CN116359084A - 粒子表征的装置及方法 - Google Patents

粒子表征的装置及方法 Download PDF

Info

Publication number
CN116359084A
CN116359084A CN202310475803.1A CN202310475803A CN116359084A CN 116359084 A CN116359084 A CN 116359084A CN 202310475803 A CN202310475803 A CN 202310475803A CN 116359084 A CN116359084 A CN 116359084A
Authority
CN
China
Prior art keywords
illumination beam
detector
sample
light
path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202310475803.1A
Other languages
English (en)
Chinese (zh)
Inventor
贾森·科比特
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Malvern Panalytical Ltd
Original Assignee
Malvern Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Malvern Instruments Ltd filed Critical Malvern Instruments Ltd
Publication of CN116359084A publication Critical patent/CN116359084A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/03—Electro-optical investigation of a plurality of particles, the analyser being characterised by the optical arrangement
    • G01N2015/035—Electro-optical investigation of a plurality of particles, the analyser being characterised by the optical arrangement the optical arrangement forming an integrated apparatus with the sample container
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4719—Multiangle measurement using a optical fibre array

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN202310475803.1A 2016-03-16 2017-09-14 粒子表征的装置及方法 Pending CN116359084A (zh)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
GBGB1604460.4A GB201604460D0 (en) 2016-03-16 2016-03-16 Dynamic light scattering
PCT/GB2017/050733 WO2017158368A1 (en) 2016-03-16 2017-03-16 Particle characterisation
GBPCT/GB2017/050733 2017-03-16
EP17161455.5 2017-03-16
EP17161455.5A EP3220128A1 (en) 2016-03-16 2017-03-16 Particle characterisation
CN201710828832.6A CN108627432A (zh) 2016-03-16 2017-09-14 粒子表征

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201710828832.6A Division CN108627432A (zh) 2016-03-16 2017-09-14 粒子表征

Publications (1)

Publication Number Publication Date
CN116359084A true CN116359084A (zh) 2023-06-30

Family

ID=55952391

Family Applications (2)

Application Number Title Priority Date Filing Date
CN202310475803.1A Pending CN116359084A (zh) 2016-03-16 2017-09-14 粒子表征的装置及方法
CN201710828832.6A Pending CN108627432A (zh) 2016-03-16 2017-09-14 粒子表征

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201710828832.6A Pending CN108627432A (zh) 2016-03-16 2017-09-14 粒子表征

Country Status (6)

Country Link
US (2) US11187638B2 (OSRAM)
EP (2) EP3220128A1 (OSRAM)
JP (2) JP2019512701A (OSRAM)
CN (2) CN116359084A (OSRAM)
GB (1) GB201604460D0 (OSRAM)
WO (1) WO2017158368A1 (OSRAM)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6936229B2 (ja) 2015-09-23 2021-09-15 マルバーン パナリティカル リミテッド 粒子特性評価
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN109030299B (zh) * 2018-11-01 2020-08-21 山东理工大学 高浓度样品的后向散射纳米颗粒粒度测量装置的测量方法
CN109030298B (zh) * 2018-11-01 2020-08-21 山东理工大学 一种利用后向散射纳米颗粒粒度测量装置实现的测量方法
EP3739321B1 (de) * 2019-05-17 2023-03-08 Xtal Concepts GmbH Qualifizierungsverfahren für kryoelektronenmikroskopie-proben sowie dazugehöriger probenhalter
CN111175203B (zh) * 2020-01-10 2022-04-05 广州市怡文环境科技股份有限公司 一种用于超低粉尘在线监测的检测系统
JP7365955B2 (ja) * 2020-04-06 2023-10-20 大塚電子株式会社 粒子径測定方法、粒子径測定装置及び粒子径測定プログラム
EP3922977B1 (en) * 2020-06-08 2024-08-07 Universität für Bodenkultur Wien Method for determining a property of a particle in a medium
CN112014284B (zh) * 2020-08-27 2023-11-24 苏州亿利安机电科技有限公司 直读式粉尘浓度测量仪
CN113959376A (zh) * 2021-10-12 2022-01-21 桂林电子科技大学 一种基于少模光纤的表面粗糙度测量系统
CN115791654A (zh) * 2022-11-09 2023-03-14 之江实验室 测量装置及测量方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010035954A1 (en) * 2000-03-10 2001-11-01 Rahn John Richard Method and apparatus for measuring particle size distributions using light scattering
US20040038413A1 (en) * 2002-08-23 2004-02-26 Kramer Donald L. Method and apparatus for differentiating blood cells using back-scatter
CN101072997A (zh) * 2003-08-14 2007-11-14 塞通诺米公司 用于粒子分类系统的光学检测器
CN101776599A (zh) * 2003-08-14 2010-07-14 塞通诺米/St有限责任公司 用于粒子分类系统的光学检测器
CN102334021A (zh) * 2009-02-27 2012-01-25 贝克曼考尔特公司 用于流式细胞仪的稳定的光学系统
CN103608671A (zh) * 2011-06-15 2014-02-26 马尔文仪器有限公司 表面电荷测量
CN105705932A (zh) * 2013-11-05 2016-06-22 马尔文仪器有限公司 与颗粒表征有关的改善

