DE68911376D1 - MOSFET mit Drainspannungsdetektorfunktion. - Google Patents

MOSFET mit Drainspannungsdetektorfunktion.

Info

Publication number
DE68911376D1
DE68911376D1 DE89305284T DE68911376T DE68911376D1 DE 68911376 D1 DE68911376 D1 DE 68911376D1 DE 89305284 T DE89305284 T DE 89305284T DE 68911376 T DE68911376 T DE 68911376T DE 68911376 D1 DE68911376 D1 DE 68911376D1
Authority
DE
Germany
Prior art keywords
mosfet
voltage detector
drain voltage
detector function
function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE89305284T
Other languages
English (en)
Other versions
DE68911376T2 (de
Inventor
Akio Intellectual Pro Nakagawa
Yoshihiro Intellectu Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE68911376D1 publication Critical patent/DE68911376D1/de
Application granted granted Critical
Publication of DE68911376T2 publication Critical patent/DE68911376T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
    • H01L29/7835—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's with asymmetrical source and drain regions, e.g. lateral high-voltage MISFETs with drain offset region, extended drain MISFETs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1025—Channel region of field-effect devices
    • H01L29/1029—Channel region of field-effect devices of field-effect transistors
    • H01L29/1033—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure
    • H01L29/1041—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure with a non-uniform doping structure in the channel region surface
    • H01L29/1045—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure with a non-uniform doping structure in the channel region surface the doping structure being parallel to the channel length, e.g. DMOS like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
    • H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
    • H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
    • H01L29/7395—Vertical transistors, e.g. vertical IGBT
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • H01L29/0692—Surface layout
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • H01L29/0692—Surface layout
    • H01L29/0696—Surface layout of cellular field-effect devices, e.g. multicellular DMOS transistors or IGBTs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42364—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity
    • H01L29/42368—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity the thickness being non-uniform

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
DE89305284T 1988-05-25 1989-05-25 MOSFET mit Drainspannungsdetektorfunktion. Expired - Fee Related DE68911376T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP12740388 1988-05-25
JP1034404A JP2698645B2 (ja) 1988-05-25 1989-02-14 Ｍｏｓｆｅｔ

Publications (2)

Publication Number Publication Date
DE68911376D1 true DE68911376D1 (de) 1994-01-27
DE68911376T2 DE68911376T2 (de) 1994-05-05

Family

ID=26373212

Family Applications (1)

Application Number Title Priority Date Filing Date
DE89305284T Expired - Fee Related DE68911376T2 (de) 1988-05-25 1989-05-25 MOSFET mit Drainspannungsdetektorfunktion.

Country Status (4)

Country Link
US (1) US4994904A (de)
EP (1) EP0343977B1 (de)
JP (1) JP2698645B2 (de)
DE (1) DE68911376T2 (de)

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US5264719A (en) * 1986-01-07 1993-11-23 Harris Corporation High voltage lateral semiconductor device
US5258641A (en) * 1989-12-28 1993-11-02 Mitsubishi Denki Kabushiki Kaisha Semiconductor device for extracting a signal used to monitor potential of a high voltage island at a low voltage island and method of manufacturing the same
JP2513874B2 (ja) * 1989-12-28 1996-07-03 三菱電機株式会社 半導体装置およびその製造方法
JP2715399B2 (ja) * 1990-07-30 1998-02-18 株式会社デンソー 電力用半導体装置
JP2833610B2 (ja) * 1991-10-01 1998-12-09 株式会社デンソー 絶縁ゲート型バイポーラトランジスタ
US5289028A (en) * 1991-11-04 1994-02-22 Motorola, Inc. High power semiconductor device with integral on-state voltage detection structure
GB9207849D0 (en) * 1992-04-09 1992-05-27 Philips Electronics Uk Ltd A semiconductor device
US5286995A (en) * 1992-07-14 1994-02-15 Texas Instruments Incorporated Isolated resurf LDMOS devices for multiple outputs on one die
GB9215654D0 (en) * 1992-07-23 1992-09-09 Philips Electronics Uk Ltd A semiconductor component
US5282107A (en) * 1992-09-01 1994-01-25 Power Integrations, Inc. Power MOSFET safe operating area current limiting device
US5371394A (en) * 1993-11-15 1994-12-06 Motorola, Inc. Double implanted laterally diffused MOS device and method thereof
WO1995019646A1 (en) * 1994-01-12 1995-07-20 Atmel Corporation Input/output transistors with optimized esd protection
JP3275569B2 (ja) * 1994-10-03 2002-04-15 富士電機株式会社 横型高耐圧電界効果トランジスタおよびその製造方法
KR970004074A (ko) * 1995-06-05 1997-01-29 빈센트 비. 인그라시아 절연 게이트 전계 효과 트랜지스터 및 그 제조 방법
US5828112A (en) * 1995-09-18 1998-10-27 Kabushiki Kaisha Toshiba Semiconductor device incorporating an output element having a current-detecting section
US5879999A (en) * 1996-09-30 1999-03-09 Motorola, Inc. Method of manufacturing an insulated gate semiconductor device having a spacer extension
US5817561A (en) * 1996-09-30 1998-10-06 Motorola, Inc. Insulated gate semiconductor device and method of manufacture
JP3857462B2 (ja) * 1999-03-19 2006-12-13 株式会社東芝 交流スイッチ回路
JP4995364B2 (ja) * 1999-03-25 2012-08-08 セイコーインスツル株式会社 半導体集積回路装置
US7166165B2 (en) * 2000-04-06 2007-01-23 Asm America, Inc. Barrier coating for vitreous materials
US6433573B1 (en) 2000-08-07 2002-08-13 Koninklijke Philips Electronics N.V. Method and apparatus for measuring parameters of an electronic device
US6855985B2 (en) * 2002-09-29 2005-02-15 Advanced Analogic Technologies, Inc. Modular bipolar-CMOS-DMOS analog integrated circuit & power transistor technology
US20080164537A1 (en) * 2007-01-04 2008-07-10 Jun Cai Integrated complementary low voltage rf-ldmos
JP5497985B2 (ja) * 2004-09-13 2014-05-21 インターナショナル レクティフィアー コーポレイション 半導体パッケージ
US20060097292A1 (en) * 2004-10-29 2006-05-11 Kabushiki Kaisha Toshiba Semiconductor device
JP2006332539A (ja) * 2005-05-30 2006-12-07 Sanken Electric Co Ltd 半導体集積回路装置
JP2009081381A (ja) * 2007-09-27 2009-04-16 Panasonic Corp 半導体装置
JP2009088317A (ja) 2007-10-01 2009-04-23 Panasonic Corp 高耐圧半導体スイッチング素子
JP2009260119A (ja) * 2008-04-18 2009-11-05 Panasonic Corp 半導体装置、及び該半導体装置を用いたエネルギー伝達装置
TWI451571B (zh) * 2012-05-18 2014-09-01 Leadtrend Tech Corp 超高壓元件與操作超高壓元件的方法
CN103427603B (zh) * 2012-05-22 2016-09-21 通嘉科技股份有限公司 超高压组件与操作超高压组件的方法
JP5983122B2 (ja) * 2012-07-17 2016-08-31 富士通セミコンダクター株式会社 半導体装置
FR2995892B1 (fr) 2012-09-27 2014-10-17 Herakles Procede de fabrication d'une piece en cmc
JP6123516B2 (ja) * 2013-06-28 2017-05-10 株式会社ソシオネクスト 半導体装置
CN106601818B (zh) * 2016-12-15 2019-09-10 深圳市锐骏半导体股份有限公司 电流检测电路的检测方法
US10355132B2 (en) * 2017-03-20 2019-07-16 North Carolina State University Power MOSFETs with superior high frequency figure-of-merit
FR3071830B1 (fr) 2017-10-02 2021-03-12 Safran Ceram Procede pour la realisation d'une piece creuse en materiau composite a matrice ceramique
CN112543749A (zh) 2018-08-03 2021-03-23 赛峰集团陶瓷 由cmc制成的零件的制造方法
CN117334694B (zh) * 2023-12-01 2024-01-26 南京芯舟科技有限公司 一种过流防护器件

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US4344081A (en) * 1980-04-14 1982-08-10 Supertex, Inc. Combined DMOS and a vertical bipolar transistor device and fabrication method therefor
NL8204855A (nl) * 1982-12-16 1984-07-16 Philips Nv Veldeffekttransistor met geisoleerde stuurelektrode en werkwijze ter vervaardiging daarvan.
JPS60196974A (ja) * 1984-03-19 1985-10-05 Toshiba Corp 導電変調型ｍｏｓｆｅｔ
US4553084A (en) * 1984-04-02 1985-11-12 Motorola, Inc. Current sensing circuit
JPS60254764A (ja) * 1984-05-31 1985-12-16 Fujitsu Ltd Ｃｍｏｓ回路装置
JPH073854B2 (ja) * 1985-12-18 1995-01-18 株式会社日立製作所 複合半導体装置
US4823173A (en) * 1986-01-07 1989-04-18 Harris Corporation High voltage lateral MOS structure with depleted top gate region
JP2552880B2 (ja) * 1986-11-12 1996-11-13 シリコニックス・インコーポレイテッド 垂直ｄｍｏｓセル構造

Also Published As

Publication number Publication date
US4994904A (en) 1991-02-19
JPH02138773A (ja) 1990-05-28
EP0343977B1 (de) 1993-12-15
EP0343977A2 (de) 1989-11-29
DE68911376T2 (de) 1994-05-05
EP0343977A3 (en) 1990-10-31
JP2698645B2 (ja) 1998-01-19

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Legal Events

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8339 Ceased/non-payment of the annual fee