HK9582A - Improvements in or relation to the fabrication of semoconductor device - Google Patents
Improvements in or relation to the fabrication of semoconductor deviceInfo
- Publication number
- HK9582A HK9582A HK95/82A HK9582A HK9582A HK 9582 A HK9582 A HK 9582A HK 95/82 A HK95/82 A HK 95/82A HK 9582 A HK9582 A HK 9582A HK 9582 A HK9582 A HK 9582A
- Authority
- HK
- Hong Kong
- Prior art keywords
- fabrication
- relation
- semoconductor
- semoconductor device
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
- H10D10/60—Lateral BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0112—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs
- H10D84/0116—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs the components including integrated injection logic [I2L]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H10W10/0121—
-
- H10W10/0126—
-
- H10W10/0127—
-
- H10W10/13—
-
- H10W15/00—
-
- H10W15/01—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/053—Field effect transistors fets
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/085—Isolated-integrated
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/087—I2L integrated injection logic
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/096—Lateral transistor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/106—Masks, special
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/117—Oxidation, selective
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/518,445 US3962717A (en) | 1974-10-29 | 1974-10-29 | Oxide isolated integrated injection logic with selective guard ring |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| HK9582A true HK9582A (en) | 1982-03-12 |
Family
ID=24063967
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| HK95/82A HK9582A (en) | 1974-10-29 | 1982-03-04 | Improvements in or relation to the fabrication of semoconductor device |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US3962717A (enExample) |
| JP (1) | JPS5726417B2 (enExample) |
| BE (1) | BE834962A (enExample) |
| BR (1) | BR7506172A (enExample) |
| CA (1) | CA1030274A (enExample) |
| CH (1) | CH594288A5 (enExample) |
| DE (1) | DE2545892A1 (enExample) |
| FR (1) | FR2290037A1 (enExample) |
| GB (1) | GB1522958A (enExample) |
| HK (1) | HK9582A (enExample) |
| IT (1) | IT1047337B (enExample) |
| NL (1) | NL186608C (enExample) |
Families Citing this family (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS561783B2 (enExample) * | 1974-12-27 | 1981-01-16 | ||
| DE2510593C3 (de) * | 1975-03-11 | 1982-03-18 | Siemens AG, 1000 Berlin und 8000 München | Integrierte Halbleiter-Schaltungsanordnung |
| CA1056513A (en) * | 1975-06-19 | 1979-06-12 | Benjamin J. Sloan (Jr.) | Integrated logic circuit and method of fabrication |
| DE2532608C2 (de) * | 1975-07-22 | 1982-09-02 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Planardiffusionsverfahren zum Herstellen einer monolithisch integrierten Schaltung |
| JPS5247383A (en) * | 1975-10-13 | 1977-04-15 | Toshiba Corp | Semiconductor device |
| JPS5261977A (en) * | 1975-11-18 | 1977-05-21 | Matsushita Electric Ind Co Ltd | Semiconductor integrated circuit device and its production |
| US4084174A (en) * | 1976-02-12 | 1978-04-11 | Fairchild Camera And Instrument Corporation | Graduated multiple collector structure for inverted vertical bipolar transistors |
| US4143455A (en) * | 1976-03-11 | 1979-03-13 | Siemens Aktiengesellschaft | Method of producing a semiconductor component |
| US4137109A (en) * | 1976-04-12 | 1979-01-30 | Texas Instruments Incorporated | Selective diffusion and etching method for isolation of integrated logic circuit |
| JPS52141587A (en) * | 1976-05-20 | 1977-11-25 | Matsushita Electric Ind Co Ltd | Semiconductor device and its process |
| US4066473A (en) * | 1976-07-15 | 1978-01-03 | Fairchild Camera And Instrument Corporation | Method of fabricating high-gain transistors |
| JPS5367383A (en) * | 1976-08-08 | 1978-06-15 | Fairchild Camera Instr Co | Method of producing small ic implantation logic semiconductor |
| US4149177A (en) * | 1976-09-03 | 1979-04-10 | Fairchild Camera And Instrument Corporation | Method of fabricating conductive buried regions in integrated circuits and the resulting structures |
| JPS5338276A (en) * | 1976-09-20 | 1978-04-08 | Toshiba Corp | Semiconductor device |
| JPS5252378A (en) * | 1976-10-01 | 1977-04-27 | Sony Corp | Semiconductor device |
| US4115797A (en) * | 1976-10-04 | 1978-09-19 | Fairchild Camera And Instrument Corporation | Integrated injection logic with heavily doped injector base self-aligned with injector emitter and collector |
| JPS5368990A (en) * | 1976-12-01 | 1978-06-19 | Fujitsu Ltd | Production of semiconductor integrated circuit |
| GB1597536A (en) * | 1977-03-18 | 1981-09-09 | Texas Instruments Inc | High performance integrated injection logic gate utilizing p-type schottky input diodes |
| JPS53121485A (en) * | 1977-03-30 | 1978-10-23 | Mitsubishi Electric Corp | Semiconductor logic circuit device of electrostatic induction type |
| NL7703941A (nl) * | 1977-04-12 | 1978-10-16 | Philips Nv | Werkwijze ter vervaardiging van een halfgelei- derinrichting en inrichting, vervaardigd door toepassing van de werkwijze. |
| US4168999A (en) * | 1978-12-26 | 1979-09-25 | Fairchild Camera And Instrument Corporation | Method for forming oxide isolated integrated injection logic semiconductor structures having minimal encroachment utilizing special masking techniques |
| DE3020609C2 (de) * | 1979-05-31 | 1985-11-07 | Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa | Verfahren zum Herstellen einer integrierten Schaltung mit wenigstens einem I↑2↑L-Element |
| US4338622A (en) * | 1979-06-29 | 1982-07-06 | International Business Machines Corporation | Self-aligned semiconductor circuits and process therefor |
| JPS556899A (en) * | 1979-07-06 | 1980-01-18 | Toshiba Corp | Semiconductor device |
| US4322882A (en) * | 1980-02-04 | 1982-04-06 | Fairchild Camera & Instrument Corp. | Method for making an integrated injection logic structure including a self-aligned base contact |
| JPS5610959A (en) * | 1980-03-17 | 1981-02-03 | Toshiba Corp | Manufacture of semiconductor device |
| US4512075A (en) * | 1980-08-04 | 1985-04-23 | Fairchild Camera & Instrument Corporation | Method of making an integrated injection logic cell having self-aligned collector and base reduced resistance utilizing selective diffusion from polycrystalline regions |
| JPS5658870U (enExample) * | 1980-10-02 | 1981-05-20 | ||
| JPS5792858A (en) * | 1980-12-01 | 1982-06-09 | Hitachi Ltd | Semiconductor integrated circuit device and manufacture thereof |
| US4373252A (en) * | 1981-02-17 | 1983-02-15 | Fairchild Camera & Instrument | Method for manufacturing a semiconductor structure having reduced lateral spacing between buried regions |
| US4374011A (en) * | 1981-05-08 | 1983-02-15 | Fairchild Camera & Instrument Corp. | Process for fabricating non-encroaching planar insulating regions in integrated circuit structures |
| US4435225A (en) | 1981-05-11 | 1984-03-06 | Fairchild Camera & Instrument Corporation | Method of forming self-aligned lateral bipolar transistor |
| JPS58206171A (ja) * | 1982-05-26 | 1983-12-01 | Nec Corp | 半導体集積回路装置 |
| JPS5957471A (ja) * | 1982-09-28 | 1984-04-03 | Toshiba Corp | 半導体装置 |
| US5166094A (en) * | 1984-09-14 | 1992-11-24 | Fairchild Camera & Instrument Corp. | Method of fabricating a base-coupled transistor logic |
| US4925806A (en) * | 1988-03-17 | 1990-05-15 | Northern Telecom Limited | Method for making a doped well in a semiconductor substrate |
| US5289024A (en) * | 1990-08-07 | 1994-02-22 | National Semiconductor Corporation | Bipolar transistor with diffusion compensation |
