MY152446A - Strain and kinetics control during separation phase of imprint process - Google Patents
Strain and kinetics control during separation phase of imprint processInfo
- Publication number
- MY152446A MY152446A MYPI20111581A MY152446A MY 152446 A MY152446 A MY 152446A MY PI20111581 A MYPI20111581 A MY PI20111581A MY 152446 A MY152446 A MY 152446A
- Authority
- MY
- Malaysia
- Prior art keywords
- strain
- control during
- during separation
- imprint process
- separation phase
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C37/00—Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
- B29C37/0003—Discharging moulded articles from the mould
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
SYSTEMS AND METHODS FOR IMPROVING ROBUST LAYER SEPARATION DURING THE SEPARATION PROCESS OF AN IMPRINT LITHOGRAPHY PROCESS ARE DESCRIBED. INCLUDED ARE METHODS OF MATCHING STRAINS BETWEEN A SUBSTRATE TO BE IMPRINTED AND THE TEMPLATE, VARYING OR MODIFYING THE FORCES APPLIED TO THE TEMPLATE AND/OR THE SUBSTRATE DURING SEPARATION, OR VARYING OR MODIFYING THE KINETICS OF THE SEPARATION PROCESS.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10813108P | 2008-10-24 | 2008-10-24 | |
US10955708P | 2008-10-30 | 2008-10-30 | |
US12/604,517 US8652393B2 (en) | 2008-10-24 | 2009-10-23 | Strain and kinetics control during separation phase of imprint process |
Publications (1)
Publication Number | Publication Date |
---|---|
MY152446A true MY152446A (en) | 2014-09-30 |
Family
ID=42116691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI20111581 MY152446A (en) | 2008-10-24 | 2009-10-26 | Strain and kinetics control during separation phase of imprint process |
Country Status (8)
Country | Link |
---|---|
US (3) | US8652393B2 (en) |
EP (1) | EP2350741B1 (en) |
JP (2) | JP2012507141A (en) |
KR (1) | KR20110086832A (en) |
CN (1) | CN102203671B (en) |
MY (1) | MY152446A (en) |
TW (2) | TWI405659B (en) |
WO (1) | WO2010047837A2 (en) |
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CA2225784A1 (en) | 1995-06-30 | 1997-01-23 | Boston Scientific Corporation | Ultrasound imaging catheter with a cutting element |
US8652393B2 (en) | 2008-10-24 | 2014-02-18 | Molecular Imprints, Inc. | Strain and kinetics control during separation phase of imprint process |
JP4792096B2 (en) * | 2009-03-19 | 2011-10-12 | 株式会社東芝 | A template pattern design method, a template manufacturing method, and a semiconductor device manufacturing method. |
JP4940262B2 (en) * | 2009-03-25 | 2012-05-30 | 株式会社東芝 | Imprint pattern forming method |
JP5499668B2 (en) * | 2009-12-03 | 2014-05-21 | 大日本印刷株式会社 | Imprint mold and pattern forming method using the mold |
US8968620B2 (en) | 2010-04-27 | 2015-03-03 | Canon Nanotechnologies, Inc. | Safe separation for nano imprinting |
JP5750992B2 (en) * | 2011-04-27 | 2015-07-22 | 大日本印刷株式会社 | Imprint method and imprint apparatus for implementing the method |
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JP5535162B2 (en) * | 2011-09-21 | 2014-07-02 | 株式会社東芝 | PATTERN FORMING APPARATUS, PATTERN FORMING METHOD, AND PATTERN FORMING PROGRAM |
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JP6140966B2 (en) | 2011-10-14 | 2017-06-07 | キヤノン株式会社 | Imprint apparatus and article manufacturing method using the same |
JP2014033050A (en) * | 2012-08-02 | 2014-02-20 | Toshiba Corp | Imprint system and imprint method |
US20140239529A1 (en) * | 2012-09-28 | 2014-08-28 | Nanonex Corporation | System and Methods For Nano-Scale Manufacturing |
JP6060796B2 (en) * | 2013-04-22 | 2017-01-18 | 大日本印刷株式会社 | Imprint mold and dummy pattern design method |
CN103529644A (en) * | 2013-10-25 | 2014-01-22 | 无锡英普林纳米科技有限公司 | Nano embossing press |
CN106462054B (en) * | 2014-03-31 | 2020-07-07 | 皇家飞利浦有限公司 | Imprint method, computer program product and apparatus for imprint method |
JP6472189B2 (en) * | 2014-08-14 | 2019-02-20 | キヤノン株式会社 | Imprint apparatus, imprint method, and article manufacturing method |
JP6774178B2 (en) * | 2015-11-16 | 2020-10-21 | キヤノン株式会社 | Equipment for processing substrates and manufacturing methods for articles |
JP6335948B2 (en) * | 2016-02-12 | 2018-05-30 | キヤノン株式会社 | Imprint apparatus and article manufacturing method |
TWI672212B (en) * | 2016-08-25 | 2019-09-21 | 國立成功大學 | Nano imprinting assembly and imprinting method thereof |
US10627715B2 (en) | 2016-10-31 | 2020-04-21 | Canon Kabushiki Kaisha | Method for separating a nanoimprint template from a substrate |
JP6762853B2 (en) | 2016-11-11 | 2020-09-30 | キヤノン株式会社 | Equipment, methods, and article manufacturing methods |
US11442359B2 (en) | 2019-03-11 | 2022-09-13 | Canon Kabushiki Kaisha | Method of separating a template from a shaped film on a substrate |
JP7284639B2 (en) * | 2019-06-07 | 2023-05-31 | キヤノン株式会社 | Molding apparatus and article manufacturing method |
US11034057B2 (en) * | 2019-08-15 | 2021-06-15 | Canon Kabushiki Kaisha | Planarization process, apparatus and method of manufacturing an article |
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US6873087B1 (en) | 1999-10-29 | 2005-03-29 | Board Of Regents, The University Of Texas System | High precision orientation alignment and gap control stages for imprint lithography processes |
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CN101868760B (en) | 2007-11-21 | 2013-01-16 | 分子制模股份有限公司 | Porous template and method for nano-imprint lithography, and imprint laminate |
US8075299B2 (en) | 2008-10-21 | 2011-12-13 | Molecular Imprints, Inc. | Reduction of stress during template separation |
US8652393B2 (en) | 2008-10-24 | 2014-02-18 | Molecular Imprints, Inc. | Strain and kinetics control during separation phase of imprint process |
US8309008B2 (en) | 2008-10-30 | 2012-11-13 | Molecular Imprints, Inc. | Separation in an imprint lithography process |
JP4940262B2 (en) * | 2009-03-25 | 2012-05-30 | 株式会社東芝 | Imprint pattern forming method |
-
2009
- 2009-10-23 US US12/604,517 patent/US8652393B2/en active Active
- 2009-10-26 EP EP09748532A patent/EP2350741B1/en active Active
- 2009-10-26 CN CN2009801426456A patent/CN102203671B/en active Active
- 2009-10-26 JP JP2011533187A patent/JP2012507141A/en active Pending
- 2009-10-26 KR KR1020117011723A patent/KR20110086832A/en not_active Application Discontinuation
- 2009-10-26 TW TW098136139A patent/TWI405659B/en active
- 2009-10-26 MY MYPI20111581 patent/MY152446A/en unknown
- 2009-10-26 WO PCT/US2009/005803 patent/WO2010047837A2/en active Application Filing
- 2009-10-26 TW TW102121927A patent/TWI541125B/en active
-
2014
- 2014-01-08 US US14/150,261 patent/US20140117574A1/en not_active Abandoned
- 2014-04-10 JP JP2014080783A patent/JP5728602B2/en active Active
-
2019
- 2019-01-31 US US16/264,318 patent/US11161280B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US8652393B2 (en) | 2014-02-18 |
TWI405659B (en) | 2013-08-21 |
US20190232533A1 (en) | 2019-08-01 |
TW201345698A (en) | 2013-11-16 |
US11161280B2 (en) | 2021-11-02 |
US20100102469A1 (en) | 2010-04-29 |
EP2350741B1 (en) | 2012-08-29 |
WO2010047837A2 (en) | 2010-04-29 |
KR20110086832A (en) | 2011-08-01 |
TW201026482A (en) | 2010-07-16 |
JP5728602B2 (en) | 2015-06-03 |
US20140117574A1 (en) | 2014-05-01 |
WO2010047837A3 (en) | 2010-10-07 |
JP2014160844A (en) | 2014-09-04 |
EP2350741A2 (en) | 2011-08-03 |
CN102203671A (en) | 2011-09-28 |
TWI541125B (en) | 2016-07-11 |
JP2012507141A (en) | 2012-03-22 |
CN102203671B (en) | 2013-07-17 |
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