Family Cites Families (84)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3621220A (en) 1969-08-29 1971-11-16 Norman C Ford Jr Scattered light measurement providing autocorrelation function
US4074939A (en) 1973-12-19 1978-02-21 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Apparatus for investigating fast chemical reactions by optical detection
US4473296A (en) 1978-05-03 1984-09-25 Ppm, Inc. System and method and apparatus for a continuous aerosol monitor (CAM) using electro-optical weighing for general aerosols
US4178917A (en) * 1979-01-03 1979-12-18 Shapiro Howard M Method and system for non-invasive detection of zinc protoporphyrin in erythrocytes
US4710025A (en) 1982-06-22 1987-12-01 Wyatt Technology Company Process for characterizing suspensions of small particles
US4537861A (en) * 1983-02-03 1985-08-27 Elings Virgil B Apparatus and method for homogeneous immunoassay
US4690561A (en) * 1985-01-18 1987-09-01 Canon Kabushiki Kaisha Particle analyzing apparatus
US4676641A (en) 1986-01-08 1987-06-30 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid
US4781460A (en) * 1986-01-08 1988-11-01 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid
US5166052A (en) 1986-05-27 1992-11-24 Boris Cercek Method for measuring polarization of bathochromically shifted fluorescence
GB8705844D0 (en) * 1987-03-12 1987-04-15 Secr Defence Dynamic light scattering apparatus
JPH02228069A (ja) * 1989-02-28 1990-09-11 Omron Tateisi Electron Co 受光素子アレイ
JPH05172730A (ja) 1991-12-25 1993-07-09 Shimadzu Corp 粒度分布測定装置
JP3294668B2 (ja) 1993-04-30 2002-06-24 花王株式会社 粒子群の粒度検出方法および装置
US5576827A (en) 1994-04-15 1996-11-19 Micromeritics Instrument Corporation Apparatus and method for determining the size distribution of particles by light scattering
FI98765C (fi) 1995-01-16 1997-08-11 Erkki Soini Virtaussytometrinen menetelmä ja laite
US6052184A (en) 1996-11-13 2000-04-18 The Administrators Of The Tulane Educational Fund Miniature, submersible, versatile, light scattering probe for absolute equilibrium and non-equilibrium characterization of macromolecular and colloidal solutions
DE19725211C1 (de) * 1997-06-15 1998-06-04 Alv Laser Vertriebsgesellschaf Faserdetektor zur Detektion des Streulichtes oder des Fluoreszenzlichtes einer flüssigen Suspension
US5956139A (en) * 1997-08-04 1999-09-21 Ohio Aerospace Institute Cross-correlation method and apparatus for suppressing the effects of multiple scattering
US6016193A (en) 1998-06-23 2000-01-18 Awareness Technology, Inc. Cuvette holder for coagulation assay test
US6100976A (en) * 1998-09-21 2000-08-08 The Board Of Regents For Oklahoma State University Method and apparatus for fiber optic multiple scattering suppression
US6509161B1 (en) 2000-02-29 2003-01-21 Gentronix Limited Green fluorescent protein
US6603546B1 (en) 2000-07-21 2003-08-05 I.S.S. (Usa) Inc. Rapid high throughput spectrometer and method
JP2002196222A (ja) 2000-12-25 2002-07-12 Nikon Corp 面位置検出装置、露光装置
JP2002341173A (ja) * 2001-05-15 2002-11-27 Namiki Precision Jewel Co Ltd 微小レンズ付光ファイバアレイ及びその製造方法
EP1291642A1 (en) 2001-09-05 2003-03-12 Linde Medical Sensors AG Sensor system comprising an integrated optical waveguide for the detection of chemical substances
GB0122219D0 (en) 2001-09-13 2001-11-07 Gentronix Ltd Toxicity monitoring
