IT1256362B - Processo di realizzazione su semiconduttori di regioni impiantate a basso rischio di channeling - Google Patents

Processo di realizzazione su semiconduttori di regioni impiantate a basso rischio di channeling

Info

Publication number
IT1256362B
IT1256362B ITMI922003A ITMI922003A IT1256362B IT 1256362 B IT1256362 B IT 1256362B IT MI922003 A ITMI922003 A IT MI922003A IT MI922003 A ITMI922003 A IT MI922003A IT 1256362 B IT1256362 B IT 1256362B
Authority
IT
Italy
Prior art keywords
regions
masking
channeling
low
areas
Prior art date
Application number
ITMI922003A
Other languages
English (en)
Inventor
Chiara Zaccherini
Original Assignee
St Microelectronics Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by St Microelectronics Srl filed Critical St Microelectronics Srl
Priority to ITMI922003A priority Critical patent/IT1256362B/it
Publication of ITMI922003A0 publication Critical patent/ITMI922003A0/it
Priority to JP5180263A priority patent/JPH07106275A/ja
Priority to DE69330986T priority patent/DE69330986T2/de
Priority to EP93111968A priority patent/EP0588032B1/en
Priority to US08/106,037 priority patent/US5436177A/en
Publication of ITMI922003A1 publication Critical patent/ITMI922003A1/it
Application granted granted Critical
Publication of IT1256362B publication Critical patent/IT1256362B/it

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/20—Resistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/3215—Doping the layers
    • H01L21/32155—Doping polycristalline - or amorphous silicon layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B10/00—Static random access memory [SRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B10/00—Static random access memory [SRAM] devices
    • H10B10/15—Static random access memory [SRAM] devices comprising a resistor load element

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
  • Element Separation (AREA)

Abstract

Un processo di realizzazione su semiconduttori di regioni impiantate a basso rischio di channeling, del tipo applicato a dispositivi elettronici a semiconduttore aventi almeno uno strato di silicio policristallino (7) ricoprente sia regioni (5) di isolamento, sia aeree (4) attive sensibili al fenomeno di channeling, prevede la successione delle seguenti fasi:- Mascheratura delle aree o regioni (8) da impiantare sullo strato (7) policristallino;- Impiantazione di una prima specie drogante avente elevato peso atomico, con conseguente amorfizazzione del silicio policristallino nelle aree prive di mascheratura;- Rimozione della mascheratura e successiva fase di impiantazione su tutto il semiconduttore di una seconda specie drogante.Ciò consente di ottenere una amorfizzazione selettiva delle sole zone sovrastanti un area attiva, quelle cioè in cui il fenomeno di channeling potrebbe essere dannoso.
ITMI922003A 1992-08-19 1992-08-19 Processo di realizzazione su semiconduttori di regioni impiantate a basso rischio di channeling IT1256362B (it)

Priority Applications (5)

Application Number Priority Date Filing Date Title
ITMI922003A IT1256362B (it) 1992-08-19 1992-08-19 Processo di realizzazione su semiconduttori di regioni impiantate a basso rischio di channeling
JP5180263A JPH07106275A (ja) 1992-08-19 1993-07-21 半導体上にチャネリング現象を起こす危険性の低い注入領域を形成する方法
DE69330986T DE69330986T2 (de) 1992-08-19 1993-07-27 Verfahren zur Bildung implantierter Gebiete mit einem reduzierten Channeling-Risiko in Halbleitern
EP93111968A EP0588032B1 (en) 1992-08-19 1993-07-27 Process for forming implanted regions with lowered channeling risk on semiconductors
US08/106,037 US5436177A (en) 1992-08-19 1993-08-12 Process for forming implanted regions with lowered channeling risk on semiconductors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI922003A IT1256362B (it) 1992-08-19 1992-08-19 Processo di realizzazione su semiconduttori di regioni impiantate a basso rischio di channeling

Publications (3)

Publication Number Publication Date
ITMI922003A0 ITMI922003A0 (it) 1992-08-19
ITMI922003A1 ITMI922003A1 (it) 1994-02-19
IT1256362B true IT1256362B (it) 1995-12-04

Family

ID=11363880

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI922003A IT1256362B (it) 1992-08-19 1992-08-19 Processo di realizzazione su semiconduttori di regioni impiantate a basso rischio di channeling

Country Status (5)

Country Link
US (1) US5436177A (it)
EP (1) EP0588032B1 (it)
JP (1) JPH07106275A (it)
DE (1) DE69330986T2 (it)
IT (1) IT1256362B (it)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0622832B1 (en) * 1993-03-17 2000-05-31 Canon Kabushiki Kaisha Method of connecting a wiring with a semiconductor region and semiconductor device obtained by this method
US5883566A (en) * 1997-02-24 1999-03-16 International Business Machines Corporation Noise-isolated buried resistor
US6090656A (en) * 1998-05-08 2000-07-18 Lsi Logic Linear capacitor and process for making same
US7217613B2 (en) * 2001-04-11 2007-05-15 Newport Fab, Llc Low cost fabrication of high resistivity resistors
US7122436B2 (en) * 2004-09-16 2006-10-17 Lsi Logic Corporation Techniques for forming passive devices during semiconductor back-end processing

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4208781A (en) * 1976-09-27 1980-06-24 Texas Instruments Incorporated Semiconductor integrated circuit with implanted resistor element in polycrystalline silicon layer
US4290185A (en) * 1978-11-03 1981-09-22 Mostek Corporation Method of making an extremely low current load device for integrated circuit
JPS55107244A (en) * 1979-02-09 1980-08-16 Toshiba Corp Manufacture of semiconductor device
US4367580A (en) * 1980-03-21 1983-01-11 Texas Instruments Incorporated Process for making polysilicon resistors
US4391650A (en) * 1980-12-22 1983-07-05 Ncr Corporation Method for fabricating improved complementary metal oxide semiconductor devices
FR2534415A1 (fr) * 1982-10-07 1984-04-13 Cii Honeywell Bull Procede de fabrication de resistances electriques dans un materiau semi-conducteur polycristallin et dispositif a circuits integres resultant
US4489104A (en) * 1983-06-03 1984-12-18 Industrial Technology Research Institute Polycrystalline silicon resistor having limited lateral diffusion
JPS6063961A (ja) * 1983-08-30 1985-04-12 Fujitsu Ltd 半導体装置の製造方法
JPS61191070A (ja) * 1985-02-20 1986-08-25 Toshiba Corp 半導体装置の製造方法
US4637836A (en) * 1985-09-23 1987-01-20 Rca Corporation Profile control of boron implant
US4866002A (en) * 1985-11-26 1989-09-12 Fuji Photo Film Co., Ltd. Complementary insulated-gate field effect transistor integrated circuit and manufacturing method thereof
JPS62169472A (ja) * 1986-01-22 1987-07-25 Hitachi Ltd 半導体集積回路装置
US5304502A (en) * 1988-11-08 1994-04-19 Yamaha Corporation Process of fabricating semiconductor integrated circuit having conductive strips used as resistor and gate electrode of component transistor
JPH0434966A (ja) * 1990-05-30 1992-02-05 Seiko Instr Inc 半導体装置の製造方法
US5141597A (en) * 1990-11-14 1992-08-25 United Technologies Corporation Thin polysilicon resistors
US5204279A (en) * 1991-06-03 1993-04-20 Sgs-Thomson Microelectronics, Inc. Method of making SRAM cell and structure with polycrystalline p-channel load devices
JPH06104384A (ja) * 1991-07-18 1994-04-15 Sgs Thomson Microelectron Inc 高値抵抗及びその製造方法
US5236857A (en) * 1991-10-30 1993-08-17 Texas Instruments Incorporated Resistor structure and process

Also Published As

Publication number Publication date
JPH07106275A (ja) 1995-04-21
US5436177A (en) 1995-07-25
EP0588032A3 (en) 1996-01-31
ITMI922003A1 (it) 1994-02-19
EP0588032B1 (en) 2001-10-24
EP0588032A2 (en) 1994-03-23
DE69330986D1 (de) 2001-11-29
DE69330986T2 (de) 2002-06-13
ITMI922003A0 (it) 1992-08-19

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19960828