CN101499498B - 光学传感器元件、成像装置、电子设备和存储元件 - Google Patents

光学传感器元件、成像装置、电子设备和存储元件 Download PDF

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Publication number
CN101499498B
CN101499498B CN2009100098102A CN200910009810A CN101499498B CN 101499498 B CN101499498 B CN 101499498B CN 2009100098102 A CN2009100098102 A CN 2009100098102A CN 200910009810 A CN200910009810 A CN 200910009810A CN 101499498 B CN101499498 B CN 101499498B
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semiconductor layer
light
optical sensor
gate
leakage current
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CN101499498A (zh
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田中勉
达拉姆·帕尔·戈斯艾因
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Japan Display West Inc
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Sony Corp
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/04—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
    • G11C13/047—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using electro-optical elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/04—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
    • G11C13/042—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using information stored in the form of interference pattern
    • G11C13/044—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using information stored in the form of interference pattern using electro-optical elements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Thin Film Transistor (AREA)
  • Semiconductor Memories (AREA)
  • Light Receiving Elements (AREA)
CN2009100098102A 2008-01-31 2009-01-23 光学传感器元件、成像装置、电子设备和存储元件 Expired - Fee Related CN101499498B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008020558A JP5121478B2 (ja) 2008-01-31 2008-01-31 光センサー素子、撮像装置、電子機器、およびメモリー素子
JP2008020558 2008-01-31
JP2008-020558 2008-01-31

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CN101499498A CN101499498A (zh) 2009-08-05
CN101499498B true CN101499498B (zh) 2012-07-11

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US (1) US8194469B2 (enExample)
JP (1) JP5121478B2 (enExample)
KR (1) KR101562609B1 (enExample)
CN (1) CN101499498B (enExample)
TW (1) TWI384634B (enExample)

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