US6794671B2 (en) 2002-07-17 2004-09-21 Particle Sizing Systems, Inc. Sensors and methods for high-sensitivity optical particle counting and sizing
JP3720799B2 (ja) 2002-10-02 2005-11-30 神栄株式会社 花粉センサ
CN1502981A (zh) 2002-11-20 2004-06-09 上海理工大学 基于动态光散射信号分形的颗粒测量方法及装置
US7138091B2 (en) 2003-07-18 2006-11-21 Dade Behring Inc. Reaction cuvette having anti-wicking features for use in an automatic clinical analyzer
US7268881B2 (en) 2004-02-17 2007-09-11 The Curators Of The University Of Missouri Light scattering detector
US10955327B2 (en) * 2004-03-06 2021-03-23 Michael Trainer Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered light
US10620105B2 (en) * 2004-03-06 2020-04-14 Michael Trainer Methods and apparatus for determining characteristics of particles from scattered light
US10386283B2 (en) * 2004-03-06 2019-08-20 Michael Trainer Methods and apparatus for determining particle characteristics by utilizing force on particles
US20070206203A1 (en) 2004-04-10 2007-09-06 Michael Trainer Methods and Apparatus for Determining Particle Characteristics by Measuring Scattered Light
US20080221814A1 (en) 2004-04-10 2008-09-11 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
US20140226158A1 (en) * 2004-03-06 2014-08-14 Michael Trainer Methods and apparatus for determining particle characteristics
GB2429058B (en) * 2004-03-06 2008-12-03 Michael Trainer Method and apparatus for determining the size and shape of particles
JP4517145B2 (ja) * 2004-09-02 2010-08-04 国立大学法人北海道大学 光散乱装置、光散乱測定法、光散乱解析装置および光散乱測定解析法
ITMI20050964A1 (it) 2005-05-25 2006-11-26 Tenax Spa Confezione particolarmente per prodotti ortofrutticoli ed alimentari in genere realizzabile con macchine confezionatrici automatiche
US20070229823A1 (en) 2006-03-31 2007-10-04 Intel Corporation Determination of the number concentration and particle size distribution of nanoparticles using dark-field microscopy
WO2007126389A1 (en) 2006-05-02 2007-11-08 Asensor Pte Ltd Optical detector system for sample analysis having at least two different optical pathlengths
JP2008039539A (ja) 2006-08-04 2008-02-21 Shimadzu Corp 光散乱検出装置
EP1906252A1 (en) 2006-09-28 2008-04-02 Carl Zeiss SMT AG Instrument for measuring the angular distribution of light produced by an illumination system of a microlithographic projection exposure apparatus
US8877458B2 (en) 2007-02-02 2014-11-04 Canadian Blood Services Method of detecting bacterial contamination using dynamic light scattering
CA2699523A1 (en) * 2007-09-13 2009-03-19 Duke University Apparatuses, systems, and methods for low-coherence interferometry (lci)
CN101477023A (zh) 2008-01-02 2009-07-08 杨晖 基于动态光散射信号时间相干度的超细颗粒测量装置及方法
EP2235501B1 (en) 2008-01-15 2018-05-23 Malvern Panalytical Limited Light scattering measurements using simultaneous detection
CN102037343B (zh) * 2008-06-12 2013-10-02 东卡莱罗纳大学 用于三维衍射成像的流式细胞仪系统及方法
JP5172730B2 (ja) 2009-02-05 2013-03-27 株式会社ジェイアール西日本ビルト 外装材用取付部材、外装構造、及びその施工方法
US8493559B2 (en) 2009-03-17 2013-07-23 Trevor Harvard Cuvette
DE102009014080B4 (de) 2009-03-23 2011-12-15 Baumer Innotec Ag Vorrichtung zum Bestimmen von Partikelgrössen
JP5366728B2 (ja) 2009-09-14 2013-12-11 北斗電子工業株式会社 液体中の粒子のサイズの検出方法および装置
DE102010005962B4 (de) * 2010-01-21 2012-01-26 Alv-Laser Vertriebsgesellschaft Mbh Verfahren zur Bestimmung der statischen und/oder dynamischen Lichtstreuung
EP2365313B1 (en) * 2010-03-12 2015-08-26 LS Instruments AG Cross-correlation dynamic light scattering (DLS) method and system
US8717562B2 (en) 2010-08-23 2014-05-06 Scattering Solutions, Inc. Dynamic and depolarized dynamic light scattering colloid analyzer
JP5662742B2 (ja) 2010-08-27 2015-02-04 アイステーシス株式会社 粒径計測装置及び粒径計測方法
US8729502B1 (en) 2010-10-28 2014-05-20 The Research Foundation For The State University Of New York Simultaneous, single-detector fluorescence detection of multiple analytes with frequency-specific lock-in detection
WO2012108306A1 (ja) * 2011-02-10 2012-08-16 株式会社日立ハイテクノロジーズ 異物検出装置及び異物検出方法
US10359361B2 (en) * 2011-02-18 2019-07-23 The General Hospital Corporation Laser speckle micro-rheology in characterization of biomechanical properties of tissues
CN202275041U (zh) 2011-03-17 2012-06-13 上海理工大学 同时测量多颗粒的动态光散射纳米颗粒粒度的装置
GB2493391B (en) * 2011-08-05 2015-09-16 Malvern Instr Ltd Optical detection and analysis of particles
CN202453283U (zh) 2011-12-27 2012-09-26 江西科技师范学院 一种比色皿支撑架
JP5442052B2 (ja) * 2012-02-16 2014-03-12 株式会社堀場製作所 粒子分析装置
RU2015101834A (ru) 2012-06-22 2016-08-10 Малверн Инструментс Лимитед Определение характеристик гетерогенных флюидных проб
EP2698624A1 (de) 2012-08-16 2014-02-19 Siemens Healthcare Diagnostics Products GmbH Reaktionsgefäß
US8854621B1 (en) 2012-08-29 2014-10-07 University Of South Florida Systems and methods for determining nanoparticle dimensions
CN104619233B (zh) * 2012-09-11 2016-09-28 奥林巴斯株式会社 散射光测量装置
RU2525605C2 (ru) 2012-10-26 2014-08-20 Вячеслав Геннадьевич Певгов Способ и устройство для оптического измерения распределения размеров и концентраций дисперсных частиц в жидкостях и газах с использованием одноэлементных и матричных фотоприемников лазерного излучения
EP2869054A1 (en) 2013-11-05 2015-05-06 Malvern Instruments Limited Improvements relating to particle characterisation
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
GB201516851D0 (en) 2015-09-23 2015-11-04 Malvern Instr Ltd Cuvette carrier
JP6936229B2 (ja) 2015-09-23 2021-09-15 マルバーン パナリティカル リミテッド 粒子特性評価
US10634598B2 (en) * 2015-10-02 2020-04-28 Institut National D'optique System and method for individual particle sizing using light scattering techniques
US10119910B2 (en) * 2015-10-09 2018-11-06 Malvern Panalytical Limited Particle characterisation instrument
FR3048240B1 (fr) * 2016-02-29 2018-04-13 Cordouan Tech Dispositif de caracterisation de particules dispersees dans un milieu liquide
GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
US10365198B2 (en) * 2016-04-21 2019-07-30 Malvern Panalytical Limited Particle characterization
US10113945B2 (en) * 2016-05-10 2018-10-30 Microtrac Inc. Method and apparatus for combining measurements of particle characteristics using light scattering and optical imaging
EP3309536A1 (en) * 2016-10-11 2018-04-18 Malvern Panalytical Limited Particle characterisation instrument
DE102017001439A1 (de) * 2017-02-15 2018-08-16 Paragon Ag Partikelmessvorrichtung zur Bestimmung der Partikelmassenkonzentration in Aerosolen mit unterschiedlichen Eigenschaften und Verfahren zur Bestimmung der Partikelmassenkonzentration in Aerosolen mit unterschiedlichen Eigenschaften
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
FR3090874B1 (fr) * 2018-12-21 2022-05-27 Commissariat Energie Atomique Détecteur optique de particules

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010035954A1 (en) * 2000-03-10 2001-11-01 Rahn John Richard Method and apparatus for measuring particle size distributions using light scattering
US20040038413A1 (en) * 2002-08-23 2004-02-26 Kramer Donald L. Method and apparatus for differentiating blood cells using back-scatter
CN101072997A (zh) * 2003-08-14 2007-11-14 塞通诺米公司 用于粒子分类系统的光学检测器
CN101776599A (zh) * 2003-08-14 2010-07-14 塞通诺米/St有限责任公司 用于粒子分类系统的光学检测器
CN102334021A (zh) * 2009-02-27 2012-01-25 贝克曼考尔特公司 用于流式细胞仪的稳定的光学系统
CN103608671A (zh) * 2011-06-15 2014-02-26 马尔文仪器有限公司 表面电荷测量
CN105705932A (zh) * 2013-11-05 2016-06-22 马尔文仪器有限公司 与颗粒表征有关的改善

Also Published As

Publication number Publication date
JP2019512701A (ja) 2019-05-16
US11187638B2 (en) 2021-11-30
EP3220128A1 (en) 2017-09-20
US11747257B2 (en) 2023-09-05
WO2017158368A1 (en) 2017-09-21
EP3376203B1 (en) 2023-08-02
GB201604460D0 (en) 2016-04-27
US20190078990A1 (en) 2019-03-14
JP2022174213A (ja) 2022-11-22
CN108627432A (zh) 2018-10-09
JP7444941B2 (ja) 2024-03-06
US20220091006A1 (en) 2022-03-24
EP3376203A1 (en) 2018-09-19

Similar Documents

Publication Publication Date Title
US11747257B2 (en) Particle characterization
CN110402380B (zh) 利用可调焦透镜的粒子表征
JP2911877B2 (ja) 懸濁液の散乱光或いは蛍光を検出するためのファイバー検出器
EP2270449B1 (en) Dynamic light-scattering measuring apparatus and method for measuring light-scattering intensity of particles in a medium
JP2019512701A5 (OSRAM)
US8705036B2 (en) Method and device for determining the static and/or dynamic scattering of light
US20170307503A1 (en) Flow cytometry with dual laser beams
CN111486952A (zh) 一种光学测量系统
JPH0843292A (ja) コロイド状の媒体の薄層による散乱光の光度を測定する検知器
JP4009442B2 (ja) 低コヒーレンス干渉法を用いた動的光散乱測定装置
EP4191344B1 (en) Imaging device and method for holographic imaging of samples
RU2460988C1 (ru) Способ измерения распределения частиц по размерам в расширенном диапазоне концентраций и устройство для реализации способа (варианты)
JPS61294335A (ja) 粒子解析装置
CN114216865B (zh) 基于激光回馈的共焦显微方法及装置
EP0579829A1 (en) Particle measurement system
JPH02304333A (ja) 流動細胞分析装置
CN121925559A (zh) 用于测量电泳迁移率的设备
WO2023233562A1 (ja) 微粒子計測センサ
JPH01240839A (ja) 粒子解析装置
RU2196299C2 (ru) Устройство измерения характеристик прозрачных неоднородностей
JPH01305338A (ja) 粒子解析装置
JPH0213829A (ja) 粒子測定装置
JPH03197840A (ja) 粒子解析装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination