HK1214404A1 - 液體浸入元件和曝光設備 - Google Patents
液體浸入元件和曝光設備Info
- Publication number
- HK1214404A1 HK1214404A1 HK16102124.7A HK16102124A HK1214404A1 HK 1214404 A1 HK1214404 A1 HK 1214404A1 HK 16102124 A HK16102124 A HK 16102124A HK 1214404 A1 HK1214404 A1 HK 1214404A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- liquid
- exposure device
- immersion member
- immersion
- exposure
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261746497P | 2012-12-27 | 2012-12-27 | |
PCT/JP2013/084758 WO2014104139A1 (ja) | 2012-12-27 | 2013-12-25 | 液浸部材及び露光装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1214404A1 true HK1214404A1 (zh) | 2016-07-22 |
Family
ID=51021216
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK16102124.7A HK1214404A1 (zh) | 2012-12-27 | 2016-02-25 | 液體浸入元件和曝光設備 |
HK16102986.4A HK1215327A1 (zh) | 2012-12-27 | 2016-03-15 | 液浸部件及曝光裝置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK16102986.4A HK1215327A1 (zh) | 2012-12-27 | 2016-03-15 | 液浸部件及曝光裝置 |
Country Status (8)
Country | Link |
---|---|
US (6) | US9651873B2 (zh) |
EP (2) | EP2940714B1 (zh) |
JP (3) | JP6319098B2 (zh) |
KR (1) | KR102229741B1 (zh) |
CN (2) | CN105144342B (zh) |
HK (2) | HK1214404A1 (zh) |
TW (3) | TWI645264B (zh) |
WO (1) | WO2014104139A1 (zh) |
Families Citing this family (19)
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US20090262316A1 (en) * | 2005-01-31 | 2009-10-22 | Nikon Corporation | Exposure apparatus and method for producing device |
NL2005655A (en) | 2009-12-09 | 2011-06-14 | Asml Netherlands Bv | A lithographic apparatus and a device manufacturing method. |
US9256137B2 (en) * | 2011-08-25 | 2016-02-09 | Nikon Corporation | Exposure apparatus, liquid holding method, and device manufacturing method |
NL2009692A (en) | 2011-12-07 | 2013-06-10 | Asml Netherlands Bv | A lithographic apparatus and a device manufacturing method. |
US9268231B2 (en) | 2012-04-10 | 2016-02-23 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium |
US9323160B2 (en) | 2012-04-10 | 2016-04-26 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium |
US9823580B2 (en) | 2012-07-20 | 2017-11-21 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium |
US9568828B2 (en) | 2012-10-12 | 2017-02-14 | Nikon Corporation | Exposure apparatus, exposing method, device manufacturing method, program, and recording medium |
US9494870B2 (en) | 2012-10-12 | 2016-11-15 | Nikon Corporation | Exposure apparatus, exposing method, device manufacturing method, program, and recording medium |
US9651873B2 (en) | 2012-12-27 | 2017-05-16 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium |
US9720331B2 (en) | 2012-12-27 | 2017-08-01 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium |
EP3057122B1 (en) | 2013-10-08 | 2018-11-21 | Nikon Corporation | Immersion member, exposure apparatus, exposure method, and device manufacturing method |
WO2016000883A1 (en) * | 2014-07-04 | 2016-01-07 | Asml Netherlands B.V. | Lithographic apparatus and a method of manufacturing a device using a lithographic apparatus |
CN107106938B (zh) * | 2014-12-19 | 2019-06-18 | Asml荷兰有限公司 | 流体处理结构、光刻设备和器件制造方法 |
US10416571B2 (en) | 2016-01-13 | 2019-09-17 | Asml Netherlands B.V. | Fluid handling structure and lithographic apparatus |
JP6757849B2 (ja) * | 2016-09-12 | 2020-09-23 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置のための流体ハンドリング構造 |
KR102412406B1 (ko) | 2016-12-14 | 2022-06-22 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조 방법 |
US11156921B2 (en) * | 2017-12-15 | 2021-10-26 | Asml Netherlands B.V. | Fluid handling structure, lithographic apparatus, and method of using a fluid handling structure |
CN112684665B (zh) * | 2020-12-25 | 2024-06-25 | 浙江启尔机电技术有限公司 | 一种浸液供给回收装置 |
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US6208407B1 (en) | 1997-12-22 | 2001-03-27 | Asm Lithography B.V. | Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement |
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JP5241862B2 (ja) * | 2011-01-01 | 2013-07-17 | キヤノン株式会社 | 露光装置及びデバイスの製造方法 |
NL2009271A (en) | 2011-09-15 | 2013-03-18 | Asml Netherlands Bv | A fluid handling structure, a lithographic apparatus and a device manufacturing method. |
WO2013100114A1 (ja) | 2011-12-28 | 2013-07-04 | 株式会社ニコン | 露光装置、露光方法、デバイス製造方法、液体回収方法、プログラム、及び記録媒体 |
US9268231B2 (en) | 2012-04-10 | 2016-02-23 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium |
US9323160B2 (en) | 2012-04-10 | 2016-04-26 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium |
AR086047A1 (es) | 2012-04-24 | 2013-11-13 | Sergio Martin Carabajal | Anteojo con computadora incorporada |
JP2013236000A (ja) * | 2012-05-10 | 2013-11-21 | Nikon Corp | 液浸部材、露光装置、露光方法、デバイス製造方法、プログラム、及び記録媒体 |
US9823580B2 (en) | 2012-07-20 | 2017-11-21 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium |
US9494870B2 (en) | 2012-10-12 | 2016-11-15 | Nikon Corporation | Exposure apparatus, exposing method, device manufacturing method, program, and recording medium |
US9568828B2 (en) | 2012-10-12 | 2017-02-14 | Nikon Corporation | Exposure apparatus, exposing method, device manufacturing method, program, and recording medium |
US9651873B2 (en) * | 2012-12-27 | 2017-05-16 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium |
US9720331B2 (en) | 2012-12-27 | 2017-08-01 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium |
-
2013
- 2013-12-19 US US14/134,999 patent/US9651873B2/en active Active
- 2013-12-25 CN CN201380073365.0A patent/CN105144342B/zh active Active
- 2013-12-25 EP EP13867519.4A patent/EP2940714B1/en active Active
- 2013-12-25 WO PCT/JP2013/084758 patent/WO2014104139A1/ja active Application Filing
- 2013-12-25 CN CN201811255979.1A patent/CN109375473B/zh active Active
- 2013-12-25 JP JP2014554512A patent/JP6319098B2/ja active Active
- 2013-12-25 KR KR1020157019504A patent/KR102229741B1/ko active IP Right Grant
- 2013-12-25 EP EP17191297.5A patent/EP3309821B1/en active Active
- 2013-12-26 TW TW107102722A patent/TWI645264B/zh active
- 2013-12-26 TW TW107135325A patent/TWI686679B/zh active
- 2013-12-26 TW TW102148425A patent/TWI631426B/zh active
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2015
- 2015-06-18 US US14/743,430 patent/US9823583B2/en active Active
-
2016
- 2016-02-25 HK HK16102124.7A patent/HK1214404A1/zh not_active IP Right Cessation
- 2016-03-15 HK HK16102986.4A patent/HK1215327A1/zh not_active IP Right Cessation
-
2017
- 2017-04-13 US US15/486,976 patent/US9904184B2/en active Active
- 2017-10-17 US US15/786,026 patent/US10095127B2/en active Active
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2018
- 2018-04-03 JP JP2018071597A patent/JP6601527B2/ja active Active
- 2018-09-27 US US16/144,034 patent/US10423080B2/en active Active
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2019
- 2019-09-20 US US16/577,113 patent/US20200012201A1/en not_active Abandoned
- 2019-10-10 JP JP2019186811A patent/JP2020003828A/ja active Pending
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20221225 |