ES2699223T3 - Composición acuosa alcalina de grabado y de limpieza y procedimiento de tratamiento de la superficie de sustratos de silicio - Google Patents

Composición acuosa alcalina de grabado y de limpieza y procedimiento de tratamiento de la superficie de sustratos de silicio Download PDF

Info

Publication number
ES2699223T3
ES2699223T3 ES11792023T ES11792023T ES2699223T3 ES 2699223 T3 ES2699223 T3 ES 2699223T3 ES 11792023 T ES11792023 T ES 11792023T ES 11792023 T ES11792023 T ES 11792023T ES 2699223 T3 ES2699223 T3 ES 2699223T3
Authority
ES
Spain
Prior art keywords
water
soluble
silicon substrate
general formula
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES11792023T
Other languages
English (en)
Spanish (es)
Inventor
Berthold Ferstl
Simon Braun
Achim Fessenbecker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BASF SE
Original Assignee
BASF SE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BASF SE filed Critical BASF SE
Application granted granted Critical
Publication of ES2699223T3 publication Critical patent/ES2699223T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/04Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/06Etching, surface-brightening or pickling compositions containing an inorganic acid with organic material
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3209Amines or imines with one to four nitrogen atoms; Quaternized amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/34Organic compounds containing sulfur
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/36Organic compounds containing phosphorus
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/60Wet etching
    • H10P50/64Wet etching of semiconductor materials
    • H10P50/642Chemical etching
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Materials Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
  • Photovoltaic Devices (AREA)
  • Detergent Compositions (AREA)
  • General Chemical & Material Sciences (AREA)
ES11792023T 2010-06-09 2011-06-01 Composición acuosa alcalina de grabado y de limpieza y procedimiento de tratamiento de la superficie de sustratos de silicio Active ES2699223T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US35283110P 2010-06-09 2010-06-09
PCT/IB2011/052418 WO2011154875A1 (en) 2010-06-09 2011-06-01 Aqueous alkaline etching and cleaning composition and method for treating the surface of silicon substrates

Publications (1)

Publication Number Publication Date
ES2699223T3 true ES2699223T3 (es) 2019-02-08

Family

ID=45097599

Family Applications (1)

Application Number Title Priority Date Filing Date
ES11792023T Active ES2699223T3 (es) 2010-06-09 2011-06-01 Composición acuosa alcalina de grabado y de limpieza y procedimiento de tratamiento de la superficie de sustratos de silicio

Country Status (11)

Country Link
US (1) US9076920B2 (https=)
EP (1) EP2580303B1 (https=)
JP (1) JP2013534547A (https=)
KR (1) KR101894603B1 (https=)
CN (1) CN103038311B (https=)
ES (1) ES2699223T3 (https=)
MY (1) MY160091A (https=)
PH (1) PH12012502385A1 (https=)
SG (1) SG186108A1 (https=)
TW (1) TWI498421B (https=)
WO (1) WO2011154875A1 (https=)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120295447A1 (en) * 2010-11-24 2012-11-22 Air Products And Chemicals, Inc. Compositions and Methods for Texturing of Silicon Wafers
WO2013021296A1 (en) * 2011-08-09 2013-02-14 Basf Se Aqueous alkaline compositions and method for treating the surface of silicon substrates
CN102751384A (zh) * 2012-07-07 2012-10-24 蚌埠玻璃工业设计研究院 一种晶体硅表面织构方法
WO2014024414A1 (ja) * 2012-08-10 2014-02-13 第一工業製薬株式会社 テクスチャー形成用エッチング液およびそれを用いたテクスチャー形成方法
KR102118964B1 (ko) * 2012-12-05 2020-06-08 엔테그리스, 아이엔씨. Iii-v 반도체 물질을 세척하기 위한 조성물 및 이를 사용하는 방법
WO2015007630A1 (en) * 2013-07-16 2015-01-22 Akzo Nobel Chemicals International B.V. New salts, crystals, complexes, and derivatives of threonine diacetic acid, a process to prepare threonine diacetic acid, and the use thereof
US20160200571A1 (en) * 2013-09-05 2016-07-14 Kit Co, Ltd. Hydrogen production apparatus, hydrogen production method, silicon fine particles for hydrogen production, and production method for silicon fine particles for hydrogen production
JP2015189829A (ja) * 2014-03-27 2015-11-02 株式会社フジミインコーポレーテッド 研磨用組成物
JP6373029B2 (ja) * 2014-03-27 2018-08-15 株式会社フジミインコーポレーテッド 研磨用組成物
DE102014206675A1 (de) * 2014-04-07 2015-10-08 Gebr. Schmid Gmbh Verfahren und Lösung zur Herstellung und Nachbehandlung von Wafern
JP6417612B2 (ja) * 2014-12-01 2018-11-07 メック株式会社 エッチング剤およびその補給液、マグネシウム部品の表面粗化方法、ならびにマグネシウム−樹脂複合体の製造方法
KR101765212B1 (ko) 2015-07-17 2017-08-04 주식회사 위즈켐 천연계 태양광 웨이퍼 세정제 조성물
KR102457249B1 (ko) * 2015-09-18 2022-10-21 주식회사 이엔에프테크놀로지 식각 조성물
CN105118898A (zh) * 2015-09-23 2015-12-02 中利腾晖光伏科技有限公司 一种硅片表面钝化方法及基于其的n型双面电池的制作方法
TWI675905B (zh) * 2015-11-14 2019-11-01 日商東京威力科創股份有限公司 使用稀釋的氫氧化四甲基銨處理微電子基板的方法
CN107164109A (zh) * 2017-03-31 2017-09-15 吴江创源新材料科技有限公司 一种蓝宝石晶片退火前清洗液及其制备方法和清洗工艺
KR102756186B1 (ko) 2020-02-05 2025-01-17 삼성전자주식회사 반도체 패키지 및 패키지-온-패키지의 제조 방법
CN112689886B (zh) * 2020-06-16 2022-11-18 福建晶安光电有限公司 一种衬底加工方法及半导体器件制造方法
CN119286525B (zh) * 2024-12-10 2025-06-24 嘉兴市小辰光伏科技有限公司 一种用于解决TOPCon电池LPCVD双插正面绕扩印的添加剂及清洗工艺

