IL145118A0 - Single wafer type substrate cleaning method and apparatus - Google Patents

Single wafer type substrate cleaning method and apparatus

Info

Publication number
IL145118A0
IL145118A0 IL14511801A IL14511801A IL145118A0 IL 145118 A0 IL145118 A0 IL 145118A0 IL 14511801 A IL14511801 A IL 14511801A IL 14511801 A IL14511801 A IL 14511801A IL 145118 A0 IL145118 A0 IL 145118A0
Authority
IL
Israel
Prior art keywords
wafer
type substrate
single wafer
supplied
wafer type
Prior art date
Application number
IL14511801A
Other languages
English (en)
Original Assignee
S E S Company Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by S E S Company Ltd filed Critical S E S Company Ltd
Publication of IL145118A0 publication Critical patent/IL145118A0/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00—Cleaning and liquid contact with solids
    • Y10S134/902—Semiconductor wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
IL14511801A 2000-12-05 2001-08-26 Single wafer type substrate cleaning method and apparatus IL145118A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000370718A JP2002176026A (ja) 2000-12-05 2000-12-05 枚葉式基板洗浄方法および枚葉式基板洗浄装置

Publications (1)

Publication Number Publication Date
IL145118A0 true IL145118A0 (en) 2002-06-30

Family

ID=18840556

Family Applications (1)

Application Number Title Priority Date Filing Date
IL14511801A IL145118A0 (en) 2000-12-05 2001-08-26 Single wafer type substrate cleaning method and apparatus

Country Status (10)

Country Link
US (2) US7029538B2 (fr)
EP (1) EP1213746B1 (fr)
JP (1) JP2002176026A (fr)
KR (1) KR100812482B1 (fr)
CN (1) CN1217386C (fr)
AT (1) ATE392709T1 (fr)
DE (1) DE60133618T2 (fr)
IL (1) IL145118A0 (fr)
SG (1) SG101461A1 (fr)
TW (1) TW518684B (fr)

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JP4262004B2 (ja) 2002-08-29 2009-05-13 大日本スクリーン製造株式会社 基板処理装置および基板処理方法
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US6818566B2 (en) * 2002-10-18 2004-11-16 The Boc Group, Inc. Thermal activation of fluorine for use in a semiconductor chamber
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US20040238008A1 (en) * 2003-03-12 2004-12-02 Savas Stephen E. Systems and methods for cleaning semiconductor substrates using a reduced volume of liquid
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US7431040B2 (en) * 2003-09-30 2008-10-07 Tokyo Electron Limited Method and apparatus for dispensing a rinse solution on a substrate
US8211242B2 (en) 2005-02-07 2012-07-03 Ebara Corporation Substrate processing method, substrate processing apparatus, and control program
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JP5153296B2 (ja) * 2007-10-31 2013-02-27 大日本スクリーン製造株式会社 基板処理装置および基板処理方法
KR100897547B1 (ko) * 2007-11-05 2009-05-15 세메스 주식회사 기판 처리 장치 및 방법
CN101673062B (zh) * 2008-09-09 2011-10-26 中芯国际集成电路制造(北京)有限公司 一种全湿法去胶的装置
CN102410711B (zh) * 2010-09-21 2014-02-26 如皋市大昌电子有限公司 一种二极管脱水机
US8926788B2 (en) 2010-10-27 2015-01-06 Lam Research Ag Closed chamber for wafer wet processing
US9997379B2 (en) 2010-11-30 2018-06-12 Lam Research Ag Method and apparatus for wafer wet processing
JP5829082B2 (ja) * 2011-09-09 2015-12-09 オリンパス株式会社 洗浄装置
US20130068264A1 (en) * 2011-09-21 2013-03-21 Nanya Technology Corporation Wafer scrubber apparatus
US20130171832A1 (en) * 2011-12-28 2013-07-04 Intermolecular Inc. Enhanced Isolation For Combinatorial Atomic Layer Deposition (ALD)
US20130269612A1 (en) * 2012-04-16 2013-10-17 Hermes-Epitek Corporation Gas Treatment Apparatus with Surrounding Spray Curtains
KR101512560B1 (ko) 2012-08-31 2015-04-15 가부시키가이샤 스크린 홀딩스 기판처리장치
JP5973299B2 (ja) * 2012-09-25 2016-08-23 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
JP6010398B2 (ja) * 2012-08-31 2016-10-19 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
CN102915909A (zh) * 2012-10-08 2013-02-06 上海华力微电子有限公司 一种改进酸槽式硅片清洗设备内环境的方法
KR101925581B1 (ko) * 2012-11-23 2018-12-05 주식회사 원익아이피에스 챔버 세정 방법
KR101536718B1 (ko) * 2013-01-31 2015-07-15 세메스 주식회사 지지 유닛, 이송 유닛, 기판 처리 장치, 그리고 기판 처리 장치를 이용한 기판 처리 방법
US10707099B2 (en) 2013-08-12 2020-07-07 Veeco Instruments Inc. Collection chamber apparatus to separate multiple fluids during the semiconductor wafer processing cycle
CN106133880B (zh) 2014-03-28 2019-03-22 株式会社斯库林集团 基板处理装置以及基板处理方法
CN104438201A (zh) * 2014-11-26 2015-03-25 乐山新天源太阳能科技有限公司 一种硅料清洗工艺及其设备
TWI582886B (zh) * 2016-01-12 2017-05-11 弘塑科技股份有限公司 單晶圓溼式處理裝置
CN106824884A (zh) * 2017-03-31 2017-06-13 贵州大学 一种硅片翻转冲洗装置
WO2018200398A1 (fr) 2017-04-25 2018-11-01 Veeco Precision Surface Processing Llc Chambre de traitement de plaquette semi-conductrice
JP2019054112A (ja) * 2017-09-15 2019-04-04 株式会社Ｓｃｒｅｅｎホールディングス 基板乾燥方法および基板乾燥装置
JP6442018B2 (ja) * 2017-10-04 2018-12-19 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法
JP6990602B2 (ja) * 2018-02-27 2022-01-12 東京エレクトロン株式会社 基板処理装置、基板処理方法及びコンピュータ読み取り可能な記録媒体
JP7080331B2 (ja) * 2018-08-22 2022-06-03 東京エレクトロン株式会社 基板処理方法および基板処理装置
CN110148573B (zh) * 2019-04-17 2020-12-04 湖州达立智能设备制造有限公司 一种半导体设备工艺腔的晶圆升降装置
JP7315389B2 (ja) * 2019-06-28 2023-07-26 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置および基板処理方法
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Also Published As

Publication number Publication date
US7029538B2 (en) 2006-04-18
US6807974B2 (en) 2004-10-26
DE60133618D1 (de) 2008-05-29
EP1213746B1 (fr) 2008-04-16
CN1357907A (zh) 2002-07-10
US20020074020A1 (en) 2002-06-20
TW518684B (en) 2003-01-21
DE60133618T2 (de) 2008-08-07
JP2002176026A (ja) 2002-06-21
EP1213746A3 (fr) 2006-04-05
KR100812482B1 (ko) 2008-03-10
CN1217386C (zh) 2005-08-31
ATE392709T1 (de) 2008-05-15
EP1213746A2 (fr) 2002-06-12
SG101461A1 (en) 2004-01-30
US20030047192A1 (en) 2003-03-13
KR20020044536A (ko) 2002-06-15

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