EP3127673A4 - Verfahren zum schneiden eines substrats aus brüchigem material - Google Patents
Verfahren zum schneiden eines substrats aus brüchigem material Download PDFInfo
- Publication number
- EP3127673A4 EP3127673A4 EP15772939.3A EP15772939A EP3127673A4 EP 3127673 A4 EP3127673 A4 EP 3127673A4 EP 15772939 A EP15772939 A EP 15772939A EP 3127673 A4 EP3127673 A4 EP 3127673A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- material substrate
- cutting brittle
- brittle
- cutting
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000463 material Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/10—Glass-cutting tools, e.g. scoring tools
- C03B33/105—Details of cutting or scoring means, e.g. tips
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D1/00—Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
- B28D1/22—Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising
- B28D1/225—Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising for scoring or breaking, e.g. tiles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Mining & Mineral Resources (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
- Dicing (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP18205159.9A EP3517269A1 (de) | 2014-03-31 | 2015-03-12 | Verfahren zum schneiden eines substrats aus brüchigem material |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014074089 | 2014-03-31 | ||
PCT/JP2015/057316 WO2015151755A1 (ja) | 2014-03-31 | 2015-03-12 | 脆性材料基板の分断方法 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP18205159.9A Division EP3517269A1 (de) | 2014-03-31 | 2015-03-12 | Verfahren zum schneiden eines substrats aus brüchigem material |
EP18205159.9A Division-Into EP3517269A1 (de) | 2014-03-31 | 2015-03-12 | Verfahren zum schneiden eines substrats aus brüchigem material |
Publications (3)
Publication Number | Publication Date |
---|---|
EP3127673A1 EP3127673A1 (de) | 2017-02-08 |
EP3127673A4 true EP3127673A4 (de) | 2017-12-06 |
EP3127673B1 EP3127673B1 (de) | 2018-12-12 |
Family
ID=54240087
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP18205159.9A Withdrawn EP3517269A1 (de) | 2014-03-31 | 2015-03-12 | Verfahren zum schneiden eines substrats aus brüchigem material |
EP15772939.3A Not-in-force EP3127673B1 (de) | 2014-03-31 | 2015-03-12 | Verfahren zum schneiden eines substrats aus brüchigem material |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP18205159.9A Withdrawn EP3517269A1 (de) | 2014-03-31 | 2015-03-12 | Verfahren zum schneiden eines substrats aus brüchigem material |
Country Status (7)
Country | Link |
---|---|
US (2) | US10927031B2 (de) |
EP (2) | EP3517269A1 (de) |
JP (5) | JP6249091B2 (de) |
KR (1) | KR101847921B1 (de) |
CN (2) | CN106232311B (de) |
TW (2) | TWI680106B (de) |
WO (1) | WO2015151755A1 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI680106B (zh) | 2014-03-31 | 2019-12-21 | 日商三星鑽石工業股份有限公司 | 脆性材料基板之分斷方法 |
EP3150561B1 (de) * | 2014-05-30 | 2022-07-06 | Mitsuboshi Diamond Industrial Co., Ltd. | Verfahren zum spalten eines brüchigen substrats |
JP6589381B2 (ja) * | 2015-05-29 | 2019-10-16 | 三星ダイヤモンド工業株式会社 | 脆性材料基板における垂直クラックの形成方法および脆性材料基板の分断方法 |
TWI605024B (zh) * | 2015-08-07 | 2017-11-11 | Mitsuboshi Diamond Ind Co Ltd | Breaking method of brittle substrate |
TW202039193A (zh) * | 2016-02-26 | 2020-11-01 | 日商三星鑽石工業股份有限公司 | 脆性基板之分斷方法 |
JP6682907B2 (ja) * | 2016-02-26 | 2020-04-15 | 三星ダイヤモンド工業株式会社 | 脆性基板の分断方法 |
JP6645577B2 (ja) | 2016-05-25 | 2020-02-14 | 三星ダイヤモンド工業株式会社 | 脆性基板の分断方法 |
JP6755037B2 (ja) * | 2016-07-28 | 2020-09-16 | 三星ダイヤモンド工業株式会社 | 脆性基板の分断方法 |
CN106542727B (zh) * | 2016-10-10 | 2019-03-05 | 华南理工大学 | 一种微磨削尖端精准诱导的曲面镜面脆裂成型方法 |
JP2018150191A (ja) * | 2017-03-13 | 2018-09-27 | 日本電気硝子株式会社 | ガラス板の製造方法 |
JP6955754B2 (ja) | 2017-07-25 | 2021-10-27 | 三星ダイヤモンド工業株式会社 | ダイヤモンド刃先および基板分断方法 |
US11701739B2 (en) * | 2019-04-12 | 2023-07-18 | Skyworks Solutions, Inc. | Method of optimizing laser cutting of wafers for producing integrated circuit dies |
JP7137238B2 (ja) * | 2020-09-30 | 2022-09-14 | 三星ダイヤモンド工業株式会社 | 脆性材料基板の加工方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3138875A (en) * | 1961-09-11 | 1964-06-30 | Tempress Res Co Inc | Diamond scriber |
US3230625A (en) * | 1961-11-17 | 1966-01-25 | Siemens Ag | Method and apparatus for scoring semiconductor plates to be broken into smaller bodies |
US3680213A (en) * | 1969-02-03 | 1972-08-01 | Karl O Reichert | Method of grooving semiconductor wafer for the dividing thereof |
JP2003183040A (ja) * | 2001-12-18 | 2003-07-03 | Oputo System:Kk | ポイントカッター並びにその使用の方法及び装置 |
US20090183617A1 (en) * | 2005-12-14 | 2009-07-23 | Namiki Seimitsu Houseki Kabushiki Kaisha | Shank and diamond scriber assembled therewith |
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US2812579A (en) * | 1953-06-15 | 1957-11-12 | William M Arck | Adjustable glass-cutting tool head |
BE797819A (fr) * | 1972-04-10 | 1973-10-05 | Ppg Industries Inc | Procede et appareil de decoupe de verre en utilisant des fissures creees en dessous de la surface et articles obtenus |
JP2712723B2 (ja) * | 1990-03-07 | 1998-02-16 | 松下電器産業株式会社 | レーザ切断方法 |
JPH04276645A (ja) * | 1991-03-04 | 1992-10-01 | Toshiba Corp | 化合物半導体ウエーハのダイシング方法 |
JP2603779B2 (ja) * | 1992-01-14 | 1997-04-23 | 松下電工株式会社 | プリント配線板 |
JPH07240571A (ja) * | 1994-02-28 | 1995-09-12 | Kyocera Corp | 分割溝を有するセラミック基板の製造方法 |
JP3074143B2 (ja) | 1995-11-06 | 2000-08-07 | 三星ダイヤモンド工業株式会社 | ガラスカッターホイール |
JP3027768U (ja) * | 1996-02-08 | 1996-08-13 | 株式会社アールイシダ | 健康スリッパ |
US5963289A (en) * | 1997-10-27 | 1999-10-05 | S Vision | Asymmetrical scribe and separation method of manufacturing liquid crystal devices on silicon wafers |
JP2000247671A (ja) * | 1999-03-04 | 2000-09-12 | Takatori Corp | ガラスの分断方法 |
JP4203177B2 (ja) | 1999-03-18 | 2008-12-24 | 株式会社ベルデックス | スクライブ方法および装置 |
JP2003002676A (ja) * | 2001-06-19 | 2003-01-08 | Seiko Epson Corp | 基板の分割方法及び液晶装置の製造方法 |
RU2206525C2 (ru) * | 2001-07-25 | 2003-06-20 | Кондратенко Владимир Степанович | Способ резки хрупких неметаллических материалов |
JP2003114420A (ja) * | 2001-10-03 | 2003-04-18 | Matsushita Electric Ind Co Ltd | 液晶表示パネルの製造方法 |
JP2003292332A (ja) * | 2002-03-29 | 2003-10-15 | Nakamura Tome Precision Ind Co Ltd | スクライブ方法及びスクライブ装置 |
FR2839508B1 (fr) * | 2002-05-07 | 2005-03-04 | Saint Gobain | Vitrage decoupe sans rompage |
CN1758993B (zh) | 2003-01-29 | 2012-03-21 | 三星宝石工业株式会社 | 基板切割设备和基板切割方法 |
JP4550457B2 (ja) * | 2004-03-26 | 2010-09-22 | ルネサスエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
KR101164856B1 (ko) * | 2005-07-06 | 2012-07-11 | 미쓰보시 다이야몬도 고교 가부시키가이샤 | 취성재료용 스크라이빙 휠의 제조방법 |
DE102005046479B4 (de) * | 2005-09-28 | 2008-12-18 | Infineon Technologies Austria Ag | Verfahren zum Spalten von spröden Materialien mittels Trenching Technologie |
JP2007331983A (ja) | 2006-06-15 | 2007-12-27 | Sony Corp | ガラスのスクライブ方法 |
JP2008201629A (ja) | 2007-02-21 | 2008-09-04 | Epson Imaging Devices Corp | 電気光学装置の製造方法、基板の分断方法、及び、基板分断装置 |
JP5450964B2 (ja) * | 2008-02-29 | 2014-03-26 | 三星ダイヤモンド工業株式会社 | スクライブ装置及びスクライブ方法 |
CN102026926B (zh) * | 2008-04-14 | 2013-06-05 | 三星钻石工业股份有限公司 | 脆性材料基板的加工方法 |
JP5832064B2 (ja) * | 2009-01-30 | 2015-12-16 | 三星ダイヤモンド工業株式会社 | カッター及びそれを用いた脆性材料基板の分断方法 |
JP2011054709A (ja) * | 2009-09-01 | 2011-03-17 | Disco Abrasive Syst Ltd | スクライバシャンク調整方法 |
JP2011121817A (ja) * | 2009-12-10 | 2011-06-23 | Seiko Instruments Inc | 接合ガラスの切断方法、パッケージの製造方法、パッケージ、圧電振動子、発振器、電子機器及び電波時計 |
US8802479B2 (en) * | 2010-06-03 | 2014-08-12 | NuvoSun, Inc. | Solar cell interconnection method using a flat metallic mesh |
KR101247571B1 (ko) | 2010-06-14 | 2013-03-26 | 미쓰보시 다이야몬도 고교 가부시키가이샤 | 취성 재료 기판의 스크라이브 방법 |
JP5210356B2 (ja) | 2010-06-14 | 2013-06-12 | 三星ダイヤモンド工業株式会社 | 脆性材料基板のスクライブ方法 |
JP2012012238A (ja) * | 2010-06-30 | 2012-01-19 | Mitsuboshi Diamond Industrial Co Ltd | ホイール間距離設定治具 |
JP5118736B2 (ja) * | 2010-09-28 | 2013-01-16 | 三星ダイヤモンド工業株式会社 | スクライブ方法及びスクライビングホイール |
TWI498293B (zh) * | 2011-05-31 | 2015-09-01 | Mitsuboshi Diamond Ind Co Ltd | 劃線方法、鑽石尖、劃線裝置 |
JP5966564B2 (ja) * | 2011-06-08 | 2016-08-10 | 三星ダイヤモンド工業株式会社 | スクライビングホイール及びスクライブ方法 |
JP2013010644A (ja) | 2011-06-28 | 2013-01-17 | Mitsuboshi Diamond Industrial Co Ltd | ガラス基板のスクライブ方法 |
TWI474983B (zh) * | 2011-10-04 | 2015-03-01 | Mitsuboshi Diamond Ind Co Ltd | Scoring Method and Breaking Method of Mother Substrate |
JP2013089622A (ja) * | 2011-10-13 | 2013-05-13 | Mitsuboshi Diamond Industrial Co Ltd | 半導体基板のブレイク方法 |
US8723314B2 (en) * | 2012-02-29 | 2014-05-13 | Advanced Micro Devices, Inc. | Semiconductor workpiece with backside metallization and methods of dicing the same |
US10351460B2 (en) * | 2012-05-22 | 2019-07-16 | Corning Incorporated | Methods of separating strengthened glass sheets by mechanical scribing |
JP2014004812A (ja) * | 2012-06-27 | 2014-01-16 | Mitsuboshi Diamond Industrial Co Ltd | カッティングツール及びこれを用いたスクライブ方法並びにスクライブ装置 |
JP5912927B2 (ja) * | 2012-06-29 | 2016-04-27 | 三星ダイヤモンド工業株式会社 | 基板加工システム及びこれに用いるチップホルダの取付方法 |
US9651627B2 (en) * | 2013-03-29 | 2017-05-16 | Stmicroelectronics Pte Ltd. | Accumulated power consumption sensor: application in smart batteries systems |
US9236351B2 (en) * | 2013-10-09 | 2016-01-12 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor wafer device |
TWI680106B (zh) | 2014-03-31 | 2019-12-21 | 日商三星鑽石工業股份有限公司 | 脆性材料基板之分斷方法 |
KR20170041378A (ko) * | 2015-10-07 | 2017-04-17 | 삼성전자주식회사 | 기판 측정 방법 및 이를 이용한 반도체 장치 제조 방법 |
