工業株式会社 水晶発振器の温度補償回路
JPH09178782A (ja) * 1995-12-25 1997-07-11 Advantest Corp 電流検出回路及びその回路を用いた直流試験装置
US20030025488A1 (en) * 1996-12-26 2003-02-06 Emc Technology, Inc. Power sensing RF termination apparatus including temperature compensation means
JPH10283044A (ja) * 1997-04-04 1998-10-23 Asia Electron Inc 定電流電源装置
JP2000258472A (ja) * 1999-03-10 2000-09-22 Mitsubishi Electric Corp 電流検出装置
US6688119B2 (en) * 2000-12-22 2004-02-10 General Electric Company Methods and apparatus for increasing appliance measuring system accuracy
US6700365B2 (en) * 2001-12-10 2004-03-02 Intersil Americas Inc. Programmable current-sensing circuit providing discrete step temperature compensation for DC-DC converter

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101923124B (zh) * 2009-06-17 2012-06-20 上海华虹Nec电子有限公司 确定em测试结构中加速因子的方法
CN101957402A (zh) * 2010-08-31 2011-01-26 上海华岭集成电路技术股份有限公司 瞬时电流的测试系统与方法
CN103257275A (zh) * 2012-02-10 2013-08-21 横河电机株式会社 电极评价装置和电极评价方法
CN109564262A (zh) * 2016-08-12 2019-04-02 东京毅力科创株式会社 器件检查电路、器件检查装置和探针卡
CN109564262B (zh) * 2016-08-12 2021-03-05 东京毅力科创株式会社 器件检查电路、器件检查装置和探针卡
CN116034283A (zh) * 2020-09-16 2023-04-28 欧姆龙株式会社 电压检测装置
CN114878033A (zh) * 2022-03-29 2022-08-09 深圳国微感知技术有限公司 一种矩阵式压力分布测量系统及方法
CN114878033B (zh) * 2022-03-29 2023-12-22 深圳国微感知技术有限公司 一种矩阵式压力分布测量系统及方法
CN114924109A (zh) * 2022-07-20 2022-08-19 深圳市英特瑞半导体科技有限公司 低功耗芯片电流的测试方法、电路及其装置

Also Published As

Publication number Publication date
JP2005315729A (ja) 2005-11-10
WO2005106513A1 (ja) 2005-11-10
US20070103174A1 (en) 2007-05-10
KR20070013314A (ko) 2007-01-30
DE112005000986T5 (de) 2007-03-29

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