CN103035605B - 半导体装置及其制造方法 - Google Patents

半导体装置及其制造方法 Download PDF

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CN103035605B
CN103035605B CN201210366786.XA CN201210366786A CN103035605B CN 103035605 B CN103035605 B CN 103035605B CN 201210366786 A CN201210366786 A CN 201210366786A CN 103035605 B CN103035605 B CN 103035605B
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wiring pattern
insulated substrate
semiconductor device
relay terminal
power terminal
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CN103035605A (zh
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大月高实
小原太
小原太一
后藤章
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Mitsubishi Electric Corp
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Abstract

本发明的目的在于提供一种适合于低成本化的半导体装置及其制造方法。本申请发明的半导体装置的特征在于,具备:绝缘基板;布线图形,形成在该绝缘基板上;半导体芯片,固定在该布线图形上;中继端子,以一端固定于该绝缘基板且另一端向该绝缘基板的上方延伸的方式由与该布线图形相同的材料形成,并且与该半导体芯片电连接;控制电路,与该中继端子电连接,发送该半导体芯片的控制信号。

Description

半导体装置及其制造方法
技术领域
本发明涉及在例如大功率的开关等中使用的半导体装置及其制造方法。
背景技术
在专利文献1中公开了在绝缘基板上形成了成为布线图形的金属板的半导体装置。在布线图形上固定有向绝缘基板的上方延伸的连接端子。连接端子是将半导体装置与外部连接的端子。
现有技术文献
专利文献
专利文献1:日本特开2002-315357号公报。
在专利文献1所公开的半导体装置中,将连接端子固定在布线图形上,所以,制造工序复杂。其结果是,专利文献1中所公开的半导体装置为高成本。
发明内容
本发明是为了解决上述课题而提出的,其目的在于提供一种适合于低成本化的半导体装置及其制造方法。
本发明提供一种半导体装置,其特征在于,具备:绝缘基板;布线图形,形成在该绝缘基板上;半导体芯片,固定在该布线图形上;中继端子,以一端固定于该绝缘基板且另一端向该绝缘基板的上方延伸的方式由与该布线图形相同的材料形成,并且与该半导体芯片电连接;控制电路,与该中继端子电连接,发送该半导体芯片的控制信号。
本发明提供另一种半导体装置,其特征在于,具备:绝缘基板;布线图形,在该绝缘基板上以具有第一布线图形、第二布线图形、第三布线图形的方式形成;半导体芯片,固定在该第一布线图形上;中继端子,一端埋入到该第二布线图形且另一端向该绝缘基板的上方延伸,并且与该半导体芯片电连接;控制电路,与该中继端子电连接,发送该半导体芯片的控制信号;功率端子,一端埋入到该第三布线图形且另一端向该绝缘基板的上方延伸,并且与该半导体芯片电连接。
本发明提供一种半导体装置的制造方法,其特征在于,具备:在模具的内部配置绝缘基板的工序,该模具具有用于在该绝缘基板上形成布线图形的布线图形用空腔和用于形成从该绝缘基板向上方延伸的中继端子的中继端子用空腔;使铝流入到该布线图形用空腔和该中继端子用空腔中的铝注入工序;对该铝进行冷却的工序。
根据本发明,能够提供一种适合于低成本化的半导体装置及其制造方法。
附图说明
图1是本发明的实施方式1的半导体装置的剖面图。
图2是示出在本发明的实施方式1的半导体装置的制造方法中使用的模具等的图。
图3是本发明的实施方式2的半导体装置的剖面图。
图4是示出在本发明的实施方式2的半导体装置的制造方法中使用的模具等的图。
图5是本发明的实施方式3的半导体装置的剖面图。
图6是本发明的实施方式4的半导体装置的剖面图。
图7是本发明的实施方式5的半导体装置的剖面图。
图8是本发明的实施方式6的半导体装置的剖面图。
图9是示出在本发明的实施方式6的半导体装置的制造方法中使用的模具等的图。
图10是示出将控制电路固定在布线图形上的半导体装置的剖面图。
图11是示出形成了模塑树脂的半导体装置的剖面图。
图12是示出形成了粘接底涂剂(adhesive primer)的半导体装置的剖面图。
具体实施方式
实施方式1
图1是本发明的实施方式1的半导体装置的剖面图。半导体装置10具备绝缘基板12。绝缘基板12由例如AlN、Al2O3、SiN等形成。在绝缘基板12上形成有布线图形14a、14b。在绝缘基板12上还形成有中继端子14c。中继端子14c以一端固定于绝缘基板12且另一端向绝缘基板12的上方延伸的方式由与布线图形14a、14b相同的材料形成。
在绝缘基板12的背面形成有背面图形16。背面图形16以及布线图形14a、14b由厚度1~5mm的铝形成。利用焊料18将半导体芯片20固定于布线图形14b。半导体芯片20例如由使用了硅的IGBT或二极管形成。半导体芯片20利用引线22与中继端子14c以及布线图形14a电连接。
利用粘接剂24a、24b将壳体26固定于绝缘基板12。壳体26以将背面图形16露出到外部的方式形成。功率端子28以沿着壳体26的内壁的方式形成。功率端子28利用引线22与半导体芯片20电连接。
在壳体26中形成有硅胶(silicon gel)30。硅胶30将半导体芯片20密封。中继端子14c和功率端子28从硅胶30延伸到外部。控制基板32与硅胶30的外部的中继端子14c连接。控制电路34固定于控制基板32。控制电路34是与中继端子14c电连接并且发送半导体芯片20的控制信号的电路。将壳体26的盖子38安装在控制基板32的上方。控制端子40固定于控制基板32。控制端子40延伸到盖子38的外部。
接着,对本发明实施方式1的半导体装置的制造方法进行说明。图2是示出在本发明的实施方式1的半导体装置的制造方法中使用的模具等的图。利用铸造来形成上述的布线图形14a、14b、中继端子14c以及背面图形16。具体地说,使用模具42、44来形成。在模具42中形成有用于在绝缘基板12上形成布线图形14a、14b的布线图形用空腔14a’、14b’。此外,形成有用于形成从绝缘基板向上方延伸的中继端子14c的中继端子用空腔14c’。在模具44中形成有用于形成背面图形16的背面图形用空腔16’。使用模具42、44进行以下的处理。
首先,在模具42、44的内部配置绝缘基板12。接着,使熔融的铝流入到布线图形用空腔14a’、14b’、中继端子用空腔14c’以及背面图形用空腔16’中。将该工序称为铝注入工序。接着,将上述的铝冷却。接着,将模具42、44从成形物上取下,形成了布线图形14a、14b、中继端子14c以及背面图形16。之后,进行将半导体芯片20焊接在布线图形14b上等操作,形成图1的半导体装置10。
根据本发明的实施方式1的半导体装置,能够利用铸造与布线图形14a、14b等同时形成中继端子14c。因此,能够省略将中继端子固定于布线图形的工序来制造半导体装置。因此,能够制造适合于低成本化的半导体装置。
实施方式2
本发明的实施方式2的半导体装置及其制造方法与实施方式1共同点较多,所以,以与实施方式1的不同点为中心进行说明。图3是本发明的实施方式2的半导体装置的剖面图。半导体装置50具备功率端子14d。功率端子14d以一端固定于绝缘基板12并且另一端向绝缘基板12的上方延伸的方式形成。功率端子14d由与布线图形14b相同的材料即铝形成。因此,功率端子14d、布线图形14b、中继端子14c以及背面图形16全部由铝形成。并且,功率端子14d利用引线22与半导体芯片20电连接。
接着,对本发明的实施方式2的半导体装置的制造方法进行说明。本发明的实施方式2的半导体装置的制造方法基本上与实施方式1相同,但是,模具的形状不同。图4是示出在本发明的实施方式2的半导体装置的制造方法中使用的模具等的图。模具46具有用于形成从绝缘基板12向上方延伸的功率端子14d的功率端子用空腔14d’。在铝注入工序中,将熔融的铝注入到布线图形用空腔14b’、中继端子用空腔14c’、功率端子用空腔14d’以及背面图形用空腔16’中。利用功率端子用空腔14d’以从绝缘基板12笔直向上方延伸的方式形成的部分在取下模具46之后折弯,使得成为功率端子14d的形状。这样,在本发明的实施方式2的半导体装置的制造方法中,使用模具44、46利用铸造来形成布线图形14b、中继端子14c、功率端子14d以及背面图形16。
根据本发明的实施方式2的半导体装置及其制造方法,利用铸造统一形成布线图形14b、中继端子14c、功率端子14d以及背面图形16,所以,工序变得简单,能够制造适合于低成本化的半导体装置。
实施方式3
本发明的实施方式3的半导体装置及其制造方法与实施方式1共同点较多,所以,以与实施方式1的不同点为中心进行说明。图5是本发明的实施方式3的半导体装置的剖面图。半导体装置60具备在绝缘基板12上形成的控制电路用布线图形14e。控制电路用布线图形14e由与布线图形14b相同的材料即铝形成。因此,控制电路用布线图形14e、功率端子14d、布线图形14b、中继端子14c以及背面图形16全部由铝形成。控制电路34固定于控制电路用布线图形14e。控制电路34利用引线22与半导体芯片20以及中继端子14c连接。并且,控制电路34被硅胶30密封。
根据本发明的实施方式3的半导体装置,将控制电路34固定在控制电路用布线图形14e上,所以,不需要控制基板。此外,例如,在图1的半导体装置中,为了将半导体芯片与外部连接而需要中继端子和控制端子,但是,在本发明的实施方式3的半导体装置中,仅中继端子14c即可。因此,能够制造适合于低成本化的半导体装置。
实施方式4
本发明的实施方式4的半导体装置及其制造方法与实施方式3共同点较多,所以,以与实施方式3的不同点为中心进行说明。图6是本发明的实施方式4的半导体装置的剖面图。半导体装置70具备模塑树脂72。模塑树脂72以使背面图形16的与绝缘基板12相反的面、中继端子14c的另一端以及功率端子14d的另一端露出到外部的方式覆盖绝缘基板12、布线图形14b、控制电路用布线图形14e、半导体芯片20、中继端子14c、控制电路34以及功率端子14d。模塑树脂72的线膨胀系数与布线图形14b的线膨胀系数(铝的线膨胀系数)相同。
根据本发明的实施方式4的半导体装置70,由于形成了模塑树脂72,所以,不需要壳体、盖子、硅胶。因此,能够制造适合于低成本化的半导体装置。但是,在半导体装置的结构方面,绝缘基板的背面的背面图形与绝缘基板上的布线图形等相比为大面积。即,与绝缘基板之上(表面)相比,在背面形成有大量的铝。若这样,则存在如下情况:由于加热后的背面图形的收缩,绝缘基板以向上凸的方式发生翘曲。但是,在本发明的实施方式4的半导体装置中,使模塑树脂72的线膨胀系数与布线图形14b的膨胀系数一致,所以,将绝缘基板12的周围包围的材料的线膨胀系数均一。因此,可以防止绝缘基板12的翘曲。
模塑树脂72的材料不特别限定,但是,若在环氧树脂中加入玻璃或二氧化硅等填充材料,则容易以线膨胀系数与铝一致的方式进行调整。此外,也可以将模塑树脂72的材料自身进行最优化。例如,作为模塑树脂72,考虑使用苯酚树脂。但是,关于模塑树脂72的线膨胀系数,若果在能够抑制绝缘基板12的翘曲的程度上接近铝的线膨胀系数,则不特别限定。因此,只要能够抑制绝缘基板12的翘曲,模塑树脂72的线膨胀系数和铝的线膨胀系数也可以不一致。
实施方式5
本发明的实施方式5的半导体装置及其制造方法与实施方式4共同点较多,因此,以与实施方式4的不同点为中心进行说明。图7是本发明的实施方式5的半导体装置的剖面图。半导体装置74具有在布线图形的表面(称为由铝形成的部分的表面)和绝缘基板12的表面形成的粘接底涂剂76。粘接底涂剂76是为了提高模塑树脂72和绝缘基板12的紧贴性而形成的。根据本发明的实施方式5的半导体装置,能够利用粘接底涂剂76确保模塑树脂72和绝缘基板12的紧贴性。
实施方式6
本发明的实施方式6的半导体装置及其制造方法与实施方式1共同点较多,所以,以与实施方式1的不同点为中心进行说明。图8是本发明的实施方式6的半导体装置的剖面图。半导体装置80的特征在于,中继端子82的一端和功率端子84的一端分别埋入到布线图形中。
在绝缘基板12上形成有第一布线图形14f、第二布线图形14g以及第三布线图形14h。有时将第一布线图形14f、第二布线图形14g以及第三布线图形14h概括称为布线图形。半导体芯片20固定在第一布线图形14f上。
半导体装置80具备中继端子82。中继端子82的一端埋入到第二布线图形14g中,另一端向绝缘基板12的上方延伸,与控制基板32连接。中继端子82经由第二布线图形14g和引线22与半导体芯片20电连接。发送半导体芯片20的控制信号的控制电路34与中继端子82的另一端电连接。
半导体装置80具备功率端子84。功率端子84的一端埋入到第三布线图形14h中,另一端向绝缘基板12的上方延伸。功率端子84与半导体芯片20电连接。
图9是示出在本发明的实施方式6的半导体装置的制造方法中使用的模具等的图。模具86具有:用于形成第一布线图形14f的第一布线图形用空腔14f’;用于形成第二布线图形14g的第二布线图形用空腔14g’;用于形成第三布线图形14h的第三布线图形用空腔14h’。使用模具44、86在绝缘基板12上形成第一布线图形14f、第二布线图形14g、第三布线图形14h以及背面图形16。此时,在将中继端子82和功率端子84插入到模具86中的状态下,使铝流入到模具44、86内,由此,将中继端子82的一端埋入到第二布线图形14g中,将功率端子84的一端埋入到第三布线图形14h中。以从绝缘基板12笔直向上方延伸的方式形成的功率端子84在取下模具86之后折弯。
根据本发明的实施方式6的半导体装置及其制造方法,能够在形成布线图形的同时将中继端子82和功率端子84固定于布线图形。因此,能够将工序简单化。但是,在中继端子或功率端子的形状复杂的情况下,制作与它们对应的模具在成本方面是困难的。但是,根据本发明的实施方式6的半导体装置及其制造方法,将中继端子和功率端子埋入到布线图形中,所以,不需要使模具与中继端子或功率端子的形状匹配。因此,能够利用简单的工序制造具有复杂的结构的中继端子或功率端子的半导体装置。
若本发明的实施方式6的半导体装置及其制造方法与上述的各种技术进行组合,则对于进一步低成本化是有效的。图10是示出将控制电路固定于布线图形的半导体装置的剖面图。该结构不需要控制基板等,所以,对于低成本化是有效的。图11是示出形成了模塑树脂的半导体装置的剖面图。通过形成模塑树脂72,从而不需要壳体、盖子、硅胶,所以,对于低成本化是有效的。图12是示出形成了粘接底涂剂的半导体装置的剖面图。该结构与图11的结构相比,在能够提高可靠性方面是有效的。
上述实施方式1至6的半导体芯片20由硅形成,但是,也可以由带隙比硅大的宽带隙半导体形成半导体芯片。作为宽带隙半导体,例如有碳化硅、氮化镓类材料、或者金刚石。若利用宽带隙半导体形成IGBT或二极管,则能够将能允许的电流密度变大,所以,能够将它们小型化。
附图标记的说明:
10 半导体装置
12 绝缘基板
14a、14b 布线图形
14c中继端子
14d功率端子
14e控制电路用布线图形
14f第一布线图形
14g第二布线图形
14h第三布线图形
16 背面图形
18 焊料
20 半导体芯片
22 引线
24a、24b粘接剂
26 壳体
28 功率端子
30 硅胶
32 控制基板
34 控制电路
38 盖子
40 控制端子
42、44模具
72 模塑树脂
76 粘接底涂剂
82 中继端子
84 功率端子。

Claims (10)

1.一种半导体装置,其特征在于,具备:
绝缘基板;
布线图形,通过铸造形成在所述绝缘基板上;
半导体芯片,固定在所述布线图形上;
中继端子,通过铸造以一端固定于所述绝缘基板且另一端向所述绝缘基板的上方延伸的方式由与所述布线图形相同的材料形成,并且与所述半导体芯片电连接;以及
控制电路,与所述中继端子电连接,发送所述半导体芯片的控制信号,
所述布线图形和所述中继端子是同时形成的。
2.如权利要求1所述的半导体装置,其特征在于,
具备:功率端子,以一端固定于所述绝缘基板且另一端向所述绝缘基板的上方延伸的方式由与所述布线图形相同材料形成,并且与所述半导体芯片电连接。
3.如权利要求1或2所述的半导体装置,其特征在于,
具备由与所述布线图形相同的材料形成在所述绝缘基板上的控制电路用布线图形,
所述控制电路固定在所述控制电路用布线图形上。
4.如权利要求2所述的半导体装置,其特征在于,具备:
背面图形,形成在所述绝缘基板的背面;以及
模塑树脂,以将所述背面图形的与所述绝缘基板相反的面、所述中继端子的另一端以及所述功率端子的另一端露出到外部的方式,覆盖所述绝缘基板、所述布线图形、所述半导体芯片、所述中继端子、所述控制电路以及所述功率端子。
5.如权利要求2所述的半导体装置,其特征在于,具备:
背面图形,形成在所述绝缘基板的背面;
粘接底涂剂,形成在所述布线图形的表面和所述绝缘基板的表面;
模塑树脂,以将所述背面图形的与所述绝缘基板相反的面、所述中继端子的另一端以及所述功率端子的另一端露出到外部的方式,覆盖所述绝缘基板、所述布线图形、所述底涂剂、所述半导体芯片、所述中继端子、所述控制电路以及所述功率端子。
6.如权利要求4所述的半导体装置,其特征在于,
所述模塑树脂的线膨胀系数与所述布线图形的线膨胀系数相同。
7.如权利要求1所述的半导体装置,其特征在于,
所述半导体芯片由宽带隙半导体形成。
8.如权利要求7所述的半导体装置,其特征在于,
所述宽带隙半导体是碳化硅、氮化镓类材料、或者金刚石。
9.一种半导体装置的制造方法,其特征在于,具备:
在模具的内部配置绝缘基板的工序,该模具具有用于在所述绝缘基板上形成布线图形的布线图形用空腔和用于形成从所述绝缘基板向上方延伸的中继端子的中继端子用空腔;
使铝流入到所述布线图形用空腔和所述中继端子用空腔中的铝注入工序;以及
对所述铝进行冷却的工序。
10.如权利要求9所述的半导体装置的制造方法,其特征在于,
所述模具具有用于形成从所述绝缘基板向上方延伸的功率端子的功率端子用空腔,
在所述铝注入工序中,向所述功率端子用空腔中注入铝。
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