FR2538912B1 - Equipement de test automatique - Google Patents

Equipement de test automatique

Info

Publication number
FR2538912B1
FR2538912B1 FR8222081A FR8222081A FR2538912B1 FR 2538912 B1 FR2538912 B1 FR 2538912B1 FR 8222081 A FR8222081 A FR 8222081A FR 8222081 A FR8222081 A FR 8222081A FR 2538912 B1 FR2538912 B1 FR 2538912B1
Authority
FR
France
Prior art keywords
test equipment
automatic test
automatic
equipment
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8222081A
Other languages
English (en)
Other versions
FR2538912A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR8222081A priority Critical patent/FR2538912B1/fr
Publication of FR2538912A1 publication Critical patent/FR2538912A1/fr
Application granted granted Critical
Publication of FR2538912B1 publication Critical patent/FR2538912B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
FR8222081A 1982-12-30 1982-12-30 Equipement de test automatique Expired FR2538912B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8222081A FR2538912B1 (fr) 1982-12-30 1982-12-30 Equipement de test automatique

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8222081A FR2538912B1 (fr) 1982-12-30 1982-12-30 Equipement de test automatique

Publications (2)

Publication Number Publication Date
FR2538912A1 FR2538912A1 (fr) 1984-07-06
FR2538912B1 true FR2538912B1 (fr) 1985-06-14

Family

ID=9280690

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8222081A Expired FR2538912B1 (fr) 1982-12-30 1982-12-30 Equipement de test automatique

Country Status (1)

Country Link
FR (1) FR2538912B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4998250A (en) * 1988-09-08 1991-03-05 Data I/O Corporation Method and apparatus for determining an internal state of an electronic component
US6958598B2 (en) * 2003-09-30 2005-10-25 Teradyne, Inc. Efficient switching architecture with reduced stub lengths

Also Published As

Publication number Publication date
FR2538912A1 (fr) 1984-07-06

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Legal Events

Date Code Title Description
ST Notification of lapse