CN1553855A - 制造陶瓷基片的方法以及陶瓷基片 - Google Patents
制造陶瓷基片的方法以及陶瓷基片 Download PDFInfo
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- CN1553855A CN1553855A CNA028178580A CN02817858A CN1553855A CN 1553855 A CN1553855 A CN 1553855A CN A028178580 A CNA028178580 A CN A028178580A CN 02817858 A CN02817858 A CN 02817858A CN 1553855 A CN1553855 A CN 1553855A
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- 239000000463 material Substances 0.000 claims description 110
- 238000000034 method Methods 0.000 claims description 46
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- 229910052751 metal Inorganic materials 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 19
- 239000006071 cream Substances 0.000 claims description 18
- 239000004020 conductor Substances 0.000 claims description 15
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- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
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Abstract
本发明涉及制造陶瓷基片的方法,它有以下几个步骤:a)准备好一个基体(2),它有一叠(2a)相互重叠的层(3),这些层含有一种未烧结的陶瓷材料和一种烧结辅助材料(5),其中的一个层(3a)含有比一相邻的层(3)更多的烧结辅助材料(5);b)烧结层叠(2a)。本发明还涉及一种陶瓷基片。通过更高的烧结辅助材料的含量,可以改善一个层(3a)与相邻层(3)的机械连结。
Description
本发明涉及制造陶瓷基片的方法,其中准备好一个基体,它具有一叠相互重叠的层。该层叠的这些层含有一种未烧结的陶瓷材料。在一个随后的步骤中,烧结该层叠。
开头所述类型的方法用于制造陶瓷叠层基片,无源元件可被集成到基片里。在基片表面上,可以借助连接技术如SMD(表面安装法)、引线焊接或倒装法来安装有源元件。因此,由这些陶瓷基片产生多功能模块,这种模块尤其适于节省空间。
从文献US 6,207,905中公开了开头所述类型的方法,其中,上下重叠的层含有一种陶瓷材料和玻璃。在这里,玻璃和陶瓷材料的重量百分比各约为50%。玻璃用作烧结辅助材料,而且它在该已知方法中置应保证在烧结时能再结晶(反应烧结)。由于玻璃含量约为50重量%,因而在该已知方法中,在叠层构造的各层之间形成一些反应层,它们只有几微米厚。在将元件安装到烧结层叠的表面上时,在剪切应力下可能在反应层的最顶层中出现破裂,这就造成层叠最顶层的一部分开裂。若层叠最顶层的整个面例如被一种有机材料盖住并且剪切应力作用在该最顶层上,则这个问题就相当明显。
因而,本发明的目的是提出一种制造陶瓷基片的方法,该方法可以改善层叠的各层之间的相互机械连结。
该目的通过如权利要求1所述的方法来实现。该方法的有利实施形式以及陶瓷基片见其它的权利要求。
本发明提出一种制造陶瓷基片的方法,其中,在第一步中准备好一个基体,它具有一叠相互重叠的层。这些重叠的层包含有一种未烧结材料和一种烧结辅助材料。
层叠中的一个层含有比一相邻的层更多的烧结辅助材料。
在一个随后的步骤里,烧结该层叠,因而形成一个单体的烧结物,它至少是所要制造的陶瓷基片的一个主要组成部分。
本发明方法的优点在于,通过提高在其中一个层里的烧结辅助材料的含量,加强了在层叠各层之间的烧结辅助材料交换,其原因在于,在这些层之间出现了烧结辅助材料浓度差。烧结辅助材料在层叠各层之间的交换可以通过扩散来进行,其中,在各层之间的烧结辅助材料浓度差促进了这种扩散。在层叠各层之间的更强的烧结辅助材料交换改善了在含有大量烧结辅助材料的层和邻接层之间的连结。
在本发明的一个有利的实施形式中采用了一种烧结辅助材料,与在烧结之前相比,它的化学组成在烧结之后是不同的。这些烧结辅助材料例如是适于反应烧结的烧结辅助材料。这样的烧结辅助材料例如是含有SiO2和钙的玻璃。这样的玻璃可以在900℃下与陶瓷材料Al2O3形成一种名为钙长石的化合物(CaAl2Si2O8)。此外,反应烧结的特征是,烧结辅助材料在低于烧结温度时就已经能够流动。因而,烧结辅助材料在烧结时能够迁移并分布在基体之内。烧结辅助材料尤其可以从烧结辅助材料含量较高的层中移到烧结辅助材料含量较低的相邻层中。
还有利的是,烧结辅助材料的含量较高的层是层叠的最顶层。在此情况下,就可以改善层叠最顶层与其下面的层之间的连结,从而减小用这种方法制造的陶瓷基片对陶瓷基片表面的剪切应力的敏感性,正如例如在将元件焊到基片表面上时所产生的剪切应力那样。
在层叠的这些层里的烧结辅助材料或者陶瓷材料可以如此选择,即在烧结中,在烧结辅助材料的重量百分比较高的层和烧结辅助材料的重量百分比较低的相邻层之间形成一反应层。这样的反应层含有来自烧结辅助材料含量较高的层的烧结辅助材料和来自与该层相邻的层的烧结辅助材料。反应层生成在烧结辅助材料含量较低的层内。
烧结辅助材料或者烧结辅助材料的高重量百分比尤其可以这样选择,即生成5μm-100μm厚的反应层。这样一种在层叠的两层之间的反应层要比如在已知用于制造陶瓷基片的方法中所形成的反应层的厚度要大得多。因此,按照本发明方法制造的反应层促成在两个陶瓷层之间的强得多的附着。
还有利的是,在本发明的方法中,为激活更多的玻璃而使用一个经过改良的脱除粘结剂断面和烧结断面。对一种改良的烧结断面来说,当温度高于烧结辅助材料的软化温度时,就加入一段附加的保温时间,它使高含量的烧结辅助材料有足够的时间扩散。
含有大量烧结辅助材料的层例如可以含有60重量%-90重量%的烧结辅助材料。
在制造陶瓷基片的另一个步骤里,可以紧接在烧结之后将一种含有烧结辅助材料的金属膏糊涂覆在层叠最顶层的表面上并进行焙烧。金属膏糊的焙烧可以在600℃以上的温度下进行。由于在陶瓷最顶层里的烧结辅助材料的含量高,因而在烧结时就在陶瓷材料和烧结辅助材料之间形成一种化合物,该化合物与如果当陶瓷和玻璃的重量含量大致相等时所产生的化合物不同。这种与之不同的化合物的特性是,由于玻璃含量高,它稍有些脆。这样一种在层叠最顶层里的化合物由于玻璃从金属膏糊中渗入最顶层里而可以使受损伤程度远比一种由烧结辅助材料和陶瓷材料制成的且其两种成分的重量百分比大致相同的化合物小得多。因而,如果对由金属膏糊在陶瓷基片表面形成接触面的情况来说,本发明方法的优点在于,这些接触面可以更好地附着在陶瓷基片的最顶层上并且不太容易在装配元件时开裂。
这样一种金属膏糊除玻璃外还含有70重量%-90重量%的金属以及适合的有机粘结剂和溶剂。
