CN101013701A - 电可擦除可编程只读存储器及其制造和操作方法 - Google Patents

电可擦除可编程只读存储器及其制造和操作方法 Download PDF

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Publication number
CN101013701A
CN101013701A CNA2006100643942A CN200610064394A CN101013701A CN 101013701 A CN101013701 A CN 101013701A CN A2006100643942 A CNA2006100643942 A CN A2006100643942A CN 200610064394 A CN200610064394 A CN 200610064394A CN 101013701 A CN101013701 A CN 101013701A
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CN
China
Prior art keywords
well
active region
region
floating gate
active
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2006100643942A
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English (en)
Chinese (zh)
Inventor
朴根淑
李相培
李受哲
黄晧益
李泰政
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of CN101013701A publication Critical patent/CN101013701A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/30—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/60—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates the control gate being a doped region, e.g. single-poly memory cell
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/80—Arrangements comprising multiple bistable or multi-stable switching components of the same type on a plane parallel to the substrate, e.g. cross-point arrays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices

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  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
CNA2006100643942A 2005-12-22 2006-12-22 电可擦除可编程只读存储器及其制造和操作方法 Pending CN101013701A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR127770/05 2005-12-22
KR1020050127770A KR100660901B1 (ko) 2005-12-22 2005-12-22 단일 게이트 구조를 갖는 이이피롬, 상기 이이피롬의동작방법 및 상기 이이피롬의 제조방법

Publications (1)

Publication Number Publication Date
CN101013701A true CN101013701A (zh) 2007-08-08

Family

ID=37815403

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2006100643942A Pending CN101013701A (zh) 2005-12-22 2006-12-22 电可擦除可编程只读存储器及其制造和操作方法

Country Status (5)

Country Link
US (2) US7593261B2 (enExample)
JP (1) JP5259081B2 (enExample)
KR (1) KR100660901B1 (enExample)
CN (1) CN101013701A (enExample)
DE (1) DE102006062381B4 (enExample)

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DE102005002739B4 (de) * 2005-01-20 2010-11-25 Infineon Technologies Ag Verfahren zum Herstellen eines Feldeffekttransistors, Tunnel-Feldeffekttransistor und integrierte Schaltungsanordnung mit mindestens einem Feldeffekttransistor
KR100660901B1 (ko) * 2005-12-22 2006-12-26 삼성전자주식회사 단일 게이트 구조를 갖는 이이피롬, 상기 이이피롬의동작방법 및 상기 이이피롬의 제조방법
US8472251B2 (en) * 2008-02-11 2013-06-25 Aplus Flash Technology, Inc. Single-polycrystalline silicon electrically erasable and programmable nonvolatile memory device
US7989875B2 (en) * 2008-11-24 2011-08-02 Nxp B.V. BiCMOS integration of multiple-times-programmable non-volatile memories
KR20100072979A (ko) * 2008-12-22 2010-07-01 주식회사 동부하이텍 싱글 게이트 구조의 반도체 메모리 소자
JP5467809B2 (ja) * 2009-07-16 2014-04-09 ルネサスエレクトロニクス株式会社 半導体装置
JP2011176163A (ja) * 2010-02-25 2011-09-08 Panasonic Corp 不揮発性半導体記憶装置
US8199578B2 (en) * 2010-06-03 2012-06-12 Ememory Technology Inc. Single polysilicon layer non-volatile memory and operating method thereof
KR101291750B1 (ko) 2011-10-14 2013-07-31 주식회사 동부하이텍 이이피롬과 그 제조 방법
JP5690873B2 (ja) * 2013-06-07 2015-03-25 イーメモリー テクノロジー インコーポレイテッド 消去可能プログラム可能単一ポリ不揮発性メモリ
US9450052B1 (en) * 2015-07-01 2016-09-20 Chengdu Monolithic Power Systems Co., Ltd. EEPROM memory cell with a coupler region and method of making the same
JP6954854B2 (ja) * 2017-03-31 2021-10-27 旭化成エレクトロニクス株式会社 不揮発性記憶素子および基準電圧生成回路
US10896979B2 (en) * 2017-09-28 2021-01-19 International Business Machines Corporation Compact vertical injection punch through floating gate analog memory and a manufacture thereof
US10685716B1 (en) * 2019-04-11 2020-06-16 Yield Microelectronics Corp. Method of fast erasing low-current EEPROM array
IT202100008075A1 (it) * 2021-03-31 2022-10-01 St Microelectronics Srl Memoria non volatile a singolo poly, porta flottante, programmabile poche volte e relativo metodo di polarizzazone
US11984165B2 (en) 2022-05-24 2024-05-14 Taiwan Semiconductor Manufacturing Company, Ltd. Memory device with reduced area

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US5640346A (en) 1992-03-03 1997-06-17 Harris Corporation Electrically programmable memory cell
US5523964A (en) * 1994-04-07 1996-06-04 Symetrix Corporation Ferroelectric non-volatile memory unit
JP2596695B2 (ja) * 1993-05-07 1997-04-02 インターナショナル・ビジネス・マシーンズ・コーポレイション Ｅｅｐｒｏｍ
US5615150A (en) * 1995-11-02 1997-03-25 Advanced Micro Devices, Inc. Control gate-addressed CMOS non-volatile cell that programs through gates of CMOS transistors
US5587945A (en) * 1995-11-06 1996-12-24 Advanced Micro Devices, Inc. CMOS EEPROM cell with tunneling window in the read path
US5646901A (en) * 1996-03-26 1997-07-08 Advanced Micro Devices, Inc. CMOS memory cell with tunneling during program and erase through the NMOS and PMOS transistors and a pass gate separating the NMOS and PMOS transistors
US6005270A (en) * 1997-11-10 1999-12-21 Sony Corporation Semiconductor nonvolatile memory device and method of production of same
US5886920A (en) * 1997-12-01 1999-03-23 Motorola, Inc. Variable conducting element and method of programming
US6198652B1 (en) * 1998-04-13 2001-03-06 Kabushiki Kaisha Toshiba Non-volatile semiconductor integrated memory device
US5969992A (en) * 1998-12-21 1999-10-19 Vantis Corporation EEPROM cell using P-well for tunneling across a channel
JP4212178B2 (ja) * 1999-03-12 2009-01-21 株式会社東芝 半導体集積回路の製造方法
US6326663B1 (en) * 1999-03-26 2001-12-04 Vantis Corporation Avalanche injection EEPROM memory cell with P-type control gate
JP3377762B2 (ja) * 1999-05-19 2003-02-17 株式会社半導体理工学研究センター 強誘電体不揮発性メモリ
JP2001085660A (ja) * 1999-09-10 2001-03-30 Toshiba Corp 固体撮像装置及びその制御方法
JP2001185633A (ja) * 1999-12-15 2001-07-06 Texas Instr Inc <Ti> Ｅｅｐｒｏｍデバイス
JP3762658B2 (ja) * 2001-05-17 2006-04-05 シャープ株式会社 不揮発性半導体記憶装置の駆動方法
JP4859292B2 (ja) * 2001-07-02 2012-01-25 富士通セミコンダクター株式会社 半導体集積回路装置およびｎａｎｄ型不揮発性半導体装置
JP2005353984A (ja) 2004-06-14 2005-12-22 Seiko Epson Corp 不揮発性記憶装置
US7098499B2 (en) * 2004-08-16 2006-08-29 Chih-Hsin Wang Electrically alterable non-volatile memory cell
KR100660901B1 (ko) * 2005-12-22 2006-12-26 삼성전자주식회사 단일 게이트 구조를 갖는 이이피롬, 상기 이이피롬의동작방법 및 상기 이이피롬의 제조방법

Also Published As

Publication number Publication date
US8050091B2 (en) 2011-11-01
DE102006062381B4 (de) 2009-10-22
JP2007173834A (ja) 2007-07-05
DE102006062381A1 (de) 2007-08-09
US20090310427A1 (en) 2009-12-17
KR100660901B1 (ko) 2006-12-26
JP5259081B2 (ja) 2013-08-07
US7593261B2 (en) 2009-09-22
US20070145459A1 (en) 2007-06-28

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