DE60321977D1 - Kunststoffformverfahren zur Verkapselung von elektronischem Bauteil und dafür verwendete Verkapselungs-Kunststoffformeinrichtung - Google Patents
Kunststoffformverfahren zur Verkapselung von elektronischem Bauteil und dafür verwendete Verkapselungs-KunststoffformeinrichtungInfo
- Publication number
- DE60321977D1 DE60321977D1 DE60321977T DE60321977T DE60321977D1 DE 60321977 D1 DE60321977 D1 DE 60321977D1 DE 60321977 T DE60321977 T DE 60321977T DE 60321977 T DE60321977 T DE 60321977T DE 60321977 D1 DE60321977 D1 DE 60321977D1
- Authority
- DE
- Germany
- Prior art keywords
- plastic molding
- encapsulating
- electronic component
- device used
- used therefor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/18—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/56—Coatings, e.g. enameled or galvanised; Releasing, lubricating or separating agents
- B29C33/68—Release sheets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
- H01L21/566—Release layers for moulds, e.g. release layers, layers against residue during moulding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002260894A JP4268389B2 (ja) | 2002-09-06 | 2002-09-06 | 電子部品の樹脂封止成形方法及び装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60321977D1 true DE60321977D1 (de) | 2008-08-14 |
Family
ID=31712334
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60317864T Expired - Lifetime DE60317864D1 (de) | 2002-09-06 | 2003-08-18 | Kunststoffformverfahren zum Einschliessen eines elektronischen Bauteils in Harz und dazu verwendbare Vorrichtung |
DE60321977T Expired - Fee Related DE60321977D1 (de) | 2002-09-06 | 2003-08-18 | Kunststoffformverfahren zur Verkapselung von elektronischem Bauteil und dafür verwendete Verkapselungs-Kunststoffformeinrichtung |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60317864T Expired - Lifetime DE60317864D1 (de) | 2002-09-06 | 2003-08-18 | Kunststoffformverfahren zum Einschliessen eines elektronischen Bauteils in Harz und dazu verwendbare Vorrichtung |
Country Status (6)
Country | Link |
---|---|
US (1) | US6977188B2 (de) |
EP (2) | EP1803539B1 (de) |
JP (1) | JP4268389B2 (de) |
KR (1) | KR100546191B1 (de) |
DE (2) | DE60317864D1 (de) |
TW (1) | TWI235703B (de) |
Families Citing this family (52)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4094515B2 (ja) * | 2003-09-26 | 2008-06-04 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
JP2005150350A (ja) * | 2003-11-14 | 2005-06-09 | Renesas Technology Corp | 半導体装置の製造方法 |
JP4373237B2 (ja) * | 2004-02-13 | 2009-11-25 | Towa株式会社 | 半導体チップの樹脂封止成形方法および樹脂封止成形用金型 |
JP5004410B2 (ja) | 2004-04-26 | 2012-08-22 | Towa株式会社 | 光素子の樹脂封止成形方法および樹脂封止成形装置 |
JP5128047B2 (ja) | 2004-10-07 | 2013-01-23 | Towa株式会社 | 光デバイス及び光デバイスの生産方法 |
JP4508839B2 (ja) * | 2004-11-12 | 2010-07-21 | パナソニック株式会社 | 樹脂封止金型および樹脂封止装置 |
US7344902B2 (en) * | 2004-11-15 | 2008-03-18 | Philips Lumileds Lighting Company, Llc | Overmolded lens over LED die |
