DE3877827D1 - Spannungsdetektor. - Google Patents

Spannungsdetektor.

Info

Publication number
DE3877827D1
DE3877827D1 DE8888108542T DE3877827T DE3877827D1 DE 3877827 D1 DE3877827 D1 DE 3877827D1 DE 8888108542 T DE8888108542 T DE 8888108542T DE 3877827 T DE3877827 T DE 3877827T DE 3877827 D1 DE3877827 D1 DE 3877827D1
Authority
DE
Germany
Prior art keywords
voltage detector
detector
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888108542T
Other languages
English (en)
Other versions
DE3877827T2 (de
Inventor
Shinichiro Aoshima
Yutaka Tsuchiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE3877827D1 publication Critical patent/DE3877827D1/de
Publication of DE3877827T2 publication Critical patent/DE3877827T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE8888108542T 1987-05-30 1988-05-27 Spannungsdetektor. Expired - Fee Related DE3877827T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62137317A JPH0695109B2 (ja) 1987-05-30 1987-05-30 電圧検出装置

Publications (2)

Publication Number Publication Date
DE3877827D1 true DE3877827D1 (de) 1993-03-11
DE3877827T2 DE3877827T2 (de) 1993-05-19

Family

ID=15195857

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888108542T Expired - Fee Related DE3877827T2 (de) 1987-05-30 1988-05-27 Spannungsdetektor.

Country Status (4)

Country Link
US (1) US4920310A (de)
EP (1) EP0293788B1 (de)
JP (1) JPH0695109B2 (de)
DE (1) DE3877827T2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2537364B2 (ja) * 1987-06-10 1996-09-25 浜松ホトニクス株式会社 電圧検出装置
US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
DK0392830T3 (da) * 1989-04-12 1994-10-24 Hamamatsu Photonics Kk Fremgangsmåde og apparat til detektering af spænding
DE3924369A1 (de) * 1989-07-22 1991-01-31 Asea Brown Boveri Verfahren zur messung eines elektrischen feldes oder einer elektrischen spannung und einrichtung zur durchfuehrung des verfahrens
US5185675A (en) * 1989-11-27 1993-02-09 Moog, Inc. Electro optic modulator systems for fiber optic information transmission
US5113131A (en) * 1990-02-16 1992-05-12 Southern California Edison Company Voltage measuring device having electro-optic sensor and compensator
JPH06102295A (ja) * 1992-07-28 1994-04-15 Hewlett Packard Co <Hp> 非接触型プローブおよび非接触電圧測定装置
JPH06265574A (ja) * 1993-03-15 1994-09-22 Hamamatsu Photonics Kk Ｅ−ｏプローブ
DE29707379U1 (de) * 1997-04-24 1997-06-19 Pmk Mess Und Kommunikationstec Gerät zur Messung von Hochspannung an Hochspannungsleitungen
GB2342159B (en) * 1998-09-30 2003-04-09 Ando Electric Electrooptic probe
DE19947996C2 (de) * 1998-10-09 2002-06-20 Ando Electric Elektrooptische Sonde
US6288531B1 (en) * 1999-02-03 2001-09-11 Ando Electric Co., Ltd. Probe for electro-optic sampling oscilloscope
US6337565B1 (en) 1999-03-25 2002-01-08 Ando Electric Co., Ltd. Electro-optic probe
CN102928647B (zh) * 2012-10-29 2016-02-03 易能乾元（北京）电力科技有限公司 光学式电压传感系统及相应迭代解调方法
CN104793035B (zh) * 2015-03-30 2018-04-06 中国电子科技集团公司第三十八研究所 电压传感器及采用该电压传感器测量电压的方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5155273A (en) * 1974-11-09 1976-05-14 Eto Goro Hikarihenseigatakendenki
US4334781A (en) * 1979-06-08 1982-06-15 Tokyo Shibaura Denki Kabushiki Kaisha Optical sensing system
JPS56157872A (en) * 1980-05-10 1981-12-05 Sumitomo Electric Ind Ltd Light-applying voltage and electric field sensor
JPS58137768A (ja) * 1982-02-09 1983-08-16 Mitsubishi Electric Corp 光電圧電界センサ
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4812767A (en) * 1982-04-18 1989-03-14 Susamu Taketomi Optical apparatus using anomalously strong magneto-birefringence of magnetic fluid
JPS5918923A (ja) * 1982-07-23 1984-01-31 Toshiba Corp 複屈折測定装置
JPS59147273A (ja) * 1983-02-14 1984-08-23 Yokogawa Hokushin Electric Corp 電気量測定装置
DE3326755A1 (de) * 1983-07-25 1985-02-07 Rudolf Wanzl Kg, 8874 Leipheim Personendurchgang
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich
JPS62280498A (ja) * 1986-05-27 1987-12-05 石川島播磨重工業株式会社 不透水膜接合装置の制御装置

Also Published As

Publication number Publication date
JPS63300971A (ja) 1988-12-08
DE3877827T2 (de) 1993-05-19
EP0293788A1 (de) 1988-12-07
US4920310A (en) 1990-04-24
EP0293788B1 (de) 1993-01-27
JPH0695109B2 (ja) 1994-11-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee