EP0987632A1 - Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet - Google Patents

Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet Download PDF

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Publication number
EP0987632A1
EP0987632A1 EP98921883A EP98921883A EP0987632A1 EP 0987632 A1 EP0987632 A1 EP 0987632A1 EP 98921883 A EP98921883 A EP 98921883A EP 98921883 A EP98921883 A EP 98921883A EP 0987632 A1 EP0987632 A1 EP 0987632A1
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EP
European Patent Office
Prior art keywords
terminal
input
output
data
boundary scan
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Granted
Application number
EP98921883A
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English (en)
French (fr)
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EP0987632A4 (de
EP0987632B1 (de
Inventor
Mitsugu Nagoya
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Duaxes Corp
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Koken Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536Scan chain arrangements, e.g. connections, test bus, analog signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572Input/Output interfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815Functional tests, e.g. boundary scans, using the normal I/O contacts
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Definitions

  • the present invention relates to a boundary scan element for use in a boundary scan test method and a communication system in which the element is applied to and used as a communication element, and more particularly to a boundary scan element that enables high-speed transfer of data and a communication system using the element.
  • a boundary scan test method has been proposed as one of the inspection methods by which it is tested, with a plurality of IC chips being disposed on a printed wire board with printed wires formed thereon, whether or not the respective IC chips are connected to the respective printed wires correctly and whether or not there is any break in the respective printed wires, etc.
  • the boundary scan element comprises a plurality of boundary cells 214 disposed individually between input/output terminals of an internal logic circuit 211 for implementing the inherent functions of an integrated circuit 210, and input/output terminals 212/213 of the integrated circuit 210, a TAP controller (TAP circuit) 219 for controlling input and output of data to the boundary cells 214, a TDI terminal 220 for receiving test data, a TDO terminal 221 for transmitting test data, a TCK terminal 122 to which a clock signal is input, and a TMS terminal 223 for receiving a mode signal for switching the operation mode of the TAP controller 219.
  • TAP controller TAP circuit
  • the boundary scan element is provided with a bypass register 215, an ID CODE register 216, an instruction register 217, or a TRS terminal 224 for receiving a reset signal.
  • the bypass register 215 - the instruction register 217 are designated as a boundary scan register (118).
  • TDI Test Data In
  • TDO Test Data Out
  • TCK Test Clock
  • TMS Test Mode Select
  • TRST Test Reset
  • the integrated circuit 210 into which such boundary scan elements are incorporated can be tested on the operation conditions thereof and the connections between the integrated circuit 210 and external devices thereof in accordance with the procedures to be mentioned below.
  • serial data (test data) is shifted and set to the respective boundary cells 214 corresponding to the respective input terminals 212 while being input to the TDI terminal 220 of the integrated circuit 210.
  • the data having been set to the respective boundary cells 214 corresponding to the respective output terminals 213 is shifted to be output from the TDO terminal 221.
  • boundary scan test method can be applied to a plurality of integrated circuits if boundary scan elements are incorporated therein.
  • the integrated circuits 210 can be tested on themselves in conjunction with a test on a break in printed patterns between the integrated circuits 210.
  • the respective boundary scan elements incorporated into the plurality of integrated circuits 210 are connected in series. Specifically, the TDO terminal 221 of a first integrated circuit 210 (on the left in the figure) is connected to the TDI terminal 220 of a second integrated circuit 210 (on the right in the figure). Furthermore, the output terminal 229 of the boundary scan controller board 228 provided in the host computer unit 227 or the like is connected to the TDI terminal 220 of the first integrated circuit 210. Still furthermore, the input terminal 230 of the boundary scan controller board 228 is connected to the TDO terminal 221 of the second integrated circuit 210.
  • the test procedure is as follows.
  • test data (serial data) is prepared using a test data preparing tool 231 or the like, and then output from the output terminal 229 of the boundary scan controller board 228. Then, while being input to the TDI terminal 220 of the first integrated circuit 210, the data is shifted and set to the respective boundary cells 214 corresponding to the respective output terminals 213 of the integrated circuit 210. Under this condition, the data stored in these respective boundary cells 214 is output from the respective output terminals 213 provided on the first integrated circuit 210 as shown in Fig.7. Additionally, the data is input to the respective input terminals 212 of the second integrated circuit 210 via respective printed patterns 233 constituting a system bus or the like, and furthermore captured by the respective boundary cells 214 corresponding to these respective input terminals 212.
  • the data stored in the respective boundary cells 214 of these respective integrated circuits 210 is shifted, and analyzed using the test result analysis tool 232 while being captured by the input terminal 230 of the boundary scan controller board 228. This allows a test on the break, short-circuit and the like within the test range 235 of the printed pattern 233 that connects between the integrated circuits 210.
  • test data is output from the output terminal 229 of the boundary scan controller board 228. Then, while being input to the TDI terminal 220 of the first integrated circuit 210, the data is shifted and set to the respective boundary cells 214 corresponding to the respective input terminals 212 of the integrated circuit 210 as shown in Fig.8.
