CN103251383B - 图像形成方法和光学相干层析成像设备 - Google Patents

图像形成方法和光学相干层析成像设备 Download PDF

Info

Publication number
CN103251383B
CN103251383B CN201310015220.7A CN201310015220A CN103251383B CN 103251383 B CN103251383 B CN 103251383B CN 201310015220 A CN201310015220 A CN 201310015220A CN 103251383 B CN103251383 B CN 103251383B
Authority
CN
China
Prior art keywords
image
image information
light
tomographic image
oct
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201310015220.7A
Other languages
English (en)
Chinese (zh)
Other versions
CN103251383A (zh
Inventor
杉田充朗
野里宏治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN103251383A publication Critical patent/CN103251383A/zh
Application granted granted Critical
Publication of CN103251383B publication Critical patent/CN103251383B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0033—Features or image-related aspects of imaging apparatus, e.g. for MRI, optical tomography or impedance tomography apparatus; Arrangements of imaging apparatus in a room
    • A61B5/004—Features or image-related aspects of imaging apparatus, e.g. for MRI, optical tomography or impedance tomography apparatus; Arrangements of imaging apparatus in a room adapted for image acquisition of a particular organ or body part
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02011—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal polarization variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02048—Rough and fine measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02063—Active error reduction, i.e. varying with time by particular alignment of focus position, e.g. dynamic focussing in optical coherence tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02076—Caused by motion
    • G01B9/02077—Caused by motion of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02085—Combining two or more images of different regions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/178—Methods for obtaining spatial resolution of the property being measured
    • G01N2021/1785—Three dimensional
    • G01N2021/1787—Tomographic, i.e. computerised reconstruction from projective measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Surgery (AREA)
  • Pathology (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Molecular Biology (AREA)
  • Biophysics (AREA)
  • Medical Informatics (AREA)
  • Biomedical Technology (AREA)
  • Optics & Photonics (AREA)
  • Ophthalmology & Optometry (AREA)
  • Signal Processing (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
CN201310015220.7A 2007-05-02 2008-04-03 图像形成方法和光学相干层析成像设备 Expired - Fee Related CN103251383B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007-121745 2007-05-02
JP2007121745 2007-05-02
JP2008-066055 2008-03-14
JP2008066055A JP5448353B2 (ja) 2007-05-02 2008-03-14 光干渉断層計を用いた画像形成方法、及び光干渉断層装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN2008800143830A Division CN101674770B (zh) 2007-05-02 2008-04-03 图像形成方法和光学相干层析成像设备

Publications (2)

Publication Number Publication Date
CN103251383A CN103251383A (zh) 2013-08-21
CN103251383B true CN103251383B (zh) 2016-08-03

Family

ID=39689490

Family Applications (2)

Application Number Title Priority Date Filing Date
CN2008800143830A Expired - Fee Related CN101674770B (zh) 2007-05-02 2008-04-03 图像形成方法和光学相干层析成像设备
CN201310015220.7A Expired - Fee Related CN103251383B (zh) 2007-05-02 2008-04-03 图像形成方法和光学相干层析成像设备

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN2008800143830A Expired - Fee Related CN101674770B (zh) 2007-05-02 2008-04-03 图像形成方法和光学相干层析成像设备

Country Status (5)

Country Link
US (2) US8204300B2 (enExample)
EP (1) EP2152144A1 (enExample)
JP (1) JP5448353B2 (enExample)
CN (2) CN101674770B (enExample)
WO (1) WO2008139799A1 (enExample)

Families Citing this family (126)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1962049B1 (de) * 2007-02-21 2015-12-23 Agfa HealthCare N.V. System und Verfahren zur optischen Kohärenztomographie
EP1962051A1 (de) * 2007-02-21 2008-08-27 Agfa HealthCare N.V. System und Verfahren zur optischen Kohärenztomographie
EP2339329A3 (de) * 2007-02-21 2012-04-04 Agfa HealthCare N.V. System und Verfahren zur optischen Kohärenztomographie
ATE511635T1 (de) * 2007-02-21 2011-06-15 Agfa Healthcare Nv System zur optischen kohärenztomographie
EP2267403A3 (de) * 2007-02-21 2011-04-20 Agfa HealthCare N.V. System und Verfahren zur optischen Kohärenztomographie
JP5712342B2 (ja) * 2008-11-27 2015-05-07 ナノフォトン株式会社 光学顕微鏡、及びスペクトル測定方法
EP2199734B1 (de) * 2008-12-16 2016-03-09 Agfa HealthCare NV Verfahren und System zur optischen Kohärenztomographie
DE102008063225A1 (de) * 2008-12-23 2010-07-01 Carl Zeiss Meditec Ag Vorrichtung zur Swept Source Optical Coherence Domain Reflectometry
JP5479047B2 (ja) * 2008-12-26 2014-04-23 キヤノン株式会社 撮像装置および撮像方法
JP5483873B2 (ja) * 2008-12-26 2014-05-07 キヤノン株式会社 光断層撮像装置、および光断層撮像方法
JP5570125B2 (ja) 2009-01-22 2014-08-13 キヤノン株式会社 光断層撮像装置
JP5339934B2 (ja) 2009-01-22 2013-11-13 キヤノン株式会社 光断層撮像装置および光断層撮像方法
JP5279524B2 (ja) 2009-01-22 2013-09-04 キヤノン株式会社 光断層撮像装置、光断層撮像方法
JP5605999B2 (ja) * 2009-03-06 2014-10-15 キヤノン株式会社 光干渉断層撮像方法および装置
JP5743380B2 (ja) * 2009-03-06 2015-07-01 キヤノン株式会社 光断層撮像装置および光断層撮像方法
JP5605998B2 (ja) * 2009-03-06 2014-10-15 キヤノン株式会社 光干渉断層撮像方法および装置
JP5558735B2 (ja) 2009-04-13 2014-07-23 キヤノン株式会社 光断層撮像装置及びその制御方法
JP5725697B2 (ja) * 2009-05-11 2015-05-27 キヤノン株式会社 情報処理装置および情報処理方法
JP5627260B2 (ja) 2009-05-22 2014-11-19 キヤノン株式会社 撮像装置および撮像方法
JP5336964B2 (ja) * 2009-07-23 2013-11-06 オリンパス株式会社 波面測定装置
US8262647B2 (en) * 2009-07-29 2012-09-11 Alcon Lensx, Inc. Optical system for ophthalmic surgical laser
JP5426960B2 (ja) 2009-08-04 2014-02-26 キヤノン株式会社 撮像装置及び撮像方法
JP4902721B2 (ja) * 2009-10-23 2012-03-21 キヤノン株式会社 光断層画像生成装置及び光断層画像生成方法
JP5036785B2 (ja) * 2009-10-23 2012-09-26 キヤノン株式会社 光断層画像生成方法及び光断層画像生成装置
JP5025715B2 (ja) * 2009-12-08 2012-09-12 キヤノン株式会社 断層画像撮影装置、画像処理装置、画像処理システム、画像処理装置の制御方法及びプログラム
JP5752955B2 (ja) * 2010-03-16 2015-07-22 株式会社ニデック 光断層像撮影装置
WO2011115232A1 (ja) * 2010-03-17 2011-09-22 国立大学法人 長岡技術科学大学 電界スペクトル測定装置および物体測定装置
JP5597012B2 (ja) * 2010-03-31 2014-10-01 キヤノン株式会社 断層画像撮像装置および断層画像撮像方法
JP5587014B2 (ja) * 2010-03-31 2014-09-10 株式会社ニデック 眼科装置
JP5637720B2 (ja) * 2010-03-31 2014-12-10 キヤノン株式会社 断層撮像方法および断層撮像装置の制御装置
JP5637721B2 (ja) * 2010-03-31 2014-12-10 キヤノン株式会社 断層撮像装置および断層撮像装置の制御装置
KR101515034B1 (ko) 2010-03-31 2015-04-24 캐논 가부시끼가이샤 광간섭 단층촬상장치 및 그 제어장치
JP5709399B2 (ja) * 2010-04-02 2015-04-30 キヤノン株式会社 被検体情報取得装置およびその制御方法、ならびにプログラム
JP5808119B2 (ja) 2010-04-13 2015-11-10 キヤノン株式会社 模型眼、光断層画像撮像装置の調整方法、及び評価方法
CA2797725A1 (en) * 2010-04-29 2011-11-10 Massachusetts Institute Of Technology Method and apparatus for motion correction and image enhancement for optical coherence tomography
ES2806934T3 (es) * 2010-06-21 2021-02-19 Oculus Optikgeraete Gmbh Análisis de la presión intraocular
JP5610884B2 (ja) 2010-07-09 2014-10-22 キヤノン株式会社 光断層撮像装置及び光断層撮像方法
JP5539089B2 (ja) 2010-07-23 2014-07-02 キヤノン株式会社 眼科装置、眼科装置の制御方法及びプログラム
JP5731815B2 (ja) 2010-12-20 2015-06-10 キヤノン株式会社 撮像方法、撮像装置、およびプログラム
EP2654607B1 (en) 2010-12-21 2019-04-24 3Shape A/S Optical system in 3d focus scanner
JP5794664B2 (ja) * 2011-01-20 2015-10-14 キヤノン株式会社 断層画像生成装置及び断層画像生成方法
JP5823133B2 (ja) 2011-02-04 2015-11-25 株式会社トーメーコーポレーション 眼科装置
CN103402422B (zh) * 2011-02-15 2016-06-29 视乐有限公司 用于光学相干层析技术的设备和方法
EP2680743A4 (en) * 2011-03-02 2014-08-13 Diagnostic Photonics Inc PORTABLE OPTICAL PROBE WITH TIGHT FOCUS
WO2012128367A1 (ja) 2011-03-24 2012-09-27 株式会社ニコン 光干渉断層観察装置、画像間の相対位置決定方法および画像間の相対位置決定プログラム
JP5220156B2 (ja) 2011-03-31 2013-06-26 キヤノン株式会社 医療装置および医療システム
JP6023406B2 (ja) * 2011-06-29 2016-11-09 キヤノン株式会社 眼科装置、評価方法および当該方法を実行するプログラム
JP5686684B2 (ja) * 2011-07-19 2015-03-18 株式会社日立製作所 光学装置
CN107913053B (zh) * 2011-08-12 2020-10-30 直观外科手术操作公司 外科手术器械中的图像捕获单元
KR20140096262A (ko) 2011-08-21 2014-08-05 데이비드 레비츠 스마트폰에 장착된 광 간섭 단층 촬영 시스템
JP5955163B2 (ja) 2011-09-06 2016-07-20 キヤノン株式会社 画像処理装置および画像処理方法
JP2013075035A (ja) * 2011-09-30 2013-04-25 Canon Inc 光断層像撮像方法、光断層像撮像装置およびプログラム
JP5891001B2 (ja) * 2011-10-19 2016-03-22 株式会社トーメーコーポレーション 断層撮影装置及び断層像の補正処理方法
JP5926533B2 (ja) * 2011-10-27 2016-05-25 キヤノン株式会社 眼科装置
WO2013098942A1 (ja) * 2011-12-27 2013-07-04 キヤノン株式会社 情報信号生成方法
JP6061554B2 (ja) 2012-01-20 2017-01-18 キヤノン株式会社 画像処理装置及び画像処理方法
JP5988772B2 (ja) * 2012-01-20 2016-09-07 キヤノン株式会社 画像処理装置及び画像処理方法
JP6146951B2 (ja) 2012-01-20 2017-06-14 キヤノン株式会社 画像処理装置、画像処理方法、撮影装置及び撮影方法
JP5936368B2 (ja) 2012-01-20 2016-06-22 キヤノン株式会社 光干渉断層撮影装置及びその作動方法
JP6039185B2 (ja) 2012-01-20 2016-12-07 キヤノン株式会社 撮影装置
JP2013148509A (ja) 2012-01-20 2013-08-01 Canon Inc 画像処理装置及び画像処理方法
JP5997450B2 (ja) 2012-02-08 2016-09-28 キヤノン株式会社 収差補正方法、および収差補正装置
JP5955020B2 (ja) 2012-02-21 2016-07-20 キヤノン株式会社 眼底撮像装置及び方法
JP6021394B2 (ja) 2012-04-06 2016-11-09 キヤノン株式会社 撮像方法および撮像装置
CN102613960B (zh) * 2012-04-16 2015-03-04 北京信息科技大学 一种频域光学相干层析信号位置和相位配准方法
JP5631361B2 (ja) * 2012-06-18 2014-11-26 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
EP2868254B1 (en) * 2012-06-28 2018-04-04 Olympus Corporation Endoscope system
JP2014110883A (ja) * 2012-10-30 2014-06-19 Canon Inc 画像処理装置及び画像処理方法
JP6075755B2 (ja) 2012-11-19 2017-02-08 株式会社トプコン 光画像計測装置
US9677869B2 (en) 2012-12-05 2017-06-13 Perimeter Medical Imaging, Inc. System and method for generating a wide-field OCT image of a portion of a sample
JP6227337B2 (ja) * 2013-01-24 2017-11-08 株式会社日立エルジーデータストレージ 光計測装置
JP6274728B2 (ja) * 2013-01-31 2018-02-07 キヤノン株式会社 光干渉断層撮像装置およびその制御方法
US20140218744A1 (en) * 2013-02-01 2014-08-07 The General Hospital Corporation Systems, method and computer-accessible medium which utilize synthetic aperture(s) for extending depth-of-focus of optical coherence tomography imaging
JP6224908B2 (ja) 2013-04-17 2017-11-01 キヤノン株式会社 撮像装置
JP5696178B2 (ja) * 2013-05-29 2015-04-08 株式会社トプコン 光断層画像化装置及びその作動方法
EP2813801B1 (en) * 2013-06-10 2018-10-31 Mitutoyo Corporation Interferometer system and method to generate an interference signal of a surface of a sample
CN103292891B (zh) * 2013-06-26 2014-11-05 中国航空工业集团公司北京长城计量测试技术研究所 光纤式同步可调谐面振动测量系统
US8939582B1 (en) * 2013-07-12 2015-01-27 Kabushiki Kaisha Topcon Optical coherence tomography with dynamic focus sweeping and windowed averaging
WO2015033394A1 (ja) * 2013-09-04 2015-03-12 株式会社日立製作所 光断層観察装置
JP5714082B2 (ja) * 2013-12-02 2015-05-07 キヤノン株式会社 撮像装置及び撮像方法
US10307056B2 (en) * 2013-12-05 2019-06-04 Bioptigen, Inc. Systems and methods for quantitative doppler optical coherence tomography
US9291500B2 (en) * 2014-01-29 2016-03-22 Raytheon Company Configurable combination spectrometer and polarizer
EP3102091B1 (en) 2014-02-04 2019-01-16 University of Southern California Optical coherence tomography (oct) system with improved motion contrast
US9763570B2 (en) * 2014-02-04 2017-09-19 University Of Southern California Optical coherence tomography (OCT) system with phase-sensitive B-scan registration
US9192295B1 (en) 2014-06-11 2015-11-24 L&R Medical Inc. Focusing algorithm in OCT-only systems
CA2951623C (en) * 2014-08-12 2019-03-12 Wavelight Gmbh Instantaneous time domain optical coherence tomography
DE102014115157A1 (de) * 2014-10-17 2016-04-21 Carl Zeiss Ag Optische Kohärenztomographie zur Messung an der Retina
JP2016142551A (ja) * 2015-01-30 2016-08-08 並木精密宝石株式会社 光イメージング装置
CN105796053B (zh) * 2015-02-15 2018-11-20 执鼎医疗科技（杭州）有限公司 利用oct测量动态对比度和估计横向流量的方法
US10423002B2 (en) 2015-06-17 2019-09-24 Maxell, Ltd. Imaging apparatus capable of generating an image using moire without a lens
KR101709973B1 (ko) * 2015-06-30 2017-02-27 한국과학기술원 혼합 빔 스캐닝 광 가간섭 단층촬영 방법 및 장치
JP5991415B2 (ja) * 2015-07-31 2016-09-14 株式会社ニデック 眼科撮影装置
CN105241820B (zh) * 2015-10-13 2017-11-07 中北大学 一种弹光调制和电光调制级联的相位调制型椭偏仪
KR101861672B1 (ko) * 2015-10-29 2018-05-29 주식회사 고영테크놀러지 파장 가변 레이저를 이용한 대면적 oct 시스템과 3차원 이미지 보정 방법
WO2017090210A1 (ja) 2015-11-27 2017-06-01 株式会社ニコン 顕微鏡、観察方法、及び画像処理プログラム
KR101746763B1 (ko) 2016-02-01 2017-06-14 한국과학기술원 망막 또는 맥락막 내 혈관조영 광가간섭 단층촬영 장치 및 이를 이용한 질병 진단방법
WO2017154171A1 (ja) * 2016-03-10 2017-09-14 オリンパス株式会社 画像取得装置および画像取得方法
KR101915843B1 (ko) * 2016-06-29 2018-11-08 한국과학기술원 복굴절 매질을 이용한 영상 깊이 추정 방법 및 장치
JP6246875B1 (ja) * 2016-08-24 2017-12-13 Ckd株式会社 計測装置
JP6762810B2 (ja) * 2016-09-01 2020-09-30 株式会社Ｓｃｒｅｅｎホールディングス 画像処理装置および画像処理方法
JP7019700B2 (ja) 2016-12-21 2022-02-15 アキュセラ インコーポレイテッド 網膜の厚さを測定するための光干渉断層撮影（ｏｃｔ）システム
US11131539B2 (en) * 2017-06-12 2021-09-28 Sightline Innovation Inc. Multimodal image data acquisition system and method
EP3655748B1 (en) 2017-07-18 2023-08-09 Perimeter Medical Imaging, Inc. Sample container for stabilizing and aligning excised biological tissue samples for ex vivo analysis
JP6976778B2 (ja) 2017-09-07 2021-12-08 キヤノン株式会社 情報処理装置、情報処理方法及びプログラム
EP3675709B1 (en) 2017-11-07 2023-07-26 Notal Vision Ltd. Systems for alignment of ophthalmic imaging devices
KR102661654B1 (ko) 2017-11-07 2024-04-29 노탈 비전 엘티디. 망막 이미징 디바이스 및 관련 방법들
KR102526651B1 (ko) 2017-12-01 2023-04-27 삼성전자주식회사 영상 데이터 처리 방법 및 장치
JP7144822B2 (ja) * 2017-12-22 2022-09-30 株式会社トーメーコーポレーション 光断層画像撮影装置
CN108444914A (zh) * 2018-03-15 2018-08-24 南京理工大学 一种基于射频光子学的光子外差式信息相干成像感测系统
CN118576146A (zh) 2018-06-20 2024-09-03 奥克塞拉有限公司 基于家庭的眼科应用的微型移动低成本光学相干断层扫描系统
CN108982455B (zh) * 2018-07-31 2020-08-18 浙江大学 一种多焦点光切片荧光显微成像方法和装置
JP7108985B2 (ja) * 2018-08-24 2022-07-29 キヤノン株式会社 画像処理装置、画像処理方法、プログラム
US10595722B1 (en) 2018-10-03 2020-03-24 Notal Vision Ltd. Automatic optical path adjustment in home OCT
KR101990251B1 (ko) * 2018-10-15 2019-06-17 경북대학교 산학협력단 광 간섭성 단층 촬영 장치 및 이를 이용한 영상 생성 방법
US10653311B1 (en) 2019-06-12 2020-05-19 Notal Vision Ltd. Home OCT with automatic focus adjustment
JP7250626B2 (ja) * 2019-06-13 2023-04-03 株式会社トプコン 眼科装置及び眼科装置の制御方法
CN110558943B (zh) * 2019-09-06 2022-03-04 中国科学院深圳先进技术研究院 光学成像方法、相关装置及系统
JP7216218B2 (ja) 2019-09-11 2023-01-31 株式会社トプコン 眼科装置
CN111493831B (zh) * 2020-04-24 2023-01-06 天津恒宇医疗科技有限公司 一种基于oct光干涉的自适应校准系统及工作方法
US12206971B2 (en) * 2020-06-23 2025-01-21 The University Of Tokyo Information processing system having a mirror for switching a gaze direction of an imaging unit
US10959613B1 (en) 2020-08-04 2021-03-30 Acucela Inc. Scan pattern and signal processing for optical coherence tomography
CN111912908B (zh) * 2020-08-07 2021-08-17 北京航空航天大学 一种基于光致超声和激光干涉的全光学超声探测装置
US11974807B2 (en) * 2020-08-14 2024-05-07 Acucela Inc. System and method for optical coherence tomography a-scan decurving
CN112587084A (zh) * 2021-03-04 2021-04-02 季华实验室 一种成像深度可实时调整的光学相干成像系统
CN113837947B (zh) * 2021-11-29 2022-05-20 南开大学 一种获得光学相干层析大焦深图像的处理方法
WO2024007087A1 (en) * 2022-07-08 2024-01-11 Maltais Tariant Raphael Velocity measurement by decorrelation ratio of structured optical signals

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4410244A (en) * 1977-12-23 1983-10-18 Randwal Instrument Co., Inc. Retinal acuity testing device
CN1045028A (zh) * 1989-02-06 1990-09-05 凤凰激光系统有限公司 精密激光外科手术用的方法及仪器
CN1379647A (zh) * 1999-10-21 2002-11-13 泰思诺拉斯眼科系统公司 用于光学治疗的虹膜识别和跟踪
EP1582142A1 (en) * 2004-03-30 2005-10-05 Kabushiki Kaisha TOPCON Optical interferometer for imaging at several depth regions of an object
CN1694644A (zh) * 2002-06-28 2005-11-09 Oti眼技术股份有限公司 可调的深度分辨率及多功能光学映射装置
CN1947652A (zh) * 2005-10-12 2007-04-18 株式会社拓普康 光图像计测装置、眼底观察装置、及存储光图像计测程序与眼底观察程序的存储媒体

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69227902T3 (de) * 1991-04-29 2010-04-22 Massachusetts Institute Of Technology, Cambridge Vorrichtung für optische abbildung und messung
US6137585A (en) * 1998-05-15 2000-10-24 Laser Diagnostic Technologies, Inc. Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures
JP4464519B2 (ja) * 2000-03-21 2010-05-19 オリンパス株式会社 光イメージング装置
US6293674B1 (en) * 2000-07-11 2001-09-25 Carl Zeiss, Inc. Method and apparatus for diagnosing and monitoring eye disease
EP2333523B1 (en) * 2001-04-30 2020-04-08 The General Hospital Corporation Method and apparatus for improving image clarity and sensitivity in optical coherence tomography using dynamic feedback to control focal properties and coherence gating
US7355716B2 (en) * 2002-01-24 2008-04-08 The General Hospital Corporation Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
US7113818B2 (en) * 2002-04-08 2006-09-26 Oti Ophthalmic Technologies Inc. Apparatus for high resolution imaging of moving organs
WO2003105678A2 (en) * 2002-06-12 2003-12-24 Advanced Research And Technology Institute, Inc. Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy
JP4566685B2 (ja) 2004-10-13 2010-10-20 株式会社トプコン 光画像計測装置及び光画像計測方法
JP4756854B2 (ja) 2004-12-03 2011-08-24 株式会社トプコン 分光眼底画像データ測定装置及び測定方法
US7850305B2 (en) * 2004-12-03 2010-12-14 Topcon Corporation Apparatus and method for measuring spectrum image data of eyeground
US7365856B2 (en) * 2005-01-21 2008-04-29 Carl Zeiss Meditec, Inc. Method of motion correction in optical coherence tomography imaging
JP2006215007A (ja) * 2005-02-07 2006-08-17 Fujinon Corp プローブユニット
US8064989B2 (en) * 2005-09-29 2011-11-22 Bioptigen, Inc. Portable optical coherence tomography (OCT) devices and related systems
JP2007101250A (ja) * 2005-09-30 2007-04-19 Fujifilm Corp 光断層画像化方法
US7400410B2 (en) * 2005-10-05 2008-07-15 Carl Zeiss Meditec, Inc. Optical coherence tomography for eye-length measurement
DE102006014625B3 (de) * 2006-03-29 2007-10-25 Siemens Ag Verfahren zur Reduktion von Stufenartefakten in einer Cardio-CT-Darstellung sowie zugehöriges Speichermedium
TW200739033A (en) * 2006-04-07 2007-10-16 Chien Chou Cross-sectional scanning method using optical image and the apparatus thereof
JP5523658B2 (ja) 2007-03-23 2014-06-18 株式会社トプコン 光画像計測装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4410244A (en) * 1977-12-23 1983-10-18 Randwal Instrument Co., Inc. Retinal acuity testing device
CN1045028A (zh) * 1989-02-06 1990-09-05 凤凰激光系统有限公司 精密激光外科手术用的方法及仪器
CN1379647A (zh) * 1999-10-21 2002-11-13 泰思诺拉斯眼科系统公司 用于光学治疗的虹膜识别和跟踪
CN1694644A (zh) * 2002-06-28 2005-11-09 Oti眼技术股份有限公司 可调的深度分辨率及多功能光学映射装置
EP1582142A1 (en) * 2004-03-30 2005-10-05 Kabushiki Kaisha TOPCON Optical interferometer for imaging at several depth regions of an object
CN1947652A (zh) * 2005-10-12 2007-04-18 株式会社拓普康 光图像计测装置、眼底观察装置、及存储光图像计测程序与眼底观察程序的存储媒体

Also Published As

Publication number Publication date
US8204300B2 (en) 2012-06-19
CN101674770A (zh) 2010-03-17
US20100166293A1 (en) 2010-07-01
US20120218557A1 (en) 2012-08-30
WO2008139799A1 (en) 2008-11-20
US8384908B2 (en) 2013-02-26
EP2152144A1 (en) 2010-02-17
JP2008298767A (ja) 2008-12-11
JP5448353B2 (ja) 2014-03-19
CN103251383A (zh) 2013-08-21
CN101674770B (zh) 2013-02-20

Similar Documents

Publication Publication Date Title
CN103251383B (zh) 图像形成方法和光学相干层析成像设备
US11872015B2 (en) Apparatus and method for confocal microscopy using dispersed structured illumination
US9167144B2 (en) Camera adapter based optical imaging apparatus
US8451452B2 (en) Method for depth resolved wavefront sensing, depth resolved wavefront sensors and method and apparatus for optical imaging
CN101791213B (zh) 光学断层图像形成装置
US8514404B2 (en) Multiple path interferometer and method
US9820645B2 (en) Ophthalmologic apparatus
US9039175B2 (en) Three-dimensional retina image generation device
US20090015842A1 (en) Phase Sensitive Fourier Domain Optical Coherence Tomography
JP6360065B2 (ja) スペクトル領域干渉法における信号処理方法および装置、並びにスペクトル領域光コヒーレンストモグラフィの方法および装置
EP2279690A1 (en) Optical tomographic imaging apparatus and method
US20080002183A1 (en) Multiplexing Spectrum Interference Optical Coherence Tomography
JP2018516375A (ja) 高分解能３ｄスペクトル領域光学撮像装置及び方法
GB2407155A (en) Spectral interferometry method and apparatus
CN114646613A (zh) 一种全息点阵相干成像方法与系统
US12467735B2 (en) Apparatus and method for light sheet imaging with optical coherence gating
US8873065B2 (en) Tomographic imaging apparatus and tomographic imaging method
JP5784100B2 (ja) 画像形成装置及び画像形成方法
JP5828811B2 (ja) 撮像装置及びその制御方法
Holmes Theory and applications of multi-beam OCT

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160803