HK1214404A1 - 液體浸入元件和曝光設備 - Google Patents

液體浸入元件和曝光設備

Info

Publication number
HK1214404A1
HK1214404A1 HK16102124.7A HK16102124A HK1214404A1 HK 1214404 A1 HK1214404 A1 HK 1214404A1 HK 16102124 A HK16102124 A HK 16102124A HK 1214404 A1 HK1214404 A1 HK 1214404A1
Authority
HK
Hong Kong
Prior art keywords
liquid
exposure device
immersion member
immersion
exposure
Prior art date
Application number
HK16102124.7A
Other languages
English (en)
Inventor
Shinji Sato
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of HK1214404A1 publication Critical patent/HK1214404A1/zh

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70866Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Toxicology (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
HK16102124.7A 2012-12-27 2016-02-25 液體浸入元件和曝光設備 HK1214404A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261746497P 2012-12-27 2012-12-27
PCT/JP2013/084758 WO2014104139A1 (ja) 2012-12-27 2013-12-25 液浸部材及び露光装置

Publications (1)

Publication Number Publication Date
HK1214404A1 true HK1214404A1 (zh) 2016-07-22

Family

ID=51021216

Family Applications (2)

Application Number Title Priority Date Filing Date
HK16102124.7A HK1214404A1 (zh) 2012-12-27 2016-02-25 液體浸入元件和曝光設備
HK16102986.4A HK1215327A1 (zh) 2012-12-27 2016-03-15 液浸部件及曝光裝置

Family Applications After (1)

Application Number Title Priority Date Filing Date
HK16102986.4A HK1215327A1 (zh) 2012-12-27 2016-03-15 液浸部件及曝光裝置

Country Status (8)

Country Link
US (6) US9651873B2 (zh)
EP (2) EP2940714B1 (zh)
JP (3) JP6319098B2 (zh)
KR (1) KR102229741B1 (zh)
CN (2) CN105144342B (zh)
HK (2) HK1214404A1 (zh)
TW (3) TWI645264B (zh)
WO (1) WO2014104139A1 (zh)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090262316A1 (en) * 2005-01-31 2009-10-22 Nikon Corporation Exposure apparatus and method for producing device
NL2005655A (en) 2009-12-09 2011-06-14 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
US9256137B2 (en) * 2011-08-25 2016-02-09 Nikon Corporation Exposure apparatus, liquid holding method, and device manufacturing method
NL2009692A (en) 2011-12-07 2013-06-10 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
US9268231B2 (en) 2012-04-10 2016-02-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9323160B2 (en) 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9651873B2 (en) 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
EP3057122B1 (en) 2013-10-08 2018-11-21 Nikon Corporation Immersion member, exposure apparatus, exposure method, and device manufacturing method
WO2016000883A1 (en) * 2014-07-04 2016-01-07 Asml Netherlands B.V. Lithographic apparatus and a method of manufacturing a device using a lithographic apparatus
CN107106938B (zh) * 2014-12-19 2019-06-18 Asml荷兰有限公司 流体处理结构、光刻设备和器件制造方法
US10416571B2 (en) 2016-01-13 2019-09-17 Asml Netherlands B.V. Fluid handling structure and lithographic apparatus
JP6757849B2 (ja) * 2016-09-12 2020-09-23 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置のための流体ハンドリング構造
KR102412406B1 (ko) 2016-12-14 2022-06-22 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치 및 디바이스 제조 방법
US11156921B2 (en) * 2017-12-15 2021-10-26 Asml Netherlands B.V. Fluid handling structure, lithographic apparatus, and method of using a fluid handling structure
CN112684665B (zh) * 2020-12-25 2024-06-25 浙江启尔机电技术有限公司 一种浸液供给回收装置

Family Cites Families (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1244018C (zh) 1996-11-28 2006-03-01 株式会社尼康 曝光方法和曝光装置
USRE40043E1 (en) 1997-03-10 2008-02-05 Asml Netherlands B.V. Positioning device having two object holders
US6897963B1 (en) 1997-12-18 2005-05-24 Nikon Corporation Stage device and exposure apparatus
US6208407B1 (en) 1997-12-22 2001-03-27 Asm Lithography B.V. Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement
WO2001035168A1 (en) 1999-11-10 2001-05-17 Massachusetts Institute Of Technology Interference lithography utilizing phase-locked scanning beams
US6452292B1 (en) 2000-06-26 2002-09-17 Nikon Corporation Planar motor with linear coil arrays
JP4714403B2 (ja) 2001-02-27 2011-06-29 エーエスエムエル ユーエス,インコーポレイテッド デュアルレチクルイメージを露光する方法および装置
TW529172B (en) 2001-07-24 2003-04-21 Asml Netherlands Bv Imaging apparatus
US7362508B2 (en) 2002-08-23 2008-04-22 Nikon Corporation Projection optical system and method for photolithography and exposure apparatus and method using same
JP4352930B2 (ja) * 2003-02-26 2009-10-28 株式会社ニコン 露光装置、露光方法及びデバイス製造方法
KR101562447B1 (ko) 2003-02-26 2015-10-21 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
EP2261742A3 (en) * 2003-06-11 2011-05-25 ASML Netherlands BV Lithographic apparatus and device manufacturing method.
EP1498778A1 (en) * 2003-06-27 2005-01-19 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
EP3223074A1 (en) 2003-09-03 2017-09-27 Nikon Corporation Apparatus and method for immersion lithography for recovering fluid
CN101526759B (zh) * 2003-09-29 2013-07-24 株式会社尼康 曝光装置
US7589822B2 (en) 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
SG153813A1 (en) 2004-06-09 2009-07-29 Nikon Corp Substrate holding device, exposure apparatus having same, exposure method, method for producing device, and liquid repellent plate
KR101354801B1 (ko) 2004-08-03 2014-01-22 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
JP2006113533A (ja) * 2004-08-03 2006-04-27 Nikon Corp 投影光学系、露光装置、および露光方法
KR101264939B1 (ko) * 2004-09-17 2013-05-15 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
US7423720B2 (en) 2004-11-12 2008-09-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1681597B1 (en) * 2005-01-14 2010-03-10 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
US8692973B2 (en) 2005-01-31 2014-04-08 Nikon Corporation Exposure apparatus and method for producing device
JP5005226B2 (ja) 2005-01-31 2012-08-22 株式会社ニコン 露光装置及びデバイス製造方法、液体保持方法
JP4410121B2 (ja) * 2005-02-08 2010-02-03 東京エレクトロン株式会社 塗布、現像装置及び塗布、現像方法
TWI424260B (zh) 2005-03-18 2014-01-21 尼康股份有限公司 A board member, a substrate holding device, an exposure apparatus and an exposure method, and a device manufacturing method
JP2006319064A (ja) * 2005-05-11 2006-11-24 Canon Inc 測定装置、露光方法及び装置
JP2006332239A (ja) * 2005-05-25 2006-12-07 Nikon Corp 半導体装置、及び液浸型半導体露光装置
JP4884708B2 (ja) 2005-06-21 2012-02-29 株式会社ニコン 露光装置及びデバイス製造方法
JP4567651B2 (ja) * 2005-11-16 2010-10-20 エーエスエムエル ネザーランズ ビー.ブイ. 露光装置及びデバイス製造方法
US7656501B2 (en) 2005-11-16 2010-02-02 Asml Netherlands B.V. Lithographic apparatus
US7804577B2 (en) 2005-11-16 2010-09-28 Asml Netherlands B.V. Lithographic apparatus
US7864292B2 (en) 2005-11-16 2011-01-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
TWI550688B (zh) 2006-01-19 2016-09-21 尼康股份有限公司 液浸曝光裝置及液浸曝光方法、以及元件製造方法
EP2023378B1 (en) 2006-05-10 2013-03-13 Nikon Corporation Exposure apparatus and device manufacturing method
JP2008034801A (ja) * 2006-06-30 2008-02-14 Canon Inc 露光装置およびデバイス製造方法
US8004651B2 (en) 2007-01-23 2011-08-23 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8237911B2 (en) 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
US8068209B2 (en) 2007-03-23 2011-11-29 Nikon Corporation Nozzle to help reduce the escape of immersion liquid from an immersion lithography tool
US8134685B2 (en) 2007-03-23 2012-03-13 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
SG151198A1 (en) * 2007-09-27 2009-04-30 Asml Netherlands Bv Methods relating to immersion lithography and an immersion lithographic apparatus
JP5017232B2 (ja) * 2007-10-31 2012-09-05 エーエスエムエル ネザーランズ ビー.ブイ. クリーニング装置および液浸リソグラフィ装置
JP4525735B2 (ja) 2007-11-06 2010-08-18 トヨタ自動車株式会社 過給機付きディーゼル機関のスロットル制御装置
US8711327B2 (en) * 2007-12-14 2014-04-29 Nikon Corporation Exposure apparatus, exposure method, and device manufacturing method
US8610873B2 (en) 2008-03-17 2013-12-17 Nikon Corporation Immersion lithography apparatus and method having movable liquid diverter between immersion liquid confinement member and substrate
US8289497B2 (en) 2008-03-18 2012-10-16 Nikon Corporation Apparatus and methods for recovering fluid in immersion lithography
SG159467A1 (en) * 2008-09-02 2010-03-30 Asml Netherlands Bv Fluid handling structure, lithographic apparatus and device manufacturing method
JP2010135794A (ja) * 2008-12-04 2010-06-17 Nikon Corp 露光装置、露光方法、及びデバイス製造方法
US20100328637A1 (en) 2008-12-04 2010-12-30 Nikon Corporation Exposure apparatus, exposing method and device fabricating method
US8896806B2 (en) 2008-12-29 2014-11-25 Nikon Corporation Exposure apparatus, exposure method, and device manufacturing method
JP2010157724A (ja) * 2008-12-29 2010-07-15 Nikon Corp 露光装置、露光方法、及びデバイス製造方法
NL2005655A (en) * 2009-12-09 2011-06-14 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
JP5741859B2 (ja) 2010-01-08 2015-07-01 株式会社ニコン 液浸部材、露光装置、露光方法、及びデバイス製造方法
JP2011165798A (ja) * 2010-02-08 2011-08-25 Nikon Corp 露光装置、露光装置で使用される方法、デバイス製造方法、プログラム、及び記録媒体
EP2381310B1 (en) * 2010-04-22 2015-05-06 ASML Netherlands BV Fluid handling structure and lithographic apparatus
NL2006615A (en) * 2010-05-11 2011-11-14 Asml Netherlands Bv Fluid handling structure, lithographic apparatus and device manufacturing method.
NL2007182A (en) * 2010-08-23 2012-02-27 Asml Netherlands Bv Fluid handling structure, module for an immersion lithographic apparatus, lithographic apparatus and device manufacturing method.
JP2012084879A (ja) * 2010-10-14 2012-04-26 Nikon Corp 液浸露光装置、液浸露光方法、デバイス製造方法、プログラム、及び記録媒体
JP2012138511A (ja) * 2010-12-27 2012-07-19 Nikon Corp 露光装置の制御方法、露光装置、デバイス製造方法、プログラム、及び記録媒体
US20120162619A1 (en) * 2010-12-27 2012-06-28 Nikon Corporation Liquid immersion member, immersion exposure apparatus, exposing method, device fabricating method, program, and storage medium
JP5241862B2 (ja) * 2011-01-01 2013-07-17 キヤノン株式会社 露光装置及びデバイスの製造方法
NL2009271A (en) 2011-09-15 2013-03-18 Asml Netherlands Bv A fluid handling structure, a lithographic apparatus and a device manufacturing method.
WO2013100114A1 (ja) 2011-12-28 2013-07-04 株式会社ニコン 露光装置、露光方法、デバイス製造方法、液体回収方法、プログラム、及び記録媒体
US9268231B2 (en) 2012-04-10 2016-02-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9323160B2 (en) 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
AR086047A1 (es) 2012-04-24 2013-11-13 Sergio Martin Carabajal Anteojo con computadora incorporada
JP2013236000A (ja) * 2012-05-10 2013-11-21 Nikon Corp 液浸部材、露光装置、露光方法、デバイス製造方法、プログラム、及び記録媒体
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9651873B2 (en) * 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium

Also Published As

Publication number Publication date
US20190025716A1 (en) 2019-01-24
EP3309821B1 (en) 2020-01-29
US20180039189A1 (en) 2018-02-08
CN105144342A (zh) 2015-12-09
HK1215327A1 (zh) 2016-08-19
JPWO2014104139A1 (ja) 2017-01-12
TWI645264B (zh) 2018-12-21
TWI686679B (zh) 2020-03-01
US20200012201A1 (en) 2020-01-09
US10423080B2 (en) 2019-09-24
KR20150099803A (ko) 2015-09-01
JP6319098B2 (ja) 2018-05-09
US10095127B2 (en) 2018-10-09
TW201905605A (zh) 2019-02-01
US9823583B2 (en) 2017-11-21
CN105144342B (zh) 2018-12-04
EP3309821A1 (en) 2018-04-18
TW201818162A (zh) 2018-05-16
EP2940714A1 (en) 2015-11-04
EP2940714A4 (en) 2016-07-06
US9904184B2 (en) 2018-02-27
US20170219941A1 (en) 2017-08-03
KR102229741B1 (ko) 2021-03-18
TWI631426B (zh) 2018-08-01
US20140285781A1 (en) 2014-09-25
JP2018136561A (ja) 2018-08-30
US20160077447A1 (en) 2016-03-17
JP6601527B2 (ja) 2019-11-06
CN109375473A (zh) 2019-02-22
US9651873B2 (en) 2017-05-16
EP2940714B1 (en) 2017-09-20
WO2014104139A1 (ja) 2014-07-03
TW201435517A (zh) 2014-09-16
CN109375473B (zh) 2021-06-11
JP2020003828A (ja) 2020-01-09

Similar Documents

Publication Publication Date Title
HK1215327A1 (zh) 液浸部件及曝光裝置
HRP20190524T1 (hr) 1,2,4-triazoli kao modulatori nuklearnog transporta i njihova uporaba
HK1215102A1 (zh) 液浸構件和曝光裝置
HK1207694A1 (zh) 襯底支承裝置及曝光裝置
EP2881797A4 (en) ELECTROPHOTOGRAPHIC ELEMENT AND ELECTROPHOTOGRAPHIC DEVICE
GB2511184B (en) Fixing device
EP2829480A4 (en) FEEDING AND COUNTERING DEVICE FOR MEDICINAL PRODUCTS
EP2842000A4 (en) DEVELOPMENT DEVICE
EP2862025A4 (en) FIXING DEVICE
EP2813750A4 (en) BEAM CONTROL MEMBER AND LIGHTING DEVICE
EP2781182A4 (en) PHOTOGRAPHIC DEVICE AND PHOTOGRAPHIC SYSTEM
HK1257550A1 (zh) 液浸構件及曝光裝置
HK1204682A1 (zh) 液浸構件及曝光裝置
HK1208914A1 (zh) 液浸構件及曝光裝置
HK1211133A1 (zh) 具備防振裝置的曝光裝置
EP2975600A4 (en) FIXING DEVICE
EP2829355A4 (en) DEVICE FOR POSITIONING AND FIXING OBJECT
EP2860965A4 (en) IMAGING ELEMENT AND IMAGING DEVICE
GB201317955D0 (en) Metering device and parts therefor
EP2813748A4 (en) LIGHT SOURCE DEVICE AND REFLECTOR SUPPORT STRUCTURE
HK1221778A1 (zh) 曝光裝置及曝光方法
EP2931085A4 (en) COLLAPSIBLE AND FLEXIBLE SHOULDER CARRYING DEVICE
EP2841999A4 (en) DEVELOPMENT DEVICE
EP2833406A4 (en) PICTURE ELEMENT AND PICTURE DEVICE
HK1247672A1 (zh) 照明裝置及曝光裝置

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20221225