CN1449112A - 带有漏电流截止电路的半导体集成电路 - Google Patents
带有漏电流截止电路的半导体集成电路 Download PDFInfo
- Publication number
- CN1449112A CN1449112A CN03108282A CN03108282A CN1449112A CN 1449112 A CN1449112 A CN 1449112A CN 03108282 A CN03108282 A CN 03108282A CN 03108282 A CN03108282 A CN 03108282A CN 1449112 A CN1449112 A CN 1449112A
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- Prior art keywords
- leakage current
- circuit
- transistor
- delay
- semiconductor integrated
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- Granted
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 66
- 239000000872 buffer Substances 0.000 claims description 73
- 230000004044 response Effects 0.000 claims description 35
- 102100027582 Nuclear pore complex protein Nup85 Human genes 0.000 description 46
- 101150031080 nup85 gene Proteins 0.000 description 46
- 230000004913 activation Effects 0.000 description 18
- 230000008859 change Effects 0.000 description 13
- 238000000034 method Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 7
- 230000004048 modification Effects 0.000 description 6
- 238000012986 modification Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 101100041125 Arabidopsis thaliana RST1 gene Proteins 0.000 description 5
- 101100443250 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) DIG1 gene Proteins 0.000 description 5
- 238000012546 transfer Methods 0.000 description 4
- 102100036285 25-hydroxyvitamin D-1 alpha hydroxylase, mitochondrial Human genes 0.000 description 2
- 101000875403 Homo sapiens 25-hydroxyvitamin D-1 alpha hydroxylase, mitochondrial Proteins 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000000541 pulsatile effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0008—Arrangements for reducing power consumption
- H03K19/0016—Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Power Engineering (AREA)
- Logic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dram (AREA)
Abstract
Description
Claims (26)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP092801/2002 | 2002-03-28 | ||
JP2002092801A JP3951773B2 (ja) | 2002-03-28 | 2002-03-28 | リーク電流遮断回路を有する半導体集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1449112A true CN1449112A (zh) | 2003-10-15 |
CN1262069C CN1262069C (zh) | 2006-06-28 |
Family
ID=28449640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB031082823A Expired - Fee Related CN1262069C (zh) | 2002-03-28 | 2003-03-27 | 带有漏电流截止电路的半导体集成电路 |
Country Status (5)
Country | Link |
---|---|
US (1) | US6765429B2 (zh) |
JP (1) | JP3951773B2 (zh) |
KR (1) | KR100904695B1 (zh) |
CN (1) | CN1262069C (zh) |
TW (1) | TW586267B (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101682325A (zh) * | 2008-02-27 | 2010-03-24 | 松下电器产业株式会社 | 半导体集成电路以及包括该半导体集成电路的各种装置 |
CN102142272A (zh) * | 2010-01-29 | 2011-08-03 | 海力士半导体有限公司 | 半导体器件 |
CN103168357A (zh) * | 2010-09-10 | 2013-06-19 | 苹果公司 | 可构造电源开关单元和方法 |
CN111049513A (zh) * | 2019-11-29 | 2020-04-21 | 北京时代民芯科技有限公司 | 一种带冷备份功能的轨到轨总线保持电路 |
CN113098467A (zh) * | 2021-03-01 | 2021-07-09 | 电子科技大学 | 一种降低泄漏功率的多阈值cmos电路 |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101006397A (zh) * | 2004-06-15 | 2007-07-25 | 皇家飞利浦电子股份有限公司 | 用于性能参数的二进制控制的控制方案 |
US7276932B2 (en) * | 2004-08-26 | 2007-10-02 | International Business Machines Corporation | Power-gating cell for virtual power rail control |
JP4197678B2 (ja) * | 2004-12-24 | 2008-12-17 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置 |
US7659746B2 (en) | 2005-02-14 | 2010-02-09 | Qualcomm, Incorporated | Distributed supply current switch circuits for enabling individual power domains |
US7589584B1 (en) * | 2005-04-01 | 2009-09-15 | Altera Corporation | Programmable voltage regulator with dynamic recovery circuits |
US7307899B2 (en) * | 2005-05-23 | 2007-12-11 | Intel Corporation | Reducing power consumption in integrated circuits |
JP2007267162A (ja) * | 2006-03-29 | 2007-10-11 | Nec Electronics Corp | 半導体集積回路 |
US7791406B1 (en) | 2006-04-04 | 2010-09-07 | Marvell International Ltd. | Low leakage power management |
US7902654B2 (en) * | 2006-05-10 | 2011-03-08 | Qualcomm Incorporated | System and method of silicon switched power delivery using a package |
JP2008210858A (ja) * | 2007-02-23 | 2008-09-11 | Fujitsu Ltd | 半導体集積回路の設計方法、設計装置及びcadプログラム |
US20080211568A1 (en) * | 2007-03-01 | 2008-09-04 | Infineon Technologies Ag | MuGFET POWER SWITCH |
WO2008114342A1 (ja) * | 2007-03-16 | 2008-09-25 | Fujitsu Microelectronics Limited | 電源スイッチ回路及び半導体集積回路装置 |
DE102008023126B4 (de) * | 2007-05-09 | 2012-08-30 | Infineon Technologies Ag | Schaltkreis und Verfahren zum Schalten einer Verbindung |
JP5162956B2 (ja) * | 2007-05-11 | 2013-03-13 | ソニー株式会社 | 半導体集積回路およびその動作方法 |
JP4962173B2 (ja) | 2007-07-02 | 2012-06-27 | ソニー株式会社 | 半導体集積回路 |
FR2919446B1 (fr) * | 2007-07-27 | 2009-12-18 | Commissariat Energie Atomique | Dispositif de commutation d'alimentation electrique a reponse rapide et reseau alimentation electrique equipe d'un tel commutateur. |
JP5528662B2 (ja) | 2007-09-18 | 2014-06-25 | ソニー株式会社 | 半導体集積回路 |
JPWO2009041010A1 (ja) * | 2007-09-27 | 2011-01-13 | パナソニック株式会社 | 半導体集積回路装置、通信装置、情報再生装置、画像表示装置、電子装置、電子制御装置および移動体 |
JP5151411B2 (ja) * | 2007-11-15 | 2013-02-27 | 富士通株式会社 | 電子回路装置 |
TWI349842B (en) * | 2007-12-12 | 2011-10-01 | Univ Nat Chiao Tung | Self-aware adaptive power control system |
JP4535134B2 (ja) | 2008-01-16 | 2010-09-01 | ソニー株式会社 | 半導体集積回路およびその電源制御方法 |
JP4535136B2 (ja) | 2008-01-17 | 2010-09-01 | ソニー株式会社 | 半導体集積回路、および、スイッチの配置配線方法 |
KR101011045B1 (ko) * | 2008-05-19 | 2011-01-25 | 장소영 | 잠금장치 및 이를 포함하는 창문 |
JP5635728B2 (ja) * | 2008-09-12 | 2014-12-03 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置、及びテスト方法 |
JP5398257B2 (ja) * | 2008-12-25 | 2014-01-29 | ルネサスエレクトロニクス株式会社 | 半導体装置及びそのスイッチトランジスタの制御方法 |
FR2943866B1 (fr) * | 2009-03-24 | 2011-04-01 | Dolphin Integration Sa | Circuit d'alimentation pour mode de sommeil |
JP5486967B2 (ja) * | 2010-03-12 | 2014-05-07 | 株式会社日立製作所 | 情報処理装置 |
JP2011199113A (ja) * | 2010-03-23 | 2011-10-06 | Fujitsu Ltd | 解析装置及び半導体装置 |
JP5576248B2 (ja) | 2010-11-19 | 2014-08-20 | ルネサスエレクトロニクス株式会社 | 電源スイッチ回路 |
JP5541143B2 (ja) * | 2010-12-21 | 2014-07-09 | 富士通株式会社 | 半導体装置 |
US8519772B2 (en) * | 2011-03-30 | 2013-08-27 | International Business Machines Corporation | Alternate power gating enablement |
JP5386026B2 (ja) * | 2012-09-25 | 2014-01-15 | ルネサスエレクトロニクス株式会社 | 制御信号発生回路およびそれを用いた半導体装置 |
US9300293B2 (en) * | 2013-05-14 | 2016-03-29 | Advanced Micro Devices, Inc. | Fault detection for a distributed signal line |
JP6242183B2 (ja) * | 2013-11-22 | 2017-12-06 | 株式会社メガチップス | 半導体集積回路及び該半導体集積回路の試験方法並びに該半導体集積回路におけるラッシュカレントの抑制方法 |
US9429610B2 (en) | 2014-01-16 | 2016-08-30 | Qualcomm Incorporated | Voltage dependent die RC modeling for system level power distribution networks |
US11303274B1 (en) * | 2020-11-16 | 2022-04-12 | Micron Technology, Inc. | Sub-threshold current reduction circuit switches and related apparatuses and methods |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3112047B2 (ja) | 1991-11-08 | 2000-11-27 | 株式会社日立製作所 | 半導体集積回路 |
JP3245663B2 (ja) | 1994-01-19 | 2002-01-15 | 日本電信電話株式会社 | 論理回路 |
US5880623A (en) * | 1997-02-28 | 1999-03-09 | Exar Corporation | Power supply control techniques for FET circuits |
JPH10261946A (ja) * | 1997-03-19 | 1998-09-29 | Mitsubishi Electric Corp | 半導体集積回路 |
JP3420141B2 (ja) * | 1999-11-09 | 2003-06-23 | Necエレクトロニクス株式会社 | 半導体装置 |
JP3916837B2 (ja) * | 2000-03-10 | 2007-05-23 | 株式会社東芝 | 強誘電体メモリ |
-
2002
- 2002-03-28 JP JP2002092801A patent/JP3951773B2/ja not_active Expired - Fee Related
-
2003
- 2003-03-19 TW TW092106088A patent/TW586267B/zh not_active IP Right Cessation
- 2003-03-25 US US10/395,252 patent/US6765429B2/en not_active Expired - Lifetime
- 2003-03-26 KR KR1020030018711A patent/KR100904695B1/ko active IP Right Grant
- 2003-03-27 CN CNB031082823A patent/CN1262069C/zh not_active Expired - Fee Related
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101682325A (zh) * | 2008-02-27 | 2010-03-24 | 松下电器产业株式会社 | 半导体集成电路以及包括该半导体集成电路的各种装置 |
US8390146B2 (en) | 2008-02-27 | 2013-03-05 | Panasonic Corporation | Semiconductor integrated circuit and various devices provided with the same |
CN101682325B (zh) * | 2008-02-27 | 2013-06-05 | 松下电器产业株式会社 | 半导体集成电路以及包括该半导体集成电路的各种装置 |
CN102142272A (zh) * | 2010-01-29 | 2011-08-03 | 海力士半导体有限公司 | 半导体器件 |
US9000820B2 (en) | 2010-01-29 | 2015-04-07 | SK Hynix Inc. | Semiconductor device |
CN102142272B (zh) * | 2010-01-29 | 2016-07-06 | 海力士半导体有限公司 | 半导体器件 |
CN103168357A (zh) * | 2010-09-10 | 2013-06-19 | 苹果公司 | 可构造电源开关单元和方法 |
CN103168357B (zh) * | 2010-09-10 | 2015-08-05 | 苹果公司 | 可构造电源开关单元和方法 |
CN111049513A (zh) * | 2019-11-29 | 2020-04-21 | 北京时代民芯科技有限公司 | 一种带冷备份功能的轨到轨总线保持电路 |
CN111049513B (zh) * | 2019-11-29 | 2023-08-08 | 北京时代民芯科技有限公司 | 一种带冷备份功能的轨到轨总线保持电路 |
CN113098467A (zh) * | 2021-03-01 | 2021-07-09 | 电子科技大学 | 一种降低泄漏功率的多阈值cmos电路 |
Also Published As
Publication number | Publication date |
---|---|
CN1262069C (zh) | 2006-06-28 |
TW200306707A (en) | 2003-11-16 |
TW586267B (en) | 2004-05-01 |
US20030184364A1 (en) | 2003-10-02 |
KR20030078678A (ko) | 2003-10-08 |
US6765429B2 (en) | 2004-07-20 |
JP2003289245A (ja) | 2003-10-10 |
JP3951773B2 (ja) | 2007-08-01 |
KR100904695B1 (ko) | 2009-06-29 |
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Legal Events
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20081219 Address after: Tokyo, Japan Patentee after: Fujitsu Microelectronics Ltd. Address before: Kanagawa, Japan Patentee before: Fujitsu Ltd. |
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ASS | Succession or assignment of patent right |
Owner name: FUJITSU MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: FUJITSU LIMITED Effective date: 20081219 |
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Owner name: FUJITSU SEMICONDUCTOR CO., LTD. Free format text: FORMER NAME: FUJITSU MICROELECTRON CO., LTD. |
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CP01 | Change in the name or title of a patent holder |
Address after: Kanagawa Patentee after: FUJITSU MICROELECTRONICS Ltd. Address before: Kanagawa Patentee before: Fujitsu Microelectronics Ltd. |
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CP02 | Change in the address of a patent holder |
Address after: Kanagawa Patentee after: Fujitsu Microelectronics Ltd. Address before: Tokyo, Japan Patentee before: Fujitsu Microelectronics Ltd. |
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Owner name: SUOSI FUTURE CO., LTD. Free format text: FORMER OWNER: FUJITSU SEMICONDUCTOR CO., LTD. Effective date: 20150526 |
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