DE2724646A1 - Halbleiterspeicheranordnung - Google Patents

Halbleiterspeicheranordnung

Info

Publication number
DE2724646A1
DE2724646A1 DE19772724646 DE2724646A DE2724646A1 DE 2724646 A1 DE2724646 A1 DE 2724646A1 DE 19772724646 DE19772724646 DE 19772724646 DE 2724646 A DE2724646 A DE 2724646A DE 2724646 A1 DE2724646 A1 DE 2724646A1
Authority
DE
Germany
Prior art keywords
transistor
transistors
node
circuit
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19772724646
Other languages
German (de)
English (en)
Other versions
DE2724646C2 (ru
Inventor
Norihisa Kitagawa
Hugh P Mcadams
Donald J Redwine
Jun Lionel Stewart White
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/691,735 external-priority patent/US4081701A/en
Priority claimed from US05/716,907 external-priority patent/US4072932A/en
Priority claimed from US05/716,843 external-priority patent/US4077031A/en
Priority claimed from US05/748,790 external-priority patent/US4110639A/en
Priority claimed from US05/756,921 external-priority patent/US4144590A/en
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Priority to DE2760461A priority Critical patent/DE2760461C2/de
Priority to DE2760462A priority patent/DE2760462C2/de
Publication of DE2724646A1 publication Critical patent/DE2724646A1/de
Application granted granted Critical
Publication of DE2724646C2 publication Critical patent/DE2724646C2/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4093Input/output [I/O] data interface arrangements, e.g. data buffers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4091Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)
  • Dram (AREA)
DE19772724646 1976-06-01 1977-06-01 Halbleiterspeicheranordnung Granted DE2724646A1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE2760461A DE2760461C2 (de) 1976-06-01 1977-06-01 Schaltungsanordnung für einen Halbleiterspeicher
DE2760462A DE2760462C2 (de) 1976-06-01 1977-06-01 Halbleiterspeicheranordnung

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US69173476A 1976-06-01 1976-06-01
US05/691,735 US4081701A (en) 1976-06-01 1976-06-01 High speed sense amplifier for MOS random access memory
US05/716,907 US4072932A (en) 1976-08-23 1976-08-23 Clock generator for semiconductor memory
US05/716,843 US4077031A (en) 1976-08-23 1976-08-23 High speed address buffer for semiconductor memory
US05/748,790 US4110639A (en) 1976-12-09 1976-12-09 Address buffer circuit for high speed semiconductor memory
US75180476A 1976-12-16 1976-12-16
US05/756,921 US4144590A (en) 1976-12-29 1976-12-29 Intermediate output buffer circuit for semiconductor memory device

Publications (2)

Publication Number Publication Date
DE2724646A1 true DE2724646A1 (de) 1977-12-15
DE2724646C2 DE2724646C2 (ru) 1989-07-27

Family

ID=27569886

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19772724646 Granted DE2724646A1 (de) 1976-06-01 1977-06-01 Halbleiterspeicheranordnung

Country Status (2)

Country Link
JP (1) JPS5810799B2 (ru)
DE (1) DE2724646A1 (ru)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2912320A1 (de) * 1978-04-03 1979-10-04 Rockwell International Corp Cmos-speicher-abfuehlverstaerker
EP0010907A1 (en) * 1978-10-26 1980-05-14 Fujitsu Limited Semiconductor memory device including a flip-flop circuit
EP0012802A1 (de) * 1978-12-20 1980-07-09 International Business Machines Corporation Dynamischer Halbleiterspeicher

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53120237A (en) * 1977-03-29 1978-10-20 Mitsubishi Electric Corp Semiconductor amplifier circuit
JPS53120238A (en) * 1977-03-29 1978-10-20 Mitsubishi Electric Corp Semiconductor amplifier
JPS54158828A (en) * 1978-06-06 1979-12-15 Toshiba Corp Dynamic type semiconductor memory device
JPS5712484A (en) * 1980-06-26 1982-01-22 Mitsubishi Electric Corp Differential amplifier
JPS61110399A (ja) * 1984-11-05 1986-05-28 Toshiba Corp ダイナミツクメモリのデ−タ出力回路
JPH03228282A (ja) * 1990-10-26 1991-10-09 Hitachi Ltd 半導体メモリ

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2324769A1 (de) 1972-05-16 1973-12-06 Nippon Electric Co Speicherschaltung
US3838404A (en) * 1973-05-17 1974-09-24 Teletype Corp Random access memory system and cell
US3879621A (en) * 1973-04-18 1975-04-22 Ibm Sense amplifier
US3940747A (en) * 1973-08-02 1976-02-24 Texas Instruments Incorporated High density, high speed random access read-write memory
US3959781A (en) 1974-11-04 1976-05-25 Intel Corporation Semiconductor random access memory

