CN214313623U - 插座、插座单元、检查工具和检查工具单元 - Google Patents

插座、插座单元、检查工具和检查工具单元 Download PDF

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Publication number
CN214313623U
CN214313623U CN202120462760.XU CN202120462760U CN214313623U CN 214313623 U CN214313623 U CN 214313623U CN 202120462760 U CN202120462760 U CN 202120462760U CN 214313623 U CN214313623 U CN 214313623U
Authority
CN
China
Prior art keywords
wall member
socket
housing
housings
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202120462760.XU
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English (en)
Chinese (zh)
Inventor
酒井贵浩
笹野直哉
寺西宏真
山下裕也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Application granted granted Critical
Publication of CN214313623U publication Critical patent/CN214313623U/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/46—Bases; Cases
    • H01R13/502—Bases; Cases composed of different pieces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/46—Bases; Cases

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Connector Housings Or Holding Contact Members (AREA)
CN202120462760.XU 2020-08-05 2021-03-03 插座、插座单元、检查工具和检查工具单元 Active CN214313623U (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020-133358 2020-08-05
JP2020133358A JP7452317B2 (ja) 2020-08-05 2020-08-05 ソケット、ソケットユニット、検査治具および検査治具ユニット

Publications (1)

Publication Number Publication Date
CN214313623U true CN214313623U (zh) 2021-09-28

Family

ID=77835662

Family Applications (2)

Application Number Title Priority Date Filing Date
CN202120462760.XU Active CN214313623U (zh) 2020-08-05 2021-03-03 插座、插座单元、检查工具和检查工具单元
CN202110848991.9A Pending CN114069315A (zh) 2020-08-05 2021-07-27 插座、插座单元、检查工具和检查工具单元

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN202110848991.9A Pending CN114069315A (zh) 2020-08-05 2021-07-27 插座、插座单元、检查工具和检查工具单元

Country Status (4)

Country Link
JP (1) JP7452317B2 (ja)
KR (1) KR102610514B1 (ja)
CN (2) CN214313623U (ja)
TW (1) TWI803913B (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240025311A (ko) 2022-08-18 2024-02-27 미르텍알앤디 주식회사 디스플레이 부품 검사 소켓용 지그
KR20240025319A (ko) 2022-08-18 2024-02-27 미르텍알앤디 주식회사 디스플레이 부품 검사 소켓용 실리콘 패턴체 및 그 제조방법

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0665865U (ja) * 1993-02-24 1994-09-16 日置電機株式会社 プローブピンの取付装置
JPH10125426A (ja) * 1996-10-11 1998-05-15 Minnesota Mining & Mfg Co <3M> Ｉｃソケット
JP2001324515A (ja) 2000-05-17 2001-11-22 Suncall Corp 電子部品検査用コンタクトプローブ装置
JP2003232807A (ja) 2002-02-06 2003-08-22 Japan Electronic Materials Corp 積層型プローブ組立装置、積層型プローブの組立方法、積層型プローブ及びプローブカード
WO2004003575A2 (de) 2002-07-01 2004-01-08 Infineon Technologies Ag Testvorrichtung für bauteile integrierter schaltungen
WO2006003722A1 (ja) 2004-07-05 2006-01-12 Kabushiki Kaisha Nihon Micronics 接触子ブロック及び電気的接続装置
WO2008026875A1 (en) 2006-09-01 2008-03-06 Nemsprobe Co., Ltd. Probe beam assembly
KR20090101575A (ko) * 2008-03-24 2009-09-29 센싸타테크놀러지스코리아 주식회사 콘택트 피치 조정지그 및 콘택트 피치 조정 및 조립 방법
JP6157048B2 (ja) * 2011-02-01 2017-07-05 スリーエム イノベイティブ プロパティズ カンパニー Ｉｃデバイス用ソケット
KR101582634B1 (ko) * 2013-09-13 2016-01-08 한국기계연구원 프로브 모듈 및 프로브 모듈의 제조 방법
CN204479617U (zh) 2015-03-11 2015-07-15 法特迪精密科技（苏州）有限公司 用于芯片大规模量产测试的测试连接座
JP6627655B2 (ja) 2016-06-17 2020-01-08 オムロン株式会社 ソケット
CN111602062B (zh) * 2018-01-11 2023-03-03 欧姆龙株式会社 探针、检查工具、检查单元和检查装置
JP6881343B2 (ja) * 2018-02-07 2021-06-02 オムロン株式会社 プローブピン、検査治具、検査ユニットおよび検査装置

Also Published As

Publication number Publication date
TW202221331A (zh) 2022-06-01
KR20220017828A (ko) 2022-02-14
TWI803913B (zh) 2023-06-01
JP7452317B2 (ja) 2024-03-19
CN114069315A (zh) 2022-02-18
JP2022029833A (ja) 2022-02-18
KR102610514B1 (ko) 2023-12-07

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