US7452737B2 (en) * | 2004-11-15 | 2008-11-18 | Philips Lumileds Lighting Company, Llc | Molded lens over LED die |
US7858408B2 (en) * | 2004-11-15 | 2010-12-28 | Koninklijke Philips Electronics N.V. | LED with phosphor tile and overmolded phosphor in lens |
WO2006129343A1 (ja) | 2005-05-30 | 2006-12-07 | Spansion Llc | 半導体装置の製造装置及び半導体装置の製造方法 |
JP4587881B2 (ja) * | 2005-06-10 | 2010-11-24 | サンユレック株式会社 | 樹脂封止装置 |
US7985357B2 (en) * | 2005-07-12 | 2011-07-26 | Towa Corporation | Method of resin-sealing and molding an optical device |
JP2007109831A (ja) * | 2005-10-13 | 2007-04-26 | Towa Corp | 電子部品の樹脂封止成形方法 |
US7595515B2 (en) * | 2005-10-24 | 2009-09-29 | 3M Innovative Properties Company | Method of making light emitting device having a molded encapsulant |
CN101297411B (zh) * | 2005-10-24 | 2010-05-19 | 3M创新有限公司 | 发光器件的制造方法及发光器件 |
JP4741383B2 (ja) * | 2006-02-17 | 2011-08-03 | 富士通セミコンダクター株式会社 | 電子部品の樹脂封止方法 |
US8092735B2 (en) | 2006-08-17 | 2012-01-10 | 3M Innovative Properties Company | Method of making a light emitting device having a molded encapsulant |
JP4858966B2 (ja) * | 2006-11-02 | 2012-01-18 | Towa株式会社 | 電子部品の圧縮成形方法及び成形装置 |
EP2111651A4 (de) * | 2007-02-13 | 2011-08-17 | 3M Innovative Properties Co | Led mit linsen und verfahren zu ihrer herstellung |
JP5036372B2 (ja) * | 2007-04-02 | 2012-09-26 | Towa株式会社 | 光電子部品および光電子部品の製造方法 |
US7915089B2 (en) * | 2007-04-10 | 2011-03-29 | Infineon Technologies Ag | Encapsulation method |
KR101132136B1 (ko) * | 2007-08-03 | 2012-04-03 | 스미도모쥬기가이고교 가부시키가이샤 | 피성형품의 낙하 방지 기구 |
JP2009124012A (ja) * | 2007-11-16 | 2009-06-04 | Towa Corp | 電子部品の圧縮成形方法及び金型 |
JP4553944B2 (ja) * | 2008-01-10 | 2010-09-29 | アピックヤマダ株式会社 | 樹脂モールド方法および樹脂モールド装置 |
KR100980299B1 (ko) | 2008-02-27 | 2010-09-06 | 세크론 주식회사 | 전자 부품 몰딩 장치 |
US7875967B2 (en) * | 2008-03-10 | 2011-01-25 | Stats Chippac Ltd. | Integrated circuit with step molded inner stacking module package in package system |
JP5153509B2 (ja) * | 2008-08-08 | 2013-02-27 | Towa株式会社 | 電子部品の圧縮成形方法及び金型装置 |
US20100120199A1 (en) * | 2008-11-07 | 2010-05-13 | Bok Sim Lim | Stacked package-on-package semiconductor device and methods of fabricating thereof |
WO2010146860A1 (ja) * | 2009-06-17 | 2010-12-23 | パナソニック株式会社 | 樹脂モールド型電子部品の製造方法 |
KR101101669B1 (ko) | 2009-12-01 | 2011-12-30 | 삼성전기주식회사 | 전자부품 제조장치 및 전자부품 제조방법 |
US8771577B2 (en) * | 2010-02-16 | 2014-07-08 | Koninklijke Philips N.V. | Light emitting device with molded wavelength converting layer |
WO2011105640A1 (ko) * | 2010-02-25 | 2011-09-01 | 한미반도체 주식회사 | 압축 성형장치 및 압축 성형방법 |
WO2011105639A1 (ko) * | 2010-02-25 | 2011-09-01 | 한미반도체 주식회사 | 압축 성형 장치 및 방법 |
JP5576197B2 (ja) * | 2010-07-08 | 2014-08-20 | Towa株式会社 | 電子部品の圧縮成形方法及び成形装置 |
KR101052324B1 (ko) | 2011-03-23 | 2011-07-27 | 신한다이아몬드공업 주식회사 | 봉지재 성형 방법 |
JP5403012B2 (ja) * | 2011-08-11 | 2014-01-29 | 第一精工株式会社 | 樹脂封止装置 |
DE102011081083A1 (de) * | 2011-08-17 | 2013-02-21 | Osram Ag | Presswerkzeug und verfahren zum pressen eines silikonelements |
