DE69525128D1 - Lichtemittierende Halbleiteranordnung und Herstellungsverfahren - Google Patents
Lichtemittierende Halbleiteranordnung und HerstellungsverfahrenInfo
- Publication number
- DE69525128D1 DE69525128D1 DE69525128T DE69525128T DE69525128D1 DE 69525128 D1 DE69525128 D1 DE 69525128D1 DE 69525128 T DE69525128 T DE 69525128T DE 69525128 T DE69525128 T DE 69525128T DE 69525128 D1 DE69525128 D1 DE 69525128D1
- Authority
- DE
- Germany
- Prior art keywords
- manufacturing
- light emitting
- emitting device
- semiconductor light
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/341—Structures having reduced dimensionality, e.g. quantum wires
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
- H01L33/06—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
- H01L33/24—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate of the light emitting region, e.g. non-planar junction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2304/00—Special growth methods for semiconductor lasers
- H01S2304/04—MOCVD or MOVPE
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/227—Buried mesa structure ; Striped active layer
- H01S5/2275—Buried mesa structure ; Striped active layer mesa created by etching
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biophysics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26283794A JP3446343B2 (ja) | 1994-10-26 | 1994-10-26 | V溝構造を有する半導体発光装置 |
JP26283994A JP3446344B2 (ja) | 1994-10-26 | 1994-10-26 | V溝構造を有する半導体発光装置 |
JP26283894A JPH08125277A (ja) | 1994-10-26 | 1994-10-26 | V溝構造を有する半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69525128D1 true DE69525128D1 (de) | 2002-03-14 |
DE69525128T2 DE69525128T2 (de) | 2002-09-05 |
Family
ID=27335175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69525128T Expired - Fee Related DE69525128T2 (de) | 1994-10-26 | 1995-10-26 | Lichtemittierende Halbleiteranordnung und Herstellungsverfahren |
Country Status (3)
Country | Link |
---|---|
US (3) | US6265733B1 (de) |
EP (1) | EP0709902B1 (de) |
DE (1) | DE69525128T2 (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6342731B1 (en) * | 1997-12-31 | 2002-01-29 | Micron Technology, Inc. | Vertically mountable semiconductor device, assembly, and methods |
US6639926B1 (en) * | 1998-03-25 | 2003-10-28 | Mitsubishi Chemical Corporation | Semiconductor light-emitting device |
KR100277940B1 (ko) * | 1998-07-14 | 2001-02-01 | 구자홍 | 지에이엔(gan) 반도체 레이저 다이오드 및 그 제조방법 |
JP2001119012A (ja) * | 1999-10-15 | 2001-04-27 | Fujitsu Ltd | 半導体装置及びその製造方法 |
JP2002118327A (ja) * | 2000-10-06 | 2002-04-19 | Furukawa Electric Co Ltd:The | 化合物半導体装置の製造方法 |
US6888867B2 (en) * | 2001-08-08 | 2005-05-03 | Nobuhiko Sawaki | Semiconductor laser device and fabrication method thereof |
JP4307113B2 (ja) * | 2002-03-19 | 2009-08-05 | 宣彦 澤木 | 半導体発光素子およびその製造方法 |
US7115916B2 (en) * | 2002-09-26 | 2006-10-03 | International Business Machines Corporation | System and method for molecular optical emission |
JP4476912B2 (ja) * | 2005-09-29 | 2010-06-09 | 株式会社東芝 | 半導体発光素子およびその製造方法 |
