DE69832605D1 - Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet - Google Patents

Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet

Info

Publication number
DE69832605D1
DE69832605D1 DE69832605T DE69832605T DE69832605D1 DE 69832605 D1 DE69832605 D1 DE 69832605D1 DE 69832605 T DE69832605 T DE 69832605T DE 69832605 T DE69832605 T DE 69832605T DE 69832605 D1 DE69832605 D1 DE 69832605D1
Authority
DE
Germany
Prior art keywords
terminal
input
boundary cells
output
side boundary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69832605T
Other languages
English (en)
Other versions
DE69832605T2 (de
Inventor
Mitsugu Nagoya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Duaxes Corp
Original Assignee
Duaxes Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Duaxes Corp filed Critical Duaxes Corp
Application granted granted Critical
Publication of DE69832605D1 publication Critical patent/DE69832605D1/de
Publication of DE69832605T2 publication Critical patent/DE69832605T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
DE69832605T 1997-06-02 1998-05-29 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet Expired - Fee Related DE69832605T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP14380497 1997-06-02
JP14380497 1997-06-02
PCT/JP1998/002383 WO1998055926A1 (en) 1997-06-02 1998-05-29 Boundary scan element and communication device made by using the same

Publications (2)

Publication Number Publication Date
DE69832605D1 true DE69832605D1 (de) 2006-01-05
DE69832605T2 DE69832605T2 (de) 2006-08-17

Family

ID=15347376

Family Applications (3)

Application Number Title Priority Date Filing Date
DE69832605T Expired - Fee Related DE69832605T2 (de) 1997-06-02 1998-05-29 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet
DE69833320T Expired - Fee Related DE69833320T2 (de) 1997-06-02 1998-06-01 Kommunikationssystem
DE69835517T Expired - Fee Related DE69835517T2 (de) 1997-06-02 1998-06-02 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE69833320T Expired - Fee Related DE69833320T2 (de) 1997-06-02 1998-06-01 Kommunikationssystem
DE69835517T Expired - Fee Related DE69835517T2 (de) 1997-06-02 1998-06-02 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet

Country Status (7)

Country Link
US (3) US6658614B1 (de)
EP (3) EP0987632B1 (de)
JP (3) JP4012577B2 (de)
KR (3) KR100454989B1 (de)
CA (4) CA2485309A1 (de)
DE (3) DE69832605T2 (de)
WO (3) WO1998055926A1 (de)

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* Cited by examiner, † Cited by third party
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JP3401523B2 (ja) * 1999-01-11 2003-04-28 デュアキシズ株式会社 通信素子及びこれを用いた通信装置
US7058862B2 (en) * 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US20010037479A1 (en) * 2000-04-28 2001-11-01 Whetsel Lee D. Selectable dual mode test access port method and apparatus
US7003707B2 (en) 2000-04-28 2006-02-21 Texas Instruments Incorporated IC tap/scan test port access with tap lock circuitry
US6934898B1 (en) * 2001-11-30 2005-08-23 Koninklijke Philips Electronics N.V. Test circuit topology reconfiguration and utilization techniques
US7957356B2 (en) 2002-05-13 2011-06-07 Misomino Chi Acquisitions L.L.C. Scalable media access control for multi-hop high bandwidth communications
US7852796B2 (en) * 2002-05-13 2010-12-14 Xudong Wang Distributed multichannel wireless communication
US7835372B2 (en) * 2002-05-13 2010-11-16 Weilin Wang System and method for transparent wireless bridging of communication channel segments
US7941149B2 (en) 2002-05-13 2011-05-10 Misonimo Chi Acquistion L.L.C. Multi-hop ultra wide band wireless network communication
US7069483B2 (en) * 2002-05-13 2006-06-27 Kiyon, Inc. System and method for identifying nodes in a wireless mesh network
US20050201346A1 (en) * 2003-05-13 2005-09-15 Weilin Wang Systems and methods for broadband data communication in a wireless mesh network
US20050201340A1 (en) * 2002-05-13 2005-09-15 Xudong Wang Distributed TDMA for wireless mesh network
US8780770B2 (en) 2002-05-13 2014-07-15 Misonimo Chi Acquisition L.L.C. Systems and methods for voice and video communication over a wireless network
US20040229566A1 (en) * 2003-05-13 2004-11-18 Weilin Wang Systems and methods for congestion control in a wireless mesh network
KR20050089889A (ko) * 2003-01-28 2005-09-08 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 물리적 동작 파라미터 감지용 집적 센서를 갖는 집적 회로장치와 이러한 장치를 갖는 전자 시스템의 테스트 방법 및이를 포함하는 전자 장치
US8175613B2 (en) * 2006-08-04 2012-05-08 Misonimo Chi Acquisitions L.L.C. Systems and methods for determining location of devices within a wireless network
EP2092664A4 (de) * 2006-12-07 2013-10-16 Misonimo Chi Acquisition L L C Systeme und verfahren für zeitfenster- und kanalzuweisung
GB0712373D0 (en) * 2007-06-26 2007-08-01 Astrium Ltd Embedded test system and method
US20100031077A1 (en) 2008-07-29 2010-02-04 Swoboda Gary L Alternate Signaling Mechanism Using Clock and Data
US8331163B2 (en) * 2010-09-07 2012-12-11 Infineon Technologies Ag Latch based memory device
US9208571B2 (en) 2011-06-06 2015-12-08 Microsoft Technology Licensing, Llc Object digitization
CN110659037B (zh) * 2019-09-25 2021-03-09 苏州浪潮智能科技有限公司 一种基于jtag的烧录装置

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0690260B2 (ja) * 1986-05-30 1994-11-14 三菱電機株式会社 論理回路試験装置
JPS6468843A (en) * 1987-09-10 1989-03-14 Matsushita Electric Ind Co Ltd Test mode setting circuit
JPH01229982A (ja) 1988-03-10 1989-09-13 Fujitsu Ltd スキャン試験方式
US4989209A (en) 1989-03-24 1991-01-29 Motorola, Inc. Method and apparatus for testing high pin count integrated circuits
US5130988A (en) * 1990-09-17 1992-07-14 Northern Telecom Limited Software verification by fault insertion
US5132635A (en) * 1991-03-05 1992-07-21 Ast Research, Inc. Serial testing of removable circuit boards on a backplane bus
JPH04281691A (ja) * 1991-03-11 1992-10-07 Sony Corp デジタル信号処理回路の自己診断装置
US5377198A (en) * 1991-11-27 1994-12-27 Ncr Corporation (Nka At&T Global Information Solutions Company JTAG instruction error detection
US5325368A (en) * 1991-11-27 1994-06-28 Ncr Corporation JTAG component description via nonvolatile memory
US5400345A (en) 1992-03-06 1995-03-21 Pitney Bowes Inc. Communications system to boundary-scan logic interface
JPH05273311A (ja) * 1992-03-24 1993-10-22 Nec Corp 論理集積回路
US5617420A (en) * 1992-06-17 1997-04-01 Texas Instrument Incorporated Hierarchical connection method, apparatus, and protocol
JP2960261B2 (ja) 1992-07-04 1999-10-06 三洋化成工業株式会社 汚泥脱水剤
US5450415A (en) * 1992-11-25 1995-09-12 Matsushita Electric Industrial Co., Ltd. Boundary scan cell circuit and boundary scan test circuit
US5333139A (en) * 1992-12-30 1994-07-26 Intel Corporation Method of determining the number of individual integrated circuit computer chips or the like in a boundary scan test chain and the length of the chain
WO1994019741A2 (en) * 1993-02-25 1994-09-01 Reticular Systems, Inc. Real-time rule based processing system
JPH06300821A (ja) * 1993-04-14 1994-10-28 Nec Corp コントローラ内蔵のｌｓｉ
US5544309A (en) * 1993-04-22 1996-08-06 International Business Machines Corporation Data processing system with modified planar for boundary scan diagnostics
US5535222A (en) 1993-12-23 1996-07-09 At&T Corp. Method and apparatus for controlling a plurality of systems via a boundary-scan port during testing
JPH08233904A (ja) * 1995-02-27 1996-09-13 Nec Eng Ltd バウンダリスキャン回路
US5487074A (en) * 1995-03-20 1996-01-23 Cray Research, Inc. Boundary scan testing using clocked signal
JPH0915299A (ja) * 1995-06-27 1997-01-17 Nec Eng Ltd バウンダリスキャン回路およびこれを用いた集積 回路
US5862152A (en) * 1995-11-13 1999-01-19 Motorola, Inc. Hierarchically managed boundary-scan testable module and method

Also Published As

Publication number Publication date
DE69835517T2 (de) 2007-08-09
KR20010013201A (ko) 2001-02-26
DE69833320D1 (de) 2006-04-13
EP0987632A4 (de) 2002-10-09
WO1998055927A1 (en) 1998-12-10
KR20010013021A (ko) 2001-02-26
WO1998055926A1 (en) 1998-12-10
WO1998058317A1 (en) 1998-12-23
CA2291682C (en) 2004-11-02
US6658614B1 (en) 2003-12-02
EP0987633A1 (de) 2000-03-22
EP0987632A1 (de) 2000-03-22
DE69832605T2 (de) 2006-08-17
EP0987633A4 (de) 2002-10-09
CA2291681C (en) 2005-07-26
KR100316000B1 (ko) 2001-12-12
CA2292771A1 (en) 1998-12-23
JP4012577B2 (ja) 2007-11-21
EP0987634A1 (de) 2000-03-22
KR100315999B1 (ko) 2001-12-12
EP0987633B1 (de) 2006-01-25
JP3936747B2 (ja) 2007-06-27
KR20010013200A (ko) 2001-02-26
DE69833320T2 (de) 2006-09-21
EP0987634A4 (de) 2002-10-09
EP0987634B1 (de) 2006-08-09
KR100454989B1 (ko) 2004-11-06
CA2292771C (en) 2003-05-20
CA2291681A1 (en) 1998-12-10
US6701475B1 (en) 2004-03-02
CA2291682A1 (en) 1998-12-10
CA2485309A1 (en) 1998-12-10
US6671840B1 (en) 2003-12-30
EP0987633B8 (de) 2006-05-03
JP3984300B2 (ja) 2007-10-03
EP0987632B1 (de) 2005-11-30
DE69835517D1 (de) 2006-09-21

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee