MY152446A - Strain and kinetics control during separation phase of imprint process - Google Patents

Strain and kinetics control during separation phase of imprint process

Info

Publication number
MY152446A
MY152446A MYPI20111581A MY152446A MY 152446 A MY152446 A MY 152446A MY PI20111581 A MYPI20111581 A MY PI20111581A MY 152446 A MY152446 A MY 152446A
Authority
MY
Malaysia
Prior art keywords
strain
control during
during separation
imprint process
separation phase
Prior art date
Application number
Inventor
Khusnatdinov Niyaz
Frank Y Xu
Meissl Mario Johannes
Michael N Miller
Thompson Ecron
Schmid Gerard
Pawan K Nimmakayala
Lu Xiaoming
Choi Byung-Jin
Original Assignee
Molecular Imprints Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Molecular Imprints Inc filed Critical Molecular Imprints Inc
Publication of MY152446A publication Critical patent/MY152446A/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C37/00Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
    • B29C37/0003Discharging moulded articles from the mould
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

SYSTEMS AND METHODS FOR IMPROVING ROBUST LAYER SEPARATION DURING THE SEPARATION PROCESS OF AN IMPRINT LITHOGRAPHY PROCESS ARE DESCRIBED. INCLUDED ARE METHODS OF MATCHING STRAINS BETWEEN A SUBSTRATE TO BE IMPRINTED AND THE TEMPLATE, VARYING OR MODIFYING THE FORCES APPLIED TO THE TEMPLATE AND/OR THE SUBSTRATE DURING SEPARATION, OR VARYING OR MODIFYING THE KINETICS OF THE SEPARATION PROCESS.
MYPI20111581 2008-10-24 2009-10-26 Strain and kinetics control during separation phase of imprint process MY152446A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10813108P 2008-10-24 2008-10-24
US10955708P 2008-10-30 2008-10-30
US12/604,517 US8652393B2 (en) 2008-10-24 2009-10-23 Strain and kinetics control during separation phase of imprint process

Publications (1)

Publication Number Publication Date
MY152446A true MY152446A (en) 2014-09-30

Family

ID=42116691

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI20111581 MY152446A (en) 2008-10-24 2009-10-26 Strain and kinetics control during separation phase of imprint process

Country Status (8)

Country Link
US (3) US8652393B2 (en)
EP (1) EP2350741B1 (en)
JP (2) JP2012507141A (en)
KR (1) KR20110086832A (en)
CN (1) CN102203671B (en)
MY (1) MY152446A (en)
TW (2) TWI405659B (en)
WO (1) WO2010047837A2 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2225784A1 (en) 1995-06-30 1997-01-23 Boston Scientific Corporation Ultrasound imaging catheter with a cutting element
US8652393B2 (en) 2008-10-24 2014-02-18 Molecular Imprints, Inc. Strain and kinetics control during separation phase of imprint process
JP4792096B2 (en) * 2009-03-19 2011-10-12 株式会社東芝 A template pattern design method, a template manufacturing method, and a semiconductor device manufacturing method.
JP4940262B2 (en) * 2009-03-25 2012-05-30 株式会社東芝 Imprint pattern forming method
JP5499668B2 (en) * 2009-12-03 2014-05-21 大日本印刷株式会社 Imprint mold and pattern forming method using the mold
US8968620B2 (en) 2010-04-27 2015-03-03 Canon Nanotechnologies, Inc. Safe separation for nano imprinting
JP5750992B2 (en) * 2011-04-27 2015-07-22 大日本印刷株式会社 Imprint method and imprint apparatus for implementing the method
JP5875250B2 (en) * 2011-04-28 2016-03-02 キヤノン株式会社 Imprint apparatus, imprint method, and device manufacturing method
JP5747670B2 (en) * 2011-06-10 2015-07-15 大日本印刷株式会社 Molded member and manufacturing method thereof
JP6004738B2 (en) * 2011-09-07 2016-10-12 キヤノン株式会社 Imprint apparatus and article manufacturing method using the same
JP5535162B2 (en) * 2011-09-21 2014-07-02 株式会社東芝 PATTERN FORMING APPARATUS, PATTERN FORMING METHOD, AND PATTERN FORMING PROGRAM
JP2013069920A (en) * 2011-09-22 2013-04-18 Toshiba Corp Deposition method and pattern formation method
JP6140966B2 (en) 2011-10-14 2017-06-07 キヤノン株式会社 Imprint apparatus and article manufacturing method using the same
JP2014033050A (en) * 2012-08-02 2014-02-20 Toshiba Corp Imprint system and imprint method
US20140239529A1 (en) * 2012-09-28 2014-08-28 Nanonex Corporation System and Methods For Nano-Scale Manufacturing
JP6060796B2 (en) * 2013-04-22 2017-01-18 大日本印刷株式会社 Imprint mold and dummy pattern design method
CN103529644A (en) * 2013-10-25 2014-01-22 无锡英普林纳米科技有限公司 Nano embossing press
CN106462054B (en) * 2014-03-31 2020-07-07 皇家飞利浦有限公司 Imprint method, computer program product and apparatus for imprint method
JP6472189B2 (en) * 2014-08-14 2019-02-20 キヤノン株式会社 Imprint apparatus, imprint method, and article manufacturing method
JP6774178B2 (en) * 2015-11-16 2020-10-21 キヤノン株式会社 Equipment for processing substrates and manufacturing methods for articles
JP6335948B2 (en) * 2016-02-12 2018-05-30 キヤノン株式会社 Imprint apparatus and article manufacturing method
TWI672212B (en) * 2016-08-25 2019-09-21 國立成功大學 Nano imprinting assembly and imprinting method thereof
US10627715B2 (en) 2016-10-31 2020-04-21 Canon Kabushiki Kaisha Method for separating a nanoimprint template from a substrate
JP6762853B2 (en) 2016-11-11 2020-09-30 キヤノン株式会社 Equipment, methods, and article manufacturing methods
US11442359B2 (en) 2019-03-11 2022-09-13 Canon Kabushiki Kaisha Method of separating a template from a shaped film on a substrate
JP7284639B2 (en) * 2019-06-07 2023-05-31 キヤノン株式会社 Molding apparatus and article manufacturing method
US11034057B2 (en) * 2019-08-15 2021-06-15 Canon Kabushiki Kaisha Planarization process, apparatus and method of manufacturing an article

Family Cites Families (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO311797B1 (en) * 1999-05-12 2002-01-28 Thin Film Electronics Asa Methods for patterning polymer films and using the methods
US6873087B1 (en) 1999-10-29 2005-03-29 Board Of Regents, The University Of Texas System High precision orientation alignment and gap control stages for imprint lithography processes
SE515607C2 (en) 1999-12-10 2001-09-10 Obducat Ab Device and method for fabrication of structures
JP3848070B2 (en) * 2000-09-27 2006-11-22 株式会社東芝 Pattern formation method
JP2003017390A (en) 2001-06-29 2003-01-17 Toshiba Corp Pattern forming method and mask used for pattern formation
DE20122197U1 (en) 2001-06-30 2004-12-02 Zf Friedrichshafen Ag Gearshift clutch unit for road vehicle gearbox has restoring element for piston of each shift element in plate bearer radially above associated plates, secondary piston acting against restoring force
US20050064344A1 (en) 2003-09-18 2005-03-24 University Of Texas System Board Of Regents Imprint lithography templates having alignment marks
JP3556647B2 (en) 2001-08-21 2004-08-18 沖電気工業株式会社 Method for manufacturing semiconductor device
US7179079B2 (en) 2002-07-08 2007-02-20 Molecular Imprints, Inc. Conforming template for patterning liquids disposed on substrates
US20080160129A1 (en) 2006-05-11 2008-07-03 Molecular Imprints, Inc. Template Having a Varying Thickness to Facilitate Expelling a Gas Positioned Between a Substrate and the Template
US7442336B2 (en) 2003-08-21 2008-10-28 Molecular Imprints, Inc. Capillary imprinting technique
US7077992B2 (en) 2002-07-11 2006-07-18 Molecular Imprints, Inc. Step and repeat imprint lithography processes
US6932934B2 (en) 2002-07-11 2005-08-23 Molecular Imprints, Inc. Formation of discontinuous films during an imprint lithography process
US7019819B2 (en) * 2002-11-13 2006-03-28 Molecular Imprints, Inc. Chucking system for modulating shapes of substrates
US6936194B2 (en) 2002-09-05 2005-08-30 Molecular Imprints, Inc. Functional patterning material for imprint lithography processes
US20040065252A1 (en) 2002-10-04 2004-04-08 Sreenivasan Sidlgata V. Method of forming a layer on a substrate to facilitate fabrication of metrology standards
US8349241B2 (en) 2002-10-04 2013-01-08 Molecular Imprints, Inc. Method to arrange features on a substrate to replicate features having minimal dimensional variability
US7641840B2 (en) 2002-11-13 2010-01-05 Molecular Imprints, Inc. Method for expelling gas positioned between a substrate and a mold
US6980282B2 (en) 2002-12-11 2005-12-27 Molecular Imprints, Inc. Method for modulating shapes of substrates
AU2003291477A1 (en) 2002-11-13 2004-06-03 Molecular Imprints, Inc. A chucking system and method for modulating shapes of substrates
US20040168613A1 (en) 2003-02-27 2004-09-02 Molecular Imprints, Inc. Composition and method to form a release layer
US7179396B2 (en) 2003-03-25 2007-02-20 Molecular Imprints, Inc. Positive tone bi-layer imprint lithography method
US6943117B2 (en) 2003-03-27 2005-09-13 Korea Institute Of Machinery & Materials UV nanoimprint lithography process using elementwise embossed stamp and selectively additive pressurization
US7396475B2 (en) 2003-04-25 2008-07-08 Molecular Imprints, Inc. Method of forming stepped structures employing imprint lithography
US7157036B2 (en) 2003-06-17 2007-01-02 Molecular Imprints, Inc Method to reduce adhesion between a conformable region and a pattern of a mold
US7150622B2 (en) 2003-07-09 2006-12-19 Molecular Imprints, Inc. Systems for magnification and distortion correction for imprint lithography processes
JP2005085922A (en) * 2003-09-08 2005-03-31 Canon Inc Method of manufacturing mask, and the mask having very small opening
JPWO2005057634A1 (en) 2003-12-11 2007-07-05 農工大ティー・エル・オー株式会社 Pattern formation method using nanoimprint and apparatus for executing the method
US8076386B2 (en) 2004-02-23 2011-12-13 Molecular Imprints, Inc. Materials for imprint lithography
EP1594001B1 (en) 2004-05-07 2015-12-30 Obducat AB Device and method for imprint lithography
US7504268B2 (en) 2004-05-28 2009-03-17 Board Of Regents, The University Of Texas System Adaptive shape substrate support method
JP2008501244A (en) 2004-05-28 2008-01-17 ボード・オブ・リージエンツ,ザ・ユニバーシテイ・オブ・テキサス・システム Substrate support system and method
US7768624B2 (en) 2004-06-03 2010-08-03 Board Of Regents, The University Of Texas System Method for obtaining force combinations for template deformation using nullspace and methods optimization techniques
US20050270516A1 (en) * 2004-06-03 2005-12-08 Molecular Imprints, Inc. System for magnification and distortion correction during nano-scale manufacturing
US20060081557A1 (en) 2004-10-18 2006-04-20 Molecular Imprints, Inc. Low-k dielectric functional imprinting materials
US7363854B2 (en) 2004-12-16 2008-04-29 Asml Holding N.V. System and method for patterning both sides of a substrate utilizing imprint lithography
US20060145398A1 (en) 2004-12-30 2006-07-06 Board Of Regents, The University Of Texas System Release layer comprising diamond-like carbon (DLC) or doped DLC with tunable composition for imprint lithography templates and contact masks
US7349076B2 (en) * 2005-01-14 2008-03-25 The Institute For Technology Development Video tracking-based real-time hyperspectral data acquisition
US7798801B2 (en) * 2005-01-31 2010-09-21 Molecular Imprints, Inc. Chucking system for nano-manufacturing
US7636999B2 (en) * 2005-01-31 2009-12-29 Molecular Imprints, Inc. Method of retaining a substrate to a wafer chuck
US7635263B2 (en) * 2005-01-31 2009-12-22 Molecular Imprints, Inc. Chucking system comprising an array of fluid chambers
US7922474B2 (en) 2005-02-17 2011-04-12 Asml Netherlands B.V. Imprint lithography
JP2006245072A (en) 2005-02-28 2006-09-14 Canon Inc Mold for transferring pattern and transfer device
US7762186B2 (en) 2005-04-19 2010-07-27 Asml Netherlands B.V. Imprint lithography
US20070035717A1 (en) 2005-08-12 2007-02-15 Wei Wu Contact lithography apparatus, system and method
JP2007081048A (en) * 2005-09-13 2007-03-29 Canon Inc Nano-imprinting mold, device, and method
JP2007083626A (en) * 2005-09-22 2007-04-05 Ricoh Co Ltd Microstructure transfer device
JP4533358B2 (en) 2005-10-18 2010-09-01 キヤノン株式会社 Imprint method, imprint apparatus and chip manufacturing method
JP4923924B2 (en) 2005-11-22 2012-04-25 コニカミノルタホールディングス株式会社 Imprint apparatus and imprint method
US7803308B2 (en) 2005-12-01 2010-09-28 Molecular Imprints, Inc. Technique for separating a mold from solidified imprinting material
US7670530B2 (en) 2006-01-20 2010-03-02 Molecular Imprints, Inc. Patterning substrates employing multiple chucks
CN101535021A (en) 2005-12-08 2009-09-16 分子制模股份有限公司 Method and system for double-sided patterning of substrates
US20070231422A1 (en) 2006-04-03 2007-10-04 Molecular Imprints, Inc. System to vary dimensions of a thin template
WO2007126767A2 (en) * 2006-04-03 2007-11-08 Molecular Imprints, Inc. Chucking system comprising an array of fluid chambers
US20070238815A1 (en) 2006-04-11 2007-10-11 Lai On Products Industrial, Ltd. Sponge-like sculpturing compound
WO2007136832A2 (en) 2006-05-18 2007-11-29 Molecular Imprints, Inc. Method for expelling gas positioned between a substrate and a mold
JP4810319B2 (en) 2006-06-09 2011-11-09 キヤノン株式会社 Processing apparatus and device manufacturing method
JP4939134B2 (en) 2006-07-07 2012-05-23 株式会社日立ハイテクノロジーズ Imprint apparatus and imprint method
JP4999069B2 (en) * 2007-01-23 2012-08-15 株式会社日立製作所 Nanoimprint stamper, method for producing nanoimprint stamper, and surface treatment agent for nanoimprint stamper
JP5062521B2 (en) 2007-02-27 2012-10-31 独立行政法人理化学研究所 Method for manufacturing replica mold and replica mold
CN101868760B (en) 2007-11-21 2013-01-16 分子制模股份有限公司 Porous template and method for nano-imprint lithography, and imprint laminate
US8075299B2 (en) 2008-10-21 2011-12-13 Molecular Imprints, Inc. Reduction of stress during template separation
US8652393B2 (en) 2008-10-24 2014-02-18 Molecular Imprints, Inc. Strain and kinetics control during separation phase of imprint process
US8309008B2 (en) 2008-10-30 2012-11-13 Molecular Imprints, Inc. Separation in an imprint lithography process
JP4940262B2 (en) * 2009-03-25 2012-05-30 株式会社東芝 Imprint pattern forming method

Also Published As

Publication number Publication date
US8652393B2 (en) 2014-02-18
TWI405659B (en) 2013-08-21
US20190232533A1 (en) 2019-08-01
TW201345698A (en) 2013-11-16
US11161280B2 (en) 2021-11-02
US20100102469A1 (en) 2010-04-29
EP2350741B1 (en) 2012-08-29
WO2010047837A2 (en) 2010-04-29
KR20110086832A (en) 2011-08-01
TW201026482A (en) 2010-07-16
JP5728602B2 (en) 2015-06-03
US20140117574A1 (en) 2014-05-01
WO2010047837A3 (en) 2010-10-07
JP2014160844A (en) 2014-09-04
EP2350741A2 (en) 2011-08-03
CN102203671A (en) 2011-09-28
TWI541125B (en) 2016-07-11
JP2012507141A (en) 2012-03-22
CN102203671B (en) 2013-07-17

Similar Documents

Publication Publication Date Title
MY152446A (en) Strain and kinetics control during separation phase of imprint process
WO2010047788A3 (en) Imprint lithography system and method
WO2010042140A3 (en) Template having alignment marks formed of contrast material
WO2011002518A3 (en) Chucking system with recessed support feature
WO2011163393A3 (en) Method for producing nanosurfaces with nano, micron, and/or submicron structures on a polymer
SG162673A1 (en) Process and method for modifying polymer film surface interaction
WO2007123805A3 (en) Lithography imprinting system
MX2009004446A (en) Printed deformable films.
WO2009083146A3 (en) Method for producing a microstructure
WO2010010275A3 (en) Method of transferring a portion of a functional film
HK1129633A1 (en) Original sheet of embossed release sheet, embossed release sheet, method for producing original sheet of embossed release sheet, method for producing embossed release sheet, apparatus for producing embossed release sheet, synthetic leather, and method for producing synthetic leather
JP2013532369A5 (en)
TW200722288A (en) Apparatus for pattern replication with intermediate stamp
TW200710584A (en) Method for forming high-resolution pattern and substrate having prepattern formed thereby
WO2012150278A9 (en) Hierarchical carbon nano and micro structures
WO2010117229A3 (en) Method for arranging fine particles on substrate by physical pressure
WO2012071192A3 (en) Sidewall image transfer pitch doubling and inline critical dimension slimming
WO2008068701A3 (en) Method and apparatus for applying a sheet to a substrate
EP2259137A4 (en) Original plate for lithographic printing plate, and method for production of lithographic printing plate using the same
WO2011115452A3 (en) Blanket for offset printing and manufacturing method therefor
MY152453A (en) Separation in an imprint lithography process
WO2009121038A3 (en) Shaped films of hydrogels fabricated using templates of patterned paper
EP2343195A4 (en) Lithographic printing original plate, method for producing lithographic printing plate, and polymerizable monomer
WO2011144292A3 (en) Selectively etching of a carbon nano tubes (cnt) polymer matrix on a plastic substructure
WO2013139899A3 (en) Treatment of an anodically oxidized surface