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3838295A (en) * 1973-02-05 1974-09-24 Lockheed Electronics Co Ratioless mos sense amplifier
JPS592118B2 (ja) * 1976-04-09 1984-01-17 日本電気株式会社 増巾回路
US4028557A (en) * 1976-05-21 1977-06-07 Bell Telephone Laboratories, Incorporated Dynamic sense-refresh detector amplifier

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2324769A1 (de) 1972-05-16 1973-12-06 Nippon Electric Co Speicherschaltung
US3879621A (en) * 1973-04-18 1975-04-22 Ibm Sense amplifier
US3838404A (en) * 1973-05-17 1974-09-24 Teletype Corp Random access memory system and cell
US3940747A (en) * 1973-08-02 1976-02-24 Texas Instruments Incorporated High density, high speed random access read-write memory
US3959781A (en) 1974-11-04 1976-05-25 Intel Corporation Semiconductor random access memory

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
IBM Technical Disclosure Bulletin, Vol. 17, No. 9, Februar 1975, S. 2582,2583
US-Z.: IBM Technical Disclosure Bulletin, Vol. 18, No. 4, September 1975, S. 1021-1022 *
US-Z.: IEEE Journal of Solid-State Circuits, Vol. SC-10, No. 5, Oktober 1975, S. 255-257 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2912320A1 (de) * 1978-04-03 1979-10-04 Rockwell International Corp Cmos-speicher-abfuehlverstaerker
EP0010907A1 (en) * 1978-10-26 1980-05-14 Fujitsu Limited Semiconductor memory device including a flip-flop circuit
EP0012802A1 (de) * 1978-12-20 1980-07-09 International Business Machines Corporation Dynamischer Halbleiterspeicher

Also Published As

Publication number Publication date
JPS5316537A (en) 1978-02-15
DE2724646C2 (ru) 1989-07-27
JPS5810799B2 (ja) 1983-02-28

Similar Documents

Publication Publication Date Title
DE2324965C3 (de) Schaltungsanordnung zum Auslesen eines kapazitiven Datenspeichers
DE2650479C2 (de) Speicheranordnung mit Ladungsspeicherzellen
DE4128918C2 (de) Leseverstärker für nichtflüchtige Halbleiterspeichereinrichtungen
EP0387379B1 (de) Integrierter Halbleiterspeicher vom Typ DRAM und Verfahren zu seinem Testen
DE2712735C2 (ru)
DE2919166A1 (de) Speichervorrichtung
DE69119208T2 (de) Halbleiter-Speichereinrichtung mit Möglichkeit zum direkten Einlesen des Potentials von Bit-Lines
DE69123409T2 (de) Halbleiterspeicherschaltung
DE2901233A1 (de) Dynamischer lese-auffrischdetektor
DE69222606T2 (de) Bitleitungs- und Gegenplattenfesthaltungsschaltung, insbesondere für DRAM
DE3781193T2 (de) Leseverstaerker.
DE2647892A1 (de) Eingabepufferschaltung
DE3236729C2 (ru)
DE69115075T2 (de) CMOS-Vorladungs- und Ausgleichsschaltung.
DE4108996C2 (de) Halbleiterspeichereinrichtung
DE4324649A1 (de) Verstärkerschaltung und Halbleiterspeichervorrichtung, die diesen benutzt
DE2724646A1 (de) Halbleiterspeicheranordnung
DE3710821A1 (de) Halbleiterspeichereinrichtung
DE2431079C3 (de) Dynamischer Halbleiterspeicher mit Zwei-Transistor-Speicherelementen
DE102007034878A1 (de) Beschleunigtes Single-Ended-Lesen für eine Speicherschaltung
DE19844101A1 (de) Schaltungsanordnung zur Generierung einer Referenzspannung für das Auslesen eines ferroelektrischen Speichers
DE4135686A1 (de) Halbleiter-speicheranordnung
DE69836183T2 (de) Selbstgetakteter sekundärer Abfühlverstärker mit Fensterdiskriminator
DE2935121C2 (ru)
DE3826418C2 (ru)

Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8128 New person/name/address of the agent

Representative=s name: PRINZ, E., DIPL.-ING. LEISER, G., DIPL.-ING., PAT.

8172 Supplementary division/partition in:

Ref country code: DE

Ref document number: 2760461

Format of ref document f/p: P

Q171 Divided out to:

Ref country code: DE

Ref document number: 2760461

8172 Supplementary division/partition in:

Ref country code: DE

Ref document number: 2760462

Format of ref document f/p: P

Q171 Divided out to:

Ref country code: DE

Ref document number: 2760462

AH Division in

Ref country code: DE

Ref document number: 2760462

Format of ref document f/p: P

Ref country code: DE

Ref document number: 2760461

Format of ref document f/p: P

D2 Grant after examination
8364 No opposition during term of opposition
AH Division in

Ref country code: DE

Ref document number: 2760461

Format of ref document f/p: P

AH Division in

Ref country code: DE

Ref document number: 2760462

Format of ref document f/p: P