CN101908530B - 半导体装置 - Google Patents
半导体装置 Download PDFInfo
- Publication number
- CN101908530B CN101908530B CN201010198397.1A CN201010198397A CN101908530B CN 101908530 B CN101908530 B CN 101908530B CN 201010198397 A CN201010198397 A CN 201010198397A CN 101908530 B CN101908530 B CN 101908530B
- Authority
- CN
- China
- Prior art keywords
- semiconductor chip
- source
- terminal
- semiconductor
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group subclass H10D
- H01L25/074—Stacked arrangements of non-apertured devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49537—Plurality of lead frames mounted in one device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for individual devices of subclass H10D
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49575—Assemblies of semiconductor devices on lead frames
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49579—Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
- H01L23/49582—Metallic layers on lead frames
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of DC power input into DC power output
- H02M3/003—Constructional details, e.g. physical layout, assembly, wiring or busbar connections
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of DC power input into DC power output
- H02M3/02—Conversion of DC power input into DC power output without intermediate conversion into AC
- H02M3/04—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters
- H02M3/10—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
- H02M3/156—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
- H02M3/158—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators including plural semiconductor devices as final control devices for a single load
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
- H01L2224/331—Disposition
- H01L2224/3318—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/33181—On opposite sides of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Dc-Dc Converters (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009136611A JP5443837B2 (ja) | 2009-06-05 | 2009-06-05 | 半導体装置 |
| JP2009-136611 | 2009-06-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101908530A CN101908530A (zh) | 2010-12-08 |
| CN101908530B true CN101908530B (zh) | 2015-02-25 |
Family
ID=42359504
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010198397.1A Expired - Fee Related CN101908530B (zh) | 2009-06-05 | 2010-06-04 | 半导体装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9024423B2 (enExample) |
| EP (1) | EP2259313A1 (enExample) |
| JP (1) | JP5443837B2 (enExample) |
| CN (1) | CN101908530B (enExample) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI453831B (zh) | 2010-09-09 | 2014-09-21 | 台灣捷康綜合有限公司 | 半導體封裝結構及其製造方法 |
| JP5813963B2 (ja) | 2011-02-28 | 2015-11-17 | ローム株式会社 | 半導体装置、および、半導体装置の実装構造 |
| JP5464159B2 (ja) * | 2011-03-08 | 2014-04-09 | 三菱電機株式会社 | パワーモジュール |
| US8987777B2 (en) * | 2011-07-11 | 2015-03-24 | International Rectifier Corporation | Stacked half-bridge power module |
| DE112012007339B3 (de) | 2011-08-10 | 2020-03-05 | Denso Corporation | Halbleitermodul und Verfahren zur Herstellung des Halbleitermoduls |
| US20140063744A1 (en) * | 2012-09-05 | 2014-03-06 | Texas Instruments Incorporated | Vertically Stacked Power FETS and Synchronous Buck Converter Having Low On-Resistance |