-
2015
- 2015-03-12 TW TW107136972A patent/TWI680106B/zh active
- 2015-03-12 TW TW104107980A patent/TWI648231B/zh active
- 2015-03-12 CN CN201580017504.7A patent/CN106232311B/zh not_active Expired - Fee Related
- 2015-03-12 JP JP2016511500A patent/JP6249091B2/ja active Active
- 2015-03-12 CN CN201811280461.3A patent/CN109455919B/zh active Active
- 2015-03-12 US US15/127,052 patent/US10927031B2/en active Active
- 2015-03-12 EP EP18205159.9A patent/EP3517269A1/de not_active Withdrawn
- 2015-03-12 WO PCT/JP2015/057316 patent/WO2015151755A1/ja active Application Filing
- 2015-03-12 EP EP15772939.3A patent/EP3127673B1/de not_active Not-in-force
- 2015-03-12 KR KR1020167026885A patent/KR101847921B1/ko active IP Right Grant
-
2017
- 2017-06-30 JP JP2017128389A patent/JP6493456B2/ja active Active
- 2017-06-30 JP JP2017128388A patent/JP6508262B2/ja active Active
- 2017-06-30 JP JP2017128390A patent/JP6508263B2/ja active Active
- 2017-06-30 JP JP2017128391A patent/JP6583644B2/ja active Active
-
2020
- 2020-02-24 US US16/799,706 patent/US20200189957A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3138875A (en) * | 1961-09-11 | 1964-06-30 | Tempress Res Co Inc | Diamond scriber |
US3230625A (en) * | 1961-11-17 | 1966-01-25 | Siemens Ag | Method and apparatus for scoring semiconductor plates to be broken into smaller bodies |
US3680213A (en) * | 1969-02-03 | 1972-08-01 | Karl O Reichert | Method of grooving semiconductor wafer for the dividing thereof |
JP2003183040A (ja) * | 2001-12-18 | 2003-07-03 | Oputo System:Kk | ポイントカッター並びにその使用の方法及び装置 |
US20090183617A1 (en) * | 2005-12-14 | 2009-07-23 | Namiki Seimitsu Houseki Kabushiki Kaisha | Shank and diamond scriber assembled therewith |
Non-Patent Citations (3)
Title |
---|
ANONYMOUS: "Glasschneider", 29 October 2013 (2013-10-29), XP055419231, Retrieved from the Internet <URL:https://de.wikipedia.org/w/index.php?title=Glasschneider&oldid=123936432> [retrieved on 20171025] * |
DATABASE WPI Week 200349, 3 July 2003 Derwent World Patents Index; AN 2003-519309, XP002775064 * |
See also references of WO2015151755A1 * |
Also Published As
Publication number | Publication date |
---|---|
TWI680106B (zh) | 2019-12-21 |
CN106232311A (zh) | 2016-12-14 |
TW201536700A (zh) | 2015-10-01 |
EP3517269A1 (de) | 2019-07-31 |
EP3127673B1 (de) | 2018-12-12 |
TWI648231B (zh) | 2019-01-21 |
JPWO2015151755A1 (ja) | 2017-04-13 |
JP2017209999A (ja) | 2017-11-30 |
WO2015151755A1 (ja) | 2015-10-08 |
US20170113960A1 (en) | 2017-04-27 |
JP6583644B2 (ja) | 2019-10-02 |
EP3127673A1 (de) | 2017-02-08 |
US20200189957A1 (en) | 2020-06-18 |
KR20160126072A (ko) | 2016-11-01 |
JP6508263B2 (ja) | 2019-05-08 |
CN109455919A (zh) | 2019-03-12 |
CN106232311B (zh) | 2018-11-23 |
US10927031B2 (en) | 2021-02-23 |
JP6249091B2 (ja) | 2017-12-20 |
CN109455919B (zh) | 2022-03-08 |
JP2017202975A (ja) | 2017-11-16 |
KR101847921B1 (ko) | 2018-04-11 |
JP2017209998A (ja) | 2017-11-30 |
JP6493456B2 (ja) | 2019-04-03 |
JP2017202686A (ja) | 2017-11-16 |
TW201902843A (zh) | 2019-01-16 |
JP6508262B2 (ja) | 2019-05-08 |
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