| US5047117A (en) * | 1990-09-26 | 1991-09-10 | Micron Technology, Inc. | Method of forming a narrow self-aligned, annular opening in a masking layer |
| JPH0785476B2 (ja) * | 1991-06-14 | 1995-09-13 | インターナショナル・ビジネス・マシーンズ・コーポレイション | エミッタ埋め込み型バイポーラ・トランジスタ構造 |
| US5573837A (en) * | 1992-04-22 | 1996-11-12 | Micron Technology, Inc. | Masking layer having narrow isolated spacings and the method for forming said masking layer and the method for forming narrow isolated trenches defined by said masking layer |
| JPH10303291A (ja) * | 1997-04-25 | 1998-11-13 | Nippon Steel Corp | 半導体装置及びその製造方法 |
| JP2001217317A (ja) | 2000-02-07 | 2001-08-10 | Sony Corp | 半導体装置およびその製造方法 |
| DE50305348D1 (de) | 2003-04-24 | 2006-11-23 | Goldschmidt Gmbh | Verfahren zur Herstellung von ablösbaren schmutz- und wasserabweisenden flächigen Beschichtungen |
| TR201906951A2 (tr) * | 2019-05-09 | 2019-05-21 | Ankara Ueniversitesi Rektoerluegue | Enzimatik İşlemlerle Nar Suyu Kusurlarının Giderilmesi İçin Yöntem |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3386865A (en) * | 1965-05-10 | 1968-06-04 | Ibm | Process of making planar semiconductor devices isolated by encapsulating oxide filled channels |
| GB1153497A (en) * | 1966-07-25 | 1969-05-29 | Associated Semiconductor Mft | Improvements in and relating to Semiconductor Devices |
| DE2021824C3 (de) * | 1970-05-05 | 1980-08-14 | Ibm Deutschland Gmbh, 7000 Stuttgart | Monolithische Halbleiterschaltung |
| US3648125A (en) * | 1971-02-02 | 1972-03-07 | Fairchild Camera Instr Co | Method of fabricating integrated circuits with oxidized isolation and the resulting structure |
| NL173110C (nl) * | 1971-03-17 | 1983-12-01 | Philips Nv | Werkwijze ter vervaardiging van een halfgeleiderinrichting, waarbij op een oppervlak van een halfgeleiderlichaam een uit ten minste twee deellagen van verschillend materiaal samengestelde maskeringslaag wordt aangebracht. |
| JPS5528229B1 (enExample) * | 1971-03-19 | 1980-07-26 | ||
| NL170901C (nl) * | 1971-04-03 | 1983-01-03 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting. |
| US3873989A (en) * | 1973-05-07 | 1975-03-25 | Fairchild Camera Instr Co | Double-diffused, lateral transistor structure |
| US3904450A (en) * | 1974-04-26 | 1975-09-09 | Bell Telephone Labor Inc | Method of fabricating injection logic integrated circuits using oxide isolation |
| NL7413264A (nl) * | 1974-10-09 | 1976-04-13 | Philips Nv | Geintegreerde schakeling. |
-
1974
- 1974-10-29 US US05/518,445 patent/US3962717A/en not_active Expired - Lifetime
-
1975
- 1975-08-21 CA CA233,893A patent/CA1030274A/en not_active Expired
- 1975-09-08 GB GB36831/75A patent/GB1522958A/en not_active Expired
- 1975-09-09 JP JP10860275A patent/JPS5726417B2/ja not_active Expired
- 1975-09-24 BR BR7506172*A patent/BR7506172A/pt unknown
- 1975-10-02 IT IT69440/75A patent/IT1047337B/it active
- 1975-10-14 DE DE19752545892 patent/DE2545892A1/de not_active Ceased
- 1975-10-17 CH CH1350175A patent/CH594288A5/xx not_active IP Right Cessation
- 1975-10-21 NL NLAANVRAGE7512333,A patent/NL186608C/xx not_active IP Right Cessation
- 1975-10-27 FR FR7532773A patent/FR2290037A1/fr active Granted
- 1975-10-28 BE BE161332A patent/BE834962A/xx not_active IP Right Cessation
-
1982
- 1982-03-04 HK HK95/82A patent/HK9582A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CH594288A5 (enExample) | 1978-01-13 |
| BR7506172A (pt) | 1976-08-17 |
| AU8607775A (en) | 1977-05-05 |
| BE834962A (fr) | 1976-02-16 |
| FR2290037B1 (enExample) | 1980-05-16 |
| DE2545892A1 (de) | 1976-05-13 |
| FR2290037A1 (fr) | 1976-05-28 |
| CA1030274A (en) | 1978-04-25 |
| JPS5154379A (enExample) | 1976-05-13 |
| NL186608B (nl) | 1990-08-01 |
| US3962717A (en) | 1976-06-08 |
| GB1522958A (en) | 1978-08-31 |
| NL186608C (nl) | 1991-01-02 |
| JPS5726417B2 (enExample) | 1982-06-04 |
| IT1047337B (it) | 1980-09-10 |
| NL7512333A (nl) | 1976-05-04 |
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