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50158281A (https=) 1974-06-10 1975-12-22
GB1573206A (en) 1975-11-26 1980-08-20 Tokyo Shibaura Electric Co Method of trating surfaces of intermediate products obtained in the manufacture of semiconductor devices
FR2372904A1 (fr) 1976-11-19 1978-06-30 Ibm Composition de decapage du silicium polycristallin contenant de l'hydroxyde de tetramethylammonium et procede d'application
JPS6348830A (ja) 1986-08-19 1988-03-01 Toshiba Corp 半導体表面処理方法
JPS63274149A (ja) 1987-05-06 1988-11-11 Mitsubishi Gas Chem Co Inc 半導体処理剤
US5129955A (en) 1989-01-11 1992-07-14 Dainippon Screen Mfg. Co., Ltd. Wafer cleaning method
US5207866A (en) 1991-01-17 1993-05-04 Motorola, Inc. Anisotropic single crystal silicon etching solution and method
US5179414A (en) 1991-01-22 1993-01-12 Compag Computer Corporation Apparatus for developing an image on a photoconductive surface
TW263531B (https=) 1992-03-11 1995-11-21 Mitsubishi Gas Chemical Co
TW274630B (https=) 1994-01-28 1996-04-21 Wako Zunyaku Kogyo Kk
US5466389A (en) 1994-04-20 1995-11-14 J. T. Baker Inc. PH adjusted nonionic surfactant-containing alkaline cleaner composition for cleaning microelectronics substrates
US5498293A (en) 1994-06-23 1996-03-12 Mallinckrodt Baker, Inc. Cleaning wafer substrates of metal contamination while maintaining wafer smoothness
US6465403B1 (en) 1998-05-18 2002-10-15 David C. Skee Silicate-containing alkaline compositions for cleaning microelectronic substrates
US6417147B2 (en) 2000-02-29 2002-07-09 Showa Denko K.K. Cleaning agent composition, method for cleaning and use thereof
US6599370B2 (en) 2000-10-16 2003-07-29 Mallinckrodt Inc. Stabilized alkaline compositions for cleaning microelectronic substrates
JP3893104B2 (ja) 2002-12-20 2007-03-14 花王株式会社 銅配線半導体基板用ポリマー洗浄剤組成物
PT1664935E (pt) 2003-08-19 2008-01-10 Mallinckrodt Baker Inc Composições de decapagem e limpeza para micro electrónica
CN1546627A (zh) 2003-12-16 2004-11-17 上海华虹(集团)有限公司 解决湿法剥离氮化硅薄膜新的清洗溶液
BRPI0508291A (pt) * 2004-03-01 2007-07-31 Mallinckrodt Baker Inc composições e processo de limpeza para substratos nanoeletrÈnicas e microeletrÈnicas para limpeza
WO2006110279A1 (en) * 2005-04-08 2006-10-19 Sachem, Inc. Selective wet etching of metal nitrides
US8685909B2 (en) 2006-09-21 2014-04-01 Advanced Technology Materials, Inc. Antioxidants for post-CMP cleaning formulations
TW200833871A (en) * 2006-11-17 2008-08-16 Sachem Inc Selective metal wet etch composition and process
KR100964153B1 (ko) 2006-11-22 2010-06-17 엘지전자 주식회사 태양전지의 제조방법 및 그에 의해 제조되는 태양전지
KR101561708B1 (ko) * 2007-05-17 2015-10-19 인티그리스, 인코포레이티드 Cmp후 세정 제제용 신규한 항산화제
CN100546627C (zh) * 2007-06-29 2009-10-07 王芬 一种外用祛除黄褐斑的中药面膜
JPWO2009044647A1 (ja) * 2007-10-04 2011-02-03 三菱瓦斯化学株式会社 シリコンエッチング液およびエッチング方法
WO2009102004A1 (ja) 2008-02-15 2009-08-20 Lion Corporation 洗浄剤組成物および電子デバイス用基板の洗浄方法
US8623231B2 (en) 2008-06-11 2014-01-07 Taiwan Semiconductor Manufacturing Company, Ltd. Method for etching an ultra thin film
KR101622429B1 (ko) 2008-12-04 2016-05-18 뵈스트알파인 스탈 게엠베하 한면 또는 양면이 아연도금된 강판으로부터 성형체를 제조하는 방법
MY158452A (en) 2009-09-21 2016-10-14 Basf Se Aqueous acidic etching solution and method for texturing the surface of single crystal and polycrystal silicon substrates

Also Published As

Publication number Publication date
WO2011154875A1 (en) 2011-12-15
CN103038311B (zh) 2015-10-07
TW201209157A (en) 2012-03-01
KR20130093070A (ko) 2013-08-21
EP2580303A4 (en) 2016-01-06
JP2013534547A (ja) 2013-09-05
PH12012502385A1 (en) 2022-03-21
US20130078756A1 (en) 2013-03-28
EP2580303B1 (en) 2018-08-29
TWI498421B (zh) 2015-09-01
EP2580303A1 (en) 2013-04-17
SG186108A1 (en) 2013-01-30
KR101894603B1 (ko) 2018-09-03
CN103038311A (zh) 2013-04-10
US9076920B2 (en) 2015-07-07
MY160091A (en) 2017-02-28

Similar Documents

Publication Publication Date Title
ES2699223T3 (es) Composición acuosa alcalina de grabado y de limpieza y procedimiento de tratamiento de la superficie de sustratos de silicio
TWI564386B (zh) 水性鹼性組合物及處理矽基板表面之方法
CN107075693B (zh) 铜、钼金属层叠膜蚀刻液组合物、使用该组合物的蚀刻方法及延长该组合物的寿命的方法
EP2458622A2 (en) Compositions and methods for texturing of silicon wafers
TW202026409A (zh) 化學機械研磨後清潔組合物
WO2012154498A2 (en) Removal of metal impurities from silicon surfaces for solar cell and semiconductor applications
JPWO2018181896A1 (ja) チタン層またはチタン含有層のエッチング液組成物およびエッチング方法
TW200902705A (en) Process for cleaning a semiconductor wafer using a cleaning solution
CN111278962A (zh) 用于清洁玻璃制品的清洁组成物以及使用其清洁玻璃基板的方法
US20120090670A1 (en) Cleaning solution composition for a solar cell
ES2541222T3 (es) Composiciones alcalinas acuosas y procedimiento de tratamiento de la superficie de sustratos de silicio
KR101608610B1 (ko) 텍스처 형성용 에칭액
TW201615803A (zh) 半導體基板用蝕刻液
JP2017162967A (ja) タンタル含有層用エッチング液組成物及びエッチング方法
CN121699700A (zh) 一种干刻后硅基残留的清洗剂及清洗工艺
TW201224121A (en) Compositions and methods for texturing of silicon wafers
WO2012057132A1 (ja) シリコン基板の製造方法