DE60314287D1 - Nichtflüchtiger speicher und schreibverfahren dafür - Google Patents

Nichtflüchtiger speicher und schreibverfahren dafür

Info

Publication number
DE60314287D1
DE60314287D1 DE60314287T DE60314287T DE60314287D1 DE 60314287 D1 DE60314287 D1 DE 60314287D1 DE 60314287 T DE60314287 T DE 60314287T DE 60314287 T DE60314287 T DE 60314287T DE 60314287 D1 DE60314287 D1 DE 60314287D1
Authority
DE
Germany
Prior art keywords
volatile memory
writing procedure
procedure therefor
therefor
writing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60314287T
Other languages
English (en)
Other versions
DE60314287T2 (de
Inventor
Takaaki Furuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of DE60314287D1 publication Critical patent/DE60314287D1/de
Application granted granted Critical
Publication of DE60314287T2 publication Critical patent/DE60314287T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/02—Structural aspects of erasable programmable read-only memories
    • G11C2216/10—Floating gate memory cells with a single polysilicon layer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/14—Circuits or methods to write a page or sector of information simultaneously into a nonvolatile memory, typically a complete row or word line in flash memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/16—Flash programming of all the cells in an array, sector or block simultaneously

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
DE60314287T 2002-12-20 2003-12-17 Nichtflüchtiger speicher und schreibverfahren dafür Expired - Lifetime DE60314287T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002370278 2002-12-20
JP2002370278A JP3914869B2 (ja) 2002-12-20 2002-12-20 不揮発性メモリ及びその書き換え方法
PCT/JP2003/016157 WO2004057623A1 (ja) 2002-12-20 2003-12-17 不揮発性メモリ及びその書き込み方法

Publications (2)

Publication Number Publication Date
DE60314287D1 true DE60314287D1 (de) 2007-07-19
DE60314287T2 DE60314287T2 (de) 2008-01-31

Family

ID=32677160

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60314287T Expired - Lifetime DE60314287T2 (de) 2002-12-20 2003-12-17 Nichtflüchtiger speicher und schreibverfahren dafür

Country Status (7)

Country Link
US (1) US7212443B2 (de)
EP (1) EP1575056B1 (de)
JP (1) JP3914869B2 (de)
KR (1) KR100757290B1 (de)
CN (1) CN1692450B (de)
DE (1) DE60314287T2 (de)
WO (1) WO2004057623A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITMI20042462A1 (it) * 2004-12-23 2005-03-23 St Microelectronics Srl Memoria ausiliare
US7471570B2 (en) * 2005-09-19 2008-12-30 Texas Instruments Incorporated Embedded EEPROM array techniques for higher density
KR100856292B1 (ko) * 2006-09-29 2008-09-03 주식회사 하이닉스반도체 플래시 메모리 소자 및 프로그램 방법
US8320191B2 (en) 2007-08-30 2012-11-27 Infineon Technologies Ag Memory cell arrangement, method for controlling a memory cell, memory array and electronic device
JP5367977B2 (ja) * 2007-12-12 2013-12-11 セイコーインスツル株式会社 不揮発性半導体記憶装置およびその書き込み方法と読み出し方法
JP5136328B2 (ja) 2008-09-26 2013-02-06 富士通セミコンダクター株式会社 半導体メモリ、半導体メモリの動作方法およびシステム
KR101083302B1 (ko) * 2009-05-13 2011-11-15 주식회사 하이닉스반도체 반도체 메모리 장치
TWI445051B (zh) * 2011-06-28 2014-07-11 Univ Nat Chiao Tung 半導體裝置及其操作方法與應用電路
JP5556873B2 (ja) * 2012-10-19 2014-07-23 株式会社フローディア 不揮発性半導体記憶装置
CN107993685A (zh) * 2018-01-12 2018-05-04 厦门理工学院 一种用于阻变存储器的双参考源的自调谐写驱动电路
US10971213B1 (en) * 2019-09-24 2021-04-06 Macronix International Co., Ltd. Data sensing device and data sensing method thereof
JP2021064731A (ja) * 2019-10-16 2021-04-22 キオクシア株式会社 半導体記憶装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6276098A (ja) * 1985-09-30 1987-04-08 Toshiba Corp センスアンプ回路
US5844842A (en) * 1989-02-06 1998-12-01 Hitachi, Ltd. Nonvolatile semiconductor memory device
JPH05342892A (ja) 1992-06-09 1993-12-24 Fujitsu Ltd 不揮発性半導体記憶装置
JPH0612884A (ja) * 1992-06-30 1994-01-21 Nec Corp 連想記憶装置
US5418743A (en) * 1992-12-07 1995-05-23 Nippon Steel Corporation Method of writing into non-volatile semiconductor memory
JPH06251594A (ja) 1993-03-02 1994-09-09 Oki Micro Design Miyazaki:Kk 半導体記憶装置
JPH07201191A (ja) * 1993-12-28 1995-08-04 Toshiba Corp 不揮発性半導体メモリ装置
JP3739102B2 (ja) * 1994-07-07 2006-01-25 富士通株式会社 不揮発性半導体記憶装置
JP3610621B2 (ja) * 1994-11-11 2005-01-19 ソニー株式会社 不揮発性半導体メモリ装置
JPH08190796A (ja) * 1995-01-09 1996-07-23 Mitsubishi Denki Semiconductor Software Kk データリフレッシュ機能を有するフラッシュメモリ及びフラッシュメモリのデータリフレッシュ方法
JP3204119B2 (ja) * 1996-09-30 2001-09-04 日本電気株式会社 不揮発性半導体メモリおよびそのデータ書込方法
JP3378879B2 (ja) 1997-12-10 2003-02-17 松下電器産業株式会社 不揮発性半導体記憶装置及びその駆動方法
KR100386611B1 (ko) * 2000-05-08 2003-06-02 주식회사 하이닉스반도체 플래쉬 메모리 셀의 어레이와 그를 이용한 데이터프로그램방법과 소거방법
JP2003124362A (ja) * 2001-10-18 2003-04-25 Matsushita Electric Ind Co Ltd 不揮発性半導体記憶装置およびその駆動方法

Also Published As

Publication number Publication date
CN1692450A (zh) 2005-11-02
US7212443B2 (en) 2007-05-01
WO2004057623A1 (ja) 2004-07-08
EP1575056B1 (de) 2007-06-06
JP3914869B2 (ja) 2007-05-16
EP1575056A1 (de) 2005-09-14
JP2004199837A (ja) 2004-07-15
US20050141277A1 (en) 2005-06-30
KR100757290B1 (ko) 2007-09-11
DE60314287T2 (de) 2008-01-31
KR20050084562A (ko) 2005-08-26
CN1692450B (zh) 2011-07-27
EP1575056A4 (de) 2006-06-07

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Legal Events

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