在本发明的另一个有利的实施形式中,在烧结中,在层叠最顶层上设置一个约束层,该约束层由于在烧结中使层叠最顶层里的烧结辅助材料渗入约束层里而被固定在层叠上。在烧结之后,约束层又被除去。约束层的除去例如可以通过刮擦或者溅射掉来实现。
在烧结层叠时设置一个约束层的优点在于,层叠在构成该层叠的这些层的侧向上的收缩可以减小。约束层用于使层叠在侧向上只有很小的收缩。
作为约束层,例如可以考虑成烧结的Al2O3板形式的刚性约束层或者也可以用成新膜形式的柔性约束层,这种约束层本身不含有烧结辅助材料,并且它因此即便在层叠烧结中也未被烧结在一起。这样的柔性约束层例如从文献DE 691 06 830 T2中公开了。
由于层叠最顶层里的烧结辅助材料的含量高,因而可以使烧结辅助材料渗入约束层的深度大于50μm。烧结辅助材料渗入约束层的深度因而可能大于50μm。在柔性约束层时的阻碍收缩效果主要由以下原因引起,即一未烧结的致密粉末堆在该层叠的上表面上。根据烧结辅助材料渗入约束层的深度的不同,必须使约束层的最小厚度保证使至少一部分约束层(厚度约100μm)不与烧结辅助材料接触并因而也不被烧结。只有通过部分约束层的不烧结,才能减小烧结时的层叠收缩。
在柔性约束层的情况下,约束层厚度例如可大于150μm。
层叠的最顶层可以含有一种在烧结时变得能够流动的烧结辅助材料。因此,在烧结时就能使约束层固定到最顶层上。
在本发明的一个有利的实施形式中,约束层可以具有气孔,在烧结时,烧结辅助材料就渗入这些气孔里。由于烧结辅助材料在烧结时变得能够流动,因而烧结辅助材料能渗入约束层气孔里。适宜的约束层气孔大小可以为5μm-10μm,其中,适当的气孔大小也取决于烧结时的烧结辅助材料的粘度。在本发明的一个实施例中,可以以含有SiO2和钙的玻璃作为烧结辅助材料。
烧结辅助材料和约束层之间的化学反应例如可以通过烧结(反应烧结)来进行。尤其可以使用一种柔性的约束层,如由上述对比文件中知道的那样。这样的约束层以陶瓷新膜的形式涂覆在层叠上表面上,但新膜中不含有烧结辅助材料。因而就保证了至少约束层的局部没有在烧结层叠时被烧结在一起。
柔性约束层例如可以是新膜,它含有Al2O3体和聚合物粘合剂。
在本发明的另一个有利的实施形式中,约束层和烧结辅助材料的选择应使烧结辅助材料在烧结时与约束层的组成成分起化学反应。
一种陶瓷板可以作为刚性约束层地用于这样的化学反应,它含有Al2O3。含有SiO2和钙的玻璃可以作为在层叠最顶层里的烧结辅助材料,这样的玻璃可以在900℃温度下与约束层的Al2O3形成一种名为钙长石(CaAl2Si2O8)的化合物。因而,在层叠最顶层和约束层之间形成一个反应层,它使约束层牢固地结合在层叠最顶层上。
尤其可以使用一种含有Al2O3并且没有烧结辅助材料的陶瓷板作为刚性约束层。这样的陶瓷板可以通过1500℃下的烧结来制成。这样高的烧结温度确保了约束层在在高于1000℃地烧结层叠时不再收缩。
还有利的是,烧结辅助材料渗入约束层气孔以及烧结辅助材料与约束层的组成成分的化学反应通过适当选择材料而联合应用。这样就使约束层牢固地结合在层叠的最顶层上。
在本发明的一个有利的实施形式中,可以使用一种刚性约束层,其厚度为0.5-1.5mm。约束层必须有一定的最小厚度,以便特别是为使大面积的烧结体具有足够的机械稳定性。此外,约束层也不能太厚,因为否则的话去除约束层就太费事了。
约束层例如可以含有由Al2O3组成的颗粒,它们被烧结在一起。
层叠的层作为陶瓷的固体组成部分可以含有钛酸钡、钛酸钙、钛酸锶、钛酸铅、CaZrO3、BaZrO3、BaSnO3、金属碳化物如碳化硅、金属氮化物如氮化铝、矿物质如钼酸钙(Molit)和蓝晶石、二氧化锆或者不同种类的二氧化硅。即使是具有高软化点的玻璃,它也可以被用作陶瓷成分,其先决条件是它们要有足够高的软化点。此外,这种材料的混合物可被用于层叠的层的陶瓷固体成分。
