IL108974A - Device and method for testing a display panel - Google Patents

Device and method for testing a display panel

Info

Publication number
IL108974A
IL108974A IL10897494A IL10897494A IL108974A IL 108974 A IL108974 A IL 108974A IL 10897494 A IL10897494 A IL 10897494A IL 10897494 A IL10897494 A IL 10897494A IL 108974 A IL108974 A IL 108974A
Authority
IL
Israel
Prior art keywords
panel
pixels
pixel
image
sensor
Prior art date
Application number
IL10897494A
Other languages
English (en)
Hebrew (he)
Other versions
IL108974A0 (en
Original Assignee
Orbotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orbotech Ltd filed Critical Orbotech Ltd
Priority to IL10897494A priority Critical patent/IL108974A/en
Publication of IL108974A0 publication Critical patent/IL108974A0/xx
Priority to US08/402,141 priority patent/US5771068A/en
Priority to TW084102320A priority patent/TW315574B/zh
Priority to EP95301647A priority patent/EP0672933A1/en
Priority to JP7053884A priority patent/JPH0868976A/ja
Priority to KR1019950005238A priority patent/KR950033565A/ko
Priority to US09/099,494 priority patent/US6215895B1/en
Publication of IL108974A publication Critical patent/IL108974A/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Geometry (AREA)
  • Quality & Reliability (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
IL10897494A 1994-03-14 1994-03-14 Device and method for testing a display panel IL108974A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IL10897494A IL108974A (en) 1994-03-14 1994-03-14 Device and method for testing a display panel
US08/402,141 US5771068A (en) 1994-03-14 1995-03-10 Apparatus and method for display panel inspection
TW084102320A TW315574B (ko) 1994-03-14 1995-03-11
EP95301647A EP0672933A1 (en) 1994-03-14 1995-03-13 Apparatus and method for display panel inspection
JP7053884A JPH0868976A (ja) 1994-03-14 1995-03-14 表示パネル検査装置及び検査方法
KR1019950005238A KR950033565A (ko) 1994-03-14 1995-03-14 디스플레이 패널 검사를 위한 장치와 방법
US09/099,494 US6215895B1 (en) 1994-03-14 1998-06-18 Apparatus and method for display panel inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL10897494A IL108974A (en) 1994-03-14 1994-03-14 Device and method for testing a display panel

Publications (2)

Publication Number Publication Date
IL108974A0 IL108974A0 (en) 1994-06-24
IL108974A true IL108974A (en) 1999-11-30

Family

ID=11065931

Family Applications (1)

Application Number Title Priority Date Filing Date
IL10897494A IL108974A (en) 1994-03-14 1994-03-14 Device and method for testing a display panel

Country Status (6)

Country Link
US (2) US5771068A (ko)
EP (1) EP0672933A1 (ko)
JP (1) JPH0868976A (ko)
KR (1) KR950033565A (ko)
IL (1) IL108974A (ko)
TW (1) TW315574B (ko)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL108974A (en) * 1994-03-14 1999-11-30 Orbotech Ltd Device and method for testing a display panel
JP2898269B1 (ja) * 1998-03-02 1999-05-31 日本放送協会 映像検査装置、方法および記録媒体
US6714670B1 (en) * 1998-05-20 2004-03-30 Cognex Corporation Methods and apparatuses to determine the state of elements
JP3828283B2 (ja) * 1998-06-04 2006-10-04 株式会社アドバンテスト フラットパネル表示器検査用画像取得方法、フラットパネル表示器検査用画像取得装置
IL126866A (en) 1998-11-02 2003-02-12 Orbotech Ltd Apparatus and method for fabricating flat workpieces
TW417133B (en) * 1998-11-25 2001-01-01 Koninkl Philips Electronics Nv Method of manufacturing a cathode ray tube, in which a display screen is inspected
US6831995B1 (en) * 1999-03-23 2004-12-14 Hitachi, Ltd. Method for detecting a defect in a pixel of an electrical display unit and a method for manufacturing an electrical display unit
US7373015B2 (en) * 1999-12-15 2008-05-13 Sharp Kabushiki Kaisha Image processing device and method
DE10046845C2 (de) * 2000-09-20 2003-08-21 Fresenius Medical Care De Gmbh Verfahren und Vorrichtung zur Funktionsprüfung einer Anzeigeeinrichtung eines medizinisch-technischen Gerätes
EP1472668A2 (en) * 2001-09-14 2004-11-03 American Panel Corporation Visual display testing, optimization and harmonization method and system
US6712466B2 (en) * 2001-10-25 2004-03-30 Ophthonix, Inc. Eyeglass manufacturing method using variable index layer
DE10228579A1 (de) * 2002-06-26 2004-01-15 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtung zum Messen der Bildqualität des Displays eines Mobiltelefons
KR20040045173A (ko) * 2002-11-22 2004-06-01 갈란트 프리시젼 머시닝 캄파니, 리미티드 교대 팰릿을 갖춘 검사 시스템
KR100471084B1 (ko) * 2002-12-16 2005-03-10 삼성전자주식회사 영상처리시스템 및 영상처리방법
JP2005017116A (ja) * 2003-06-26 2005-01-20 Sharp Corp 光学式エンコーダ用受光素子
GB0318000D0 (en) * 2003-07-31 2003-09-03 Ncr Int Inc Mobile applications
KR100955486B1 (ko) * 2004-01-30 2010-04-30 삼성전자주식회사 디스플레이 패널의 검사장치 및 검사방법
US8184923B2 (en) 2004-04-19 2012-05-22 Semiconductor Energy Laboratory Co., Ltd. Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis program
US20050286753A1 (en) * 2004-06-25 2005-12-29 Triant Technologies Inc. Automated inspection systems and methods
KR20070039604A (ko) * 2004-07-23 2007-04-12 넥스텍 솔루션즈 인크. 대형 기판 평탄 패널의 검사 시스템
JP4353479B2 (ja) * 2004-10-08 2009-10-28 大日本スクリーン製造株式会社 ムラ検査装置、ムラ検査方法、および、濃淡ムラをコンピュータに検査させるプログラム
KR20060044032A (ko) * 2004-11-11 2006-05-16 삼성전자주식회사 표시패널용 검사 장치 및 이의 검사 방법
US8436632B2 (en) * 2008-06-27 2013-05-07 American Panel Corporation System and method for optimizing LCD displays
KR20100072762A (ko) * 2008-12-22 2010-07-01 삼성전자주식회사 물체 정보 제공장치, 물체 인식 장치 및 물체 인식 시스템
US9035673B2 (en) * 2010-01-25 2015-05-19 Palo Alto Research Center Incorporated Method of in-process intralayer yield detection, interlayer shunt detection and correction
KR20140091916A (ko) * 2013-01-14 2014-07-23 삼성디스플레이 주식회사 디스플레이 패널 검사방법
CN104977304A (zh) * 2015-06-26 2015-10-14 清华大学 具有子像素结构的空间光调制器缺陷检测的装置及方法
CN112689752A (zh) * 2018-09-20 2021-04-20 美国西门子医学诊断股份有限公司 用于对基于视觉的检查系统的光学组件进行自主诊断验证的系统、方法和装置
KR102668970B1 (ko) * 2018-12-14 2024-05-24 삼성디스플레이 주식회사 비전 검사 장치 및 이의 구동 방법
CN112837620B (zh) 2021-01-22 2023-07-04 武汉京东方光电科技有限公司 柔性显示屏及电子设备

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL72878A (en) * 1984-09-06 1988-10-31 Tadiran Ltd Reconnaissance system
US5245328A (en) * 1988-10-14 1993-09-14 Compaq Computer Corporation Method and apparatus for displaying different shades of gray on a liquid crystal display
US5012314A (en) * 1989-03-31 1991-04-30 Mitsubishi Denki Kabushiki Kaisha Liquid crystal display restoring apparatus
US5020116A (en) * 1989-12-13 1991-05-28 Hughes Aircraft Company Image registration method and apparatus
US5177437A (en) * 1990-08-08 1993-01-05 Photon Dynamics, Inc. High-density optically-addressable circuit board probe panel and method for use
JPH0634142B2 (ja) * 1990-09-26 1994-05-02 ミナトエレクトロニクス株式会社 表示素子検査方式
JPH04158238A (ja) * 1990-10-22 1992-06-01 Ezel Inc 液晶パネルの検査方法
US5081687A (en) * 1990-11-30 1992-01-14 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array prior to shorting bar removal
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5402170A (en) * 1991-12-11 1995-03-28 Eastman Kodak Company Hand-manipulated electronic camera tethered to a personal computer
JPH07507139A (ja) * 1992-03-16 1995-08-03 フォトン・ダイナミクス・インコーポレーテッド フラット・パネル・ディスプレイ検査システム
JPH06230744A (ja) * 1993-02-05 1994-08-19 Fuji Electric Co Ltd フラットディスプレイの表示検査方法およびその検査 装置
JPH06236162A (ja) * 1993-02-09 1994-08-23 Sharp Corp カラー液晶パネル欠陥検査方法および装置
JPH06250139A (ja) * 1993-02-23 1994-09-09 Casio Comput Co Ltd 液晶表示パネルの検査方法
IL108974A (en) * 1994-03-14 1999-11-30 Orbotech Ltd Device and method for testing a display panel

Also Published As

Publication number Publication date
IL108974A0 (en) 1994-06-24
KR950033565A (ko) 1995-12-26
US6215895B1 (en) 2001-04-10
US5771068A (en) 1998-06-23
EP0672933A1 (en) 1995-09-20
JPH0868976A (ja) 1996-03-12
TW315574B (ko) 1997-09-11

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