CN100475798C - 磺酸衍生物及其作为潜酸的用途 - Google Patents
磺酸衍生物及其作为潜酸的用途 Download PDFInfo
- Publication number
- CN100475798C CN100475798C CNB038033054A CN03803305A CN100475798C CN 100475798 C CN100475798 C CN 100475798C CN B038033054 A CNB038033054 A CN B038033054A CN 03803305 A CN03803305 A CN 03803305A CN 100475798 C CN100475798 C CN 100475798C
- Authority
- CN
- China
- Prior art keywords
- group
- acid
- alkyl
- phenyl
- compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0037—Production of three-dimensional images
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C323/00—Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups
- C07C323/64—Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups containing thio groups and sulfur atoms, not being part of thio groups, bound to the same carbon skeleton
- C07C323/66—Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups containing thio groups and sulfur atoms, not being part of thio groups, bound to the same carbon skeleton containing sulfur atoms of sulfo, esterified sulfo or halosulfonyl groups, bound to the carbon skeleton
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
- G03F7/0758—Macromolecular compounds containing Si-O, Si-C or Si-N bonds with silicon- containing groups in the side chains
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0005—Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
- G03F7/001—Phase modulating patterns, e.g. refractive index patterns
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Organic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
- Materials For Photolithography (AREA)
- Nitrogen Condensed Heterocyclic Rings (AREA)
- Heterocyclic Compounds Containing Sulfur Atoms (AREA)
- Optical Filters (AREA)
- Indole Compounds (AREA)
- Hydrogenated Pyridines (AREA)
- Detergent Compositions (AREA)
- Agricultural Chemicals And Associated Chemicals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP02405082.5 | 2002-02-06 | ||
| EP02405082 | 2002-02-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1628268A CN1628268A (zh) | 2005-06-15 |
| CN100475798C true CN100475798C (zh) | 2009-04-08 |
Family
ID=27675790
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB038033054A Expired - Fee Related CN100475798C (zh) | 2002-02-06 | 2003-01-28 | 磺酸衍生物及其作为潜酸的用途 |
Country Status (11)
| Country | Link |
|---|---|
| US (2) | US7326511B2 (https=) |
| EP (1) | EP1472576B1 (https=) |
| JP (1) | JP2005517026A (https=) |
| KR (1) | KR20040089607A (https=) |
| CN (1) | CN100475798C (https=) |
| AU (1) | AU2003206787A1 (https=) |
| BR (1) | BR0307501A (https=) |
| CA (1) | CA2474532A1 (https=) |
| MX (1) | MXPA04006581A (https=) |
| TW (1) | TWI288859B (https=) |
| WO (1) | WO2003067332A2 (https=) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU2003301344A1 (en) | 2002-10-16 | 2004-05-04 | Georgia Tech Research Corporation | Polymers, methods of use thereof, and methods of decomposition thereof |
| EP1595182B1 (en) * | 2003-02-19 | 2015-09-30 | Basf Se | Halogenated oxime derivatives and the use thereof as latent acids |
| WO2006008250A2 (en) * | 2004-07-20 | 2006-01-26 | Ciba Specialty Chemicals Holding Inc. | Oxime derivatives and the use therof as latent acids |
| WO2006046398A1 (ja) * | 2004-10-29 | 2006-05-04 | Nissan Chemical Industries, Ltd. | 光酸発生剤を含む染料含有レジスト組成物及びそれを用いるカラーフィルター |
| US7183036B2 (en) * | 2004-11-12 | 2007-02-27 | International Business Machines Corporation | Low activation energy positive resist |
| JP4484681B2 (ja) * | 2004-12-03 | 2010-06-16 | 富士フイルム株式会社 | 感光性組成物及び該感光性組成物を用いたパターン形成方法 |
| JP4780586B2 (ja) * | 2006-05-08 | 2011-09-28 | 旭化成イーマテリアルズ株式会社 | ポジ型感光性樹脂組成物 |
| WO2007147782A2 (en) * | 2006-06-20 | 2007-12-27 | Ciba Holding Inc. | Oxime sulfonates and the use therof as latent acids |
| BRPI0715723A2 (pt) * | 2006-08-24 | 2013-09-17 | Ciba Holding Inc | indicadores de doses de uv |
| JP4866783B2 (ja) * | 2007-04-27 | 2012-02-01 | 東京応化工業株式会社 | レジスト組成物およびレジストパターン形成方法 |
| GB2450975B (en) | 2007-07-12 | 2010-02-24 | Ciba Holding Inc | Yellow radiation curing inks |
| CN102037409B (zh) * | 2008-05-23 | 2013-12-11 | 康奈尔大学 | 在电子和电气设备中使用的有机材料的正交工艺 |
| TW201016651A (en) * | 2008-07-28 | 2010-05-01 | Sumitomo Chemical Co | Oxime compound and resist composition containing the same |
| EP2404315A4 (en) * | 2009-03-06 | 2012-08-08 | Du Pont | METHOD FOR FORMING AN ELECTROACTIVE LAYER |
| EP2414894B1 (en) | 2009-03-30 | 2014-02-12 | Basf Se | Uv-dose indicator films |
| KR101813298B1 (ko) * | 2010-02-24 | 2017-12-28 | 바스프 에스이 | 잠재성 산 및 그의 용도 |
| TWI550338B (zh) * | 2010-08-30 | 2016-09-21 | 富士軟片股份有限公司 | 感光性樹脂組成物、肟基磺酸酯化合物、硬化膜之形成方法、硬化膜、有機el顯示裝置、及液晶顯示裝置 |
| JP5840146B2 (ja) * | 2011-01-17 | 2016-01-06 | 株式会社クラレ | ビニルスルホン酸エステル誘導体、高分子化合物およびフォトレジスト組成物 |
| WO2014025370A1 (en) | 2012-08-10 | 2014-02-13 | Hallstar Innovations Corp. | Tricyclic energy quencher compounds for reducing singlet oxygen generation |
| US9145383B2 (en) | 2012-08-10 | 2015-09-29 | Hallstar Innovations Corp. | Compositions, apparatus, systems, and methods for resolving electronic excited states |
| US9125829B2 (en) | 2012-08-17 | 2015-09-08 | Hallstar Innovations Corp. | Method of photostabilizing UV absorbers, particularly dibenzyolmethane derivatives, e.g., Avobenzone, with cyano-containing fused tricyclic compounds |
| JP6592896B2 (ja) * | 2014-01-10 | 2019-10-23 | 住友化学株式会社 | 樹脂及びレジスト組成物 |
| JP6904662B2 (ja) * | 2016-01-29 | 2021-07-21 | 株式会社アドテックエンジニアリング | 露光装置 |
| US9950999B2 (en) | 2016-08-12 | 2018-04-24 | International Business Machines Corporation | Non-ionic low diffusing photo-acid generators |
| ES2747768T3 (es) | 2017-03-20 | 2020-03-11 | Forma Therapeutics Inc | Composiciones de pirrolopirrol como activadores de quinasa de piruvato (PKR) |
| ES2989438T3 (es) | 2018-09-19 | 2024-11-26 | Novo Nordisk Healthcare Ag | Activación de la piruvato cinasa R |
| US12053458B2 (en) | 2018-09-19 | 2024-08-06 | Novo Nordisk Health Care Ag | Treating sickle cell disease with a pyruvate kinase R activating compound |
| US20220378756A1 (en) | 2019-09-19 | 2022-12-01 | Forma Therapeutics, Inc. | Activating pyruvate kinase r |
| IT201900022233A1 (it) * | 2019-11-27 | 2021-05-27 | Epta Inks S P A | Inchiostro fotosensibile e embossabile |
| JP7041201B2 (ja) * | 2020-06-30 | 2022-03-23 | 株式会社アドテックエンジニアリング | 露光方法 |
| US12128035B2 (en) | 2021-03-19 | 2024-10-29 | Novo Nordisk Health Care Ag | Activating pyruvate kinase R |
| CN117042327B (zh) * | 2022-12-27 | 2024-01-30 | 珠海浩奕电子科技有限公司 | 一种高强度低介电常数印刷电路板及其制备工艺 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1153926A (zh) * | 1995-10-31 | 1997-07-09 | 希巴特殊化学控股公司 | 肟磺酸酯及其作为潜在磺酸的应用 |
| US5714625A (en) * | 1995-09-29 | 1998-02-03 | Tokyo Ohka Kogyo Co., Ltd. | Cyanooxime sulfonate compound |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4346094A (en) | 1980-09-22 | 1982-08-24 | Eli Lilly And Company | 3-Aryl-5-isothiazolecarboxylic acids and related compounds used to lower uric acid levels |
| US4540598A (en) | 1983-08-17 | 1985-09-10 | Ciba-Geigy Corporation | Process for curing acid-curable finishes |
| EP0199672B1 (de) * | 1985-04-12 | 1988-06-01 | Ciba-Geigy Ag | Oximsulfonate mit reaktiven Gruppen |
| JPS6336240A (ja) | 1986-07-28 | 1988-02-16 | インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン | レジスト構造の作成方法 |
| JPH0225850A (ja) | 1988-07-15 | 1990-01-29 | Hitachi Ltd | 放射線感応性組成物およびそれを用いたパターン形成法 |
| KR900005232A (ko) | 1988-09-29 | 1990-04-13 | 존 에이 페니 | 음화 상 생성방법. |
| JPH03100657A (ja) * | 1989-09-14 | 1991-04-25 | Fuji Photo Film Co Ltd | 電子写真感光体 |
| JPH03223860A (ja) | 1990-01-30 | 1991-10-02 | Wako Pure Chem Ind Ltd | 新規レジスト材料 |
| JP3008594B2 (ja) | 1990-08-31 | 2000-02-14 | 和光純薬工業株式会社 | 新規なレジスト材料及びパタ−ン形成方法 |
| JPH04199152A (ja) * | 1990-11-29 | 1992-07-20 | Toshiba Corp | 感光性組成物 |
| JPH04295458A (ja) | 1991-03-22 | 1992-10-20 | Fuji Photo Film Co Ltd | 光照射により酸を発生する化合物 |
| JPH04328552A (ja) | 1991-04-26 | 1992-11-17 | Konica Corp | 感光性組成物 |
| DE4390097T1 (de) * | 1992-01-10 | 1994-12-01 | Fuji Photo Film Co Ltd | Vorstufe für eine elektrophotographische Flachdruckplatte |
| US5714289A (en) * | 1992-02-12 | 1998-02-03 | Fuji Photo Film Co., Ltd. | Method of preparation of electrophotographic printing plate |
| EP0571330B1 (de) * | 1992-05-22 | 1999-04-07 | Ciba SC Holding AG | Hochauflösender I-Linien Photoresist mit höherer Empfindlichkeit |
| DE4236068A1 (de) | 1992-10-26 | 1994-04-28 | Hoechst Ag | Positiv arbeitendes strahlungsempfindliches Gemisch und damit hergestelltes Aufzeichnungsmaterial |
| US6159665A (en) | 1993-06-17 | 2000-12-12 | Lucent Technologies Inc. | Processes using photosensitive materials including a nitro benzyl ester photoacid generator |
| DE59409351D1 (de) | 1993-10-13 | 2000-06-21 | Ciba Sc Holding Ag | Pyrrolo[3,4-c]pyrrole |
| DE59408909D1 (de) | 1993-10-13 | 1999-12-16 | Ciba Sc Holding Ag | Neue Fluoreszenzfarbstoffe |
| EP0654711B1 (en) | 1993-11-22 | 1999-06-02 | Ciba SC Holding AG | Compositions for making structured color images and application thereof |
| DE69520655T2 (de) | 1994-12-06 | 2001-11-29 | Ocg Microelectronics Materials, Inc. | Durch Belichtung einer Säure erzeugende Zusammensetzung für strahlungsempfindliche Zusammensetzungen |
| EP0742255B1 (en) | 1995-05-12 | 2004-04-14 | Ciba SC Holding AG | Colouration of high molecular weight organic materials in the mass with soluble phthalocyanine precursors |
| JP3456808B2 (ja) | 1995-09-29 | 2003-10-14 | 東京応化工業株式会社 | ホトレジスト組成物 |
| US20010037037A1 (en) * | 1995-10-31 | 2001-11-01 | Kurt Dietliker | Oximesulfonic acid esters and the use thereof as latent sulfonic acids |
| JP3587413B2 (ja) * | 1995-12-20 | 2004-11-10 | 東京応化工業株式会社 | 化学増幅型レジスト組成物及びそれに用いる酸発生剤 |
| JP3875271B2 (ja) * | 1996-09-02 | 2007-01-31 | チバ スペシャルティ ケミカルズ ホールディング インコーポレーテッド | 高感度の高解像度i線ホトレジスト用のアルキルスルホニルオキシム類 |
| EP0877293B1 (en) | 1997-05-09 | 2004-01-14 | Fuji Photo Film Co., Ltd. | Positive photosensitive composition |
| DE69803117T2 (de) | 1997-05-12 | 2002-10-02 | Fuji Photo Film Co., Ltd. | Positiv arbeitende Resistzusammensetzung |
| TW550439B (en) | 1997-07-01 | 2003-09-01 | Ciba Sc Holding Ag | New oxime sulfonates as latent acids and compositions and photoresists comprising said oxime sulfonates |
| TW575792B (en) | 1998-08-19 | 2004-02-11 | Ciba Sc Holding Ag | New unsaturated oxime derivatives and the use thereof as latent acids |
| SG78412A1 (en) * | 1999-03-31 | 2001-02-20 | Ciba Sc Holding Ag | Oxime derivatives and the use thereof as latent acids |
| NL1014545C2 (nl) * | 1999-03-31 | 2002-02-26 | Ciba Sc Holding Ag | Oxim-derivaten en de toepassing daarvan als latente zuren. |
| TWI272451B (en) * | 2000-09-25 | 2007-02-01 | Ciba Sc Holding Ag | Chemically amplified photoresist composition, process for preparation of a photoresist, and use of said chemically amplified photoresist composition |
| JP4210439B2 (ja) * | 2001-04-05 | 2009-01-21 | 富士フイルム株式会社 | ポジ型フォトレジスト組成物 |
| DK1392675T3 (da) * | 2001-06-01 | 2005-04-04 | Ciba Sc Holding Ag | Substituerede oximderivater og anvendelsen deraf som latente syrer |
| JP2003182218A (ja) * | 2001-12-13 | 2003-07-03 | Fuji Photo Film Co Ltd | 感熱記録材料 |
-
2003
- 2003-01-28 AU AU2003206787A patent/AU2003206787A1/en not_active Abandoned
- 2003-01-28 KR KR10-2004-7012252A patent/KR20040089607A/ko not_active Ceased
- 2003-01-28 EP EP03704479.9A patent/EP1472576B1/en not_active Expired - Lifetime
- 2003-01-28 JP JP2003566624A patent/JP2005517026A/ja active Pending
- 2003-01-28 US US10/495,710 patent/US7326511B2/en not_active Expired - Fee Related
- 2003-01-28 CA CA002474532A patent/CA2474532A1/en not_active Abandoned
- 2003-01-28 MX MXPA04006581A patent/MXPA04006581A/es not_active Application Discontinuation
- 2003-01-28 CN CNB038033054A patent/CN100475798C/zh not_active Expired - Fee Related
- 2003-01-28 BR BR0307501-0A patent/BR0307501A/pt not_active Application Discontinuation
- 2003-01-28 WO PCT/EP2003/000821 patent/WO2003067332A2/en not_active Ceased
- 2003-01-30 TW TW092102265A patent/TWI288859B/zh not_active IP Right Cessation
-
2007
- 2007-12-04 US US11/999,116 patent/US20080286693A1/en not_active Abandoned
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5714625A (en) * | 1995-09-29 | 1998-02-03 | Tokyo Ohka Kogyo Co., Ltd. | Cyanooxime sulfonate compound |
| CN1153926A (zh) * | 1995-10-31 | 1997-07-09 | 希巴特殊化学控股公司 | 肟磺酸酯及其作为潜在磺酸的应用 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200302952A (en) | 2003-08-16 |
| CA2474532A1 (en) | 2003-08-14 |
| AU2003206787A1 (en) | 2003-09-02 |
| EP1472576B1 (en) | 2013-04-24 |
| KR20040089607A (ko) | 2004-10-21 |
| CN1628268A (zh) | 2005-06-15 |
| WO2003067332A2 (en) | 2003-08-14 |
| US20050153244A1 (en) | 2005-07-14 |
| TWI288859B (en) | 2007-10-21 |
| MXPA04006581A (es) | 2004-10-04 |
| EP1472576A2 (en) | 2004-11-03 |
| AU2003206787A8 (en) | 2003-09-02 |
| WO2003067332A3 (en) | 2003-12-24 |
| US20080286693A1 (en) | 2008-11-20 |
| BR0307501A (pt) | 2004-12-07 |
| US7326511B2 (en) | 2008-02-05 |
| JP2005517026A (ja) | 2005-06-09 |
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