CN101124554A - 带多流更新跟踪的非易失性存储器和方法 - Google Patents
带多流更新跟踪的非易失性存储器和方法 Download PDFInfo
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- CN101124554A CN101124554A CNA200580047187XA CN200580047187A CN101124554A CN 101124554 A CN101124554 A CN 101124554A CN A200580047187X A CNA200580047187X A CN A200580047187XA CN 200580047187 A CN200580047187 A CN 200580047187A CN 101124554 A CN101124554 A CN 101124554A
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- 230000015654 memory Effects 0.000 title claims abstract description 259
- 238000000034 method Methods 0.000 title claims description 83
- 238000003860 storage Methods 0.000 claims description 356
- 230000005055 memory storage Effects 0.000 claims description 109
- 230000003139 buffering effect Effects 0.000 claims description 18
- 241001269238 Data Species 0.000 claims description 9
- 210000004027 cell Anatomy 0.000 description 50
- 230000008569 process Effects 0.000 description 19
- 238000010586 diagram Methods 0.000 description 18
- 238000005516 engineering process Methods 0.000 description 8
- 230000008878 coupling Effects 0.000 description 7
- 238000010168 coupling process Methods 0.000 description 7
- 238000005859 coupling reaction Methods 0.000 description 7
- 238000013500 data storage Methods 0.000 description 7
- 230000000739 chaotic effect Effects 0.000 description 6
- 238000007726 management method Methods 0.000 description 6
- 238000012546 transfer Methods 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 238000007667 floating Methods 0.000 description 5
- 230000008520 organization Effects 0.000 description 5
- 238000004321 preservation Methods 0.000 description 5
- 230000001360 synchronised effect Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 230000006378 damage Effects 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 238000012797 qualification Methods 0.000 description 3
- 210000000352 storage cell Anatomy 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 230000001186 cumulative effect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 230000008676 import Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 230000000717 retained effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 230000000454 anti-cipatory effect Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001915 proofreading effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000009991 scouring Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/72—Details relating to flash memory management
- G06F2212/7203—Temporary buffering, e.g. using volatile buffer or dedicated buffer blocks
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Read Only Memory (AREA)
- Memory System (AREA)
Abstract
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Claims (64)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/016,285 | 2004-12-16 | ||
US11/016,285 US7315916B2 (en) | 2004-12-16 | 2004-12-16 | Scratch pad block |
US11/192,220 | 2005-07-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101124554A true CN101124554A (zh) | 2008-02-13 |
CN100547565C CN100547565C (zh) | 2009-10-07 |
Family
ID=36190514
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005800422500A Active CN101095121B (zh) | 2004-12-16 | 2005-12-01 | 高速暂存区块 |
CNB200580047187XA Expired - Fee Related CN100547565C (zh) | 2004-12-16 | 2005-12-05 | 带多流更新跟踪的非易失性存储器和方法 |
CNA2005800483896A Pending CN101124556A (zh) | 2004-12-16 | 2005-12-07 | 具有用于高速暂存器和更新区块的改进索引的非易失性存储器和方法 |
CN2005800473818A Expired - Fee Related CN101124555B (zh) | 2004-12-16 | 2005-12-08 | 具有多流更新的非易失性存储器和方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005800422500A Active CN101095121B (zh) | 2004-12-16 | 2005-12-01 | 高速暂存区块 |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNA2005800483896A Pending CN101124556A (zh) | 2004-12-16 | 2005-12-07 | 具有用于高速暂存器和更新区块的改进索引的非易失性存储器和方法 |
CN2005800473818A Expired - Fee Related CN101124555B (zh) | 2004-12-16 | 2005-12-08 | 具有多流更新的非易失性存储器和方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7315916B2 (zh) |
EP (1) | EP1828906B1 (zh) |
JP (1) | JP4787266B2 (zh) |
KR (1) | KR100914263B1 (zh) |
CN (4) | CN101095121B (zh) |
TW (1) | TWI393140B (zh) |
WO (1) | WO2006065566A1 (zh) |
Cited By (5)
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CN104412241A (zh) * | 2012-06-21 | 2015-03-11 | 微软公司 | 用于主存储器数据库的存储器紧缩机制 |
CN106528441A (zh) * | 2016-10-26 | 2017-03-22 | 珠海格力电器股份有限公司 | 仿真eeprom的数据处理方法、装置及电子设备 |
TWI690928B (zh) * | 2019-01-10 | 2020-04-11 | 慧榮科技股份有限公司 | 改善快閃記憶體之讀取重試的方法、控制器以及相關儲存裝置 |
CN111400302A (zh) * | 2019-11-28 | 2020-07-10 | 杭州海康威视系统技术有限公司 | 连续存储数据的修改方法、装置和系统 |
TWI718889B (zh) * | 2019-01-10 | 2021-02-11 | 慧榮科技股份有限公司 | 改善快閃記憶體之讀取重試的方法、控制器以及相關儲存裝置 |
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2005
- 2005-12-01 JP JP2007546731A patent/JP4787266B2/ja active Active
- 2005-12-01 CN CN2005800422500A patent/CN101095121B/zh active Active
- 2005-12-01 EP EP05852895.1A patent/EP1828906B1/en not_active Not-in-force
- 2005-12-01 WO PCT/US2005/043811 patent/WO2006065566A1/en active Application Filing
- 2005-12-01 KR KR1020077012082A patent/KR100914263B1/ko active IP Right Grant
- 2005-12-05 CN CNB200580047187XA patent/CN100547565C/zh not_active Expired - Fee Related
- 2005-12-07 CN CNA2005800483896A patent/CN101124556A/zh active Pending
- 2005-12-08 CN CN2005800473818A patent/CN101124555B/zh not_active Expired - Fee Related
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Cited By (8)
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CN104412241A (zh) * | 2012-06-21 | 2015-03-11 | 微软公司 | 用于主存储器数据库的存储器紧缩机制 |
CN104412241B (zh) * | 2012-06-21 | 2017-06-27 | 微软技术许可有限责任公司 | 用于主存储器数据库的存储器紧缩机制 |
CN106528441A (zh) * | 2016-10-26 | 2017-03-22 | 珠海格力电器股份有限公司 | 仿真eeprom的数据处理方法、装置及电子设备 |
TWI690928B (zh) * | 2019-01-10 | 2020-04-11 | 慧榮科技股份有限公司 | 改善快閃記憶體之讀取重試的方法、控制器以及相關儲存裝置 |
TWI718889B (zh) * | 2019-01-10 | 2021-02-11 | 慧榮科技股份有限公司 | 改善快閃記憶體之讀取重試的方法、控制器以及相關儲存裝置 |
US11573734B2 (en) | 2019-01-10 | 2023-02-07 | Silicon Motion, Inc. | Method for improving read-retry of flash memory and related controller and storage device |
CN111400302A (zh) * | 2019-11-28 | 2020-07-10 | 杭州海康威视系统技术有限公司 | 连续存储数据的修改方法、装置和系统 |
CN111400302B (zh) * | 2019-11-28 | 2023-09-19 | 杭州海康威视系统技术有限公司 | 连续存储数据的修改方法、装置和系统 |
Also Published As
Publication number | Publication date |
---|---|
TW200632916A (en) | 2006-09-16 |
EP1828906B1 (en) | 2014-09-10 |
KR100914263B1 (ko) | 2009-08-27 |
WO2006065566A9 (en) | 2006-09-08 |
US7315916B2 (en) | 2008-01-01 |
CN100547565C (zh) | 2009-10-07 |
EP1828906A1 (en) | 2007-09-05 |
CN101124555A (zh) | 2008-02-13 |
US20060161722A1 (en) | 2006-07-20 |
WO2006065566A1 (en) | 2006-06-22 |
CN101124555B (zh) | 2012-05-09 |
TWI393140B (zh) | 2013-04-11 |
JP2008524705A (ja) | 2008-07-10 |
CN101095121A (zh) | 2007-12-26 |
CN101095121B (zh) | 2010-05-05 |
KR20070087571A (ko) | 2007-08-28 |
CN101124556A (zh) | 2008-02-13 |
JP4787266B2 (ja) | 2011-10-05 |
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