DE102006006048B4 - Testgerät und Testverfahren - Google Patents
Testgerät und Testverfahren Download PDFInfo
- Publication number
- DE102006006048B4 DE102006006048B4 DE102006006048A DE102006006048A DE102006006048B4 DE 102006006048 B4 DE102006006048 B4 DE 102006006048B4 DE 102006006048 A DE102006006048 A DE 102006006048A DE 102006006048 A DE102006006048 A DE 102006006048A DE 102006006048 B4 DE102006006048 B4 DE 102006006048B4
- Authority
- DE
- Germany
- Prior art keywords
- test
- jitter
- pin
- signal
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 223
- 238000010998 test method Methods 0.000 title claims description 15
- 238000002347 injection Methods 0.000 claims abstract description 77
- 239000007924 injection Substances 0.000 claims abstract description 77
- 230000005540 biological transmission Effects 0.000 claims abstract description 45
- 238000004891 communication Methods 0.000 claims description 5
- 230000008054 signal transmission Effects 0.000 claims description 2
- 230000001276 controlling effect Effects 0.000 description 22
- 238000001228 spectrum Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 7
- 230000000630 rising effect Effects 0.000 description 4
- 101150071746 Pbsn gene Proteins 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 230000003750 conditioning effect Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 101100518972 Caenorhabditis elegans pat-6 gene Proteins 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/31709—Jitter measurements; Jitter generators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31716—Testing of input or output with loop-back
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/056,330 US7313496B2 (en) | 2005-02-11 | 2005-02-11 | Test apparatus and test method for testing a device under test |
| US11/056,330 | 2005-02-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE102006006048A1 DE102006006048A1 (de) | 2006-08-24 |
| DE102006006048B4 true DE102006006048B4 (de) | 2008-05-15 |
Family
ID=36776383
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102006006048A Expired - Fee Related DE102006006048B4 (de) | 2005-02-11 | 2006-02-09 | Testgerät und Testverfahren |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7313496B2 (https=) |
| JP (1) | JP4861717B2 (https=) |
| DE (1) | DE102006006048B4 (https=) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7496137B2 (en) * | 2005-05-25 | 2009-02-24 | Advantest Corporation | Apparatus for measuring jitter and method of measuring jitter |
| US7277805B2 (en) * | 2006-01-06 | 2007-10-02 | International Business Machines Corporation | Jitter measurements for repetitive clock signals |
| JP5025638B2 (ja) * | 2006-04-19 | 2012-09-12 | 株式会社アドバンテスト | 信号出力装置、試験装置、およびプログラム |
| US7936809B2 (en) * | 2006-07-11 | 2011-05-03 | Altera Corporation | Economical, scalable transceiver jitter test |
| JP2008116420A (ja) * | 2006-11-08 | 2008-05-22 | Yokogawa Electric Corp | 試験用モジュール |
| CN101657731B (zh) * | 2007-04-24 | 2012-10-10 | 爱德万测试株式会社 | 测试装置及测试方法 |
| US7991046B2 (en) * | 2007-05-18 | 2011-08-02 | Teradyne, Inc. | Calibrating jitter |
| US7797121B2 (en) * | 2007-06-07 | 2010-09-14 | Advantest Corporation | Test apparatus, and device for calibration |
| US8090009B2 (en) * | 2007-08-07 | 2012-01-03 | Advantest Corporation | Test apparatus |
| US20090138761A1 (en) * | 2007-11-28 | 2009-05-28 | Jose Moreira | System and method for electronic testing of devices |
| KR100960118B1 (ko) * | 2007-12-17 | 2010-05-27 | 한국전자통신연구원 | 클럭 지터 발생 장치 및 이를 포함하는 시험 장치 |
| JP5228481B2 (ja) | 2007-12-28 | 2013-07-03 | 富士通株式会社 | 半導体装置に対する同時動作信号ノイズに基づいてジッタを見積る方法、その見積りに使用する同時動作信号ノイズ量対ジッタ量相関関係を算出する方法、それらを実現するプログラム、及び半導体装置及びそれが搭載されたプリント回路基板の設計方法 |
| JP5012663B2 (ja) * | 2008-05-27 | 2012-08-29 | 富士通株式会社 | 回路シミュレーション装置、回路シミュレーションプログラム、回路シミュレーション方法 |
| US8466700B2 (en) * | 2009-03-18 | 2013-06-18 | Infineon Technologies Ag | System that measures characteristics of output signal |
| JP5735755B2 (ja) * | 2010-05-17 | 2015-06-17 | 株式会社アドバンテスト | 試験装置及び試験方法 |
| US20120194206A1 (en) * | 2011-01-28 | 2012-08-02 | Advantest Corporation | Measuring Apparatus |
| JP5394435B2 (ja) * | 2011-05-13 | 2014-01-22 | 株式会社アドバンテスト | 製造方法、スイッチ装置、伝送路切り替え装置、および試験装置 |
| US9602225B2 (en) | 2011-06-28 | 2017-03-21 | Keysight Technologies, Inc. | Impairment compensation |
| US9667358B2 (en) | 2011-06-28 | 2017-05-30 | Keysight Technologies, Inc. | Impairment compensation |
| JP5394451B2 (ja) * | 2011-07-26 | 2014-01-22 | 株式会社アドバンテスト | アクチュエータの製造方法、スイッチ装置、伝送路切替装置、および試験装置 |
| US20150084660A1 (en) * | 2013-09-25 | 2015-03-26 | Tektronix, Inc. | Time-domain reflectometer de-embed probe |
| TWI512309B (zh) * | 2013-12-27 | 2015-12-11 | Chroma Ate Inc | 自動測試設備及其控制方法 |
| JP2015169524A (ja) | 2014-03-06 | 2015-09-28 | 株式会社アドバンテスト | 試験装置、キャリブレーションデバイス、キャリブレーション方法、および試験方法 |
| US9577818B2 (en) * | 2015-02-04 | 2017-02-21 | Teradyne, Inc. | High speed data transfer using calibrated, single-clock source synchronous serializer-deserializer protocol |
| US9929856B1 (en) * | 2016-11-07 | 2018-03-27 | Dell Products, Lp | System and method for jitter negation in a high speed serial interface |
| US12117486B2 (en) | 2019-01-31 | 2024-10-15 | Tektronix, Inc. | Systems, methods and devices for high-speed input/output margin testing |
| US11940483B2 (en) | 2019-01-31 | 2024-03-26 | Tektronix, Inc. | Systems, methods and devices for high-speed input/output margin testing |
| US12140609B2 (en) * | 2020-03-31 | 2024-11-12 | Advantest Corporation | Universal test interface systems and methods |
| US11334459B2 (en) * | 2020-08-18 | 2022-05-17 | Advantest Corporation | Flexible test systems and methods |
| US12061232B2 (en) | 2020-09-21 | 2024-08-13 | Tektronix, Inc. | Margin test data tagging and predictive expected margins |
| US12055584B2 (en) | 2020-11-24 | 2024-08-06 | Tektronix, Inc. | Systems, methods, and devices for high-speed input/output margin testing |
| WO2022111804A1 (en) * | 2020-11-25 | 2022-06-02 | Advantest Corporation | An automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback |
| CN112946526B (zh) * | 2021-01-13 | 2022-12-09 | 桂林电子科技大学 | 电子器件断点检测方法、装置和电子设备 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003071297A1 (en) * | 2002-02-15 | 2003-08-28 | Npt Est, Inc. | Signal paths providing multiple test configurations |
| DE60100114T2 (de) * | 2001-04-03 | 2003-10-02 | Agilent Technologies Inc., A Delaware Corp. | Filter zur Einspeisung von datenabhängigem Jitter und Pegelgeräusch |
| EP1464970A1 (en) * | 2003-04-04 | 2004-10-06 | Agilent Technologies Inc | Loop-back testing with delay elements |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3176318B2 (ja) * | 1997-06-19 | 2001-06-18 | 日本電気アイシーマイコンシステム株式会社 | Ｉｃ試験装置および方法 |
| US6173427B1 (en) * | 1997-06-20 | 2001-01-09 | Nec Corporation | Immunity evaluation method and apparatus for electronic circuit device and LSI tester |
| US6100815A (en) * | 1997-12-24 | 2000-08-08 | Electro Scientific Industries, Inc. | Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| JP2001111408A (ja) * | 1999-10-08 | 2001-04-20 | Hitachi Ltd | 高速信号伝送配線実装構造 |
| WO2003073280A1 (en) * | 2002-02-26 | 2003-09-04 | Advantest Corporation | Measuring apparatus and measuring method |
| JP3790741B2 (ja) * | 2002-12-17 | 2006-06-28 | アンリツ株式会社 | ジッタ測定装置およびジッタ測定方法 |
| JP3886941B2 (ja) * | 2003-07-10 | 2007-02-28 | アンリツ株式会社 | ジッタ耐力測定装置 |
| DE102004061510A1 (de) * | 2003-12-16 | 2005-10-06 | Advantest Corp. | Prüfvorrichtung und Prüfverfahren |
| US20050172181A1 (en) * | 2004-01-16 | 2005-08-04 | Mellanox Technologies Ltd. | System and method for production testing of high speed communications receivers |
-
2005
- 2005-02-11 US US11/056,330 patent/US7313496B2/en not_active Expired - Lifetime
-
2006
- 2006-02-09 DE DE102006006048A patent/DE102006006048B4/de not_active Expired - Fee Related
- 2006-02-13 JP JP2006035588A patent/JP4861717B2/ja not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE60100114T2 (de) * | 2001-04-03 | 2003-10-02 | Agilent Technologies Inc., A Delaware Corp. | Filter zur Einspeisung von datenabhängigem Jitter und Pegelgeräusch |
| WO2003071297A1 (en) * | 2002-02-15 | 2003-08-28 | Npt Est, Inc. | Signal paths providing multiple test configurations |
| EP1464970A1 (en) * | 2003-04-04 | 2004-10-06 | Agilent Technologies Inc | Loop-back testing with delay elements |
Non-Patent Citations (2)
| Title |
|---|
| SHIMANOUCHI,M.: New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom De- vice Testing. In: Proceedings of International Test Conference. IEEE, 2002, S.903-912 |
| SHIMANOUCHI,M.: New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing. In: Proceedings of International Test Conference. IEEE, 2002, S.903-912 * |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4861717B2 (ja) | 2012-01-25 |
| DE102006006048A1 (de) | 2006-08-24 |
| US20060184332A1 (en) | 2006-08-17 |
| JP2006220660A (ja) | 2006-08-24 |
| US7313496B2 (en) | 2007-12-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8364 | No opposition during term of opposition | ||
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20110901 |