将本发明方法用于制造陶瓷基片尤其允许使用具有平板形状的层叠,其中平板具有至少为18cm×18cm的底面积和0.5-3mm的厚度。借助一个这样的平板,可以在唯一一个制造步骤里制成大面积的基片,或者随后将大面积的基片分割成许多小基片。
还特别有利的是,该层叠的烧结在小于1000℃时,因为在这种情况下存在LTCC-烧结过程,它允许用银来连接在基片内部的导线结构,这样就使元件内的损耗较少。此外,使用银的优点还在于,与在较高烧结温度时所需的铂相比,可以更容易且更价廉地得到它。
还有利的是,除层叠的上表面之外,也在层叠下表面上,在层叠最底层的表面上设有一个约束层,因而从两侧减小了层叠的这些层的收缩,总之造成收缩更小。
尤其可以考虑使用一种在它的层之间设有印制导线的层叠。这些印刷导线可被用于在布置于陶瓷基片表面上的有源元件和布置在陶瓷基片内部的无源元件之间形成布线。在层叠的两层之间的印制导线或者导电表面也可被用于实现无源元件,例如电容或者线圈。
为了相互接通位于各层之间的印制导线,有利地在层叠的一个层中设有一个引线,该引线是导电的并且将布置在该层的两个不同侧面上的印制导线连接起来。
此外,本发明提出一种具有一叠相互重叠的层的陶瓷基片。该层叠的相互重叠的层含有一种陶瓷材料并被烧结在一起。它们还含有烧结辅助材料的剩余物,它们没有因反应烧结而转变成另一种化合物。该层叠的这些层中的一个层含有比一相邻层更多的烧结辅助材料剩余物。这样的陶瓷基片可以通过本发明方法来制造。由于在烧结之前烧结辅助材料的含量较高,因而这个层的烧结辅助材料的剩余物含量也较高。烧结辅助材料中的不变的剩余物的含量可达5重量%-30重量%。
在含有较多的烧结辅助材料的不变剩余物的层和相邻层之间,尤其可以布置一个反应层,它含有来自烧结辅助材料的不变剩余物的含量较高的层的烧结辅助材料。此外,反应层含有相邻层的陶瓷材料的烧结辅助材料。反应层的厚度可达10-50μm。因而,反应层要比按照过去的已知方法制造的反应层厚得多。
以下根据实施例和所属附图对本发明进行详细说明。
图1以横截面示意图举例表示在按照本发明方法制造时的陶瓷基片;
图2举例表示一种按照本发明的方法制成的且在表面上有金属膏糊的陶瓷基片;
图3以横截面示意图举例表示在按照本发明方法进行制造时的陶瓷基片;
图4举例表示按照本发明的LTCC-基片的横断面示意图,它是按照本发明的方法制成的。
图1表示一个基体2,它有一叠2a重叠的层3。这些层3含有一种未烧结的陶瓷材料。通常,层叠2a的层3除陶瓷材料和烧结辅助材料外还含有粘结剂,它赋予通常以新膜形式出现的这些层3以加工所需的延展性。粘结剂例如可以是聚合物粘结剂,它借助胶合剂燃尽在层叠烧结前就已从层叠中被除去。层叠2a的最顶层7是一个含有大量烧结辅助材料的层3a。如箭头所示,烧结辅助材料可从层3a中扩散到其下面的层3里并在那里生成一反应层9。反应层9的厚度d例如可达到10-50μm。反应层9的厚度d可以通过层3a中的烧结辅助材料的过剩量来调节。反应层9越厚,层叠2a最顶层7与下面的层3的机械结合越牢。
图2表示一个具有多个重叠层3的层叠2a,其中层叠2a的最顶层7是含有较多烧结辅助材料的层。对图1、2来说,层3a里的烧结辅助材料的重量百分比达到70%。此外,层3a还含有作为陶瓷材料的Al2O3。在最顶层7的表面6上涂有一层金属膏糊20,借助这种膏糊,应能实现在层叠2a上表面上的一接触表面。金属膏糊20含有一种金属粉末和一种玻璃成分。在这里,该玻璃成分可以是与在层叠2a的层3里所用的一样的烧结辅助材料,而且它尤其也可以是与在烧结辅助材料含量较高的层3a中所用的一样的烧结辅助材料。但也可以各有不同的烧结辅助材料,例如在不同温度下熔化的玻璃被用于层叠2a的各层3,或者也可以只用于烧结辅助材料含量较高的层3a。
