DE69739498D1 - Festkörperbildaufnameapparat und Verwendung in einer Kamera - Google Patents
Festkörperbildaufnameapparat und Verwendung in einer KameraInfo
- Publication number
- DE69739498D1 DE69739498D1 DE69739498T DE69739498T DE69739498D1 DE 69739498 D1 DE69739498 D1 DE 69739498D1 DE 69739498 T DE69739498 T DE 69739498T DE 69739498 T DE69739498 T DE 69739498T DE 69739498 D1 DE69739498 D1 DE 69739498D1
- Authority
- DE
- Germany
- Prior art keywords
- camera
- solid state
- imaging apparatus
- state imaging
- solid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000003384 imaging method Methods 0.000 title 1
- 239000007787 solid Substances 0.000 title 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/54—Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16152—Cap comprising a cavity for hosting the device, e.g. U-shaped cap
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19106—Disposition of discrete passive components in a mirrored arrangement on two different side of a common die mounting substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0284—Details of three-dimensional rigid printed circuit boards
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/144—Stacked arrangements of planar printed circuit boards
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electromagnetism (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Studio Devices (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12293196 | 1996-05-17 | ||
JP8155234A JPH104510A (ja) | 1996-06-17 | 1996-06-17 | カメラ |
JP8214438A JPH1065132A (ja) | 1996-08-14 | 1996-08-14 | 半導体撮像装置 |
JP21886096A JP3417225B2 (ja) | 1996-05-17 | 1996-08-20 | 固体撮像装置とそれを用いたカメラ |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69739498D1 true DE69739498D1 (de) | 2009-09-03 |
Family
ID=27470895
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69739498T Expired - Lifetime DE69739498D1 (de) | 1996-05-17 | 1997-05-14 | Festkörperbildaufnameapparat und Verwendung in einer Kamera |
DE69739708T Expired - Lifetime DE69739708D1 (de) | 1996-05-17 | 1997-05-14 | Festkörperbildaufnahmegerät |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69739708T Expired - Lifetime DE69739708D1 (de) | 1996-05-17 | 1997-05-14 | Festkörperbildaufnahmegerät |
Country Status (3)
Country | Link |
---|---|
US (4) | US6795120B2 (de) |
EP (4) | EP1715525B1 (de) |
DE (2) | DE69739498D1 (de) |
Families Citing this family (132)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3645702B2 (ja) * | 1997-12-25 | 2005-05-11 | オリンパス株式会社 | 電子カメラ |
US20080128844A1 (en) * | 2002-11-18 | 2008-06-05 | Tessera North America | Integrated micro-optical systems and cameras including the same |
US7129978B1 (en) | 1998-07-13 | 2006-10-31 | Zoran Corporation | Method and architecture for an improved CMOS color image sensor |
AU4603200A (en) | 1999-04-26 | 2000-11-10 | Simage Oy | Device for imaging radiation |
GB9909574D0 (en) * | 1999-04-26 | 1999-06-23 | Simage Oy | X-ray imaging system |
US7092031B1 (en) * | 1999-07-30 | 2006-08-15 | Zoran Corporation | Digital camera imaging module |
US7176446B1 (en) | 1999-09-15 | 2007-02-13 | Zoran Corporation | Method and apparatus for distributing light onto electronic image sensors |
FR2800912B1 (fr) * | 1999-11-04 | 2003-07-25 | St Microelectronics Sa | Boitier semi-conducteur optique et procede de fabrication d'un tel boitier |
FR2800909B1 (fr) * | 1999-11-04 | 2003-08-22 | St Microelectronics Sa | Boitier semi-conducteur optique et procede de fabrication d'un tel boitier |
FR2800911B1 (fr) * | 1999-11-04 | 2003-08-22 | St Microelectronics Sa | Boitier semi-conducteur optique et procede de fabrication d'un tel boitier |
US20010007475A1 (en) * | 2000-01-06 | 2001-07-12 | Asahi Kogaku Kogyo Kabushiki Kaisha | Image pickup device and its mounting structure for an optical low-pass filter |
JP4004705B2 (ja) * | 2000-02-29 | 2007-11-07 | 松下電器産業株式会社 | 撮像装置と撮像装置組立方法 |
US6351027B1 (en) | 2000-02-29 | 2002-02-26 | Agilent Technologies, Inc. | Chip-mounted enclosure |
JP3607160B2 (ja) * | 2000-04-07 | 2005-01-05 | 三菱電機株式会社 | 撮像装置 |
US7304684B2 (en) * | 2000-11-14 | 2007-12-04 | Kabushiki Kaisha Toshiba | Image pickup apparatus, method of making, and electric apparatus having image pickup apparatus |
JP2002252338A (ja) * | 2000-12-18 | 2002-09-06 | Canon Inc | 撮像装置及び撮像システム |
JP3540281B2 (ja) * | 2001-02-02 | 2004-07-07 | シャープ株式会社 | 撮像装置 |
JP3821652B2 (ja) * | 2001-02-26 | 2006-09-13 | 三菱電機株式会社 | 撮像装置 |
GB2374725A (en) * | 2001-04-20 | 2002-10-23 | Kingpak Tech Inc | Stacked structure having image sensing chip and integrated circuit arrange on opposite surfaces of a substrate |
FR2824953B1 (fr) * | 2001-05-18 | 2004-07-16 | St Microelectronics Sa | Boitier semi-conducteur optique a lentille incorporee et blindage |
JP2003060948A (ja) * | 2001-06-05 | 2003-02-28 | Seiko Precision Inc | 固体撮像装置 |
WO2003015400A1 (fr) * | 2001-08-07 | 2003-02-20 | Hitachi Maxell, Ltd | Module de camera |
US6545716B2 (en) * | 2001-09-13 | 2003-04-08 | Tracey Gardiner | Camera body for protecting components |
US7545437B2 (en) * | 2001-11-29 | 2009-06-09 | Olympus Optical Co., Ltd. | Digital camera for an optical apparatus including a cooling mechanism for a solid-state imaging device |
JP4009473B2 (ja) * | 2002-03-08 | 2007-11-14 | オリンパス株式会社 | カプセル型内視鏡 |
DE10220671B4 (de) * | 2002-05-10 | 2004-08-26 | Hella Kg Hueck & Co. | Optisches System für eine Kamera |
JP2004104078A (ja) * | 2002-06-28 | 2004-04-02 | Sanyo Electric Co Ltd | カメラモジュールおよびその製造方法 |
KR20040019650A (ko) * | 2002-08-28 | 2004-03-06 | 삼성전기주식회사 | 내장형 카메라 모듈 |
TW558064U (en) * | 2002-09-23 | 2003-10-11 | Ist Internat Semiconductor Tec | Thin type camera module |
JP3688677B2 (ja) * | 2002-11-19 | 2005-08-31 | 株式会社東芝 | カメラの組み込み方法及びカメラ付き携帯形電子機器 |
US7742088B2 (en) * | 2002-11-19 | 2010-06-22 | Fujifilm Corporation | Image sensor and digital camera |
JP2004200965A (ja) * | 2002-12-18 | 2004-07-15 | Sanyo Electric Co Ltd | カメラモジュール及びその製造方法 |
DE10259795A1 (de) * | 2002-12-19 | 2004-07-08 | Siemens Ag | Bilderzeugungsvorrichtung zum Einbau im Dachbereich oder im Aussenspiegel eines Kraftfahrzeuges |
EP1471730A1 (de) * | 2003-03-31 | 2004-10-27 | Dialog Semiconductor GmbH | Miniaturkameramodul |
US20040212726A1 (en) * | 2003-04-22 | 2004-10-28 | Mu-Jung Wang | Electronic image-capture module |
JP4231328B2 (ja) * | 2003-04-24 | 2009-02-25 | 浜松ホトニクス株式会社 | 固体撮像装置 |
FR2854498B1 (fr) | 2003-04-29 | 2005-09-16 | St Microelectronics Sa | Boitier semi-conducteur a capteur optique s'installant a l'interieur d'un objet. |
US7701489B1 (en) * | 2003-05-27 | 2010-04-20 | Apple Inc. | Method and apparatus for color correction |
KR100526191B1 (ko) * | 2003-06-18 | 2005-11-03 | 삼성전자주식회사 | 고체 촬상용 반도체 장치 |
JP4253534B2 (ja) * | 2003-06-23 | 2009-04-15 | オリンパス株式会社 | 撮像装置 |
KR100541650B1 (ko) * | 2003-08-12 | 2006-01-10 | 삼성전자주식회사 | 고체 촬상용 반도체 장치 및 그 제조방법 |
US7369699B1 (en) | 2003-08-29 | 2008-05-06 | Apple Inc. | Methods and apparatuses for restoring color and enhancing electronic images |
US6934065B2 (en) * | 2003-09-18 | 2005-08-23 | Micron Technology, Inc. | Microelectronic devices and methods for packaging microelectronic devices |
JP4170950B2 (ja) * | 2003-10-10 | 2008-10-22 | 松下電器産業株式会社 | 光学デバイスおよびその製造方法 |
JP2007510291A (ja) * | 2003-10-27 | 2007-04-19 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | カメラモジュール及びこのようなカメラモジュールの製造方法 |
US7583862B2 (en) * | 2003-11-26 | 2009-09-01 | Aptina Imaging Corporation | Packaged microelectronic imagers and methods of packaging microelectronic imagers |
TWI296154B (en) * | 2004-01-27 | 2008-04-21 | Casio Computer Co Ltd | Optical sensor module |
US7098580B2 (en) * | 2004-01-29 | 2006-08-29 | Kyocera Corporation | Piezoelectric oscillator |
US7253397B2 (en) * | 2004-02-23 | 2007-08-07 | Micron Technology, Inc. | Packaged microelectronic imagers and methods of packaging microelectronic imagers |
US7253957B2 (en) * | 2004-05-13 | 2007-08-07 | Micron Technology, Inc. | Integrated optics units and methods of manufacturing integrated optics units for use with microelectronic imagers |
US8092734B2 (en) * | 2004-05-13 | 2012-01-10 | Aptina Imaging Corporation | Covers for microelectronic imagers and methods for wafer-level packaging of microelectronics imagers |
US20050275750A1 (en) * | 2004-06-09 | 2005-12-15 | Salman Akram | Wafer-level packaged microelectronic imagers and processes for wafer-level packaging |
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US7262405B2 (en) * | 2004-06-14 | 2007-08-28 | Micron Technology, Inc. | Prefabricated housings for microelectronic imagers |
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US7294897B2 (en) * | 2004-06-29 | 2007-11-13 | Micron Technology, Inc. | Packaged microelectronic imagers and methods of packaging microelectronic imagers |
US7232754B2 (en) | 2004-06-29 | 2007-06-19 | Micron Technology, Inc. | Microelectronic devices and methods for forming interconnects in microelectronic devices |
KR100592368B1 (ko) * | 2004-07-06 | 2006-06-22 | 삼성전자주식회사 | 반도체 소자의 초박형 모듈 제조 방법 |
US7416913B2 (en) * | 2004-07-16 | 2008-08-26 | Micron Technology, Inc. | Methods of manufacturing microelectronic imaging units with discrete standoffs |
US7189954B2 (en) * | 2004-07-19 | 2007-03-13 | Micron Technology, Inc. | Microelectronic imagers with optical devices and methods of manufacturing such microelectronic imagers |
US7402453B2 (en) * | 2004-07-28 | 2008-07-22 | Micron Technology, Inc. | Microelectronic imaging units and methods of manufacturing microelectronic imaging units |
US7364934B2 (en) | 2004-08-10 | 2008-04-29 | Micron Technology, Inc. | Microelectronic imaging units and methods of manufacturing microelectronic imaging units |
US7521719B2 (en) * | 2004-08-13 | 2009-04-21 | Paul Steven Schranz | Light emitting and image sensing device and apparatus |
US7397066B2 (en) * | 2004-08-19 | 2008-07-08 | Micron Technology, Inc. | Microelectronic imagers with curved image sensors and methods for manufacturing microelectronic imagers |
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US8098309B2 (en) | 2012-01-17 |
US20120069230A1 (en) | 2012-03-22 |
EP1715524B1 (de) | 2013-08-07 |
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EP0807976A2 (de) | 1997-11-19 |
EP1715524A3 (de) | 2008-01-23 |
DE69739708D1 (de) | 2010-01-28 |
EP1715526B1 (de) | 2013-05-08 |
US6795120B2 (en) | 2004-09-21 |
US20040263671A1 (en) | 2004-12-30 |
EP1715526A2 (de) | 2006-10-25 |
US20140042578A1 (en) | 2014-02-13 |
EP1715525B1 (de) | 2009-12-16 |
EP0807976A3 (de) | 1999-03-24 |
EP1715525A2 (de) | 2006-10-25 |
US20020044215A1 (en) | 2002-04-18 |
EP1715524A2 (de) | 2006-10-25 |
EP1715525A3 (de) | 2008-01-23 |
EP1715526A3 (de) | 2008-01-23 |
EP0807976B1 (de) | 2009-07-22 |
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