  • the integrated circuit 210 is activated and the respective boundary cells 214 corresponding to the respective output terminals 213 are allowed to capture the resultant data. Thereafter, the data stored in these respective boundary cells 214 is shifted and output from the TDO terminal 221 of the first integrated circuit 210.
  • the boundary scan controller board 228 drives the second integrated circuit 210 into a bypass state as shown in Fig.7. This allows the data output from the TDO terminal 221 to bypass the second integrated circuit 210 and to be captured by the input terminal 230 of the boundary scan controller board 228.
  • the test analysis tool 232 or the like is used to analyze the captured data, thereby allowing a test on whether or not the first integrated circuit 210 operates properly.
  • the boundary scan controller board 228 drives the first integrated circuit 210 into a bypass state as shown in Fig.8. Thereafter, test data is output from the output terminal 229 of the boundary scan controller board 228 and is allowed to bypass the first integrated circuit 210. Then, while being input to the TDI terminal 220 of the second integrated circuit 210, the test data is shifted and set to the respective boundary cells 214 corresponding to the respective input terminals 212 of the second integrated circuit 210 as shown in Fig.9. Subsequently, this integrated circuit 210 is activated, and the respective boundary cells 214 corresponding to the respective output terminals 213 are allowed to capture the resultant data.
  • the data stored in the respective boundary cells 214 is shifted to be output from the TDO terminal 221 and further captured by the input terminal 230 of the boundary scan controller board 228. Then, the test result analysis tool 232 or the like is used to analyze the captured data, thereby allowing a test on whether or not the second integrated circuit 210 operates properly.
  • such a board 226 that uses integrated circuits 210 into which boundary scan elements are incorporated can be tested on a quality of the respective integrated circuits 210 themselves and connections between the integrated circuits 210 by applying the boundary scan test method.
  • the inventor has proposed a communication system to which boundary scan elements are applied and which allows for communicating with a host computer or the like without using a communication device.
  • Fig.10 is a block diagram showing an example of a communication system to which boundary scan elements are applied.
  • the communication system 240 shown in the figure includes a communication controller unit 241 for transmitting and collecting communication data, and the like, a plurality of sensor units 242a - 242c for monitoring a target object to be monitored, and the like, a plurality of boundary scan elements 243a - 243c being disposed for the respective sensor units 242a - 242c and performing such processing as capturing the control data output from the communication controller 241 and then supplying the data to the respective sensor units 242a - 242c, and as capturing detection data or the like to be output from these respective sensor units 242a - 242c and then supplying the data to the communication controller 241, and communication lines 244 for connecting these respective boundary scan elements 243a - 243c to said communication controller unit 241.
  • the respective boundary scan elements 243a - 243c are connected in series to the communication controller unit 241. Specifically, the output terminal 241a of the communication controller unit 241 is connected to the TDI terminal of the boundary scan element 243a, the TDO terminal of the boundary scan element 243a is connected to the TDI terminal of the subsequent boundary scan element 243b, and so on. The TDO terminal of the boundary scan element 243c is connected to the input terminal 241b of the communication controller unit 241.
  • the action of the communication system 240 is as follows.
  • the respective boundary scan elements 243a - 243c are allowed to function in synchronization with the clock signal to be transmitted from the TCK terminal 241d of the communication controller unit 241.
  • the TMS signal to be transmitted from the TMS terminal 241c of the communication controller unit 241 switches the operation mode of the respective TAP controllers.
  • control data serial data
  • the data is supplied to the respective boundary scan elements 243a - 243c and set to the boundary cells corresponding to the output terminals.
  • the control data thus set is output from the output terminals and supplied to the respective sensor units 242a - 242c corresponding to the respective boundary scan elements 243a - 243c to drive them.
  • the detection data or the like of the respective sensor units 242a - 242c is once set to the boundary cells corresponding to the input terminals of the corresponding respective boundary scan elements 243a - 243c. Then, the data is output as serial data from the TDO terminal and captured at the input terminal 241b of the communication controller unit 241.
  • Such communication system 240 allows its data transfer rate to be 20Mbps at the maximum and thus enables transferring of communication data at a higher transfer rate than by means of a prior-art communication system in the case of setting control data to the respective boundary scan elements 243a - 243c or in the case of allowing the respective boundary scan elements 243a - 243c to output detection data or the like.
  • the prior-art boundary scan element since the prior-art boundary scan element has all boundary cells connected in series between the TDI and TDO terminals even, for example, in the case of setting data only to the boundary cells assigned to the output terminals, the data had to be shifted in sequence from the boundary cells assigned to the input terminals in some cases.
  • An object of the present invention is to provide a boundary scan element and a communication system employing the same, which enables high-speed transfer of data to boundary cells.
  • a boundary scan element comprising a plurality of input-terminal-side boundary cells connected in series and assigned individually to respective input terminals, a plurality of output-terminal-side boundary cells connected in series and assigned individually to respective output terminals, a TAP circuit for controlling input and output of data to or from the aforesaid input-terminal-side and output-terminal-side boundary cells, a TDI terminal for inputting serial data to be provided to the aforesaid boundary cells, a TDO terminal for outputting data from the aforesaid boundary cells as serial data, a TCK terminal to which a clock signal is input, and a TMS terminal to which a mode signal is input to switch an operation mode of the aforesaid TAP circuit, characterized in that the aforesaid input-terminal-side boundary cells and the aforesaid output-terminal-side boundary cells are connected in parallel between the aforesaid TDI terminal and the afores
  • all boundary cells are not connected in series as in the prior art, but the input-terminal-side boundary cells assigned to the input terminals and the output-terminal-side boundary cells assigned to the output terminals are connected in parallel between the TDI terminal and the TDO terminal.
  • the boundary scan element of the present invention can be also configured in such a manner that two of each of the TDI terminal and the TDO terminal are provided, the input-terminal-side boundary cells are connected between either one of the TDI terminals and either one of the TDO terminals, and the output-terminal-side boundary cells are connected between the other one of the TDI terminals and the other one of the TDO terminals (Claim 2).
  • Such configuration enables simultaneous transfer of data to both the input-terminal-side boundary cells and the output-terminal-side boundary cells, thereby enabling further improvement in high-speed transfer of test data or the like to boundary cells.
  • the boundary scan element of the present invention may be either encapsulated in an independent single package itself or incorporated into other IC.
  • the input and output terminals mean the input and output terminals thereof.
  • they mean the input and output terminals of the IC.
  • a communication system comprising boundary scan elements each having a plurality of input-terminal-side boundary cells connected in series and assigned individually to respective input terminals, a plurality of output-terminal-side boundary cells connected in series and assigned individually to respective output terminals, a TAP circuit for controlling input and output of data to or from the aforesaid input-terminal-side and output-terminal-side boundary cells, a TDI terminal for inputting serial data to be provided to the aforesaid boundary cells, a TDO terminal for outputting data from the aforesaid boundary cells as serial data, a TCK terminal to which a clock signal is input, and a TMS terminal to which a mode signal is input to switch an operation mode of the aforesaid TAP circuit; a plurality of terminal devices respectively connected to the aforesaid boundary scan elements or having an IC into which the elements are incorporated; and a communication controller to which the aforesaid boundary scan elements are connected
  • the communication system of the present invention employs the boundary scan elements as communication elements in order to control the terminal devices by means of the communication controller.
  • the communication data is once transferred from the communication controller to the output-terminal-side boundary cells of the boundary scan elements, and thereafter the communication data is transmitted from the boundary scan elements to the terminal devices.
  • the communication data is once transferred from the terminal devices to the input-terminal-side boundary cells of the boundary scan elements, and thereafter the communication data is transmitted from the boundary scan elements to the communication controller.
  • boundary scan elements have the input-terminal-side boundary cells and the output-terminal-side boundary cells connected in parallel between the TDI terminal and the TDO terminal, communication data can be directly transferred to the respective-terminal-side boundary cells via the TDI terminal and the TDO terminal
  • communication data can be transferred at a greater transfer rate than by means of a communication system employing prior-art boundary scan elements in which all boundary cells are connected in series.
  • a communication system comprising boundary scan elements each having a plurality of input-terminal-side boundary cells connected in series and assigned individually to respective input terminals, a plurality of output-terminal-side boundary cells connected in series and assigned individually to respective output terminals, a TAP circuit for controlling input and output of data to or from the aforesaid input-terminal-side and output-terminal-side boundary cells, TDI terminals for inputting serial data to be provided to the aforesaid boundary cells, TDO terminals for outputting data from the aforesaid boundary cells as serial data, a TCK terminal to which a clock signal is input, and a TMS terminal to which a mode signal is input to switch an operation mode of the aforesaid TAP circuit; a plurality of terminal devices connected to the aforesaid respective boundary scan elements or having an IC into which the elements are incorporated, and a communication controller to which the aforesaid boundary scan elements are connected in series
  • the communication system of the present invention employs, as communication elements, the boundary scan elements set forth in claim 2 mentioned above in order to control the terminal devices by means of the communication controller.
  • the TDI terminal and the TDO terminal of the boundary scan elements comprise a first TDI terminal and a first TDO terminal connected respectively to opposite ends of the input-terminal-side boundary cells, and a second TDI terminal and a second TDO terminal connected respectively to opposite ends of the output-terminal-side boundary cells; thereby enabling simultaneous transfer of mutually different communication data to the input-terminal-side and output-terminal-side boundary cells, and enabling communication data to be transferred at a still higher transfer rate than by means of the communication system of the present invention mentioned above.
  • the communication system of the present invention may employ various sensor units, for example, monitoring cameras or the like as the aforesaid terminal devices.
  • the output terminals are connected to the input terminals of the terminal devices and the input terminals are connected to the output terminals of the terminal devices respectively, thereby allowing data of the boundary cells to be output to the terminal devices, and conversely, the data to be input to the boundary cells.
  • the aforesaid communication data include, in addition to control data transmitted to the terminal devices to control the same, the data detected by the terminal devices transmitted by the aforesaid terminal devices, and status data indicating whether or not the terminal devices are being operated normally, and the like.
  • Fig.1 is a block diagram showing a communication system 1a of the present invention.
  • the communication system 1a includes a plurality of boundary scan elements 26a-26d of the present invention, sensor units (terminal devices) 4a - 4d connected to the respective boundary scan elements 26a-26d, and a communication controller unit 2 for controlling the sensor units 4a - 4d via the boundary scan elements 26a-26d. Further, the communication controller unit 2 is connected with a host computer unit 6.
  • each of the boundary scan elements 26a-26d is incorporated into a chip housing 12 as a single package and, like the conventional boundary scan element shown in Fig.5, includes boundary cells 19 and 20, a TAP controller 25 for controlling input and output of data to or from the boundary cells 19 and 20, a TDI terminal 14 for receiving serial data, a TDO terminal 15 for transmitting serial data, a TCK terminal 17 to which a clock signal is input, and a TMS terminal 16 for receiving a mode signal for switching the operation mode of the TAP controller 25, and is further provided with a bypass register 21, an ID CODE register 22, and an instruction register 23 (a boundary scan register 24) and the like as required.
  • the bypass register 21 is to transfer communication data without passing through the boundary cells.
  • the ID CODE register 22 is to identify where communication data comes from by outputting ID CODE attached individually thereto.
  • the instruction register 23 is to decode specific data among communication data to shift operation modes or the like independent of the TMS signal.
  • the boundary scan elements 26a-26d are configured in a manner such that all of the boundary cells 19 and 20 are not connected in series but divided into the output cells (output-side boundary cells) 20 and the input cells (input-side boundary cells) 19 corresponding to output terminals 18 and input terminals 13, respectively, which are provided outside the chip housing 12. Moreover, the input cells 19 and the output cells 20 are respectively connected in series, and connected in parallel between the TDI terminal 14 and the TDO terminal 15.
  • the boundary scan elements 26a-26d have an operation mode in which only either of the input cells 19 or the output cells 20 are driven into an operating state and the other are driven into a non-operating state.
  • Such boundary scan elements 26a-26d are connected in series to the communication controller unit 2.
  • the output terminal 2a of the communication controller unit 2 is connected to the TDI terminal 14 of the boundary scan element 26d by an outgoing communication line 7, while the TDO terminal 15 of the boundary scan element 26d is connected to the TDI terminal 14 of the subsequent boundary scan element 26c by an incoming communication line 8.
  • the incoming communication line 8 connects between the boundary scan elements 26c and 26b, and between the boundary scan elements 26b and 26a.
  • the TDO terminal 15 of the boundary scan element 26a is connected to an input terminal 3b of the communication controller unit 2 via an incoming communication line 9.
  • communication data given to the boundary scan elements 26a-26d or communication data output from the boundary scan elements 26a-26d is always transferred in the direction from the boundary scan element 26d to 26a.
  • the communication controller unit 2 and the boundary scan elements 26a-26d may be connected totally in the reversed manner. That is, the output terminal 2a of the communication controller unit 2 may be connected to the TDI terminal 14 of the boundary scan element 26a and an input terminal 2b may be connected to the TDO terminal 15 of the boundary scan element 26d, while the TDI terminal and the TDO terminal between the respective boundary scan elements may be connected. In this case, data is transferred in the direction opposite to that mentioned above.
  • the TCK terminal or the TMS terminal of the respective boundary scan elements 26a-26d is supplied with a clock signal or a mode signal from the communication controller unit 2, respectively. This allows the respective boundary scan elements 26a-26d to function in a synchronous manner.
  • the input terminals 13 and the output terminals 18 of the boundary scan elements 26a-26d are connected to output terminals and input terminals (not shown) of the corresponding sensor units 4a - 4d, respectively.
  • Control data set to the output cells 20 is transmitted to the input terminals of the sensor units 4a - 4d and detection data or the like obtained by the sensor units 4a - 4d is transmitted from the output terminals to the input cells 19.
  • the sensor units 4a - 4d are disposed at positions corresponding to a target object to be monitored, and includes various sensors for measuring temperature, pressure or the like, or a monitoring circuit for monitoring the operating conditions of a CPU circuit, a target for monitoring. Then, in accordance with the measuring conditions or monitoring conditions specified by the control data or the like given via the boundary scan elements 26a-26d, the sensor units execute measuring operation or monitoring operation and transmit as well the resultant measurements or results given by the monitoring or the like to the communication controller unit 2 via the boundary scan elements 26a-26d.
  • the communication controller unit 2 includes a hardware circuit or a microprocessor circuit and transmits a signal, necessary for driving the boundary scan elements 26a-26d, from a TMS terminal 2c and a TCK terminal 2d in accordance with the contents of the directions output by the host computer unit 6. Moreover, the controller unit performs processing such as transmitting data for controlling the sensor units 4a - 4d from the output terminal 2a to a communication line 5 and receiving further from the input terminal 2b the data obtained by the sensor units 4a - 4d and then supplying the data to the host computer unit 6.
  • Transmission of a command for driving the sensor units 4a - 4d from the host computer unit 6 causes the communication controller unit 2 to prepare control data in response to the command. Then, the communication controller unit 2 transmits the mode signal from the TMS terminal 2c to switch the respective boundary scan elements 26a-26d to the operation mode required, and as well transmits the control data to the outgoing communication line 5, thereby allowing the control data to be set to the output cells 20 of the respective boundary scan elements 26a-26d. At this time, since the control data can be directly transferred from the TDI terminal 14 of each of the boundary scan elements 26a-26d to the output cells 20, the transfer time is short.
  • the communication controller unit 2 outputs a mode signal indicating an output command for the control data from the TMS terminal 2c, thereby allowing the control data set to the output cells 20 of the respective boundary scan elements 26a-26d to be transmitted to the corresponding sensor units 4a - 4d.
  • the sensor units 4a - 4d execute the measuring operation or monitoring operation in response to the contents of the control data received. Additionally, in accordance with the contents of the control data, the sensor units output measurement data, monitor data, or status data or the like of the sensor units 4a - 4d themselves to the corresponding boundary scan elements 26a-26d.
  • the communication controller unit 2 transmits the mode signal from the TMS terminal 2c to switch the respective boundary scan elements 26a-26d to the operation mode required. This allows detection data or the like such as measurement data to be set from the sensor units 4a - 4d to the corresponding input cells 19 of the respective boundary scan elements 26a-26d. Then, the communication controller unit 2 outputs the mode signal indicating a transfer command for communication data from the TMS terminal 2c. This causes detection data or the like set to the input cells 19 of the respective boundary scan elements 26a-26d to be transferred to the communication controller unit 2. At this time, since the detection data or the like set to the input cells 19 is directly shifted to the TDO terminal 15 of each of the boundary scan elements 26a-26d, the transfer time is short.
  • the host computer unit 6 or the communication controller unit 2 will perform analysis of the detection data received or the like.
  • the communication system 1a of the present invention employs the boundary scan elements 26a-26d of the present invention, thereby enabling the transfer rate of communication data to be improved.
  • Fig.3 is a block diagram showing another communication system 1b of the present invention, wherein the parts corresponding to those of the communication system 1a of Fig.1 are alloted the same symbols in Fig. 1.
  • the communication system 1b includes a plurality of boundary scan elements 27a-27d of the present invention, sensor units (terminal devices) 4a - 4d connected to the respective boundary scan elements 27a-27d, and a communication controller unit 2 for controlling the sensor units 4a - 4d via the boundary scan elements 27a-27d. Further, the communication controller unit 2 is connected with a host computer unit 6.
  • each of the boundary scan elements 27a-27d is incorporated into a chip housing 42 as a single package and, like the boundary scan elements 26a-26d shown in Fig.2, includes output cells 48 provided corresponding to output terminals 47 and input cells 52 provided corresponding to input terminals 51, a TAP controller 46 for controlling input and output of data to the cells 48 and 52, TDI terminals 34 and 36 for receiving serial data, TDO terminals 35 and 37 for transmitting serial data, a TCK terminal 39 to which a clock signal is input, and a TMS terminal 38 for receiving a mode signal for switching the operation mode of the TAP controller 46, and is further provided with bypass registers 49 and 53, ID CODE registers 50 and 54 and the like as required.
  • each of the boundary scan elements 27a-27d has two TDI terminals and two TDO terminals, that is, an outgoing TDI terminal 34 and an incoming TDI terminal 36, and an outgoing TDO terminal 35 and an incoming TDO terminal 37.
  • the bypass registers and ID CODE registers are provided, they are disposed individually between the respective terminals as shown in Fig.4.
  • the output cells 48 are connected between the outgoing TDI terminal 34 and the outgoing TDO terminal 35, and the input cells 52 are connected between the incoming TDI terminal 36 and the incoming TDO terminal 37.
  • boundary scan elements 27a-27d have an operation mode in which only either of the input cells 52 or the output cells 48 are driven into an operating state and the other are driven into a non-operating state, and have as well an operation mode in which providing two TDI terminals and two TDO terminals allows for driving both the input cells 52 and the output cells 48 into the operating state and allows input and output of mutually different data.
  • the boundary scan elements 27a-27d allow high-speed transfer of test data at the time the boundary scan test method is executed.
  • the communication system 1b allows the input cells 52 to capture detection data or the like from the input terminals 51 while it simultaneously allows the output cells 48 to shift control data from the outgoing TDI terminal 34, or output the detection data or the like of the input cells 52 from the incoming TDO terminal 37 while it simultaneously allows the output cells 48 to output the control data to the output terminals 47.
  • boundary scan elements 27a-27d are connected in series to the communication controller unit 2.
  • the output terminal 2a of the communication controller unit 2 is connected to the outgoing TDI terminal 34 of the boundary scan element 27a, one of those located at the both ends, via an outgoing communication line 29.
  • the outgoing TDO terminal 35 of the boundary scan element 27a is connected to the outgoing TDI terminal 34 of the boundary scan element 27b via outgoing communication line 30.
  • the outgoing TDO terminal 35 and the outgoing TDI terminal 34 between the boundary scan elements 27b and 27c and between the boundary scan elements 27c and 27d are connected via the outgoing communication line 30.
  • the outgoing TDO terminal 35 of the boundary scan element 27d is connected to the incoming TDI terminal 36 of the same boundary scan element 27d via an outgoing/incoming connection line 31, and the communication line is returned.
  • the incoming TDO terminal 37 of the boundary scan element 27d is connected to the incoming TDI terminal 36 of the subsequent boundary scan element 27c via an incoming communication line 32.
  • the incoming TDO terminal 37 and the incoming TDI terminal 36 between the boundary scan elements 27c and 27b and between the boundary scan elements 27b and 27a are connected via an incoming communication line 32.
  • the incoming TDO terminal 37 of the boundary scan element 27a and the input terminal 2b of the communication controller unit 2 are connected via an incoming communication line 33.
  • the communication data output from the output terminal 2a of the communication controller unit 2 is transferred in sequence from the output cells 48 of the boundary scan element 27a to the output cells 48 of the respective boundary scan elements 27b-27d. If the data is shifted in this manner, the communication data would be input to the input cells 52 of the boundary scan element 27d via the outgoing/incoming connection line 31 and further transferred to the input cells 52 of the respective boundary scan elements 27c-27a and thus could be returned to the input terminal 2b of the communication controller unit 2.
  • the TCK terminal 39 or the TMS terminal 38 of each of the boundary scan elements 27a-27d is supplied with a clock signal or a mode signal from the communication controller unit 2 respectively. This allows the respective boundary scan elements 27a-27d to function in a synchronous manner.
  • the input terminals 51 and the output terminals 47 of the respective boundary scan elements 27a-27d are connected to output terminals and input terminals (not shown) of the corresponding sensor units 4a - 4d, so that the control data set to the output cells 48 is transmitted to the input terminals of the sensor units 4a - 4d and the detection data or the like obtained by the sensor units 4a - 4d is transmitted from the output terminals thereof to the input cells 52.
  • the configuration and functions of the sensor units 4a - 4d and the communication controller unit 2 are the same as those of the communication system 1a mentioned above.
  • Transmission of a command for driving the sensor units 4a - 4d from the host computer unit 6 causes the communication controller unit 2 to prepare control data in response to the command. Then, the communication controller unit 2 transmits the mode signal from the TMS terminal 2c to switch the respective boundary scan elements 27a-27d to the operation mode required, and as well transmits the control data to the outgoing communication line 29, thereby allowing the control data to be set to the output cells 48 of the respective boundary scan elements 27a-27d. At this time, since the control data can be directly transferred from the outgoing TDI terminal 34 of each of the respective boundary scan elements 27a-27d to the output cells 48, the transfer time is short, which is the same as the communication system 1a of the present invention mentioned above.
  • the communication controller unit 2 outputs a mode signal indicating an output command for the communication data from the TMS terminal 2c, thereby allowing the control data set to the output cells 48 of the respective boundary scan elements 27a-27d to be transmitted to the corresponding sensor units 4a - 4d.
  • the sensor units 4a - 4d execute the measuring operation or monitoring operation in response to the contents of the control data received. Additionally, in accordance with the contents of the control data, the sensor units output measurement data, monitor data, or status data or the like of the sensor units 4a - 4d themselves to the corresponding boundary scan elements 26a-26d.
  • transmission of a command for collecting the measurement data or the like of the sensor units 4a - 4d and a new command for driving the sensor units 4a - 4d from the host computer unit 6 causes the communication controller unit 2 to transmit the mode signal from the TMS terminal 2c to switch the respective boundary scan elements 26a-26d to the operation mode required.
  • This allows detection data or the like such as measurement data to be set from the sensor units 4a - 4d to the corresponding input cells 19 of the respective boundary scan elements 26a-26d.
  • the communication controller unit 2 prepares control data in response to the new command.
  • the communication controller unit 2 outputs, from the TMS terminal 2c, the mode signal indicating a transfer command for communication data of both the input cells 52 and the output cells 48. This causes the detection data or the like set to the input cells 52 of the respective boundary scan elements 27a-27d to be transferred to the input terminal 2b of the communication controller unit 2. Simultaneously, the new control data is transferred from the output terminal 2a of the communication controller unit 2 to be set to the output cells 48 of the respective boundary scan elements 27a-27d.
  • the communication system 1b of the present invention employs the boundary scan elements 27a-27d of the present invention, thereby enabling simultaneous transfer or the like of mutually different communication data to the input cells 52 and output cells 48, and thus allowing the transfer rate of communication data to be more improved than by means of the aforementioned communication system 1a of the present invention.
  • the communication system 1b can detect the occurrence of a break in communication lines 28 or a failure in the boundary scan elements or the like. For example, even in the case where a break has occurred in one of the communication lines 28 between the respective boundary scan elements 27a-27d, since the communication data of the input cells 52 of the boundary scan element(s) that is/are located closer to the communication controller unit 2 than the break point can be transmitted to the communication controller unit 2, the boundary scan element whose communication data is dropped off can be identified and thus the break point can be searched.

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  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Communication Control (AREA)
EP98921883A 1997-06-02 1998-05-29 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet Expired - Lifetime EP0987632B1 (de)

Applications Claiming Priority (3)

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JP14380497 1997-06-02
JP14380497 1997-06-02
PCT/JP1998/002383 WO1998055926A1 (en) 1997-06-02 1998-05-29 Boundary scan element and communication device made by using the same

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EP0987632A1 true EP0987632A1 (de) 2000-03-22
EP0987632A4 EP0987632A4 (de) 2002-10-09
EP0987632B1 EP0987632B1 (de) 2005-11-30

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EP98921883A Expired - Lifetime EP0987632B1 (de) 1997-06-02 1998-05-29 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet
EP98923061A Expired - Lifetime EP0987633B8 (de) 1997-06-02 1998-06-01 Kommunikationssystem
EP98923083A Expired - Lifetime EP0987634B1 (de) 1997-06-02 1998-06-02 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet

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EP (3) EP0987632B1 (de)
JP (3) JP4012577B2 (de)
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CA (4) CA2291681C (de)
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004068156A1 (en) * 2003-01-28 2004-08-12 Koninklijke Philips Electronics N.V. Boundary scan circuit with integrated sensor for sensing physical operating parameters

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3401523B2 (ja) * 1999-01-11 2003-04-28 デュアキシズ株式会社 通信素子及びこれを用いた通信装置
US7058862B2 (en) * 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US20010037479A1 (en) * 2000-04-28 2001-11-01 Whetsel Lee D. Selectable dual mode test access port method and apparatus
US7003707B2 (en) 2000-04-28 2006-02-21 Texas Instruments Incorporated IC tap/scan test port access with tap lock circuitry
US6934898B1 (en) * 2001-11-30 2005-08-23 Koninklijke Philips Electronics N.V. Test circuit topology reconfiguration and utilization techniques
US7069483B2 (en) * 2002-05-13 2006-06-27 Kiyon, Inc. System and method for identifying nodes in a wireless mesh network
US7852796B2 (en) * 2002-05-13 2010-12-14 Xudong Wang Distributed multichannel wireless communication
US7835372B2 (en) * 2002-05-13 2010-11-16 Weilin Wang System and method for transparent wireless bridging of communication channel segments
US8780770B2 (en) 2002-05-13 2014-07-15 Misonimo Chi Acquisition L.L.C. Systems and methods for voice and video communication over a wireless network
US20050201346A1 (en) * 2003-05-13 2005-09-15 Weilin Wang Systems and methods for broadband data communication in a wireless mesh network
US7957356B2 (en) 2002-05-13 2011-06-07 Misomino Chi Acquisitions L.L.C. Scalable media access control for multi-hop high bandwidth communications
US7941149B2 (en) 2002-05-13 2011-05-10 Misonimo Chi Acquistion L.L.C. Multi-hop ultra wide band wireless network communication
US20040229566A1 (en) * 2003-05-13 2004-11-18 Weilin Wang Systems and methods for congestion control in a wireless mesh network
US20050201340A1 (en) * 2002-05-13 2005-09-15 Xudong Wang Distributed TDMA for wireless mesh network
US8175613B2 (en) * 2006-08-04 2012-05-08 Misonimo Chi Acquisitions L.L.C. Systems and methods for determining location of devices within a wireless network
KR101102719B1 (ko) * 2006-12-07 2012-01-05 미소니모 카이 액퀴지션 엘엘씨 타임슬롯 및 채널 할당을 위한 시스템 및 방법
GB0712373D0 (en) * 2007-06-26 2007-08-01 Astrium Ltd Embedded test system and method
US7984348B2 (en) * 2008-07-29 2011-07-19 Texas Instruments Incorporated Series equivalent scans across multiple scan topologies
US8331163B2 (en) * 2010-09-07 2012-12-11 Infineon Technologies Ag Latch based memory device
US9208571B2 (en) 2011-06-06 2015-12-08 Microsoft Technology Licensing, Llc Object digitization
CN110659037B (zh) * 2019-09-25 2021-03-09 苏州浪潮智能科技有限公司 一种基于jtag的烧录装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0388790A2 (de) * 1989-03-24 1990-09-26 Motorola, Inc. Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen mit zahlreichen Anschlüssen
US5617420A (en) * 1992-06-17 1997-04-01 Texas Instrument Incorporated Hierarchical connection method, apparatus, and protocol

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0690260B2 (ja) 1986-05-30 1994-11-14 三菱電機株式会社 論理回路試験装置
JPS6468843A (en) * 1987-09-10 1989-03-14 Matsushita Electric Ind Co Ltd Test mode setting circuit
JPH01229982A (ja) * 1988-03-10 1989-09-13 Fujitsu Ltd スキャン試験方式
US5130988A (en) * 1990-09-17 1992-07-14 Northern Telecom Limited Software verification by fault insertion
US5132635A (en) * 1991-03-05 1992-07-21 Ast Research, Inc. Serial testing of removable circuit boards on a backplane bus
JPH04281691A (ja) * 1991-03-11 1992-10-07 Sony Corp デジタル信号処理回路の自己診断装置
US5377198A (en) * 1991-11-27 1994-12-27 Ncr Corporation (Nka At&T Global Information Solutions Company JTAG instruction error detection
US5325368A (en) * 1991-11-27 1994-06-28 Ncr Corporation JTAG component description via nonvolatile memory
US5400345A (en) 1992-03-06 1995-03-21 Pitney Bowes Inc. Communications system to boundary-scan logic interface
JPH05273311A (ja) * 1992-03-24 1993-10-22 Nec Corp 論理集積回路
JP2960261B2 (ja) 1992-07-04 1999-10-06 三洋化成工業株式会社 汚泥脱水剤
US5450415A (en) * 1992-11-25 1995-09-12 Matsushita Electric Industrial Co., Ltd. Boundary scan cell circuit and boundary scan test circuit
US5333139A (en) * 1992-12-30 1994-07-26 Intel Corporation Method of determining the number of individual integrated circuit computer chips or the like in a boundary scan test chain and the length of the chain
WO1994019741A2 (en) * 1993-02-25 1994-09-01 Reticular Systems, Inc. Real-time rule based processing system
JPH06300821A (ja) * 1993-04-14 1994-10-28 Nec Corp コントローラ内蔵のlsi
US5544309A (en) * 1993-04-22 1996-08-06 International Business Machines Corporation Data processing system with modified planar for boundary scan diagnostics
US5535222A (en) * 1993-12-23 1996-07-09 At&T Corp. Method and apparatus for controlling a plurality of systems via a boundary-scan port during testing
JPH08233904A (ja) * 1995-02-27 1996-09-13 Nec Eng Ltd バウンダリスキャン回路
US5487074A (en) * 1995-03-20 1996-01-23 Cray Research, Inc. Boundary scan testing using clocked signal
JPH0915299A (ja) * 1995-06-27 1997-01-17 Nec Eng Ltd バウンダリスキャン回路およびこれを用いた集積 回路
US5862152A (en) * 1995-11-13 1999-01-19 Motorola, Inc. Hierarchically managed boundary-scan testable module and method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0388790A2 (de) * 1989-03-24 1990-09-26 Motorola, Inc. Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen mit zahlreichen Anschlüssen
US5617420A (en) * 1992-06-17 1997-04-01 Texas Instrument Incorporated Hierarchical connection method, apparatus, and protocol

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO9855926A1 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004068156A1 (en) * 2003-01-28 2004-08-12 Koninklijke Philips Electronics N.V. Boundary scan circuit with integrated sensor for sensing physical operating parameters
US7380186B2 (en) 2003-01-28 2008-05-27 Nxp B.V. Boundary scan circuit with integrated sensor for sensing physical operating parameters
CN100414315C (zh) * 2003-01-28 2008-08-27 Nxp股份有限公司 具有用于检测物理运行参数的集成传感器的边界扫描电路

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EP0987633B8 (de) 2006-05-03
CA2291682A1 (en) 1998-12-10
DE69832605D1 (de) 2006-01-05
EP0987632A4 (de) 2002-10-09
WO1998055926A1 (en) 1998-12-10
US6701475B1 (en) 2004-03-02
EP0987634A4 (de) 2002-10-09
KR20010013201A (ko) 2001-02-26
CA2291681C (en) 2005-07-26
DE69833320D1 (de) 2006-04-13
KR100316000B1 (ko) 2001-12-12
CA2485309A1 (en) 1998-12-10
CA2292771A1 (en) 1998-12-23
JP3936747B2 (ja) 2007-06-27
DE69835517T2 (de) 2007-08-09
KR100315999B1 (ko) 2001-12-12
EP0987633A1 (de) 2000-03-22
WO1998055927A1 (en) 1998-12-10
DE69833320T2 (de) 2006-09-21
CA2291681A1 (en) 1998-12-10
US6671840B1 (en) 2003-12-30
EP0987633A4 (de) 2002-10-09
WO1998058317A1 (en) 1998-12-23
EP0987632B1 (de) 2005-11-30
DE69832605T2 (de) 2006-08-17
EP0987634B1 (de) 2006-08-09
JP3984300B2 (ja) 2007-10-03
US6658614B1 (en) 2003-12-02
EP0987634A1 (de) 2000-03-22
KR20010013021A (ko) 2001-02-26
JP4012577B2 (ja) 2007-11-21
CA2291682C (en) 2004-11-02
DE69835517D1 (de) 2006-09-21
EP0987633B1 (de) 2006-01-25
KR20010013200A (ko) 2001-02-26
CA2292771C (en) 2003-05-20
KR100454989B1 (ko) 2004-11-06

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