CN100573881C - 半导体器件及其制造方法 - Google Patents

半导体器件及其制造方法 Download PDF

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Publication number
CN100573881C
CN100573881C CNB2006100514208A CN200610051420A CN100573881C CN 100573881 C CN100573881 C CN 100573881C CN B2006100514208 A CNB2006100514208 A CN B2006100514208A CN 200610051420 A CN200610051420 A CN 200610051420A CN 100573881 C CN100573881 C CN 100573881C
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film
dielectric film
transistor
semiconductor device
substrate
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CN1832179A (zh
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小山润
大力浩二
冈崎奖
守屋芳隆
山崎舜平
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • H10D86/021Manufacture or treatment of multiple TFTs
    • H10D86/0214Manufacture or treatment of multiple TFTs using temporary substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6758Thin-film transistors [TFT] characterised by the insulating substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/411Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs characterised by materials, geometry or structure of the substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/481Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs integrated with passive devices, e.g. auxiliary capacitors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K19/00Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
    • H10K19/10Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00 comprising field-effect transistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K77/00Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
    • H10K77/10Substrates, e.g. flexible substrates
    • H10K77/111Flexible substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/549Organic PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Thin Film Transistor (AREA)
  • Electroluminescent Light Sources (AREA)
  • Element Separation (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
CNB2006100514208A 2005-02-25 2006-02-24 半导体器件及其制造方法 Active CN100573881C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005051867 2005-02-25
JP2005051867 2005-02-25

Publications (2)

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CN1832179A CN1832179A (zh) 2006-09-13
CN100573881C true CN100573881C (zh) 2009-12-23

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US (2) US7566633B2 (enExample)
JP (4) JP5509259B2 (enExample)
CN (1) CN100573881C (enExample)

Families Citing this family (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101226260B1 (ko) 2004-06-02 2013-01-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치 제조방법
KR101245539B1 (ko) * 2005-05-31 2013-03-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
US7651932B2 (en) * 2005-05-31 2010-01-26 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing antenna and method for manufacturing semiconductor device
US7727859B2 (en) * 2005-06-30 2010-06-01 Semiconductor Energy Laboratory Co., Ltd Semiconductor device and manufacturing method thereof
US7652214B2 (en) * 2005-11-02 2010-01-26 Panasonic Corporation Electronic component package
JP2007256914A (ja) * 2006-02-21 2007-10-04 Seiko Epson Corp アクティブマトリクス基板、電気光学装置、電子機器
JP2008066567A (ja) * 2006-09-08 2008-03-21 Ricoh Co Ltd 配線パターンとこれを用いた電子素子、有機半導体素子、積層配線パターンおよび積層配線基板
US8137417B2 (en) 2006-09-29 2012-03-20 Semiconductor Energy Laboratory Co., Ltd. Peeling apparatus and manufacturing apparatus of semiconductor device
TWI433306B (zh) * 2006-09-29 2014-04-01 Semiconductor Energy Lab 半導體裝置的製造方法
US7941919B2 (en) * 2007-01-29 2011-05-17 Board Of Regents, The University Of Texas System Method of assembling an electronic textile
EP2372756A1 (en) * 2007-03-13 2011-10-05 Semiconductor Energy Laboratory Co, Ltd. Semiconductor device and manufacturing method thereof
US7973316B2 (en) * 2007-03-26 2011-07-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
US7851804B2 (en) * 2007-05-17 2010-12-14 Semiconductor Energy Laboratory Co., Ltd. Display device
TWI423519B (zh) * 2007-09-04 2014-01-11 Mitsubishi Electric Corp Radio frequency identification tag
WO2010035627A1 (en) 2008-09-25 2010-04-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2011003522A (ja) 2008-10-16 2011-01-06 Semiconductor Energy Lab Co Ltd フレキシブル発光装置、電子機器及びフレキシブル発光装置の作製方法
TW202025500A (zh) 2008-11-07 2020-07-01 日商半導體能源研究所股份有限公司 半導體裝置和其製造方法
KR102012160B1 (ko) 2009-05-02 2019-08-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 패널
CN102422338B (zh) 2009-05-02 2015-04-01 株式会社半导体能源研究所 显示设备
US8766269B2 (en) 2009-07-02 2014-07-01 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device, lighting device, and electronic device
KR101801956B1 (ko) * 2009-09-16 2017-11-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치 및 이의 제조 방법
TWI589042B (zh) * 2010-01-20 2017-06-21 半導體能源研究所股份有限公司 發光裝置,撓性發光裝置,電子裝置,照明設備,以及發光裝置和撓性發光裝置的製造方法
KR101174834B1 (ko) 2012-04-05 2012-08-17 주식회사 다보씨앤엠 공정필름을 이용한 필름형 디스플레이 기판의 제조방법 및 이에 사용되는 필름형 디스플레이 기판 제조용 공정필름
KR102133158B1 (ko) 2012-08-10 2020-07-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치의 제작 방법
TWI613709B (zh) * 2013-02-20 2018-02-01 財團法人工業技術研究院 半導體元件結構及其製造方法與應用其之畫素結構
JP2014182306A (ja) * 2013-03-19 2014-09-29 Japan Display Inc 表示装置、電子機器及び表示装置の製造方法
US9209207B2 (en) 2013-04-09 2015-12-08 Apple Inc. Flexible display with bent edge regions
KR102479472B1 (ko) 2013-04-15 2022-12-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치
US11145838B2 (en) 2013-05-21 2021-10-12 Samsung Display Co., Ltd. Organic light emitting diode display and method of manufacturing the same
US9203050B2 (en) * 2013-05-21 2015-12-01 Samsung Display Co., Ltd. Organic light emitting diode display and method of manufacturing the same
US9472507B2 (en) * 2013-06-17 2016-10-18 Samsung Display Co., Ltd. Array substrate and organic light-emitting display including the same
US9269914B2 (en) 2013-08-01 2016-02-23 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device, electronic device, and lighting device
TWI685026B (zh) 2013-08-06 2020-02-11 日商半導體能源研究所股份有限公司 剝離方法
TWI794098B (zh) 2013-09-06 2023-02-21 日商半導體能源研究所股份有限公司 發光裝置以及發光裝置的製造方法
JP6513929B2 (ja) 2013-11-06 2019-05-15 株式会社半導体エネルギー研究所 剥離方法
CN103545321B (zh) * 2013-11-11 2017-03-15 京东方科技集团股份有限公司 显示基板和含有该显示基板的柔性显示装置
US9427949B2 (en) 2013-12-03 2016-08-30 Semiconductor Energy Laboratory Co., Ltd. Peeling apparatus and stack manufacturing apparatus
KR102107456B1 (ko) * 2013-12-10 2020-05-08 삼성디스플레이 주식회사 플렉시블 표시 장치 및 이의 제조 방법
CN104752365A (zh) * 2013-12-27 2015-07-01 昆山国显光电有限公司 一种柔性显示器及其制备方法
US10410962B2 (en) * 2014-01-06 2019-09-10 Mc10, Inc. Encapsulated conformal electronic systems and devices, and methods of making and using the same
KR102368997B1 (ko) 2014-06-27 2022-02-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치, 모듈, 전자 기기, 발광 장치의 제작 방법
TWI695525B (zh) 2014-07-25 2020-06-01 日商半導體能源研究所股份有限公司 剝離方法、發光裝置、模組以及電子裝置
WO2016059497A1 (en) 2014-10-17 2016-04-21 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device, module, electronic device, and method for manufacturing light-emitting device
KR102799986B1 (ko) * 2014-11-28 2025-04-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 모듈, 및 전자 기기
KR102343656B1 (ko) * 2015-01-15 2021-12-27 삼성디스플레이 주식회사 유기 발광 표시 장치
US20180165996A1 (en) * 2015-06-18 2018-06-14 Sharp Kabushiki Kaisha Flexible electronic device and method for manufacturing flexible electronic device
KR102632066B1 (ko) 2015-07-30 2024-02-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치의 제작 방법, 발광 장치, 모듈, 및 전자 기기
US10259207B2 (en) 2016-01-26 2019-04-16 Semiconductor Energy Laboratory Co., Ltd. Method for forming separation starting point and separation method
JP2017147044A (ja) 2016-02-15 2017-08-24 株式会社ジャパンディスプレイ 表示装置、および表示装置の作製方法
JP6715708B2 (ja) * 2016-07-08 2020-07-01 株式会社ジャパンディスプレイ 表示装置
US10217957B2 (en) 2016-10-13 2019-02-26 Sharp Kabushiki Kaisha Organic EL display device and method of manufacturing organic EL display device
CN106585069A (zh) * 2016-12-23 2017-04-26 武汉华星光电技术有限公司 柔性基板、面板及丝网印刷机制作柔性基板、面板的方法
WO2018179214A1 (ja) * 2017-03-30 2018-10-04 シャープ株式会社 可撓性表示装置
TWI645389B (zh) * 2017-11-15 2018-12-21 友達光電股份有限公司 可撓性電子裝置
WO2019171198A1 (ja) 2018-03-06 2019-09-12 株式会社半導体エネルギー研究所 半導体装置
CN108847134B (zh) * 2018-06-13 2021-05-14 云谷(固安)科技有限公司 一种可拉伸显示屏装置及其制造方法
CN109378327B (zh) * 2018-09-26 2021-02-12 云谷(固安)科技有限公司 显示面板及显示装置
CN109686251B (zh) * 2018-12-25 2021-12-31 厦门天马微电子有限公司 一种柔性显示面板及显示装置
CN110028908A (zh) * 2018-12-25 2019-07-19 瑞声科技(新加坡)有限公司 玻璃软膜结构及其制作方法
CN110028909A (zh) * 2018-12-25 2019-07-19 瑞声科技(新加坡)有限公司 玻璃软膜结构及其制作方法
US12376373B2 (en) 2019-11-01 2025-07-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2021090116A1 (ja) 2019-11-08 2021-05-14 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
CN114137754B (zh) * 2021-11-30 2022-10-21 绵阳惠科光电科技有限公司 曲面屏及显示装置
CN119644625B (zh) * 2024-12-02 2025-09-12 东南大学 基于tft变容管和tft驱动阵列的玻璃基电磁调控阵列

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5665607A (en) * 1993-06-11 1997-09-09 Mitsubishi Denki Kabushiki Kaisha Method for producing thin film solar cell

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1655633A3 (en) * 1996-08-27 2006-06-21 Seiko Epson Corporation Exfoliating method, transferring method of thin film device, thin film integrated circuit device, and liquid crystal display device
US6199533B1 (en) * 1999-02-01 2001-03-13 Cummins Engine Company, Inc. Pilot valve controlled three-way fuel injection control valve assembly
EP1193759B1 (en) 1999-02-24 2004-09-29 Hitachi Maxell, Ltd. Ic device and its production method, and information carrier mounted with ic device
JP4748859B2 (ja) 2000-01-17 2011-08-17 株式会社半導体エネルギー研究所 発光装置の作製方法
US7060153B2 (en) 2000-01-17 2006-06-13 Semiconductor Energy Laboratory Co., Ltd. Display device and method of manufacturing the same
US20010053559A1 (en) 2000-01-25 2001-12-20 Semiconductor Energy Laboratory Co., Ltd. Method of fabricating display device
JP4495295B2 (ja) 2000-03-15 2010-06-30 株式会社日立製作所 有価証券類の不正利用防止方法および有価証券類の不正利用防止システム
JP2002083866A (ja) * 2000-09-07 2002-03-22 Sanyo Electric Co Ltd 半導体装置及びその製造方法
WO2002067329A1 (en) * 2001-02-16 2002-08-29 Ignis Innovation Inc. Flexible display device
GB0108309D0 (en) * 2001-04-03 2001-05-23 Koninkl Philips Electronics Nv Matrix array devices with flexible substrates
DE10122324A1 (de) * 2001-05-08 2002-11-14 Philips Corp Intellectual Pty Flexible integrierte monolithische Schaltung
US8415208B2 (en) 2001-07-16 2013-04-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and peeling off method and method of manufacturing semiconductor device
EP1455394B1 (en) 2001-07-24 2018-04-11 Samsung Electronics Co., Ltd. Transfer method
JP2003109773A (ja) * 2001-07-27 2003-04-11 Semiconductor Energy Lab Co Ltd 発光装置、半導体装置およびそれらの作製方法
JP3956697B2 (ja) 2001-12-28 2007-08-08 セイコーエプソン株式会社 半導体集積回路の製造方法
TWI272641B (en) 2002-07-16 2007-02-01 Semiconductor Energy Lab Method of manufacturing a semiconductor device
JP4566578B2 (ja) * 2003-02-24 2010-10-20 株式会社半導体エネルギー研究所 薄膜集積回路の作製方法
TWI328837B (en) 2003-02-28 2010-08-11 Semiconductor Energy Lab Semiconductor device and method of manufacturing the same
JP4748943B2 (ja) * 2003-02-28 2011-08-17 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP2005032979A (ja) * 2003-07-14 2005-02-03 Canon Inc 有機薄膜トランジスタおよびその製造方法
KR101207442B1 (ko) 2003-12-15 2012-12-03 가부시키가이샤 한도오따이 에네루기 켄큐쇼 박막 집적회로장치의 제조방법, 비접촉형 박막 집적회로장치 및 그 제조 방법, 비접촉형 박막 집적회로 장치를 가지는 아이디 태그 및 동전
US7271076B2 (en) * 2003-12-19 2007-09-18 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of thin film integrated circuit device and manufacturing method of non-contact type thin film integrated circuit device
JP4060289B2 (ja) * 2004-05-26 2008-03-12 株式会社半導体エネルギー研究所 携帯型コンピュータ

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5665607A (en) * 1993-06-11 1997-09-09 Mitsubishi Denki Kabushiki Kaisha Method for producing thin film solar cell

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