CN101047148A - 对应于环回测试的半导体器件的制造方法及半导体器件 - Google Patents
对应于环回测试的半导体器件的制造方法及半导体器件 Download PDFInfo
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- CN101047148A CN101047148A CNA2007100898096A CN200710089809A CN101047148A CN 101047148 A CN101047148 A CN 101047148A CN A2007100898096 A CNA2007100898096 A CN A2007100898096A CN 200710089809 A CN200710089809 A CN 200710089809A CN 101047148 A CN101047148 A CN 101047148A
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (17)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006098532A JP4726679B2 (ja) | 2006-03-31 | 2006-03-31 | 半導体試験方法および半導体装置 |
JP2006-098532 | 2006-03-31 | ||
JP2006098532 | 2006-03-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101047148A true CN101047148A (zh) | 2007-10-03 |
CN101047148B CN101047148B (zh) | 2011-05-04 |
Family
ID=38606241
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007100898096A Expired - Fee Related CN101047148B (zh) | 2006-03-31 | 2007-03-30 | 对应于环回测试的半导体器件的制造方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7560949B2 (zh) |
JP (1) | JP4726679B2 (zh) |
KR (1) | KR101265041B1 (zh) |
CN (1) | CN101047148B (zh) |
TW (1) | TW200741227A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103154753A (zh) * | 2010-10-05 | 2013-06-12 | 晶像股份有限公司 | 高速输入输出装置的测试 |
CN106249007A (zh) * | 2015-06-05 | 2016-12-21 | 旺矽科技股份有限公司 | 具备反馈测试功能的探针模块 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
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US8098073B2 (en) * | 2007-09-27 | 2012-01-17 | Lsi Corporation | System for terminating high speed input/output buffers in an automatic test equipment environment to enable external loopback testing |
US8026726B2 (en) * | 2009-01-23 | 2011-09-27 | Silicon Image, Inc. | Fault testing for interconnections |
US8533543B2 (en) | 2009-03-30 | 2013-09-10 | Infineon Technologies Ag | System for testing connections between chips |
US20120194206A1 (en) * | 2011-01-28 | 2012-08-02 | Advantest Corporation | Measuring Apparatus |
CN104297536B (zh) | 2013-07-15 | 2017-11-28 | 旺矽科技股份有限公司 | 具回馈测试功能的探针模块 |
US20150123697A1 (en) * | 2013-11-07 | 2015-05-07 | Qualcomm Incorporated | Methods and apparatuses for ac/dc characterization |
JP2015141098A (ja) * | 2014-01-29 | 2015-08-03 | 日本電気株式会社 | テストボード、集積回路テスト方法、集積回路装置、および、集積回路テストシステム |
US20160065334A1 (en) * | 2014-08-29 | 2016-03-03 | R&D Circuits, Inc | Structure and Implementation Method for implementing an embedded serial data test loopback, residing directly under the device within a printed circuit board |
TWI569027B (zh) * | 2014-08-29 | 2017-02-01 | 明泰科技股份有限公司 | 射頻裝置、射頻電路的檢測電路及檢測方法 |
KR101652704B1 (ko) | 2015-03-05 | 2016-08-31 | (주)티에스이 | 인덕터를 포함하는 전자 부품 |
TWI583961B (zh) * | 2015-06-05 | 2017-05-21 | Mpi Corp | 具回授測試功能之探針模組(一) |
KR102432540B1 (ko) * | 2015-10-08 | 2022-08-16 | 삼성전자주식회사 | 검사 회로를 갖는 반도체 칩 |
KR101793469B1 (ko) * | 2016-01-22 | 2017-11-03 | (주)티에스이 | 칩형 인덕터 |
US10720224B2 (en) | 2018-07-18 | 2020-07-21 | Micron Technology, Inc. | Protocol independent testing of memory devices using a loopback |
JP7025026B2 (ja) * | 2019-03-20 | 2022-02-24 | Necプラットフォームズ株式会社 | 論理信号検出装置及び論理信号検出方法 |
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JPS6413843A (en) * | 1987-07-08 | 1989-01-18 | Kokusai Denshin Denwa Co Ltd | Supervisory and control system for optical repeater |
JP2706077B2 (ja) * | 1988-02-12 | 1998-01-28 | 株式会社日立製作所 | 樹脂封止型半導体装置及びその製造方法 |
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US5502392A (en) * | 1992-04-30 | 1996-03-26 | International Business Machines Corporation | Methods for the measurement of the frequency dependent complex propagation matrix, impedance matrix and admittance matrix of coupled transmission lines |
JPH06324080A (ja) * | 1993-05-13 | 1994-11-25 | Mitsubishi Electric Corp | Rfプローブヘッド |
JP3362545B2 (ja) * | 1995-03-09 | 2003-01-07 | ソニー株式会社 | 半導体装置の製造方法 |
JPH10170606A (ja) * | 1996-12-10 | 1998-06-26 | Sony Corp | 半導体装置 |
JP2880975B2 (ja) * | 1997-04-07 | 1999-04-12 | 山形日本電気株式会社 | リニア増幅icのテスト用プローブカードおよびテスト方法 |
JP3508460B2 (ja) * | 1997-04-15 | 2004-03-22 | 松下電器産業株式会社 | 集積回路の検査装置および検査方法 |
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2006
- 2006-03-31 JP JP2006098532A patent/JP4726679B2/ja not_active Expired - Fee Related
-
2007
- 2007-03-16 TW TW096109100A patent/TW200741227A/zh unknown
- 2007-03-27 KR KR1020070029605A patent/KR101265041B1/ko not_active IP Right Cessation
- 2007-03-29 US US11/730,038 patent/US7560949B2/en not_active Expired - Fee Related
- 2007-03-30 CN CN2007100898096A patent/CN101047148B/zh not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103154753A (zh) * | 2010-10-05 | 2013-06-12 | 晶像股份有限公司 | 高速输入输出装置的测试 |
CN106249007A (zh) * | 2015-06-05 | 2016-12-21 | 旺矽科技股份有限公司 | 具备反馈测试功能的探针模块 |
Also Published As
Publication number | Publication date |
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JP2007271496A (ja) | 2007-10-18 |
KR101265041B1 (ko) | 2013-05-16 |
KR20070098570A (ko) | 2007-10-05 |
CN101047148B (zh) | 2011-05-04 |
US7560949B2 (en) | 2009-07-14 |
US20070245179A1 (en) | 2007-10-18 |
TW200741227A (en) | 2007-11-01 |
JP4726679B2 (ja) | 2011-07-20 |
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