JP2004514129A - レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置 - Google Patents

レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置 Download PDF

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JP2004514129A
JP2004514129A JP2002542833A JP2002542833A JP2004514129A JP 2004514129 A JP2004514129 A JP 2004514129A JP 2002542833 A JP2002542833 A JP 2002542833A JP 2002542833 A JP2002542833 A JP 2002542833A JP 2004514129 A JP2004514129 A JP 2004514129A
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polarization
light
light beam
sample
intensity
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JP2004514129A5 (https=
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ガラベ、ゴソ
ポモシ、イスワン
バイス、ゲオルグ
ヨルゲンス、ラインハルト
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カール　ツァイス　イエナ　ゲーエムベーハー
マジャレ　トゥドマノス　アカデミア　セゲディ　ビオロジアイ　コツポヌト
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Publication of JP2004514129A publication Critical patent/JP2004514129A/ja
Publication of JP2004514129A5 publication Critical patent/JP2004514129A5/ja
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means

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  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
JP2002542833A 2000-11-17 2001-11-16 レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置 Pending JP2004514129A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope
PCT/HU2001/000116 WO2002040953A1 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope

Publications (2)

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JP2004514129A true JP2004514129A (ja) 2004-05-13
JP2004514129A5 JP2004514129A5 (https=) 2005-12-22

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JP2002542833A Pending JP2004514129A (ja) 2000-11-17 2001-11-16 レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置

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US (1) US6856391B2 (https=)
EP (1) EP1334339B8 (https=)
JP (1) JP2004514129A (https=)
AT (1) ATE372507T1 (https=)
DE (1) DE60130356T2 (https=)
HU (1) HU226937B1 (https=)
WO (1) WO2002040953A1 (https=)

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CN106154593A (zh) * 2014-12-30 2016-11-23 财团法人工业技术研究院 异向性量测系统、异向性量测方法及其校正方法

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JP5189301B2 (ja) 2007-03-12 2013-04-24 オリンパス株式会社 レーザー走査型顕微鏡
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JP5907882B2 (ja) * 2010-10-19 2016-04-26 オリンパス株式会社 単一発光粒子の偏光特性を観測する光分析装置、光分析方法及びそのための光分析用コンピュータプログラム
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JP6013328B2 (ja) 2011-04-18 2016-10-25 オリンパス株式会社 標的粒子の定量方法
JP6013335B2 (ja) 2011-08-11 2016-10-25 オリンパス株式会社 標的粒子の計数方法
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JP6013338B2 (ja) 2011-08-26 2016-10-25 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
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JP5941923B2 (ja) 2011-11-10 2016-06-29 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
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JP6087751B2 (ja) * 2013-07-05 2017-03-01 株式会社モリテックス 光学異方性パラメータ測定装置、測定方法及び測定用プログラム
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WO2007088947A1 (ja) * 2006-02-02 2007-08-09 National University Corporation NARA Institute of Science and Technology 円二色性蛍光顕微鏡
JP2008076324A (ja) * 2006-09-25 2008-04-03 Moritex Corp 光学異方性パラメータ測定装置
KR101441876B1 (ko) * 2006-09-25 2014-09-19 숏토 모리텍스 가부시키가이샤 광학이방성 패러미터 측정 방법 및 측정 장치
JP2010525349A (ja) * 2007-05-02 2010-07-22 ナショナル ユニバーシティー オブ アイルランド， ゴールウェイ 集束照明場と観測されるサンプルとの間の相互作用から生じる３次元電磁場を分析するベクトル偏光測定方法および装置
CN106154593A (zh) * 2014-12-30 2016-11-23 财团法人工业技术研究院 异向性量测系统、异向性量测方法及其校正方法
CN106154593B (zh) * 2014-12-30 2019-08-02 财团法人工业技术研究院 异向性量测系统、异向性量测方法及其校正方法

Also Published As

Publication number Publication date
US6856391B2 (en) 2005-02-15
HUP0004571A2 (hu) 2002-07-29
EP1334339B1 (en) 2007-09-05
HU0004571D0 (https=) 2001-02-28
EP1334339B8 (en) 2007-12-26
DE60130356D1 (de) 2007-10-18
EP1334339A1 (en) 2003-08-13
DE60130356T2 (de) 2008-05-08
HU226937B1 (en) 2010-03-29
ATE372507T1 (de) 2007-09-15
US20030058442A1 (en) 2003-03-27
WO2002040953A1 (en) 2002-05-23

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