金属膏糊20在最顶层7表面6上进行焙烧。在焙烧中,金属膏糊20中的部分玻璃成分,如约为2%(重量)的部分,就扩散到层叠的最顶层7(参见箭头)中。作为烧结辅助材料,在图1、2中分别使用了含钙玻璃。由于层叠2a中的层3a的玻璃含量较高,因而由金属膏糊20进入到最顶层7里的玻璃只起到很小作用,因而,被烧结的层3a的化学组成变化就很小。结果,金属膏糊20与层叠2a最顶层7的结合强度提高。这样就提高了机械强度并因此减小了在焊接元件时在层叠上表面上的金属面开裂的危险。
图3表示一基体2,它具有一叠2a重叠层3。这些层3含有未烧结的陶瓷材料。通常,层叠2a的层3除含有陶瓷材料和烧结辅助材料外还含有粘结剂,它赋予这些通常作为新膜的层3以加工所需的延展性。层叠2a最底层14的表面13直接置于刚性的第二约束层12上。层叠的最顶层7是一个含有较多烧结辅助材料层3a。约束层4、12含有Al2O3颗粒8并且具有气孔21。这些气孔21形成空腔,来自层叠2a最顶层7或层叠2a最底层14的烧结辅助材料可以钻入这些空腔里。钻入气孔21里的烧结辅助材料5促使各个约束层4、12附着在层叠2a上。约束层4、12可以在层叠2a脱除粘结剂之前或也可在此之后施加到层叠2a上。因此,在层叠2a侧向上,在层3的伸展方向上可以有效地减小烧结收缩。层叠2a在侧向方向上的固定造成收缩几乎只发生在垂直方向上,也就是垂直于层3的平面侧。这种所谓的“Z方向收缩”越加强烈。
烧结辅助材料5渗入约束层4的深度为e。必须注意的是,烧结辅助材料5不是在约束层4的整个厚度上渗入,而只是渗入其中一部分。如果约束层是柔软的,则这就尤其重要。但渗入深度e可以远大于50μm。相应地,约束层4的厚度D必须大于烧结辅助材料5渗入约束层4气孔21里的渗入深度e。
相应地,也可以在最底层4的下表面13上布置一个柔性的约束层12。同样,层叠2a最底层14可以是一个含有大量烧结辅助材料5的层,其中,按照上述的类型和方式,在此也必须注意烧结辅助材料5渗入约束层12的气孔21的过程。
图4表示一个按照本发明方法制成的陶瓷基片1,其中,约束层已被除去。基片1由一叠2a相互重叠的层3制成,这些层含有未烧结的陶瓷材料,其中未烧结的陶瓷材料通过烧结转化成烧结的陶瓷材料。在陶瓷基片1的最顶层3a的上表面上设有元件18、19,其中,第一元件18通过引线连接和随后的灌封被固定在陶瓷基片1的表面上,第二元件19通过倒装法被固定在陶瓷基片1表面上。这两个元件18、19例如可以是陶瓷微波滤波器。在陶瓷基片1的下表面上设有由金属膏糊20形成的金属化物,基片1以这些金属化物可被焊接到一个线路板上并因此可以与其它的电子元件导电接触。同样,在基片1的上表面上布置有由金属膏糊20构成的金属化物,元件18、19可被固定在它们的上面。基片1的高度为1mm。
层3的数量为六。
在基片1的内部有布线平面,它们通过印制导线10来实现。布线平面总是在两层之间的界面上。印制导线10例如可以由含银的丝网印刷膏糊来制成。此外,层3也有引线11,它使得位于层3的两个对置的面上的印制导线10相互接通。在引线11里设有导电的材料,该导电材料有利地装满引线11。
在基片1的上部,层3中的两个层被构造成高度为ε的层15。这个高度ε可以等于20。通过相应构造的印制导线10或者在布线平面里的导电面24,可以将无源组成部件如电容器17整合到基片1里。如图4所示,这些导电面24布置在两层3之间的界面层上并通过引线11相互连接,从而形成相互交错嵌接的梳形构造,如在叠层电容器中知道的那样。通过在将这些层3堆叠起来之前把电阻膏糊印在层3之间的界面上,也可以在基片1里形成作为无源组成部件的集成电阻。通过形成螺旋轨迹形状的印制导线10并通过将重叠的螺旋线状印制导线成行排列,也可以在基片1里制成集成线圈16。
所示发明最好被用于这样的层叠2a,即它们由基本沿平面布置的层3制成。但也可以考虑在弯曲基片上应用本发明,其中,层3不是沿一个平面延伸,而是沿弯曲曲线延伸。
Claims (23)
1.一种制造陶瓷基片(1)的方法,它有以下步骤:
