DE3149101C2 - - Google Patents
Info
- Publication number
- DE3149101C2 DE3149101C2 DE3149101A DE3149101A DE3149101C2 DE 3149101 C2 DE3149101 C2 DE 3149101C2 DE 3149101 A DE3149101 A DE 3149101A DE 3149101 A DE3149101 A DE 3149101A DE 3149101 C2 DE3149101 C2 DE 3149101C2
- Authority
- DE
- Germany
- Prior art keywords
- layer
- effect transistor
- field effect
- transistor according
- gate electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims description 45
- 230000005669 field effect Effects 0.000 claims description 21
- 230000015556 catabolic process Effects 0.000 claims description 19
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 14
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 14
- 239000002800 charge carrier Substances 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 10
- 229910052710 silicon Inorganic materials 0.000 claims description 10
- 239000010703 silicon Substances 0.000 claims description 10
- 230000005684 electric field Effects 0.000 claims description 9
- 239000000969 carrier Substances 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 6
- 230000001419 dependent effect Effects 0.000 claims 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 9
- 238000005468 ion implantation Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 230000007704 transition Effects 0.000 description 7
- 238000002513 implantation Methods 0.000 description 6
- -1 arsenic ions Chemical class 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000000370 acceptor Substances 0.000 description 2
- 229910052785 arsenic Inorganic materials 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 230000005641 tunneling Effects 0.000 description 2
- ZXEYZECDXFPJRJ-UHFFFAOYSA-N $l^{3}-silane;platinum Chemical compound [SiH3].[Pt] ZXEYZECDXFPJRJ-UHFFFAOYSA-N 0.000 description 1
- MBGCACIOPCILDG-UHFFFAOYSA-N [Ni].[Ge].[Au] Chemical compound [Ni].[Ge].[Au] MBGCACIOPCILDG-UHFFFAOYSA-N 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- YXTPWUNVHCYOSP-UHFFFAOYSA-N bis($l^{2}-silanylidene)molybdenum Chemical compound [Si]=[Mo]=[Si] YXTPWUNVHCYOSP-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 229910021344 molybdenum silicide Inorganic materials 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910021339 platinum silicide Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/80—Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
- H01L29/812—Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with a Schottky gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1025—Channel region of field-effect devices
- H01L29/1029—Channel region of field-effect devices of field-effect transistors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB8040795A GB2090053B (en) | 1980-12-19 | 1980-12-19 | Mesfet |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3149101A1 DE3149101A1 (de) | 1982-07-29 |
| DE3149101C2 true DE3149101C2 (US06582424-20030624-M00016.png) | 1992-12-17 |
Family
ID=10518113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19813149101 Granted DE3149101A1 (de) | 1980-12-19 | 1981-12-11 | "schottky-uebergangs-feldeffekttransistor" |
Country Status (6)
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4783688A (en) * | 1981-12-02 | 1988-11-08 | U.S. Philips Corporation | Schottky barrier field effect transistors |
| JPH0669101B2 (ja) * | 1983-08-25 | 1994-08-31 | 松下電子工業株式会社 | 半導体装置の製造方法 |
| EP0178133B1 (en) * | 1984-10-08 | 1990-12-27 | Fujitsu Limited | Semiconductor integrated circuit device |
| JP2604349B2 (ja) * | 1984-12-12 | 1997-04-30 | 日本電気株式会社 | 半導体装置 |
| GB2172744B (en) * | 1985-03-23 | 1989-07-19 | Stc Plc | Semiconductor devices |
| WO1989001235A1 (en) * | 1987-08-03 | 1989-02-09 | Ford Microelectronics, Inc. | High effective barrier height transistor and method of making same |
| JPH01132170A (ja) * | 1987-11-18 | 1989-05-24 | Toshiba Corp | 電界効果トランジスタ |
| JPH01187837A (ja) * | 1988-01-22 | 1989-07-27 | Agency Of Ind Science & Technol | 半導体集積回路 |
| JPH02122027U (US06582424-20030624-M00016.png) * | 1989-03-17 | 1990-10-04 | ||
| EP0700515B1 (en) * | 1993-05-28 | 2000-09-06 | Millennium Venture Holdings Ltd. | An automatic inspection apparatus |
| JP3102783B2 (ja) * | 1998-02-11 | 2000-10-23 | 三星電子株式会社 | 外部電界を利用して電子放出を活性化させた冷陰極電子放出素子 |
| JP2005150190A (ja) * | 2003-11-12 | 2005-06-09 | Mitsubishi Electric Corp | 電界効果トランジスタ |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US28500A (en) * | 1860-05-29 | Feathebs | ||
| GB1459231A (en) * | 1973-06-26 | 1976-12-22 | Mullard Ltd | Semiconductor devices |
| GB1507091A (en) * | 1974-03-29 | 1978-04-12 | Siemens Ag | Schottky-gate field-effect transistors |
| US3964084A (en) * | 1974-06-12 | 1976-06-15 | Bell Telephone Laboratories, Incorporated | Schottky barrier diode contacts |
| US4156879A (en) * | 1977-02-07 | 1979-05-29 | Hughes Aircraft Company | Passivated V-gate GaAs field-effect transistor |
| JPS53105984A (en) * | 1977-02-28 | 1978-09-14 | Nec Corp | Semiconductor device |
| JPS5457969A (en) * | 1977-10-18 | 1979-05-10 | Sony Corp | Electric field effect transistor |
| CA1131801A (en) * | 1978-01-18 | 1982-09-14 | Johannes A. Appels | Semiconductor device |
| US4193079A (en) * | 1978-01-30 | 1980-03-11 | Xerox Corporation | MESFET with non-uniform doping |
| JPS55153378A (en) * | 1979-05-18 | 1980-11-29 | Matsushita Electronics Corp | Field effect transistor |
| NL187415C (nl) * | 1980-09-08 | 1991-09-16 | Philips Nv | Halfgeleiderinrichting met gereduceerde oppervlakteveldsterkte. |
-
1980
- 1980-12-19 GB GB8040795A patent/GB2090053B/en not_active Expired
-
1981
- 1981-12-02 US US06/326,467 patent/US4486766A/en not_active Expired - Fee Related
- 1981-12-11 DE DE19813149101 patent/DE3149101A1/de active Granted
- 1981-12-17 CA CA000392537A patent/CA1171553A/en not_active Expired
- 1981-12-18 FR FR8123711A patent/FR2496990A1/fr active Granted
- 1981-12-19 JP JP56204550A patent/JPS57128980A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| GB2090053A (en) | 1982-06-30 |
| CA1171553A (en) | 1984-07-24 |
| US4486766A (en) | 1984-12-04 |
| FR2496990A1 (fr) | 1982-06-25 |
| FR2496990B1 (US06582424-20030624-M00016.png) | 1984-02-10 |
| JPS57128980A (en) | 1982-08-10 |
| JPH0137857B2 (US06582424-20030624-M00016.png) | 1989-08-09 |
| DE3149101A1 (de) | 1982-07-29 |
| GB2090053B (en) | 1984-09-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| 8128 | New person/name/address of the agent |
Representative=s name: KUNZE, K., DIPL.-ING., PAT.-ASS., 2000 HAMBURG |
|
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL |
|
| 8339 | Ceased/non-payment of the annual fee |