CN101258415B - 电子部件试验装置 - Google Patents

电子部件试验装置 Download PDF

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Publication number
CN101258415B
CN101258415B CN2006800139501A CN200680013950A CN101258415B CN 101258415 B CN101258415 B CN 101258415B CN 2006800139501 A CN2006800139501 A CN 2006800139501A CN 200680013950 A CN200680013950 A CN 200680013950A CN 101258415 B CN101258415 B CN 101258415B
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China
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mentioned
electrical verification
tested electrical
test
container
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CN2006800139501A
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English (en)
Chinese (zh)
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CN101258415A (zh
Inventor
佐川慎
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Advantest Corp
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Advantest Corp
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Publication of CN101258415A publication Critical patent/CN101258415A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Packaging Frangible Articles (AREA)
CN2006800139501A 2006-10-04 2006-10-04 电子部件试验装置 Active CN101258415B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/319870 WO2008041334A1 (fr) 2006-10-04 2006-10-04 Appareil de test de composant électronique

Publications (2)

Publication Number Publication Date
CN101258415A CN101258415A (zh) 2008-09-03
CN101258415B true CN101258415B (zh) 2011-01-19

Family

ID=39268202

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2006800139501A Active CN101258415B (zh) 2006-10-04 2006-10-04 电子部件试验装置

Country Status (5)

Country Link
JP (1) JPWO2008041334A1 (enExample)
KR (2) KR100942527B1 (enExample)
CN (1) CN101258415B (enExample)
TW (1) TW200821599A (enExample)
WO (1) WO2008041334A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI617820B (zh) * 2015-12-29 2018-03-11 泰克元股份有限公司 用於測試半導體元件的分選機

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101499573B1 (ko) * 2010-06-16 2015-03-10 (주)테크윙 테스트핸들러에서의 반도체소자 언로딩방법
JP2013044684A (ja) * 2011-08-25 2013-03-04 Seiko Epson Corp ハンドラー、及び部品検査装置
JP2013137284A (ja) 2011-12-28 2013-07-11 Advantest Corp 電子部品移載装置、電子部品ハンドリング装置、及び電子部品試験装置
JP2013137285A (ja) 2011-12-28 2013-07-11 Advantest Corp ピッチ変更装置、電子部品ハンドリング装置、及び電子部品試験装置
JP2014224785A (ja) * 2013-05-17 2014-12-04 セイコーエプソン株式会社 ハンドラーおよび検査装置
JP2014228297A (ja) * 2013-05-20 2014-12-08 セイコーエプソン株式会社 ハンドラーおよび検査装置
KR102053081B1 (ko) * 2013-10-08 2019-12-06 (주)테크윙 테스트핸들러
CN104133173B (zh) * 2014-08-14 2017-02-01 潍坊路加精工有限公司 一种全自动测试装置
KR20160109484A (ko) 2015-03-11 2016-09-21 가부시키가이샤 어드밴티스트 반송 캐리어, 반송 장치, 및 베이스부
TW201715243A (zh) * 2015-07-31 2017-05-01 Seiko Epson Corp 電子零件搬送裝置及電子零件檢查裝置
CN106813888B (zh) * 2015-11-27 2019-01-04 环维电子(上海)有限公司 冲击试验模块及其测试板
JP2020012748A (ja) * 2018-07-19 2020-01-23 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
KR102053091B1 (ko) * 2019-06-20 2019-12-06 (주)테크윙 테스트핸들러
KR102762417B1 (ko) * 2023-11-21 2025-02-05 한미반도체 주식회사 본딩장치
KR102779986B1 (ko) * 2023-11-21 2025-03-13 한미반도체 주식회사 본딩장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001264387A (ja) * 2000-03-16 2001-09-26 Nippon Eng Kk バーンインボード用ローダアンローダ装置における吸着ヘッドおよびその制御システム
CN1820204A (zh) * 2003-06-06 2006-08-16 株式会社爱德万测试 搬运装置、电子部件处理装置及该处理装置中的搬运方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06302670A (ja) * 1993-04-15 1994-10-28 Hitachi Electron Eng Co Ltd 小形角型ワーク用非接触吸着ヘッド
JP2001004702A (ja) * 1999-06-22 2001-01-12 Advantest Corp 半導体試験装置のｉｃハンドラ装置
KR100349942B1 (ko) * 1999-12-06 2002-08-24 삼성전자 주식회사 램버스 핸들러

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001264387A (ja) * 2000-03-16 2001-09-26 Nippon Eng Kk バーンインボード用ローダアンローダ装置における吸着ヘッドおよびその制御システム
CN1820204A (zh) * 2003-06-06 2006-08-16 株式会社爱德万测试 搬运装置、电子部件处理装置及该处理装置中的搬运方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
同上.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI617820B (zh) * 2015-12-29 2018-03-11 泰克元股份有限公司 用於測試半導體元件的分選機

Also Published As

Publication number Publication date
KR20080057206A (ko) 2008-06-24
WO2008041334A1 (fr) 2008-04-10
CN101258415A (zh) 2008-09-03
KR20100017827A (ko) 2010-02-16
JPWO2008041334A1 (ja) 2010-02-04
TWI345063B (enExample) 2011-07-11
KR100942527B1 (ko) 2010-02-12
TW200821599A (en) 2008-05-16

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