KR20100093872A (ko) * | 2009-02-17 | 2010-08-26 | 삼성엘이디 주식회사 | 질화물 반도체 발광소자 및 그 제조방법 |
US8933526B2 (en) * | 2009-07-15 | 2015-01-13 | First Solar, Inc. | Nanostructured functional coatings and devices |
JP5519355B2 (ja) * | 2010-03-19 | 2014-06-11 | スタンレー電気株式会社 | 半導体発光素子及びその製造方法 |
GB2480265B (en) * | 2010-05-10 | 2013-10-02 | Toshiba Res Europ Ltd | A semiconductor device and a method of fabricating a semiconductor device |
WO2011145283A1 (ja) * | 2010-05-20 | 2011-11-24 | パナソニック株式会社 | 窒化物半導体発光素子および窒化物半導体発光素子の製造方法 |
EP3218747B1 (de) * | 2014-11-11 | 2020-10-14 | Luna Innovations Incorporated | Glasfaser und verfahren und vorrichtung zur genauen glasfasermessung unter mehrfachreizen |
CN105742423B (zh) * | 2015-11-30 | 2018-08-31 | 厦门市三安光电科技有限公司 | 发光二极管及其制作方法 |
CN105932128B (zh) * | 2016-05-10 | 2018-04-06 | 厦门市三安光电科技有限公司 | 一种氮化物发光二极管的外延结构 |
US10260005B2 (en) | 2016-08-05 | 2019-04-16 | Greyrock Technology LLC | Catalysts, related methods and reaction products |
CN107833955B (zh) * | 2017-10-09 | 2019-11-26 | 厦门三安光电有限公司 | 一种氮化物发光二极管 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4504952A (en) * | 1982-06-01 | 1985-03-12 | At&T Bell Laboratories | Stripe-guide TJS laser |
JPH01106489A (ja) * | 1987-10-20 | 1989-04-24 | Fujitsu Ltd | 半導体装置及びその製造方法 |
US5362973A (en) * | 1990-06-25 | 1994-11-08 | Xerox Corporation | Quantum fabricated via photo induced evaporation enhancement during in situ epitaxial growth |
US5138625A (en) * | 1991-01-08 | 1992-08-11 | Xerox Corporation | Quantum wire semiconductor laser |
IT1245541B (it) * | 1991-05-13 | 1994-09-29 | Cselt Centro Studi Lab Telecom | Laser a semiconduttore a reazione distribuita ed accoppiamento di guadagno ,e procedimento per la sua fabbricazione |
JPH04349622A (ja) * | 1991-05-28 | 1992-12-04 | Eastman Kodak Japan Kk | 量子デバイス製造方法 |
JP3149030B2 (ja) * | 1991-06-13 | 2001-03-26 | 富士通株式会社 | 半導体量子箱装置及びその製造方法 |
JPH05145178A (ja) * | 1991-11-18 | 1993-06-11 | Furukawa Electric Co Ltd:The | 歪量子井戸半導体レーザ素子 |
JPH06232099A (ja) * | 1992-09-10 | 1994-08-19 | Mitsubishi Electric Corp | 半導体装置の製造方法,半導体装置の製造装置,半導体レーザの製造方法,量子細線構造の製造方法,及び結晶成長方法 |
JPH07326730A (ja) * | 1994-05-31 | 1995-12-12 | Mitsubishi Electric Corp | 半導体装置,その製造方法,単一電子デバイス,及びその製造方法 |
JP3374878B2 (ja) * | 1994-09-02 | 2003-02-10 | 三菱電機株式会社 | 半導体エッチング方法 |
-
1995
- 1995-10-26 DE DE69525128T patent/DE69525128T2/de not_active Expired - Fee Related
- 1995-10-26 EP EP95307641A patent/EP0709902B1/de not_active Expired - Lifetime
-
1997
- 1997-11-13 US US08/970,145 patent/US6265733B1/en not_active Expired - Fee Related
-
2001
- 2001-02-20 US US09/785,428 patent/US6744066B2/en not_active Expired - Fee Related
- 2001-05-31 US US09/867,440 patent/US6589807B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US6744066B2 (en) | 2004-06-01 |
EP0709902B1 (de) | 2002-01-23 |
US20020014622A1 (en) | 2002-02-07 |
US6265733B1 (en) | 2001-07-24 |
DE69525128T2 (de) | 2002-09-05 |
US20010040236A1 (en) | 2001-11-15 |
US6589807B2 (en) | 2003-07-08 |
EP0709902A1 (de) | 1996-05-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |