CN102203671B - 压印工艺的分离阶段中的应变和动力学控制 - Google Patents
压印工艺的分离阶段中的应变和动力学控制 Download PDFInfo
- Publication number
- CN102203671B CN102203671B CN2009801426456A CN200980142645A CN102203671B CN 102203671 B CN102203671 B CN 102203671B CN 2009801426456 A CN2009801426456 A CN 2009801426456A CN 200980142645 A CN200980142645 A CN 200980142645A CN 102203671 B CN102203671 B CN 102203671B
- Authority
- CN
- China
- Prior art keywords
- template
- substrate
- pattern
- layer
- separation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C37/00—Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
- B29C37/0003—Discharging moulded articles from the mould
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10813108P | 2008-10-24 | 2008-10-24 | |
| US61/108,131 | 2008-10-24 | ||
| US10955708P | 2008-10-30 | 2008-10-30 | |
| US61/109,557 | 2008-10-30 | ||
| US12/604,517 | 2009-10-23 | ||
| US12/604,517 US8652393B2 (en) | 2008-10-24 | 2009-10-23 | Strain and kinetics control during separation phase of imprint process |
| PCT/US2009/005803 WO2010047837A2 (en) | 2008-10-24 | 2009-10-26 | Strain and kinetics control during separation phase of imprint process |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102203671A CN102203671A (zh) | 2011-09-28 |
| CN102203671B true CN102203671B (zh) | 2013-07-17 |
Family
ID=42116691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009801426456A Active CN102203671B (zh) | 2008-10-24 | 2009-10-26 | 压印工艺的分离阶段中的应变和动力学控制 |
Country Status (8)
| Country | Link |
|---|---|
| US (3) | US8652393B2 (enExample) |
| EP (1) | EP2350741B1 (enExample) |
| JP (2) | JP2012507141A (enExample) |
| KR (1) | KR20110086832A (enExample) |
| CN (1) | CN102203671B (enExample) |
| MY (1) | MY152446A (enExample) |
| TW (2) | TWI405659B (enExample) |
| WO (1) | WO2010047837A2 (enExample) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11508790A (ja) | 1995-06-30 | 1999-08-03 | ボストン・サイエンティフィック・コーポレイション | 切断エレメントを備えた超音波映写カテーテル |
| US8652393B2 (en) | 2008-10-24 | 2014-02-18 | Molecular Imprints, Inc. | Strain and kinetics control during separation phase of imprint process |
| JP4792096B2 (ja) * | 2009-03-19 | 2011-10-12 | 株式会社東芝 | テンプレートパターンの設計方法、テンプレートの製造方法及び半導体装置の製造方法。 |
| JP4940262B2 (ja) * | 2009-03-25 | 2012-05-30 | 株式会社東芝 | インプリントパターン形成方法 |
| JP5499668B2 (ja) * | 2009-12-03 | 2014-05-21 | 大日本印刷株式会社 | インプリント用モールドおよび該モールドを用いたパターン形成方法 |
| JP5833636B2 (ja) * | 2010-04-27 | 2015-12-16 | モレキュラー・インプリンツ・インコーポレーテッド | ナノインプリント・リソグラフィのテンプレート製作方法およびそのシステム |
| JP5750992B2 (ja) * | 2011-04-27 | 2015-07-22 | 大日本印刷株式会社 | インプリント方法およびそれを実施するためのインプリント装置 |
| JP5875250B2 (ja) * | 2011-04-28 | 2016-03-02 | キヤノン株式会社 | インプリント装置、インプリント方法及びデバイス製造方法 |
| JP5747670B2 (ja) * | 2011-06-10 | 2015-07-15 | 大日本印刷株式会社 | 成形部材およびその製造方法 |
| JP6004738B2 (ja) * | 2011-09-07 | 2016-10-12 | キヤノン株式会社 | インプリント装置、それを用いた物品の製造方法 |
| JP5535162B2 (ja) * | 2011-09-21 | 2014-07-02 | 株式会社東芝 | パターン形成装置、パターン形成方法及びパターン形成用プログラム |
| JP2013069920A (ja) * | 2011-09-22 | 2013-04-18 | Toshiba Corp | 成膜方法およびパターン形成方法 |
| JP6140966B2 (ja) * | 2011-10-14 | 2017-06-07 | キヤノン株式会社 | インプリント装置、それを用いた物品の製造方法 |
| JP2014033050A (ja) * | 2012-08-02 | 2014-02-20 | Toshiba Corp | インプリントシステム及びインプリント方法 |
| US20140239529A1 (en) * | 2012-09-28 | 2014-08-28 | Nanonex Corporation | System and Methods For Nano-Scale Manufacturing |
| JP6060796B2 (ja) * | 2013-04-22 | 2017-01-18 | 大日本印刷株式会社 | インプリントモールド及びダミーパターン設計方法 |
| CN103529644A (zh) * | 2013-10-25 | 2014-01-22 | 无锡英普林纳米科技有限公司 | 一种纳米压印机 |
| CN106462054B (zh) * | 2014-03-31 | 2020-07-07 | 皇家飞利浦有限公司 | 压印方法、用于压印方法的计算机程序产品和装置 |
| JP6472189B2 (ja) * | 2014-08-14 | 2019-02-20 | キヤノン株式会社 | インプリント装置、インプリント方法及び物品の製造方法 |
| JP6774178B2 (ja) * | 2015-11-16 | 2020-10-21 | キヤノン株式会社 | 基板を処理する装置、及び物品の製造方法 |
| JP6335948B2 (ja) * | 2016-02-12 | 2018-05-30 | キヤノン株式会社 | インプリント装置および物品製造方法 |
| TWI672212B (zh) * | 2016-08-25 | 2019-09-21 | 國立成功大學 | 奈米壓印組合體及其壓印方法 |
| US10627715B2 (en) * | 2016-10-31 | 2020-04-21 | Canon Kabushiki Kaisha | Method for separating a nanoimprint template from a substrate |
| JP6762853B2 (ja) | 2016-11-11 | 2020-09-30 | キヤノン株式会社 | 装置、方法、及び物品製造方法 |
| US11442359B2 (en) | 2019-03-11 | 2022-09-13 | Canon Kabushiki Kaisha | Method of separating a template from a shaped film on a substrate |
| JP7284639B2 (ja) * | 2019-06-07 | 2023-05-31 | キヤノン株式会社 | 成形装置、および物品製造方法 |
| US11034057B2 (en) * | 2019-08-15 | 2021-06-15 | Canon Kabushiki Kaisha | Planarization process, apparatus and method of manufacturing an article |
| TWI888630B (zh) * | 2020-09-01 | 2025-07-01 | 美商伊路米納有限公司 | 夾具及相關系統及方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020036183A1 (en) * | 2000-09-27 | 2002-03-28 | Kabushiki Kaisha Toshiba | Method for forming pattern |
| CN1350659A (zh) * | 1999-05-12 | 2002-05-22 | 薄膜电子有限公司 | 聚合物薄膜图案成形方法及其应用 |
| JP2007168422A (ja) * | 2005-11-22 | 2007-07-05 | Konica Minolta Holdings Inc | インプリント装置及びインプリント方法 |
| CN101142743A (zh) * | 2005-01-31 | 2008-03-12 | 分子制模股份有限公司 | 用于毫微制造业的夹具系统 |
Family Cites Families (61)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6873087B1 (en) | 1999-10-29 | 2005-03-29 | Board Of Regents, The University Of Texas System | High precision orientation alignment and gap control stages for imprint lithography processes |
| SE515607C2 (sv) | 1999-12-10 | 2001-09-10 | Obducat Ab | Anordning och metod vid tillverkning av strukturer |
| JP2003017390A (ja) | 2001-06-29 | 2003-01-17 | Toshiba Corp | パターン形成方法及びパターン形成に用いるマスク |
| DE20122197U1 (de) | 2001-06-30 | 2004-12-02 | Zf Friedrichshafen Ag | Schaltelement-Baugruppe für ein Getriebe |
| US20050064344A1 (en) | 2003-09-18 | 2005-03-24 | University Of Texas System Board Of Regents | Imprint lithography templates having alignment marks |
| JP3556647B2 (ja) | 2001-08-21 | 2004-08-18 | 沖電気工業株式会社 | 半導体素子の製造方法 |
| US7179079B2 (en) | 2002-07-08 | 2007-02-20 | Molecular Imprints, Inc. | Conforming template for patterning liquids disposed on substrates |
| US20080160129A1 (en) | 2006-05-11 | 2008-07-03 | Molecular Imprints, Inc. | Template Having a Varying Thickness to Facilitate Expelling a Gas Positioned Between a Substrate and the Template |
| US7019819B2 (en) | 2002-11-13 | 2006-03-28 | Molecular Imprints, Inc. | Chucking system for modulating shapes of substrates |
| US7442336B2 (en) | 2003-08-21 | 2008-10-28 | Molecular Imprints, Inc. | Capillary imprinting technique |
| US6932934B2 (en) | 2002-07-11 | 2005-08-23 | Molecular Imprints, Inc. | Formation of discontinuous films during an imprint lithography process |
| US7077992B2 (en) | 2002-07-11 | 2006-07-18 | Molecular Imprints, Inc. | Step and repeat imprint lithography processes |
| US6936194B2 (en) | 2002-09-05 | 2005-08-30 | Molecular Imprints, Inc. | Functional patterning material for imprint lithography processes |
| US8349241B2 (en) | 2002-10-04 | 2013-01-08 | Molecular Imprints, Inc. | Method to arrange features on a substrate to replicate features having minimal dimensional variability |
| US20040065252A1 (en) | 2002-10-04 | 2004-04-08 | Sreenivasan Sidlgata V. | Method of forming a layer on a substrate to facilitate fabrication of metrology standards |
| US7641840B2 (en) | 2002-11-13 | 2010-01-05 | Molecular Imprints, Inc. | Method for expelling gas positioned between a substrate and a mold |
| US6980282B2 (en) | 2002-12-11 | 2005-12-27 | Molecular Imprints, Inc. | Method for modulating shapes of substrates |
| MY133312A (en) | 2002-11-13 | 2007-11-30 | Molecular Imprints Inc | A chucking system and method for modulation shapes of substrates |
| US20040168613A1 (en) | 2003-02-27 | 2004-09-02 | Molecular Imprints, Inc. | Composition and method to form a release layer |
| US7179396B2 (en) | 2003-03-25 | 2007-02-20 | Molecular Imprints, Inc. | Positive tone bi-layer imprint lithography method |
| WO2004086471A1 (en) | 2003-03-27 | 2004-10-07 | Korea Institute Of Machinery & Materials | Uv nanoimprint lithography process using elementwise embossed stamp and selectively additive pressurization |
| US7396475B2 (en) | 2003-04-25 | 2008-07-08 | Molecular Imprints, Inc. | Method of forming stepped structures employing imprint lithography |
| US7157036B2 (en) | 2003-06-17 | 2007-01-02 | Molecular Imprints, Inc | Method to reduce adhesion between a conformable region and a pattern of a mold |
| US7150622B2 (en) | 2003-07-09 | 2006-12-19 | Molecular Imprints, Inc. | Systems for magnification and distortion correction for imprint lithography processes |
| JP2005085922A (ja) * | 2003-09-08 | 2005-03-31 | Canon Inc | マスク作製方法及び微小開口を有するマスク |
| KR20060128886A (ko) | 2003-12-11 | 2006-12-14 | 노우코우다이 티엘오 가부시키가이샤 | 나노임프린트를 이용하는 패턴 형성 방법 및 상기 방법을실행하는 장치 |
| US8076386B2 (en) | 2004-02-23 | 2011-12-13 | Molecular Imprints, Inc. | Materials for imprint lithography |
| EP1594001B1 (en) | 2004-05-07 | 2015-12-30 | Obducat AB | Device and method for imprint lithography |
| US7504268B2 (en) | 2004-05-28 | 2009-03-17 | Board Of Regents, The University Of Texas System | Adaptive shape substrate support method |
| KR20070032664A (ko) | 2004-05-28 | 2007-03-22 | 보드 오브 리전츠, 더 유니버시티 오브 텍사스 시스템 | 기판 지지 시스템 및 방법 |
| US20050270516A1 (en) * | 2004-06-03 | 2005-12-08 | Molecular Imprints, Inc. | System for magnification and distortion correction during nano-scale manufacturing |
| US7768624B2 (en) | 2004-06-03 | 2010-08-03 | Board Of Regents, The University Of Texas System | Method for obtaining force combinations for template deformation using nullspace and methods optimization techniques |
| US20060081557A1 (en) | 2004-10-18 | 2006-04-20 | Molecular Imprints, Inc. | Low-k dielectric functional imprinting materials |
| US7363854B2 (en) | 2004-12-16 | 2008-04-29 | Asml Holding N.V. | System and method for patterning both sides of a substrate utilizing imprint lithography |
| US20060145398A1 (en) | 2004-12-30 | 2006-07-06 | Board Of Regents, The University Of Texas System | Release layer comprising diamond-like carbon (DLC) or doped DLC with tunable composition for imprint lithography templates and contact masks |
| US7349076B2 (en) * | 2005-01-14 | 2008-03-25 | The Institute For Technology Development | Video tracking-based real-time hyperspectral data acquisition |
| US7636999B2 (en) | 2005-01-31 | 2009-12-29 | Molecular Imprints, Inc. | Method of retaining a substrate to a wafer chuck |
| US7635263B2 (en) * | 2005-01-31 | 2009-12-22 | Molecular Imprints, Inc. | Chucking system comprising an array of fluid chambers |
| US7922474B2 (en) | 2005-02-17 | 2011-04-12 | Asml Netherlands B.V. | Imprint lithography |
| JP2006245072A (ja) | 2005-02-28 | 2006-09-14 | Canon Inc | パターン転写用モールドおよび転写装置 |
| US7762186B2 (en) | 2005-04-19 | 2010-07-27 | Asml Netherlands B.V. | Imprint lithography |
| US20070035717A1 (en) | 2005-08-12 | 2007-02-15 | Wei Wu | Contact lithography apparatus, system and method |
| JP2007081048A (ja) * | 2005-09-13 | 2007-03-29 | Canon Inc | ナノインプリント用型、装置および方法 |
| JP2007083626A (ja) * | 2005-09-22 | 2007-04-05 | Ricoh Co Ltd | 微細構造転写装置 |
| JP4533358B2 (ja) | 2005-10-18 | 2010-09-01 | キヤノン株式会社 | インプリント方法、インプリント装置およびチップの製造方法 |
| US7803308B2 (en) | 2005-12-01 | 2010-09-28 | Molecular Imprints, Inc. | Technique for separating a mold from solidified imprinting material |
| JP4987012B2 (ja) | 2005-12-08 | 2012-07-25 | モレキュラー・インプリンツ・インコーポレーテッド | 基板の両面パターニングする方法及びシステム |
| US7670530B2 (en) | 2006-01-20 | 2010-03-02 | Molecular Imprints, Inc. | Patterning substrates employing multiple chucks |
| JP4667524B2 (ja) * | 2006-04-03 | 2011-04-13 | モレキュラー・インプリンツ・インコーポレーテッド | 流体チャンバのアレイを備えるチャック・システム |
| US20070231422A1 (en) | 2006-04-03 | 2007-10-04 | Molecular Imprints, Inc. | System to vary dimensions of a thin template |
| US20070238815A1 (en) | 2006-04-11 | 2007-10-11 | Lai On Products Industrial, Ltd. | Sponge-like sculpturing compound |
| WO2007136832A2 (en) | 2006-05-18 | 2007-11-29 | Molecular Imprints, Inc. | Method for expelling gas positioned between a substrate and a mold |
| JP4810319B2 (ja) * | 2006-06-09 | 2011-11-09 | キヤノン株式会社 | 加工装置及びデバイス製造方法 |
| JP4939134B2 (ja) | 2006-07-07 | 2012-05-23 | 株式会社日立ハイテクノロジーズ | インプリント装置およびインプリント方法 |
| JP4999069B2 (ja) * | 2007-01-23 | 2012-08-15 | 株式会社日立製作所 | ナノインプリント用スタンパ、ナノインプリント用スタンパの製造方法、およびナノインプリント用スタンパの表面処理剤 |
| JP5062521B2 (ja) | 2007-02-27 | 2012-10-31 | 独立行政法人理化学研究所 | レプリカモールドの製造方法およびレプリカモールド |
| KR101610180B1 (ko) | 2007-11-21 | 2016-04-07 | 캐논 나노테크놀로지즈 인코퍼레이티드 | 나노-임프린트 리소그래피용 다공성 주형 및 임프린팅 스택 |
| US8075299B2 (en) | 2008-10-21 | 2011-12-13 | Molecular Imprints, Inc. | Reduction of stress during template separation |
| US8652393B2 (en) | 2008-10-24 | 2014-02-18 | Molecular Imprints, Inc. | Strain and kinetics control during separation phase of imprint process |
| US8309008B2 (en) | 2008-10-30 | 2012-11-13 | Molecular Imprints, Inc. | Separation in an imprint lithography process |
| JP4940262B2 (ja) * | 2009-03-25 | 2012-05-30 | 株式会社東芝 | インプリントパターン形成方法 |
-
2009
- 2009-10-23 US US12/604,517 patent/US8652393B2/en active Active
- 2009-10-26 TW TW098136139A patent/TWI405659B/zh active
- 2009-10-26 JP JP2011533187A patent/JP2012507141A/ja active Pending
- 2009-10-26 TW TW102121927A patent/TWI541125B/zh active
- 2009-10-26 KR KR1020117011723A patent/KR20110086832A/ko not_active Ceased
- 2009-10-26 WO PCT/US2009/005803 patent/WO2010047837A2/en not_active Ceased
- 2009-10-26 CN CN2009801426456A patent/CN102203671B/zh active Active
- 2009-10-26 MY MYPI20111581 patent/MY152446A/en unknown
- 2009-10-26 EP EP09748532A patent/EP2350741B1/en active Active
-
2014
- 2014-01-08 US US14/150,261 patent/US20140117574A1/en not_active Abandoned
- 2014-04-10 JP JP2014080783A patent/JP5728602B2/ja active Active
-
2019
- 2019-01-31 US US16/264,318 patent/US11161280B2/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1350659A (zh) * | 1999-05-12 | 2002-05-22 | 薄膜电子有限公司 | 聚合物薄膜图案成形方法及其应用 |
| US20020036183A1 (en) * | 2000-09-27 | 2002-03-28 | Kabushiki Kaisha Toshiba | Method for forming pattern |
| CN101142743A (zh) * | 2005-01-31 | 2008-03-12 | 分子制模股份有限公司 | 用于毫微制造业的夹具系统 |
| JP2007168422A (ja) * | 2005-11-22 | 2007-07-05 | Konica Minolta Holdings Inc | インプリント装置及びインプリント方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20100102469A1 (en) | 2010-04-29 |
| JP2014160844A (ja) | 2014-09-04 |
| US8652393B2 (en) | 2014-02-18 |
| US20190232533A1 (en) | 2019-08-01 |
| KR20110086832A (ko) | 2011-08-01 |
| TWI541125B (zh) | 2016-07-11 |
| JP5728602B2 (ja) | 2015-06-03 |
| EP2350741B1 (en) | 2012-08-29 |
| WO2010047837A3 (en) | 2010-10-07 |
| US20140117574A1 (en) | 2014-05-01 |
| JP2012507141A (ja) | 2012-03-22 |
| CN102203671A (zh) | 2011-09-28 |
| WO2010047837A2 (en) | 2010-04-29 |
| TWI405659B (zh) | 2013-08-21 |
| TW201345698A (zh) | 2013-11-16 |
| MY152446A (en) | 2014-09-30 |
| EP2350741A2 (en) | 2011-08-03 |
| TW201026482A (en) | 2010-07-16 |
| US11161280B2 (en) | 2021-11-02 |
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