JP2002216493A - 救済修正回路および半導体記憶装置 - Google Patents

救済修正回路および半導体記憶装置

Info

Publication number
JP2002216493A
JP2002216493A JP2001015000A JP2001015000A JP2002216493A JP 2002216493 A JP2002216493 A JP 2002216493A JP 2001015000 A JP2001015000 A JP 2001015000A JP 2001015000 A JP2001015000 A JP 2001015000A JP 2002216493 A JP2002216493 A JP 2002216493A
Authority
JP
Japan
Prior art keywords
switching
switching element
correction circuit
repair
fuse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001015000A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002216493A5 (https=
Inventor
Takehiro Ochi
威洋 越智
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2001015000A priority Critical patent/JP2002216493A/ja
Priority to US09/912,537 priority patent/US6469943B2/en
Priority to KR10-2001-0057085A priority patent/KR100445500B1/ko
Priority to TW090123578A priority patent/TW511245B/zh
Publication of JP2002216493A publication Critical patent/JP2002216493A/ja
Publication of JP2002216493A5 publication Critical patent/JP2002216493A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP2001015000A 2001-01-23 2001-01-23 救済修正回路および半導体記憶装置 Pending JP2002216493A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2001015000A JP2002216493A (ja) 2001-01-23 2001-01-23 救済修正回路および半導体記憶装置
US09/912,537 US6469943B2 (en) 2001-01-23 2001-07-26 Switching circuit and semiconductor device
KR10-2001-0057085A KR100445500B1 (ko) 2001-01-23 2001-09-17 스위칭 회로
TW090123578A TW511245B (en) 2001-01-23 2001-09-25 Switching circuit and semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001015000A JP2002216493A (ja) 2001-01-23 2001-01-23 救済修正回路および半導体記憶装置

Publications (2)

Publication Number Publication Date
JP2002216493A true JP2002216493A (ja) 2002-08-02
JP2002216493A5 JP2002216493A5 (https=) 2008-01-31

Family

ID=18881620

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001015000A Pending JP2002216493A (ja) 2001-01-23 2001-01-23 救済修正回路および半導体記憶装置

Country Status (4)

Country Link
US (1) US6469943B2 (https=)
JP (1) JP2002216493A (https=)
KR (1) KR100445500B1 (https=)
TW (1) TW511245B (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006228330A (ja) * 2005-02-17 2006-08-31 Toshiba Corp 半導体記憶装置
JP2006294085A (ja) * 2005-04-06 2006-10-26 Toshiba Corp 半導体装置
JP2007234155A (ja) * 2006-03-02 2007-09-13 Sony Corp 半導体記憶装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003203496A (ja) * 2002-01-08 2003-07-18 Mitsubishi Electric Corp 半導体記憶装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62217497A (ja) * 1986-02-27 1987-09-24 Fujitsu Ltd 半導体記憶装置
JPH02146195A (ja) * 1988-11-28 1990-06-05 Nec Corp 半導体記憶装置
JPH02198100A (ja) * 1989-01-26 1990-08-06 Nec Corp 半導体メモリ装置
JPH03203900A (ja) * 1989-12-29 1991-09-05 Nec Corp 半導体記憶装置
JPH05166394A (ja) * 1991-12-19 1993-07-02 Oki Micro Design Miyazaki:Kk 半導体集積回路
JPH06150689A (ja) * 1992-11-10 1994-05-31 Nec Corp 半導体メモリ
JPH09213097A (ja) * 1996-02-07 1997-08-15 Hitachi Ltd ヒューズ装置及びそれを用いた半導体集積回路装置
JPH10228797A (ja) * 1996-12-12 1998-08-25 Mitsubishi Electric Corp 半導体記憶装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62235750A (ja) 1986-04-07 1987-10-15 Nec Corp 半導体集積回路
JPH02310898A (ja) * 1989-05-25 1990-12-26 Nec Corp メモリ回路
JP2888034B2 (ja) * 1991-06-27 1999-05-10 日本電気株式会社 半導体メモリ装置
KR940007241B1 (ko) * 1992-03-09 1994-08-10 삼성전자 주식회사 반도체 메모리 장치의 로우 리던던시장치
JPH06216253A (ja) 1993-01-19 1994-08-05 Sony Corp トリミング装置
KR0140178B1 (ko) * 1994-12-29 1998-07-15 김광호 반도체 메모리장치의 결함 셀 구제회로 및 방법
KR0158484B1 (ko) * 1995-01-28 1999-02-01 김광호 불휘발성 반도체 메모리의 행리던던씨
JPH10335594A (ja) 1997-05-29 1998-12-18 New Japan Radio Co Ltd 抵抗トリミング回路及びそのトリミング方法
US6188618B1 (en) * 1998-04-23 2001-02-13 Kabushiki Kaisha Toshiba Semiconductor device with flexible redundancy system
JPH11353893A (ja) * 1998-06-08 1999-12-24 Mitsubishi Electric Corp 半導体記憶装置
JP3749789B2 (ja) * 1998-06-08 2006-03-01 株式会社東芝 半導体記憶装置
JP2000123593A (ja) * 1998-08-13 2000-04-28 Toshiba Corp 半導体記憶装置及びその製造方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62217497A (ja) * 1986-02-27 1987-09-24 Fujitsu Ltd 半導体記憶装置
JPH02146195A (ja) * 1988-11-28 1990-06-05 Nec Corp 半導体記憶装置
JPH02198100A (ja) * 1989-01-26 1990-08-06 Nec Corp 半導体メモリ装置
JPH03203900A (ja) * 1989-12-29 1991-09-05 Nec Corp 半導体記憶装置
JPH05166394A (ja) * 1991-12-19 1993-07-02 Oki Micro Design Miyazaki:Kk 半導体集積回路
JPH06150689A (ja) * 1992-11-10 1994-05-31 Nec Corp 半導体メモリ
JPH09213097A (ja) * 1996-02-07 1997-08-15 Hitachi Ltd ヒューズ装置及びそれを用いた半導体集積回路装置
JPH10228797A (ja) * 1996-12-12 1998-08-25 Mitsubishi Electric Corp 半導体記憶装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006228330A (ja) * 2005-02-17 2006-08-31 Toshiba Corp 半導体記憶装置
JP2006294085A (ja) * 2005-04-06 2006-10-26 Toshiba Corp 半導体装置
JP2007234155A (ja) * 2006-03-02 2007-09-13 Sony Corp 半導体記憶装置

Also Published As

Publication number Publication date
KR100445500B1 (ko) 2004-08-21
US6469943B2 (en) 2002-10-22
US20020097083A1 (en) 2002-07-25
KR20020062677A (ko) 2002-07-29
TW511245B (en) 2002-11-21

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