US9159643B2 (en) | 2012-09-14 | 2015-10-13 | Freescale Semiconductor, Inc. | Matrix lid heatspreader for flip chip package |
US8921994B2 (en) | 2012-09-14 | 2014-12-30 | Freescale Semiconductor, Inc. | Thermally enhanced package with lid heat spreader |
JP5786918B2 (ja) * | 2013-10-23 | 2015-09-30 | 第一精工株式会社 | 樹脂封止金型およびこれを用いた樹脂封止装置、樹脂封止方法 |
JP6057880B2 (ja) * | 2013-11-28 | 2017-01-11 | Towa株式会社 | 圧縮成形装置の樹脂材料供給方法及び供給装置 |
JP6143665B2 (ja) * | 2013-12-26 | 2017-06-07 | Towa株式会社 | 半導体封止方法及び半導体封止装置 |
KR102335853B1 (ko) * | 2014-01-14 | 2021-12-07 | 아피쿠 야마다 가부시키가이샤 | 수지 몰드 금형 및 수지 몰드 방법 |
JP6270571B2 (ja) * | 2014-03-19 | 2018-01-31 | Towa株式会社 | シート樹脂の供給方法と半導体封止方法及び半導体封止装置 |
NL2013978B1 (en) * | 2014-12-15 | 2016-10-11 | Besi Netherlands Bv | Device and method for controlled moulding and degating of a carrier with electronic components and moulded product. |
JP6304517B1 (ja) * | 2017-02-14 | 2018-04-04 | 第一精工株式会社 | 樹脂封止方法及び樹脂封止装置 |
CN108448012A (zh) * | 2018-03-01 | 2018-08-24 | 佛山市国星光电股份有限公司 | 全彩led显示模组及其封装方法和显示屏 |
JP6994445B2 (ja) * | 2018-08-31 | 2022-01-14 | Towa株式会社 | 樹脂成形装置、離型フィルムの剥離方法、樹脂成形品の製造方法 |
JP7018377B2 (ja) * | 2018-11-26 | 2022-02-10 | Towa株式会社 | 成形型、樹脂成形装置、樹脂成形品の製造方法 |
JP7134926B2 (ja) * | 2019-07-10 | 2022-09-12 | Towa株式会社 | 樹脂成形装置、及び樹脂成形品の製造方法 |
CN112873810A (zh) * | 2019-11-29 | 2021-06-01 | 复盛应用科技股份有限公司 | 高尔夫球杆头盖片制造方法及模具 |
TWI740322B (zh) * | 2019-12-25 | 2021-09-21 | 明安國際企業股份有限公司 | 具有碳纖維板之高爾夫球桿頭及其製造方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1110846C (zh) | 1996-07-12 | 2003-06-04 | 富士通株式会社 | 半导体装置的制造方法 |
JP3282988B2 (ja) * | 1997-05-01 | 2002-05-20 | アピックヤマダ株式会社 | 樹脂モールド方法及び樹脂モールド装置 |
JP3490606B2 (ja) | 1998-03-20 | 2004-01-26 | 富士通株式会社 | 半導体装置製造用金型 |
-
2002
- 2002-09-06 JP JP2002260894A patent/JP4268389B2/ja not_active Expired - Fee Related
-
2003
- 2003-08-15 TW TW092122493A patent/TWI235703B/zh not_active IP Right Cessation
- 2003-08-15 US US10/641,606 patent/US6977188B2/en not_active Expired - Fee Related
- 2003-08-18 EP EP07006851A patent/EP1803539B1/de not_active Expired - Fee Related
- 2003-08-18 DE DE60317864T patent/DE60317864D1/de not_active Expired - Lifetime
- 2003-08-18 DE DE60321977T patent/DE60321977D1/de not_active Expired - Fee Related
- 2003-08-18 EP EP03018539A patent/EP1396323B1/de not_active Expired - Fee Related
- 2003-08-22 KR KR1020030058173A patent/KR100546191B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
TWI235703B (en) | 2005-07-11 |
EP1803539B1 (de) | 2008-07-02 |
JP4268389B2 (ja) | 2009-05-27 |
TW200406293A (en) | 2004-05-01 |
KR100546191B1 (ko) | 2006-01-24 |
EP1396323B1 (de) | 2007-12-05 |
JP2004098364A (ja) | 2004-04-02 |
EP1396323A1 (de) | 2004-03-10 |
US20040048416A1 (en) | 2004-03-11 |
DE60317864D1 (de) | 2008-01-17 |
EP1803539A1 (de) | 2007-07-04 |
KR20040022152A (ko) | 2004-03-11 |
US6977188B2 (en) | 2005-12-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8339 | Ceased/non-payment of the annual fee |