DE19782244T1 - IC-Testverfahren und unter Anwendung dieses IC-Testverfahrens arbeitendes IC-Testgerät - Google Patents

IC-Testverfahren und unter Anwendung dieses IC-Testverfahrens arbeitendes IC-Testgerät

Info

Publication number
DE19782244T1
DE19782244T1 DE19782244T DE19782244T DE19782244T1 DE 19782244 T1 DE19782244 T1 DE 19782244T1 DE 19782244 T DE19782244 T DE 19782244T DE 19782244 T DE19782244 T DE 19782244T DE 19782244 T1 DE19782244 T1 DE 19782244T1
Authority
DE
Germany
Prior art keywords
test
test method
device operating
test device
operating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19782244T
Other languages
English (en)
Inventor
Yoshihiro Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE19782244T1 publication Critical patent/DE19782244T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
DE19782244T 1997-11-20 1997-11-20 IC-Testverfahren und unter Anwendung dieses IC-Testverfahrens arbeitendes IC-Testgerät Withdrawn DE19782244T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP1997/004228 WO1999027376A1 (fr) 1997-11-20 1997-11-20 Procede de test de circuits integres et appareil de test de circuits integres utilisant ce procede
CNB971814333A CN1141593C (zh) 1997-11-20 1997-11-20 集成电路测试方法和采用该测试方法的集成电路测试装置

Publications (1)

Publication Number Publication Date
DE19782244T1 true DE19782244T1 (de) 2000-01-05

Family

ID=25744427

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19782244T Withdrawn DE19782244T1 (de) 1997-11-20 1997-11-20 IC-Testverfahren und unter Anwendung dieses IC-Testverfahrens arbeitendes IC-Testgerät

Country Status (4)

Country Link
CN (1) CN1141593C (de)
DE (1) DE19782244T1 (de)
GB (1) GB2335280B (de)
WO (1) WO1999027376A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001102609A (ja) * 1999-09-28 2001-04-13 Kanegafuchi Chem Ind Co Ltd 光電変換装置の特性測定装置
AT412242B (de) * 2000-03-02 2004-11-25 Siemens Ag Oesterreich Verfahren und anordnung zum testen eines prüflings
JP4729212B2 (ja) * 2001-09-27 2011-07-20 株式会社アドバンテスト 半導体試験装置
KR100989588B1 (ko) 2005-07-07 2010-10-25 가부시키가이샤 어드밴티스트 시험 장치
JP4944793B2 (ja) * 2005-12-15 2012-06-06 株式会社アドバンテスト 試験装置、及びピンエレクトロニクスカード
JP4726679B2 (ja) * 2006-03-31 2011-07-20 ルネサスエレクトロニクス株式会社 半導体試験方法および半導体装置
KR101184312B1 (ko) 2007-05-14 2012-09-21 가부시키가이샤 어드밴티스트 시험 장치
CN101995534B (zh) * 2009-08-10 2013-08-28 宏正自动科技股份有限公司 漏电检测装置及方法
JP5629680B2 (ja) * 2010-04-22 2014-11-26 株式会社アドバンテスト ピンカードおよびそれを用いた試験装置
CN102540055B (zh) * 2011-12-22 2015-07-29 深圳创维数字技术有限公司 一种检测逻辑电平极限值的方法及装置
US9448274B2 (en) * 2014-04-16 2016-09-20 Teradyne, Inc. Circuitry to protect a test instrument
CN105044536B (zh) * 2015-03-20 2018-11-13 深圳康姆科技有限公司 一种新型的封装缺陷检测方法和系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923676U (ja) * 1982-08-04 1984-02-14 株式会社アドバンテスト 自己診断機能を持つｉｃ試験装置
JPS6329277A (ja) * 1986-07-23 1988-02-06 Nec Corp 論理集積回路の試験装置
JPS63190975U (de) * 1987-05-29 1988-12-08

Also Published As

Publication number Publication date
WO1999027376A1 (fr) 1999-06-03
GB9912919D0 (en) 1999-08-04
GB2335280A (en) 1999-09-15
CN1141593C (zh) 2004-03-10
CN1244925A (zh) 2000-02-16
GB2335280B (en) 2002-01-16

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8607 Notification of search results after publication
8139 Disposal/non-payment of the annual fee