DE68926811D1 - Halbleiterspeicheranordnung - Google Patents

Halbleiterspeicheranordnung

Info

Publication number
DE68926811D1
DE68926811D1 DE68926811T DE68926811T DE68926811D1 DE 68926811 D1 DE68926811 D1 DE 68926811D1 DE 68926811 T DE68926811 T DE 68926811T DE 68926811 T DE68926811 T DE 68926811T DE 68926811 D1 DE68926811 D1 DE 68926811D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
semiconductor
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68926811T
Other languages
English (en)
Other versions
DE68926811T2 (de
Inventor
Haruki C O Intellectual P Toda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE68926811D1 publication Critical patent/DE68926811D1/de
Publication of DE68926811T2 publication Critical patent/DE68926811T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B53/00—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/14—Dummy cell management; Sense reference voltage generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
DE68926811T 1988-10-19 1989-10-19 Halbleiterspeicheranordnung Expired - Fee Related DE68926811T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63263153A JPH0713877B2 (ja) 1988-10-19 1988-10-19 半導体メモリ

Publications (2)

Publication Number Publication Date
DE68926811D1 true DE68926811D1 (de) 1996-08-14
DE68926811T2 DE68926811T2 (de) 1997-01-09

Family

ID=17385538

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68926811T Expired - Fee Related DE68926811T2 (de) 1988-10-19 1989-10-19 Halbleiterspeicheranordnung

Country Status (5)

Country Link
US (1) US5010518A (de)
EP (1) EP0365002B1 (de)
JP (1) JPH0713877B2 (de)
KR (1) KR900006976A (de)
DE (1) DE68926811T2 (de)

Families Citing this family (69)

* Cited by examiner, † Cited by third party
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KR930002470B1 (ko) * 1989-03-28 1993-04-02 가부시키가이샤 도시바 전기적인 독출/기록동작이 가능한 불휘발성 반도체기억장치 및 그 정보독출방법
JPH035996A (ja) * 1989-06-01 1991-01-11 Mitsubishi Electric Corp 不揮発性半導体記憶装置
US5121353A (en) * 1989-07-06 1992-06-09 Kabushiki Kaisha Toshiba Ferroelectric capacitor memory circuit MOS setting and transmission transistor
USRE40552E1 (en) 1990-04-06 2008-10-28 Mosaid Technologies, Inc. Dynamic random access memory using imperfect isolating transistors
JP3169599B2 (ja) * 1990-08-03 2001-05-28 株式会社日立製作所 半導体装置、その駆動方法、その読み出し方法
IT1246754B (it) * 1990-12-28 1994-11-26 Sgs Thomson Microelectronics Circuito di lettura di celle eprom
JPH04268287A (ja) * 1991-02-22 1992-09-24 Nec Ic Microcomput Syst Ltd 半導体メモリ回路
US5768182A (en) * 1991-05-21 1998-06-16 The Regents Of The University Of California Ferroelectric nonvolatile dynamic random access memory device
US5198706A (en) * 1991-10-15 1993-03-30 National Semiconductor Ferroelectric programming cell for configurable logic
US5303182A (en) * 1991-11-08 1994-04-12 Rohm Co., Ltd. Nonvolatile semiconductor memory utilizing a ferroelectric film
JP2930168B2 (ja) * 1992-10-09 1999-08-03 シャープ株式会社 強誘電体メモリ装置の駆動方法
JP3278981B2 (ja) * 1993-06-23 2002-04-30 株式会社日立製作所 半導体メモリ
US5539279A (en) * 1993-06-23 1996-07-23 Hitachi, Ltd. Ferroelectric memory
US5381364A (en) 1993-06-24 1995-01-10 Ramtron International Corporation Ferroelectric-based RAM sensing scheme including bit-line capacitance isolation
US5406510A (en) * 1993-07-15 1995-04-11 Symetrix Corporation Non-volatile memory
US5424975A (en) * 1993-12-30 1995-06-13 Micron Technology, Inc. Reference circuit for a non-volatile ferroelectric memory
JPH07235648A (ja) * 1994-02-24 1995-09-05 Hitachi Ltd 半導体記憶装置
JP3218844B2 (ja) * 1994-03-22 2001-10-15 松下電器産業株式会社 半導体メモリ装置
US5572459A (en) * 1994-09-16 1996-11-05 Ramtron International Corporation Voltage reference for a ferroelectric 1T/1C based memory
JPH08147965A (ja) * 1994-11-15 1996-06-07 Toshiba Corp 半導体記憶装置
JP2748873B2 (ja) * 1995-01-04 1998-05-13 日本電気株式会社 強誘電体メモリ装置およびその動作制御方法
JPH098247A (ja) * 1995-06-15 1997-01-10 Hitachi Ltd 半導体記憶装置
JPH097377A (ja) * 1995-06-20 1997-01-10 Sony Corp 強誘電体記憶装置
US5638322A (en) * 1995-07-19 1997-06-10 Cypress Semiconductor Corp. Apparatus and method for improving common mode noise rejection in pseudo-differential sense amplifiers
DE69627724T2 (de) * 1995-08-02 2003-10-23 Matsushita Electric Ind Co Ltd Ferroelektrischer Speicher mit Rücksetzschaltung
US5680344A (en) * 1995-09-11 1997-10-21 Micron Technology, Inc. Circuit and method of operating a ferrolectric memory in a DRAM mode
US5677865A (en) * 1995-09-11 1997-10-14 Micron Technology, Inc. Ferroelectric memory using reference charge circuit
US5905672A (en) * 1997-03-27 1999-05-18 Micron Technology, Inc. Ferroelectric memory using ferroelectric reference cells
US5682344A (en) * 1995-09-11 1997-10-28 Micron Technology, Inc. Destructive read protection using address blocking technique
US5638318A (en) * 1995-09-11 1997-06-10 Micron Technology, Inc. Ferroelectric memory using ferroelectric reference cells
JPH0997496A (ja) * 1995-09-29 1997-04-08 Nec Corp 強誘電体メモリ装置及びデータ読出方法
US6330178B1 (en) 1996-02-28 2001-12-11 Hitachi, Ltd. Ferroelectric memory device
JP3787361B2 (ja) * 1996-02-28 2006-06-21 株式会社 日立製作所 強誘電体記憶装置
US5721699A (en) * 1996-03-18 1998-02-24 Symetrix Corporation Ferroelectric memory with feedback circuit
EP0798729B1 (de) * 1996-03-29 2004-11-03 STMicroelectronics S.r.l. Referenzwortleitung und Datenlaufzeitwiedergabeschaltung, insbesondere für nichtflüssige Speicher mit hierarchischen Dekodern
US5852571A (en) * 1997-03-14 1998-12-22 Micron Technology, Inc. Nonvolatile ferroelectric memory with folded bit line architecture
JP3003628B2 (ja) * 1997-06-16 2000-01-31 日本電気株式会社 強誘電体メモリとその書き込み方法
JP3196824B2 (ja) * 1997-07-16 2001-08-06 日本電気株式会社 強誘電体メモリ装置
JP4030076B2 (ja) * 1997-07-18 2008-01-09 ローム株式会社 処理機能付記憶装置
KR100313932B1 (ko) * 1997-09-26 2002-01-15 김영환 반도체메모리소자의강유전체제조방법
US5978251A (en) * 1997-11-14 1999-11-02 Ramtron International Corporation Plate line driver circuit for a 1T/1C ferroelectric memory
US5880989A (en) * 1997-11-14 1999-03-09 Ramtron International Corporation Sensing methodology for a 1T/1C ferroelectric memory
US5995406A (en) * 1997-11-14 1999-11-30 Ramtron International Corporation Plate line segmentation in a 1T/1C ferroelectric memory
US5892728A (en) * 1997-11-14 1999-04-06 Ramtron International Corporation Column decoder configuration for a 1T/1C ferroelectric memory
US5986919A (en) * 1997-11-14 1999-11-16 Ramtron International Corporation Reference cell configuration for a 1T/1C ferroelectric memory
US6002634A (en) * 1997-11-14 1999-12-14 Ramtron International Corporation Sense amplifier latch driver circuit for a 1T/1C ferroelectric memory
US6028783A (en) * 1997-11-14 2000-02-22 Ramtron International Corporation Memory cell configuration for a 1T/1C ferroelectric memory
US20050122765A1 (en) * 1997-11-14 2005-06-09 Allen Judith E. Reference cell configuration for a 1T/1C ferroelectric memory
US5956266A (en) * 1997-11-14 1999-09-21 Ramtron International Corporation Reference cell for a 1T/1C ferroelectric memory
US5969980A (en) * 1997-11-14 1999-10-19 Ramtron International Corporation Sense amplifier configuration for a 1T/1C ferroelectric memory
JP3196829B2 (ja) 1997-12-26 2001-08-06 日本電気株式会社 強誘電体メモリ装置
KR100268947B1 (ko) * 1998-04-03 2000-10-16 김영환 비휘발성 강유전체 메모리 및 그의 제어회로
US5963466A (en) * 1998-04-13 1999-10-05 Radiant Technologies, Inc. Ferroelectric memory having a common plate electrode
KR100298439B1 (ko) * 1998-06-30 2001-08-07 김영환 비휘발성 강유전체 메모리
US6545902B2 (en) 1998-08-28 2003-04-08 Hitachi, Ltd. Ferroelectric memory device
DE19844101A1 (de) 1998-09-25 2000-03-30 Siemens Ag Schaltungsanordnung zur Generierung einer Referenzspannung für das Auslesen eines ferroelektrischen Speichers
KR100548847B1 (ko) 1998-10-28 2006-03-31 주식회사 하이닉스반도체 수명을 연장시킨 강유전체 메모리 장치
DE19852570A1 (de) * 1998-11-13 2000-05-25 Siemens Ag Ferroelektrische Speicheranordnung
US6282126B1 (en) 1998-12-16 2001-08-28 Micron Technology, Inc. Flash memory with overerase protection
DE19913109C2 (de) * 1999-03-23 2001-01-25 Siemens Ag Integrierter Speicher mit Speicherzellen und Referenzzellen und entsprechendes Betriebsverfahren
US6272049B1 (en) 1999-05-12 2001-08-07 Matsushita Electric Industrial Co., Ltd. Non-volatile semiconductor memory device having increased operating speed
US6538922B1 (en) 2000-09-27 2003-03-25 Sandisk Corporation Writable tracking cells
JP3646791B2 (ja) * 2001-10-19 2005-05-11 沖電気工業株式会社 強誘電体メモリ装置およびその動作方法
KR100454259B1 (ko) * 2001-11-02 2004-10-26 주식회사 하이닉스반도체 모니터링회로를 가지는 반도체메모리장치
US6920060B2 (en) * 2002-08-14 2005-07-19 Intel Corporation Memory device, circuits and methods for operating a memory device
US6756619B2 (en) 2002-08-26 2004-06-29 Micron Technology, Inc. Semiconductor constructions
US7237074B2 (en) * 2003-06-13 2007-06-26 Sandisk Corporation Tracking cells for a memory system
US7301807B2 (en) 2003-10-23 2007-11-27 Sandisk Corporation Writable tracking cells
US7057918B2 (en) * 2004-03-01 2006-06-06 Faraday Technology Corp. Memory unit and memory module using the same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4363111A (en) * 1980-10-06 1982-12-07 Heightley John D Dummy cell arrangement for an MOS memory
IT1213343B (it) * 1986-09-12 1989-12-20 Sgs Microelettronica Spa Circuito di rilevamento dello stato di celle di matrice in memorie eprom in tecnologia mos.
US4873664A (en) * 1987-02-12 1989-10-10 Ramtron Corporation Self restoring ferroelectric memory

Also Published As

Publication number Publication date
US5010518A (en) 1991-04-23
KR900006976A (ko) 1990-05-09
EP0365002A3 (de) 1992-01-22
EP0365002B1 (de) 1996-07-10
JPH02110893A (ja) 1990-04-24
EP0365002A2 (de) 1990-04-25
DE68926811T2 (de) 1997-01-09
JPH0713877B2 (ja) 1995-02-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee