GB9912919D0 - Ic testing method and ic testing device using the same - Google Patents

Ic testing method and ic testing device using the same

Info

Publication number
GB9912919D0
GB9912919D0 GBGB9912919.9A GB9912919A GB9912919D0 GB 9912919 D0 GB9912919 D0 GB 9912919D0 GB 9912919 A GB9912919 A GB 9912919A GB 9912919 D0 GB9912919 D0 GB 9912919D0
Authority
GB
United Kingdom
Prior art keywords
testing
same
testing device
testing method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB9912919.9A
Other versions
GB2335280B (en
GB2335280A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of GB9912919D0 publication Critical patent/GB9912919D0/en
Publication of GB2335280A publication Critical patent/GB2335280A/en
Application granted granted Critical
Publication of GB2335280B publication Critical patent/GB2335280B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
GB9912919A 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same Expired - Fee Related GB2335280B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP1997/004228 WO1999027376A1 (en) 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same
CNB971814333A CN1141593C (en) 1997-11-20 1997-11-20 IC testing method and IC testing device using the same

Publications (3)

Publication Number Publication Date
GB9912919D0 true GB9912919D0 (en) 1999-08-04
GB2335280A GB2335280A (en) 1999-09-15
GB2335280B GB2335280B (en) 2002-01-16

Family

ID=25744427

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9912919A Expired - Fee Related GB2335280B (en) 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same

Country Status (4)

Country Link
CN (1) CN1141593C (en)
DE (1) DE19782244T1 (en)
GB (1) GB2335280B (en)
WO (1) WO1999027376A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001102609A (en) * 1999-09-28 2001-04-13 Kanegafuchi Chem Ind Co Ltd Device for measuring characteristic of photoelectric conversion device
AT412242B (en) * 2000-03-02 2004-11-25 Siemens Ag Oesterreich METHOD AND ARRANGEMENT FOR TESTING A TEST
JP4729212B2 (en) * 2001-09-27 2011-07-20 株式会社アドバンテスト Semiconductor test equipment
JP5087398B2 (en) * 2005-07-07 2012-12-05 株式会社アドバンテスト Test apparatus and device interface apparatus
JP4944793B2 (en) * 2005-12-15 2012-06-06 株式会社アドバンテスト Test equipment and pin electronics card
JP4726679B2 (en) * 2006-03-31 2011-07-20 ルネサスエレクトロニクス株式会社 Semiconductor test method and semiconductor device
JP4874391B2 (en) 2007-05-14 2012-02-15 株式会社アドバンテスト Test equipment
CN101995534B (en) * 2009-08-10 2013-08-28 宏正自动科技股份有限公司 Electric leakage detecting device and method
CN102918407B (en) * 2010-04-22 2015-05-13 株式会社爱德万测试 Pin card and test device using same
CN102540055B (en) * 2011-12-22 2015-07-29 深圳创维数字技术有限公司 A kind of method and device detecting logic level limit value
US9448274B2 (en) * 2014-04-16 2016-09-20 Teradyne, Inc. Circuitry to protect a test instrument
CN105044536B (en) * 2015-03-20 2018-11-13 深圳康姆科技有限公司 A kind of novel encapsulation defect inspection method and system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923676U (en) * 1982-08-04 1984-02-14 株式会社アドバンテスト IC test equipment with self-diagnosis function
JPS6329277A (en) * 1986-07-23 1988-02-06 Nec Corp Testing device for logic integrated circuit
JPS63190975U (en) * 1987-05-29 1988-12-08

Also Published As

Publication number Publication date
GB2335280B (en) 2002-01-16
DE19782244T1 (en) 2000-01-05
WO1999027376A1 (en) 1999-06-03
CN1141593C (en) 2004-03-10
CN1244925A (en) 2000-02-16
GB2335280A (en) 1999-09-15

Similar Documents

Publication Publication Date Title
GB2325358B (en) Semiconductor device testing apparatus
SG108211A1 (en) Ic testing apparatus
GB2315336B (en) Test method and device for screwers
GB9916835D0 (en) IC testing device
SG86329A1 (en) Ic testing apparatus and method
HK1032553A1 (en) Mixing method and mixing device
IL140145A0 (en) Non-contact test method and apparatus
EP1001249A4 (en) Surface inspecting device and surface inspecting method
GB2318187B (en) IC Testing Device
GB9417244D0 (en) Integrated circuit device and test method therefor
GB2336915B (en) Method and device
SG63791A1 (en) Ic testing method and apparatus
SG79967A1 (en) Ic testing apparatus
GB2335280B (en) Ic testing method and ic testing device using the same
EP0694787A3 (en) System level IC testing arrangement and method
SG79250A1 (en) Ic testing apparatus
SG81269A1 (en) Ic testing apparatus
GB2338786B (en) Inspection device and method
GB2326772B (en) Electronic device and method for measuring the electronic device
SG97766A1 (en) Burn-in testing device
IL124655A (en) Ic card-based test apparatus and method
GB9704736D0 (en) Device and method
GB9816363D0 (en) Device and method
EP0890083A4 (en) Weighing device and method
SG86318A1 (en) Circuit and test method

Legal Events

Date Code Title Description
789A Request for publication of translation (sect. 89(a)/1977)
789A Request for publication of translation (sect. 89(a)/1977)
PCNP Patent ceased through non-payment of renewal fee