DE69125438T2 - Ablaufsteuerung für automatische Testeinrichtung - Google Patents

Ablaufsteuerung für automatische Testeinrichtung

Info

Publication number
DE69125438T2
DE69125438T2 DE69125438T DE69125438T DE69125438T2 DE 69125438 T2 DE69125438 T2 DE 69125438T2 DE 69125438 T DE69125438 T DE 69125438T DE 69125438 T DE69125438 T DE 69125438T DE 69125438 T2 DE69125438 T2 DE 69125438T2
Authority
DE
Germany
Prior art keywords
test equipment
sequence control
automatic test
automatic
sequence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69125438T
Other languages
English (en)
Other versions
DE69125438D1 (de
Inventor
Burnell West
Egbert Graeve
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger Technologies Inc
Original Assignee
Schlumberger Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Inc filed Critical Schlumberger Technologies Inc
Application granted granted Critical
Publication of DE69125438D1 publication Critical patent/DE69125438D1/de
Publication of DE69125438T2 publication Critical patent/DE69125438T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69125438T 1990-09-05 1991-08-12 Ablaufsteuerung für automatische Testeinrichtung Expired - Fee Related DE69125438T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/577,986 US5212443A (en) 1990-09-05 1990-09-05 Event sequencer for automatic test equipment

Publications (2)

Publication Number Publication Date
DE69125438D1 DE69125438D1 (de) 1997-05-07
DE69125438T2 true DE69125438T2 (de) 1997-10-30

Family

ID=24310992

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69125438T Expired - Fee Related DE69125438T2 (de) 1990-09-05 1991-08-12 Ablaufsteuerung für automatische Testeinrichtung

Country Status (4)

Country Link
US (2) US5212443A (de)
EP (1) EP0474274B1 (de)
JP (1) JP3220480B2 (de)
DE (1) DE69125438T2 (de)

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Also Published As

Publication number Publication date
JPH0694796A (ja) 1994-04-08
US5477139A (en) 1995-12-19
EP0474274A2 (de) 1992-03-11
EP0474274B1 (de) 1997-04-02
JP3220480B2 (ja) 2001-10-22
EP0474274A3 (en) 1993-12-15
US5212443A (en) 1993-05-18
DE69125438D1 (de) 1997-05-07

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