| US9589929B2 (en) | 2013-03-14 | 2017-03-07 | Vishay-Siliconix | Method for fabricating stack die package |
| US9966330B2 (en) | 2013-03-14 | 2018-05-08 | Vishay-Siliconix | Stack die package |
| JP2016515306A (ja) * | 2013-03-14 | 2016-05-26 | ヴィシェイ−シリコニックス | スタックダイパッケージ |
| CN104979306B (zh) * | 2014-04-11 | 2018-06-01 | 万国半导体(开曼)股份有限公司 | 小尺寸贴片印迹面积的功率半导体器件及制备方法 |
| JP6354285B2 (ja) * | 2014-04-22 | 2018-07-11 | オムロン株式会社 | 電子部品を埋設した樹脂構造体およびその製造方法 |
| US9646920B2 (en) * | 2014-06-07 | 2017-05-09 | Alpha And Omega Semiconductor (Cayman), Ltd | Power semiconductor device with small contact footprint and the preparation method |
| JP6338937B2 (ja) | 2014-06-13 | 2018-06-06 | ローム株式会社 | パワーモジュールおよびその製造方法 |
| JP6162764B2 (ja) * | 2015-09-17 | 2017-07-12 | ローム株式会社 | 半導体装置、および、半導体装置の実装構造 |
| DE102016103714B4 (de) | 2016-03-02 | 2021-09-30 | Infineon Technologies Ag | Leistungshalbleiterpackages und Multiphasengleichrichter mit einem Leistungshalbleiterpackage |
| JP6011737B1 (ja) | 2016-03-14 | 2016-10-19 | 富士電機株式会社 | 降圧チョッパ回路 |
| JP6011736B1 (ja) | 2016-03-14 | 2016-10-19 | 富士電機株式会社 | 昇圧チョッパ回路 |
| WO2017169086A1 (ja) * | 2016-03-30 | 2017-10-05 | 三菱電機株式会社 | 半導体装置およびその製造方法、電力変換装置 |
| US10137789B2 (en) | 2016-07-20 | 2018-11-27 | Ford Global Technologies, Llc | Signal pin arrangement for multi-device power module |
| KR101897639B1 (ko) * | 2016-08-25 | 2018-09-12 | 현대오트론 주식회사 | 파워 모듈 |
| CN109075761B (zh) * | 2016-09-16 | 2022-06-24 | 株式会社大真空 | 压电振动器件 |
| FR3059155B1 (fr) * | 2016-11-23 | 2018-11-16 | Exagan | Circuit integre forme d'un empilement de deux puces connectees en serie |
| JP2018107364A (ja) * | 2016-12-28 | 2018-07-05 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US10178813B2 (en) * | 2017-01-26 | 2019-01-08 | The United States Of America As Represented By The Secretary Of The Army | Stacked power module with integrated thermal management |
| WO2018150449A1 (ja) * | 2017-02-14 | 2018-08-23 | 日本精工株式会社 | 半導体モジュールおよびその製造方法と、これを備えた駆動装置、電動パワーステアリング装置 |
| US10373890B1 (en) * | 2018-04-09 | 2019-08-06 | Infineon Technologies Ag | Cooling techniques for semiconductor package |
| EP3739756A1 (en) | 2019-05-17 | 2020-11-18 | Nexperia B.V. | Cascode semiconductor device and method of manufacture |
| JP7211268B2 (ja) * | 2019-05-30 | 2023-01-24 | 株式会社デンソー | 半導体モジュール |
| JPWO2021200211A1 (enExample) * | 2020-04-01 | 2021-10-07 | ||
| JP7438071B2 (ja) * | 2020-09-15 | 2024-02-26 | 株式会社東芝 | 半導体装置 |
| EP4033527A1 (en) | 2021-01-20 | 2022-07-27 | Nexperia B.V. | Packaged semiconductor device |
| EP4057341A1 (en) * | 2021-03-12 | 2022-09-14 | Nexperia B.V. | Packaged half-bridge circuit |
| JP2023046071A (ja) | 2021-09-22 | 2023-04-03 | 株式会社東芝 | 半導体装置 |
| US12341105B2 (en) | 2021-11-11 | 2025-06-24 | Shinko Electric Industries Co., Ltd. | Semiconductor device |
| JP7728714B2 (ja) * | 2022-02-03 | 2025-08-25 | ルネサスエレクトロニクス株式会社 | 半導体装置および回路装置 |
| KR20240003596A (ko) * | 2022-07-01 | 2024-01-09 | 현대자동차주식회사 | 파워 모듈 |
| CN119181682B (zh) * | 2024-11-25 | 2025-03-14 | 北京怀柔实验室 | 功率器件单元和半导体封装结构 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101140926A (zh) * | 2006-09-07 | 2008-03-12 | 万国半导体股份有限公司 | 层迭式双金属氧化物半导体场效应晶体管包 |
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| US6266623B1 (en) * | 1994-11-21 | 2001-07-24 | Phatrat Technology, Inc. | Sport monitoring apparatus for determining loft time, speed, power absorbed and other factors such as height |
| US7624922B2 (en) * | 1999-09-15 | 2009-12-01 | Brown Laurie J | Method and apparatus for vending a containerized liquid product utilizing an automatic self-service refill system |
| US7750817B2 (en) * | 1999-12-10 | 2010-07-06 | Beverage Metrics Holding Ltd | System and method using a scale for monitoring the dispensing of a beverage |
| EP1168253A1 (en) * | 2000-06-28 | 2002-01-02 | Sicpa Holding S.A. | Use of communication equipment and method for authenticating an item, specifically documents, in particular security documents, communication equipment for authenticating items, and items to be authenticated by communication equipment |
| JP2002217416A (ja) * | 2001-01-16 | 2002-08-02 | Hitachi Ltd | 半導体装置 |
| JP4010792B2 (ja) | 2001-10-19 | 2007-11-21 | 株式会社ルネサステクノロジ | 半導体装置 |
| JP4557507B2 (ja) * | 2002-06-13 | 2010-10-06 | パナソニック株式会社 | 半導体デバイス及びその製造方法 |
| DE10301091B4 (de) * | 2003-01-14 | 2015-01-22 | Infineon Technologies Ag | Leistungs-Halbleiterbauelement und Verfahren zur Verbindung von einem gemeinsamen Substratträger zugeordneten Halbleitereinrichtungen |
| JP2005011986A (ja) * | 2003-06-19 | 2005-01-13 | Sanyo Electric Co Ltd | 半導体装置 |
| CA2530383A1 (en) * | 2003-06-26 | 2005-01-13 | Bunn-O-Matic Corporation | Method of limiting brewer operation to authorized substances |
| DE202004011399U1 (de) * | 2004-03-19 | 2004-12-23 | Niko Semiconductor Co., Ltd. | Chip-Modul |
| US7301527B2 (en) * | 2004-03-23 | 2007-11-27 | Fujitsu Limited | Feedback based user interface for motion controlled handheld devices |
| JP4811273B2 (ja) * | 2004-12-28 | 2011-11-09 | 国産電機株式会社 | 半導体装置 |
| JP2006222298A (ja) * | 2005-02-10 | 2006-08-24 | Renesas Technology Corp | 半導体装置およびその製造方法 |
| JP4916745B2 (ja) | 2006-03-28 | 2012-04-18 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| KR100844630B1 (ko) * | 2006-03-29 | 2008-07-07 | 산요덴키가부시키가이샤 | 반도체 장치 |
| JP2008108912A (ja) * | 2006-10-25 | 2008-05-08 | Toyota Motor Corp | パワートランジスタ素子のパッケージ構造 |
| JP4985009B2 (ja) * | 2007-03-20 | 2012-07-25 | トヨタ自動車株式会社 | 半導体装置とその半導体装置をパッケージする方法 |
| JP2009043820A (ja) * | 2007-08-07 | 2009-02-26 | Rohm Co Ltd | 高効率モジュール |
| CN103593915A (zh) * | 2007-09-06 | 2014-02-19 | 可口可乐公司 | 用于促进消费者与分配器交互的系统和方法 |
| US20090152345A1 (en) * | 2007-12-18 | 2009-06-18 | Ncr Corporation | Methods and Apparatus for Automated Order Delivery in Customer Service Applications |
| US8511348B2 (en) * | 2008-02-14 | 2013-08-20 | Insight Beverages, Inc. | Beverage identification system and method |
-
2009
- 2009-06-05 JP JP2009136611A patent/JP5443837B2/ja not_active Expired - Fee Related
-
2010
- 2010-04-26 US US12/767,071 patent/US9024423B2/en active Active
- 2010-05-10 EP EP20100250901 patent/EP2259313A1/en not_active Withdrawn
- 2010-06-04 CN CN201010198397.1A patent/CN101908530B/zh not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101140926A (zh) * | 2006-09-07 | 2008-03-12 | 万国半导体股份有限公司 | 层迭式双金属氧化物半导体场效应晶体管包 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101908530A (zh) | 2010-12-08 |
| US9024423B2 (en) | 2015-05-05 |
| EP2259313A1 (en) | 2010-12-08 |
| JP5443837B2 (ja) | 2014-03-19 |
| US20100308421A1 (en) | 2010-12-09 |
| JP2010283236A (ja) | 2010-12-16 |
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