DE3850918D1 - Spannungsdetektor. - Google Patents

Spannungsdetektor.

Info

Publication number
DE3850918D1
DE3850918D1 DE3850918T DE3850918T DE3850918D1 DE 3850918 D1 DE3850918 D1 DE 3850918D1 DE 3850918 T DE3850918 T DE 3850918T DE 3850918 T DE3850918 T DE 3850918T DE 3850918 D1 DE3850918 D1 DE 3850918D1
Authority
DE
Germany
Prior art keywords
voltage detector
detector
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3850918T
Other languages
English (en)
Other versions
DE3850918T2 (de
Inventor
Shinichiro Aoshima
Yutaka Tsuchiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE3850918D1 publication Critical patent/DE3850918D1/de
Publication of DE3850918T2 publication Critical patent/DE3850918T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
DE3850918T 1987-05-31 1988-05-31 Spannungsdetektor. Expired - Fee Related DE3850918T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62137056A JP2527965B2 (ja) 1987-05-31 1987-05-31 電圧検出装置

Publications (2)

Publication Number Publication Date
DE3850918D1 true DE3850918D1 (de) 1994-09-08
DE3850918T2 DE3850918T2 (de) 1994-12-01

Family

ID=15189852

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3850918T Expired - Fee Related DE3850918T2 (de) 1987-05-31 1988-05-31 Spannungsdetektor.

Country Status (4)

Country Link
US (1) US4841234A (de)
EP (1) EP0293840B1 (de)
JP (1) JP2527965B2 (de)
DE (1) DE3850918T2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
DE3924369A1 (de) * 1989-07-22 1991-01-31 Asea Brown Boveri Verfahren zur messung eines elektrischen feldes oder einer elektrischen spannung und einrichtung zur durchfuehrung des verfahrens
US5036270A (en) * 1989-08-15 1991-07-30 Victor Company Of Japan, Ltd. Apparatus for detecting electrostatic surface potential
US5113131A (en) * 1990-02-16 1992-05-12 Southern California Edison Company Voltage measuring device having electro-optic sensor and compensator
DK108691D0 (da) * 1991-06-07 1991-06-07 Allan Goettsche Maaling af induceret dobbeltbrydning
JPH06102295A (ja) * 1992-07-28 1994-04-15 Hewlett Packard Co <Hp> 非接触型プローブおよび非接触電圧測定装置
US5412330A (en) * 1993-06-16 1995-05-02 Tektronix, Inc. Optical module for an optically based measurement system
KR100243779B1 (ko) * 1993-07-07 2000-02-01 마쯔무라 토미히로 전계센서
JPH08146051A (ja) * 1994-11-21 1996-06-07 Nec Corp Ｅｏプローブ
SE9502257D0 (sv) 1995-06-21 1995-06-21 Asea Brown Boveri High voltage measuring device
DE19634251A1 (de) * 1996-08-26 1998-03-05 Abb Patent Gmbh Spannungswandler
GB2342161B (en) * 1998-09-30 2000-12-20 Ando Electric Electro-optic probe
JP2000221213A (ja) 1998-11-24 2000-08-11 Ando Electric Co Ltd 電気光学プロ―ブ
DE19955978C2 (de) * 1998-11-24 2002-06-27 Ando Electric Elektrooptische Sonde für ein Oszilloskop das eine Signalwellenform mißt
US6388434B1 (en) 2000-01-17 2002-05-14 Bechtel Bwxt Idaho, Llc Electro-optic high voltage sensor
GB2371618B (en) * 2001-01-30 2004-11-17 Teraprobe Ltd A probe, apparatus and method for examining a sample
US6894519B2 (en) * 2002-04-11 2005-05-17 Solid State Measurements, Inc. Apparatus and method for determining electrical properties of a semiconductor wafer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH482200A (de) * 1968-04-23 1969-11-30 Bbc Brown Boveri & Cie Verfahren und Einrichtung zur Messung der zeitlichen Änderung der Feldstärke eines Magnetfeldes
FR2036264A5 (de) * 1969-03-10 1970-12-24 Walter Transformateurs M
JPS5740658A (en) * 1980-08-22 1982-03-06 Meidensha Electric Mfg Co Ltd Measuring apparatus for electric field
JPS58137768A (ja) * 1982-02-09 1983-08-16 Mitsubishi Electric Corp 光電圧電界センサ
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
JPS59106071U (ja) * 1983-01-06 1984-07-17 株式会社明電舎 電界検出装置
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich
JPS61212773A (ja) * 1985-03-18 1986-09-20 Sumitomo Electric Ind Ltd 光センサ

Also Published As

Publication number Publication date
EP0293840B1 (de) 1994-08-03
JP2527965B2 (ja) 1996-08-28
DE3850918T2 (de) 1994-12-01
EP0293840A2 (de) 1988-12-07
US4841234A (en) 1989-06-20
JPS63300970A (ja) 1988-12-08
EP0293840A3 (en) 1990-06-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee