WO2005106513A1 - 直流試験装置 - Google Patents
直流試験装置 Download PDFInfo
- Publication number
- WO2005106513A1 WO2005106513A1 PCT/JP2005/007912 JP2005007912W WO2005106513A1 WO 2005106513 A1 WO2005106513 A1 WO 2005106513A1 JP 2005007912 W JP2005007912 W JP 2005007912W WO 2005106513 A1 WO2005106513 A1 WO 2005106513A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- current detection
- current
- resistor
- amplifier
- voltage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
- G01R31/3008—Quiescent current [IDDQ] test or leakage current test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/32—Compensating for temperature change
Definitions
- a coefficient obtained by dividing the resistance value of the reference resistor 14 by the resistance value of the current detection resistor 32 is multiplied by the potential difference between both ends of the current detection resistor 32. Even if the resistance value changes, it is possible to prevent a decrease in current detection accuracy due to the change in the resistance value.
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112005000986T DE112005000986T5 (de) | 2004-04-28 | 2005-04-26 | Gleichstrom-Prüfvorrichtung |
US11/589,687 US20070103174A1 (en) | 2004-04-28 | 2006-10-30 | Direct current test apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-133955 | 2004-04-28 | ||
JP2004133955A JP2005315729A (ja) | 2004-04-28 | 2004-04-28 | 直流試験装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/589,687 Continuation US20070103174A1 (en) | 2004-04-28 | 2006-10-30 | Direct current test apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005106513A1 true WO2005106513A1 (ja) | 2005-11-10 |
Family
ID=35241802
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/007912 WO2005106513A1 (ja) | 2004-04-28 | 2005-04-26 | 直流試験装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20070103174A1 (ja) |
JP (1) | JP2005315729A (ja) |
KR (1) | KR20070013314A (ja) |
CN (1) | CN1947025A (ja) |
DE (1) | DE112005000986T5 (ja) |
WO (1) | WO2005106513A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010054314A (ja) * | 2008-08-28 | 2010-03-11 | Yokogawa Electric Corp | 半導体試験装置 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI474710B (zh) * | 2007-10-18 | 2015-02-21 | Ind Tech Res Inst | 行動通訊設備於離線使用數位內容之收費方法及其系統 |
EP2169412A1 (en) * | 2008-09-25 | 2010-03-31 | Ilumab AB | Electrical current measurement arrangement |
CN101923124B (zh) * | 2009-06-17 | 2012-06-20 | 上海华虹Nec电子有限公司 | 确定em测试结构中加速因子的方法 |
US8779777B2 (en) * | 2010-06-04 | 2014-07-15 | Linear Technology Corporation | Dynamic compensation of aging drift in current sense resistor |
CN101957402A (zh) * | 2010-08-31 | 2011-01-26 | 上海华岭集成电路技术股份有限公司 | 瞬时电流的测试系统与方法 |
JP5720259B2 (ja) * | 2011-01-18 | 2015-05-20 | トヨタ自動車株式会社 | 電流検出回路 |
JP5467539B2 (ja) * | 2012-02-10 | 2014-04-09 | 横河電機株式会社 | 電極の評価装置および評価方法 |
JP6738236B2 (ja) * | 2016-08-12 | 2020-08-12 | 東京エレクトロン株式会社 | デバイス検査回路、デバイス検査装置及びプローブカード |
CN111638480B (zh) * | 2020-06-09 | 2022-10-11 | 广东省计量科学研究院(华南国家计量测试中心) | 一种基于温度补偿的电流传感器校准系统及方法 |
DE102021214606A1 (de) | 2021-12-16 | 2023-06-22 | Vitesco Technologies GmbH | Stromerfassungssystem |
CN114878033B (zh) * | 2022-03-29 | 2023-12-22 | 深圳国微感知技术有限公司 | 一种矩阵式压力分布测量系统及方法 |
CN114924109B (zh) * | 2022-07-20 | 2022-11-29 | 深圳市英特瑞半导体科技有限公司 | 低功耗芯片电流的测试方法、电路及其装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04216472A (ja) * | 1990-03-01 | 1992-08-06 | Merlin Gerin | 遮断器の電子的引外し装置用の電流センサ |
JPH09178782A (ja) * | 1995-12-25 | 1997-07-11 | Advantest Corp | 電流検出回路及びその回路を用いた直流試験装置 |
JPH10283044A (ja) * | 1997-04-04 | 1998-10-23 | Asia Electron Inc | 定電流電源装置 |
JP2000258472A (ja) * | 1999-03-10 | 2000-09-22 | Mitsubishi Electric Corp | 電流検出装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3430130A (en) * | 1966-05-20 | 1969-02-25 | Carl A Schneider | Conductivity measuring circuit utilizing conductivity cell as input resistance of an operational amplifier |
US4000643A (en) * | 1976-03-29 | 1977-01-04 | Honeywell Inc. | Apparatus for producing a compensating voltage |
US4438411A (en) * | 1981-07-20 | 1984-03-20 | Ford Aerospace & Communications Corporation | Temperature compensating method and apparatus for thermally stabilizing amplifier devices |
JPS5939105A (ja) * | 1982-08-27 | 1984-03-03 | Fujitsu Ltd | 制御電圧発生回路 |
JP3218106B2 (ja) * | 1992-12-28 | 2001-10-15 | 日本電波工業株式会社 | 水晶発振器の温度補償回路 |
US20030025488A1 (en) * | 1996-12-26 | 2003-02-06 | Emc Technology, Inc. | Power sensing RF termination apparatus including temperature compensation means |
US6688119B2 (en) * | 2000-12-22 | 2004-02-10 | General Electric Company | Methods and apparatus for increasing appliance measuring system accuracy |
US6700365B2 (en) * | 2001-12-10 | 2004-03-02 | Intersil Americas Inc. | Programmable current-sensing circuit providing discrete step temperature compensation for DC-DC converter |
-
2004
- 2004-04-28 JP JP2004133955A patent/JP2005315729A/ja active Pending
-
2005
- 2005-04-26 WO PCT/JP2005/007912 patent/WO2005106513A1/ja not_active Application Discontinuation
- 2005-04-26 CN CNA2005800134594A patent/CN1947025A/zh active Pending
- 2005-04-26 DE DE112005000986T patent/DE112005000986T5/de not_active Withdrawn
- 2005-04-26 KR KR1020067024664A patent/KR20070013314A/ko not_active Application Discontinuation
-
2006
- 2006-10-30 US US11/589,687 patent/US20070103174A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04216472A (ja) * | 1990-03-01 | 1992-08-06 | Merlin Gerin | 遮断器の電子的引外し装置用の電流センサ |
JPH09178782A (ja) * | 1995-12-25 | 1997-07-11 | Advantest Corp | 電流検出回路及びその回路を用いた直流試験装置 |
JPH10283044A (ja) * | 1997-04-04 | 1998-10-23 | Asia Electron Inc | 定電流電源装置 |
JP2000258472A (ja) * | 1999-03-10 | 2000-09-22 | Mitsubishi Electric Corp | 電流検出装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010054314A (ja) * | 2008-08-28 | 2010-03-11 | Yokogawa Electric Corp | 半導体試験装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20070013314A (ko) | 2007-01-30 |
DE112005000986T5 (de) | 2007-03-29 |
JP2005315729A (ja) | 2005-11-10 |
CN1947025A (zh) | 2007-04-11 |
US20070103174A1 (en) | 2007-05-10 |
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