GB1383981A - Electrically alterable floating gate device and method for altering same - Google Patents

Electrically alterable floating gate device and method for altering same

Info

Publication number
GB1383981A
GB1383981A GB196072A GB196072A GB1383981A GB 1383981 A GB1383981 A GB 1383981A GB 196072 A GB196072 A GB 196072A GB 196072 A GB196072 A GB 196072A GB 1383981 A GB1383981 A GB 1383981A
Authority
GB
United Kingdom
Prior art keywords
floating gate
gate
substrate
gate device
jan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB196072A
Other languages
English (en)
Inventor
D Frohman-Bentchkowsky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of GB1383981A publication Critical patent/GB1383981A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/68Floating-gate IGFETs
    • H10D30/681Floating-gate IGFETs having only two programming levels
    • H10D30/684Floating-gate IGFETs having only two programming levels programmed by hot carrier injection
    • H10D30/686Floating-gate IGFETs having only two programming levels programmed by hot carrier injection using hot carriers produced by avalanche breakdown of PN junctions, e.g. floating gate avalanche injection MOS [FAMOS]
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0416Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Non-Volatile Memory (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Semiconductor Memories (AREA)
GB196072A 1971-01-15 1972-01-14 Electrically alterable floating gate device and method for altering same Expired GB1383981A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10664371A 1971-01-15 1971-01-15

Publications (1)

Publication Number Publication Date
GB1383981A true GB1383981A (en) 1974-02-12

Family

ID=22312502

Family Applications (1)

Application Number Title Priority Date Filing Date
GB196072A Expired GB1383981A (en) 1971-01-15 1972-01-14 Electrically alterable floating gate device and method for altering same

Country Status (8)

Country Link
JP (1) JPS5146382B1 (enExample)
BE (1) BE777996A (enExample)
CA (1) CA946524A (enExample)
DE (1) DE2201028C3 (enExample)
FR (1) FR2121824B1 (enExample)
GB (1) GB1383981A (enExample)
IT (1) IT962050B (enExample)
NL (1) NL7200562A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2845328A1 (de) * 1978-10-18 1980-04-30 Itt Ind Gmbh Deutsche Speichertransistor
WO2001024268A1 (en) * 1999-09-24 2001-04-05 Intel Corporation A nonvolatile memory device with a high work function floating-gate and method of fabrication
US6518618B1 (en) 1999-12-03 2003-02-11 Intel Corporation Integrated memory cell and method of fabrication

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3797000A (en) * 1972-12-29 1974-03-12 Ibm Non-volatile semiconductor storage device utilizing avalanche injection and extraction of stored information
US3836992A (en) * 1973-03-16 1974-09-17 Ibm Electrically erasable floating gate fet memory cell
JPS5613029B2 (enExample) * 1973-09-21 1981-03-25
DE2505816C3 (de) * 1974-09-20 1982-04-22 Siemens AG, 1000 Berlin und 8000 München Verfahren zum Betrieb eines n-Kanal-Speicher-FET, n-Kanal-Speicher-FET zur Ausübung des Verfahrens und Anwendung des Verfahrens auf die n-Kanal-Speicher-FETs einer Speichermatrix
DE2513207C2 (de) * 1974-09-20 1982-07-01 Siemens AG, 1000 Berlin und 8000 München n-Kanal-Speicher-FET
DE2812049C2 (de) * 1974-09-20 1982-05-27 Siemens AG, 1000 Berlin und 8000 München n-Kanal-Speicher-FET
DE2638730C2 (de) * 1974-09-20 1982-10-28 Siemens AG, 1000 Berlin und 8000 München n-Kanal-Speicher-FET, Verfahren zum Entladen des Speichergate des n-Kanal-Speicher-FET und Verwendung des n-Kanal-Speicher-FET
DE2445079C3 (de) * 1974-09-20 1981-06-04 Siemens AG, 1000 Berlin und 8000 München Speicher-Feldeffekttransistor
DE2643987C2 (de) * 1974-09-20 1984-03-29 Siemens AG, 1000 Berlin und 8000 München n-Kanal-Speicher-FET
DE2560220C2 (de) * 1975-03-25 1982-11-25 Siemens AG, 1000 Berlin und 8000 München n-Kanal-Speicher-FET
JPS5554415A (en) * 1978-10-16 1980-04-21 Nippon Gakki Seizo Kk Method and device for space set averaging for reverberation waveform
JPS6162824A (ja) * 1985-06-22 1986-03-31 Nippon Gakki Seizo Kk 残響デ−タ圧縮取込方法およびその装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500142A (en) * 1967-06-05 1970-03-10 Bell Telephone Labor Inc Field effect semiconductor apparatus with memory involving entrapment of charge carriers
CA813537A (en) * 1967-10-17 1969-05-20 Joseph H. Scott, Jr. Semiconductor memory device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2845328A1 (de) * 1978-10-18 1980-04-30 Itt Ind Gmbh Deutsche Speichertransistor
WO2001024268A1 (en) * 1999-09-24 2001-04-05 Intel Corporation A nonvolatile memory device with a high work function floating-gate and method of fabrication
US6518618B1 (en) 1999-12-03 2003-02-11 Intel Corporation Integrated memory cell and method of fabrication
US6943071B2 (en) 1999-12-03 2005-09-13 Intel Corporation Integrated memory cell and method of fabrication

Also Published As

Publication number Publication date
CA946524A (en) 1974-04-30
JPS5146382B1 (enExample) 1976-12-08
DE2201028B2 (de) 1979-01-18
BE777996A (fr) 1972-05-02
FR2121824A1 (enExample) 1972-08-25
FR2121824B1 (enExample) 1977-04-01
DE2201028C3 (de) 1981-07-09
NL7200562A (enExample) 1972-07-18
IT962050B (it) 1973-12-20
DE2201028A1 (de) 1972-08-31

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PE20 Patent expired after termination of 20 years