HU226937B1 - Method and apparatus for determining polarization amount of material by a laser scanning microscope - Google Patents

Method and apparatus for determining polarization amount of material by a laser scanning microscope Download PDF

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Publication number
HU226937B1
HU226937B1 HU0004571A HUP0004571A HU226937B1 HU 226937 B1 HU226937 B1 HU 226937B1 HU 0004571 A HU0004571 A HU 0004571A HU P0004571 A HUP0004571 A HU P0004571A HU 226937 B1 HU226937 B1 HU 226937B1
Authority
HU
Hungary
Prior art keywords
polarization
light
intensity
laser
detector
Prior art date
Application number
HU0004571A
Other languages
English (en)
Hungarian (hu)
Inventor
Gyoezoe Dr Garab
Istvan Pomozi
Georg Dr Weiss
Reinhard Dr Joergens
Original Assignee
Mta Szegedi Biolog Koezpont
Zeiss Carl Jena Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mta Szegedi Biolog Koezpont, Zeiss Carl Jena Gmbh filed Critical Mta Szegedi Biolog Koezpont
Priority to HU0004571A priority Critical patent/HU226937B1/hu
Publication of HU0004571D0 publication Critical patent/HU0004571D0/hu
Priority to JP2002542833A priority patent/JP2004514129A/ja
Priority to DE60130356T priority patent/DE60130356T2/de
Priority to AT01996722T priority patent/ATE372507T1/de
Priority to EP01996722A priority patent/EP1334339B8/en
Priority to PCT/HU2001/000116 priority patent/WO2002040953A1/en
Priority to US10/196,593 priority patent/US6856391B2/en
Publication of HUP0004571A2 publication Critical patent/HUP0004571A2/hu
Publication of HU226937B1 publication Critical patent/HU226937B1/hu

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means

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  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
HU0004571A 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope HU226937B1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope
JP2002542833A JP2004514129A (ja) 2000-11-17 2001-11-16 レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置
DE60130356T DE60130356T2 (de) 2000-11-17 2001-11-16 Verfahren und vorrichtung zur bestimmung der polarisationseigenschaften von licht, das durch ein material emittiert, reflektiert oder durchgelassen wird, durch verwendung eines laser-scan-mikroskops
AT01996722T ATE372507T1 (de) 2000-11-17 2001-11-16 Verfahren und vorrichtung zur bestimmung der polarisationseigenschaften von licht, das durch ein material emittiert, reflektiert oder durchgelassen wird, durch verwendung eines laser- scan-mikroskops
EP01996722A EP1334339B8 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope
PCT/HU2001/000116 WO2002040953A1 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope
US10/196,593 US6856391B2 (en) 2000-11-17 2002-07-17 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope

Publications (3)

Publication Number Publication Date
HU0004571D0 HU0004571D0 (https=) 2001-02-28
HUP0004571A2 HUP0004571A2 (hu) 2002-07-29
HU226937B1 true HU226937B1 (en) 2010-03-29

Family

ID=89978770

Family Applications (1)

Application Number Title Priority Date Filing Date
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope

Country Status (7)

Country Link
US (1) US6856391B2 (https=)
EP (1) EP1334339B8 (https=)
JP (1) JP2004514129A (https=)
AT (1) ATE372507T1 (https=)
DE (1) DE60130356T2 (https=)
HU (1) HU226937B1 (https=)
WO (1) WO2002040953A1 (https=)

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CN103477210B (zh) 2011-04-13 2015-09-23 奥林巴斯株式会社 利用单个发光粒子检测的光分析装置、光分析方法以及光分析用计算机程序
JP6013328B2 (ja) 2011-04-18 2016-10-25 オリンパス株式会社 標的粒子の定量方法
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CN103733049B (zh) 2011-08-15 2016-01-20 奥林巴斯株式会社 利用单个发光粒子检测的光分析装置、光分析方法以及光分析用计算机程序
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Also Published As

Publication number Publication date
JP2004514129A (ja) 2004-05-13
US6856391B2 (en) 2005-02-15
HUP0004571A2 (hu) 2002-07-29
EP1334339B1 (en) 2007-09-05
HU0004571D0 (https=) 2001-02-28
EP1334339B8 (en) 2007-12-26
DE60130356D1 (de) 2007-10-18
EP1334339A1 (en) 2003-08-13
DE60130356T2 (de) 2008-05-08
ATE372507T1 (de) 2007-09-15
US20030058442A1 (en) 2003-03-27
WO2002040953A1 (en) 2002-05-23

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GB9A Succession in title

Owner name: MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI K, HU

Free format text: FORMER OWNER(S): MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI KOEZPONT, HU; CARL ZEISS JENA GMBH., DE

QB4A Exploitation contract

Name of requester: CARL ZEISS JENA GMBH, DE

MM4A Lapse of definitive patent protection due to non-payment of fees