a)准备好一个基体(2),它具有一叠(2a)相互重叠的层(3),这些层(3)含有一种未烧结的陶瓷材料和一种烧结辅助材料(5),其中的一个层(3a)含有比一相邻的层(3)更多的烧结辅助材料(5),
b)烧结该层叠(2a)。
2.按权利要求1所述的方法,其中,该烧结辅助材料(5)在烧结之后的化学组成与烧结之前不同。
3.按权利要求1或2所述的方法,其中,该层叠(2a)的最顶层(7)含有比一相邻的层(3)更多的烧结辅助材料(5)。
4.按权利要求1-3之一所述的方法,其中,在烧结过程中,在该烧结辅助材料(5)含量较高的层(3a)和该相邻的层(3)之间形成一个反应层(9)。
5.按权利要求4所述的方法,其中,该反应层(9)的厚度d为5μm-100μm。
6.按权利要求1-5之一所述的方法,其中,为了激活更高的玻璃成分,一种除去粘结剂断面和烧结断面是有用的,该断面在玻璃成分的软化温度之上具有一个保温时间。
7.按权利要求1-6之一所述的方法,其中,在该烧结辅助材料(5)的含量较高的层(3a)里,该烧结辅助材料(5)的含量达到60重量%-90重量%。
8.按权利要求1-7之一所述的方法,其中,紧跟在烧结之后,将一种含有烧结辅助材料的金属膏糊(20)涂覆在该层叠(2a)最顶层(7)的表面(6)上并进行焙烧。
9.按权利要求1-8之一所述的方法,其中,在烧结之前,在该层叠(2a)最顶层(7)上设置一个约束层(4),该约束层在烧结中因最顶层(7)里的烧结辅助材料(5)渗入该约束层(4)中而被固定在该层叠(2a)上并且该约束层在烧结之后又被除去。
10.按权利要求9所述的方法,其中,该烧结辅助材料(5)渗入该约束层(4)的深度(e)大于50μm。
11.按权利要求9或10所述的方法,其中,该约束层(4)的厚度(D)比渗入深度(e)至少大100μm。
12.按权利要求1-11之一所述的方法,其中,该烧结辅助材料(5)含有玻璃。
13.按权利要求1-12之一所述的方法,其中,多个层(3,3a)被用来形成该层叠(2a),这些层作为陶瓷材料地含有Al2O3并作为烧结辅助材料(5)地含有玻璃。
14.按权利要求1-13之一所述的方法,其中,采用一个具有平板形状的层叠(2a),其中,该平板具有至少为18cm×18cm的底面积和0.5mm-3mm的厚度(H)。
15.按权利要求9-14之一所述的方法,其中,使用一个层叠(2a),其中在两层(3)之间设有印制导线(10)。
16.按权利要求1-15之一所述的方法,其中,一个第二约束层(12)布置在该层叠(2a)最底层(14)的表面(13)上。
17.一种由一叠(2a)相互重叠的层(3,3a)组成的陶瓷基片,这些层含有一种陶瓷材料并烧结在一起并且含有一烧结辅助材料(5)的不变的剩余物,其中,一个层(3a)含有比一相邻的层(3)更多的该不变的烧结辅助材料(5)。
18.按权利要求17所述的陶瓷基片,其中,该不变的烧结辅助材料(5)的含量达到5重量%-30重量%。
19.按权利要求17或18所述的陶瓷基片,其中,该层叠(2a)的最顶层(7)含有比该相邻的层(3)更多的该不变的烧结辅助材料。
20.按权利要求17-20之一所述的陶瓷基片,其中,在含有较多该不变的烧结辅助材料(5)的层(3a)和与该层(3a)相邻的层(3)之间设有一个反应层(19),该反应层含有来自该层(3a)的烧结辅助材料(5)和来自与该层相邻的层(3)的陶瓷材料并且该反应层的厚度(d)为10μm-15μm。
21.按权利要求19或20所述的陶瓷基片,其中,一金属膏糊(20)在该层叠(2a)的最顶层(7)上进行焙烧。
22.按权利要求17-21之一所述的陶瓷基片,其中,在该层叠(2a)的两层(3)之间设有印制导线(10)。
23.按权利要求22所述的陶瓷基片,其中,一个层(3)含有一条导电的引线(11),该引线将两个设置在该层(3)不同侧面上的印制导线(10)相互连接起来。
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CN109076709A (zh) * | 2016-04-28 | 2018-12-21 | 株式会社村田制作所 | 多层陶瓷基板 |
CN113195221A (zh) * | 2018-12-10 | 2021-07-30 | Tdk电子股份有限公司 | 衬底和制造该衬底的方法 |
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- 2002-09-13 CN CNB028178580A patent/CN1291834C/zh not_active Expired - Lifetime
- 2002-09-13 DE DE50213033T patent/DE50213033D1/de not_active Expired - Lifetime
- 2002-09-13 EP EP02769946A patent/EP1425167B1/de not_active Expired - Lifetime
- 2002-09-13 WO PCT/DE2002/003412 patent/WO2003024711A2/de active Application Filing
- 2002-09-13 JP JP2003528391A patent/JP2005501795A/ja active Pending
-
2006
- 2006-12-01 US US11/607,363 patent/US20070151090A1/en not_active Abandoned
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109076709A (zh) * | 2016-04-28 | 2018-12-21 | 株式会社村田制作所 | 多层陶瓷基板 |
CN113195221A (zh) * | 2018-12-10 | 2021-07-30 | Tdk电子股份有限公司 | 衬底和制造该衬底的方法 |
CN113195221B (zh) * | 2018-12-10 | 2023-07-18 | Tdk电子股份有限公司 | 衬底和制造该衬底的方法 |
US11958271B2 (en) | 2018-12-10 | 2024-04-16 | Tdk Electronics Ag | Substrate and method for producing the substrate |
Also Published As
Publication number | Publication date |
---|---|
ATE414605T1 (de) | 2008-12-15 |
EP1425167B1 (de) | 2008-11-19 |
WO2003024711A3 (de) | 2003-06-26 |
US7160406B2 (en) | 2007-01-09 |
DE50213033D1 (de) | 2009-01-02 |
EP1425167A2 (de) | 2004-06-09 |
DE10145363A1 (de) | 2003-04-10 |
WO2003024711A2 (de) | 2003-03-27 |
US20070151090A1 (en) | 2007-07-05 |
CN1291834C (zh) | 2006-12-27 |
US20040206546A1 (en) | 2004-10-21 |
JP2005501795A (ja) | 2005-01-20 |
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