IL150071A - Feon test feeder and Faun test device - Google Patents

Feon test feeder and Faun test device

Info

Publication number
IL150071A
IL150071A IL15007101A IL15007101A IL150071A IL 150071 A IL150071 A IL 150071A IL 15007101 A IL15007101 A IL 15007101A IL 15007101 A IL15007101 A IL 15007101A IL 150071 A IL150071 A IL 150071A
Authority
IL
Israel
Prior art keywords
inspection object
inspection
forming member
passage forming
groove
Prior art date
Application number
IL15007101A
Other languages
English (en)
Hebrew (he)
Other versions
IL150071A0 (en
Original Assignee
Lintec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lintec Corp filed Critical Lintec Corp
Publication of IL150071A0 publication Critical patent/IL150071A0/xx
Publication of IL150071A publication Critical patent/IL150071A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67271—Sorting devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sorting Of Articles (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Specific Conveyance Elements (AREA)
  • Attitude Control For Articles On Conveyors (AREA)
IL15007101A 2000-12-28 2001-12-27 Feon test feeder and Faun test device IL150071A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000404981 2000-12-28
JP2001127248A JP4887523B2 (ja) 2000-12-28 2001-04-25 多面体検査用フィーダー及び多面体検査装置
PCT/JP2001/011514 WO2002053480A1 (fr) 2000-12-28 2001-12-27 Dispositif d'alimentation destine a l'inspection de polyedre

Publications (2)

Publication Number Publication Date
IL150071A0 IL150071A0 (en) 2002-12-01
IL150071A true IL150071A (en) 2005-12-18

Family

ID=26607309

Family Applications (1)

Application Number Title Priority Date Filing Date
IL15007101A IL150071A (en) 2000-12-28 2001-12-27 Feon test feeder and Faun test device

Country Status (9)

Country Link
US (2) US6823752B2 (ko)
JP (1) JP4887523B2 (ko)
KR (1) KR100841262B1 (ko)
CN (1) CN1273363C (ko)
IL (1) IL150071A (ko)
MX (1) MXPA02008160A (ko)
MY (1) MY128964A (ko)
TW (1) TW530149B (ko)
WO (1) WO2002053480A1 (ko)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2003202478A1 (en) * 2002-02-27 2003-09-09 Kanebo, Ltd. Conveying equipment and inspection device
JPWO2003075027A1 (ja) * 2002-03-07 2005-06-30 ヤマハ発動機株式会社 電子部品検査装置
JP4121319B2 (ja) * 2002-06-27 2008-07-23 リンテック株式会社 多面体検査用フィーダー
DE102004047848A1 (de) * 2003-09-29 2005-04-14 visicontrol Gesellschaft für elektronische Bildverarbeitung mbH Verfahren und Vorrichtung zum Sortieren von vereinzelten Prüflingen mittels Bildverarbeitung
FR2876991B1 (fr) * 2004-10-25 2007-02-16 Sidel Sas Perfectionnement au dispositif convoyeur utilise pour l'acheminement d'objets orientes du genre capsules, couvercles, bouchons...etc, entre la machine d'appret de ces objets et leur destination
ES2329405T3 (es) * 2005-03-02 2009-11-25 Heiko Schmidt Unidad de abastecimiento para suministrar o proporcionar componentes y unidad clasificadora para dichos componentes.
JP2006320779A (ja) * 2005-05-17 2006-11-30 Qualicaps Co Ltd 扁平錠剤の外観検査装置
US8074784B2 (en) * 2006-12-07 2011-12-13 Production Resource Group, Llc Conventional table for testing lights along a conveyor path
JP5168622B2 (ja) * 2007-11-27 2013-03-21 シンフォニアテクノロジー株式会社 部品供給装置
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
CN102601061B (zh) * 2012-03-23 2014-03-05 杭州师范大学 一种定时器极片不良品自动分拣装置
JP6056239B2 (ja) * 2012-07-24 2017-01-11 シンフォニアテクノロジー株式会社 パーツフィーダ、及びその製造方法
JP6238035B2 (ja) 2014-03-13 2017-11-29 株式会社村田製作所 姿勢変換装置、整列装置及び姿勢変換方法、整列方法
KR101981512B1 (ko) 2014-03-27 2019-05-23 가부시키가이샤 무라타 세이사쿠쇼 자세 변환 장치·정렬 장치 및 자세 변환 방법·정렬 방법
CN105381960A (zh) * 2015-12-14 2016-03-09 上海安添机电科技有限公司 一种用于电感六面体的自动化外观检查机
US20180085853A1 (en) * 2016-09-23 2018-03-29 Murata Manufacturing Co., Ltd. Treatment apparatus, component feeder, and treatment method
TWI670215B (zh) * 2017-05-25 2019-09-01 日商Ｙｋｋ股份有限公司 搬送裝置及搬送方法
CN107907551A (zh) * 2017-11-16 2018-04-13 铭板精密科技(中山)有限公司 一种产品印刷检测装置
CN108355980A (zh) * 2017-12-30 2018-08-03 芜湖慧盈自动化设备有限公司 一种不良品分拣的电容外壳用输送装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3447661A (en) * 1967-07-14 1969-06-03 Lakso Co Inc Inspection table for tablets and capsules
JPS5283184A (en) 1975-12-31 1977-07-11 Fujitsu Ltd Production of integrated circuit operated at extra low temperatures
JPS5928353A (ja) * 1982-08-09 1984-02-15 Nec Corp Ｉｃ外観検査装置
JPS6063523U (ja) 1983-10-04 1985-05-04 日本ノーシヨン工業株式会社 釦加工装置の部品供給装置
FR2563939B1 (fr) * 1984-05-03 1988-03-18 Telemecanique Electrique Dispositif interrupteur a ecran de coupure d'arc
JPH01249181A (ja) * 1988-03-31 1989-10-04 Tdk Corp チップ部品自動外観選別機における部品仕分け方法
JPH04308121A (ja) * 1991-04-05 1992-10-30 Hitachi Ltd 外観検査被検体回転機構
US5642298A (en) * 1994-02-16 1997-06-24 Ade Corporation Wafer testing and self-calibration system
USRE37120E1 (en) * 1994-07-23 2001-04-03 Yoshitaka Aoyama Parts send-out control device for vibratory parts feeder
GB2299164A (en) * 1995-03-22 1996-09-25 Protos Desarrollo S A Imaging quality comparison apparatus
JPH09118421A (ja) * 1995-10-24 1997-05-06 Shinjiyou Seisakusho:Kk 部品の整送装置
DE29518639U1 (de) * 1995-11-24 1997-03-27 Heuft Systemtechnik Gmbh Vorrichtung zum Transportieren von Behältern vorbei an einer Einrichtung zum Inspizieren des Bodens der Behälter
US5937270A (en) * 1996-01-24 1999-08-10 Micron Electronics, Inc. Method of efficiently laser marking singulated semiconductor devices
DE19605133C2 (de) * 1996-02-13 2000-06-15 Krones Ag Inspektionsmaschine für Gefäße
JP3704784B2 (ja) * 1996-02-16 2005-10-12 神鋼電機株式会社 部品整送装置
JP3922314B2 (ja) * 1997-04-18 2007-05-30 神鋼電機株式会社 振動フィーダ群
JP2000157935A (ja) * 1998-11-26 2000-06-13 Yamato Kk 部品の検査方法及びその装置

Also Published As

Publication number Publication date
KR100841262B1 (ko) 2008-06-25
IL150071A0 (en) 2002-12-01
CN1273363C (zh) 2006-09-06
JP4887523B2 (ja) 2012-02-29
WO2002053480A1 (fr) 2002-07-11
US20030089184A1 (en) 2003-05-15
MY128964A (en) 2007-03-30
MXPA02008160A (es) 2002-11-29
KR20020079769A (ko) 2002-10-19
TW530149B (en) 2003-05-01
US20040211270A1 (en) 2004-10-28
US6892593B2 (en) 2005-05-17
CN1429171A (zh) 2003-07-09
US6823752B2 (en) 2004-11-30
JP2002255336A (ja) 2002-09-11

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Legal Events

Date Code Title Description
FF Patent granted
KB Patent renewed
KB Patent renewed
MM9K Patent not in force due to non-payment of renewal fees