DE69119277D1 - Nichtflüchtiger Halbleiterspeicher - Google Patents
Nichtflüchtiger HalbleiterspeicherInfo
- Publication number
- DE69119277D1 DE69119277D1 DE69119277T DE69119277T DE69119277D1 DE 69119277 D1 DE69119277 D1 DE 69119277D1 DE 69119277 T DE69119277 T DE 69119277T DE 69119277 T DE69119277 T DE 69119277T DE 69119277 D1 DE69119277 D1 DE 69119277D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor memory
- volatile semiconductor
- volatile
- memory
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42324—Gate electrodes for transistors with a floating gate
- H01L29/42328—Gate electrodes for transistors with a floating gate with at least one additional gate other than the floating gate and the control gate, e.g. program gate, erase gate or select gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Non-Volatile Memory (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4812690A JP2624864B2 (ja) | 1990-02-28 | 1990-02-28 | 不揮発性半導体メモリ |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69119277D1 true DE69119277D1 (de) | 1996-06-13 |
DE69119277T2 DE69119277T2 (de) | 1996-10-02 |
Family
ID=12794637
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69119277T Expired - Fee Related DE69119277T2 (de) | 1990-02-28 | 1991-02-28 | Nichtflüchtiger Halbleiterspeicher |
Country Status (5)
Country | Link |
---|---|
US (2) | US5418742A (de) |
EP (1) | EP0447856B1 (de) |
JP (1) | JP2624864B2 (de) |
KR (1) | KR920000079A (de) |
DE (1) | DE69119277T2 (de) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3204666B2 (ja) * | 1990-11-21 | 2001-09-04 | 株式会社東芝 | 不揮発性半導体記憶装置 |
DE69231356T2 (de) * | 1992-01-22 | 2000-12-28 | Macronix Int Co Ltd | Nichtflüchtige Speicherzelle und Anordnungsarchitektur |
US6243293B1 (en) | 1992-01-29 | 2001-06-05 | Interuniversitair Micro-Elektronica Centrum | Contacted cell array configuration for erasable and programmable semiconductor memories |
US6414878B2 (en) | 1992-03-17 | 2002-07-02 | Hitachi, Ltd. | Data line disturbance free memory block divided flash memory and microcomputer having flash memory therein |
TW231343B (de) * | 1992-03-17 | 1994-10-01 | Hitachi Seisakusyo Kk | |
JP3765585B2 (ja) * | 1992-08-10 | 2006-04-12 | 株式会社ルネサステクノロジ | データ処理装置 |
US7057937B1 (en) | 1992-03-17 | 2006-06-06 | Renesas Technology Corp. | Data processing apparatus having a flash memory built-in which is rewritable by use of external device |
US5687345A (en) * | 1992-03-17 | 1997-11-11 | Hitachi, Ltd. | Microcomputer having CPU and built-in flash memory that is rewritable under control of the CPU analyzing a command supplied from an external device |
US5592415A (en) | 1992-07-06 | 1997-01-07 | Hitachi, Ltd. | Non-volatile semiconductor memory |
FR2703501B1 (fr) * | 1993-04-01 | 1995-05-19 | Gemplus Card Int | Circuit intégré pour carte à mémoire et procédé de décomptage d'unités dans une carte à mémoire. |
DE69330434T2 (de) * | 1993-05-28 | 2002-05-02 | Macronix Int Co Ltd | Flash-eprom mit block-löschmarkierungen für überlöschschutz. |
US5563823A (en) * | 1993-08-31 | 1996-10-08 | Macronix International Co., Ltd. | Fast FLASH EPROM programming and pre-programming circuit design |
JPH07201191A (ja) * | 1993-12-28 | 1995-08-04 | Toshiba Corp | 不揮発性半導体メモリ装置 |
JP3260761B2 (ja) * | 1994-09-13 | 2002-02-25 | マクロニクス インターナショナル カンパニイ リミテッド | フラッシュ・イーピーロム集積回路構造 |
US5646429A (en) * | 1996-02-23 | 1997-07-08 | Micron Quantum Devices, Inc. | Segmented non-volatile memory array having multiple sources |
TW365001B (en) * | 1996-10-17 | 1999-07-21 | Hitachi Ltd | Non-volatile semiconductor memory apparatus and the operation method |
EP0851426A3 (de) | 1996-12-27 | 1999-11-24 | STMicroelectronics S.r.l. | Speicherblock zur Realisierung von Halbleiterspeicheranordnungen und entsprechendes Herstellungsverfahren |
US5945717A (en) * | 1997-03-11 | 1999-08-31 | Micron Technology, Inc. | Segmented non-volatile memory array having multiple sources |
TW419812B (en) * | 1998-02-18 | 2001-01-21 | Sanyo Electric Co | Non-volatile semiconductor memory |
TW412861B (en) * | 1998-02-27 | 2000-11-21 | Sanyo Electric Co | Non-volatile semiconductor memory |
DE10008002C2 (de) * | 2000-02-22 | 2003-04-10 | X Fab Semiconductor Foundries | Split-gate-Flash-Speicherelement, Anordnung von Split-gate-Flash-Speicherelementen und Methode zum Löschen derselben |
US20040028559A1 (en) * | 2001-11-06 | 2004-02-12 | Peter Schuck | Sample delivery system with laminar mixing for microvolume biosensing |
US7839682B2 (en) * | 2009-01-29 | 2010-11-23 | Silicon Storage Technology, Inc. | Array and pitch of non-volatile memory cells |
US9418744B2 (en) * | 2014-05-12 | 2016-08-16 | Silicon Storage Technology, Inc. | System and method to reduce disturbances during programming of flash memory cells |
CN107799146B (zh) * | 2016-08-31 | 2020-06-09 | 中芯国际集成电路制造(上海)有限公司 | 存储器阵列及其读、编程、擦除操作方法 |
JP2022159956A (ja) | 2021-04-05 | 2022-10-18 | キオクシア株式会社 | 半導体記憶装置 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6025837B2 (ja) * | 1978-09-14 | 1985-06-20 | 株式会社東芝 | 半導体記憶装置 |
US4366555A (en) * | 1980-08-01 | 1982-12-28 | National Semiconductor Corporation | Electrically erasable programmable read only memory |
DE3175125D1 (en) * | 1980-11-20 | 1986-09-18 | Toshiba Kk | Semiconductor memory device and method for manufacturing the same |
US4408306A (en) * | 1981-09-28 | 1983-10-04 | Motorola, Inc. | Column and row erasable EEPROM |
US4797856A (en) * | 1987-04-16 | 1989-01-10 | Intel Corporation | Self-limiting erase scheme for EEPROM |
US4970692A (en) * | 1987-09-01 | 1990-11-13 | Waferscale Integration, Inc. | Circuit for controlling a flash EEPROM having three distinct modes of operation by allowing multiple functionality of a single pin |
US4740766A (en) * | 1987-09-04 | 1988-04-26 | Tektronix, Inc. | Precision tracking current generator |
JP2685770B2 (ja) * | 1987-12-28 | 1997-12-03 | 株式会社東芝 | 不揮発性半導体記憶装置 |
JPH07109701B2 (ja) * | 1987-11-30 | 1995-11-22 | 株式会社東芝 | キャッシュメモリ |
JPH01271996A (ja) * | 1988-04-22 | 1989-10-31 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置 |
US4949309A (en) * | 1988-05-11 | 1990-08-14 | Catalyst Semiconductor, Inc. | EEPROM utilizing single transistor per cell capable of both byte erase and flash erase |
JPH01296496A (ja) * | 1988-05-25 | 1989-11-29 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置の制御方式 |
US5315547A (en) * | 1988-07-11 | 1994-05-24 | Hitachi, Ltd. | Nonvolatile semiconductor memory device with selective tow erasure |
US5047981A (en) * | 1988-07-15 | 1991-09-10 | Texas Instruments Incorporated | Bit and block erasing of an electrically erasable and programmable read-only memory array |
JP2685825B2 (ja) * | 1988-08-12 | 1997-12-03 | 株式会社東芝 | 不揮発性半導体メモリ |
US5023681A (en) * | 1988-10-08 | 1991-06-11 | Hyundai Electronics Industries Co., Ltd. | Method for arranging EEPROM cells and a semiconductor device manufactured by the method |
ATE101752T1 (de) * | 1989-03-31 | 1994-03-15 | Philips Nv | Eprom, der eine mehrfache verwendung der bitleitungskontakte ermoeglicht. |
US5283758A (en) * | 1989-06-13 | 1994-02-01 | Mitsubishi Denki Kabushiki Kaisha | Non-volatile semiconductor memory device |
US5023837A (en) * | 1989-09-05 | 1991-06-11 | Texas Instruments Incorporated | Bitline segmentation in logic arrays |
US5065364A (en) * | 1989-09-15 | 1991-11-12 | Intel Corporation | Apparatus for providing block erasing in a flash EPROM |
US5126808A (en) * | 1989-10-23 | 1992-06-30 | Advanced Micro Devices, Inc. | Flash EEPROM array with paged erase architecture |
US5022008A (en) * | 1989-12-14 | 1991-06-04 | Texas Instruments Incorporated | PROM speed measuring method |
US5020026A (en) * | 1989-12-14 | 1991-05-28 | Texas Instruments Incorporated | Method and apparatus for reading and programming electrically programmable memory cells |
US5117389A (en) * | 1990-09-05 | 1992-05-26 | Macronix International Co., Ltd. | Flat-cell read-only-memory integrated circuit |
US5197029A (en) * | 1991-02-07 | 1993-03-23 | Texas Instruments Incorporated | Common-line connection for integrated memory array |
-
1990
- 1990-02-28 JP JP4812690A patent/JP2624864B2/ja not_active Expired - Lifetime
-
1991
- 1991-02-27 KR KR1019910003153A patent/KR920000079A/ko not_active Application Discontinuation
- 1991-02-28 EP EP91103051A patent/EP0447856B1/de not_active Expired - Lifetime
- 1991-02-28 DE DE69119277T patent/DE69119277T2/de not_active Expired - Fee Related
-
1992
- 1992-12-10 US US07/989,935 patent/US5418742A/en not_active Expired - Lifetime
-
1994
- 1994-07-12 US US08/273,922 patent/US5761119A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69119277T2 (de) | 1996-10-02 |
EP0447856B1 (de) | 1996-05-08 |
JP2624864B2 (ja) | 1997-06-25 |
EP0447856A1 (de) | 1991-09-25 |
US5761119A (en) | 1998-06-02 |
JPH03250495A (ja) | 1991-11-08 |
US5418742A (en) | 1995-05-23 |
KR920000079A (ko) | 1992-01-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |