AU2003226319A1 - Electropolishing and/or electroplating apparatus and methods - Google Patents
Electropolishing and/or electroplating apparatus and methodsInfo
- Publication number
- AU2003226319A1 AU2003226319A1 AU2003226319A AU2003226319A AU2003226319A1 AU 2003226319 A1 AU2003226319 A1 AU 2003226319A1 AU 2003226319 A AU2003226319 A AU 2003226319A AU 2003226319 A AU2003226319 A AU 2003226319A AU 2003226319 A1 AU2003226319 A1 AU 2003226319A1
- Authority
- AU
- Australia
- Prior art keywords
- electropolishing
- methods
- electroplating apparatus
- electroplating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0418—Apparatus for fluid treatment for etching
- H10P72/0422—Apparatus for fluid treatment for etching for wet etching
- H10P72/0424—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F3/00—Electrolytic etching or polishing
- C25F3/16—Polishing
- C25F3/30—Polishing of semiconducting materials
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F7/00—Constructional parts, or assemblies thereof, of cells for electrolytic removal of material from objects; Servicing or operating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/46—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a liquid
- H10P14/47—Electrolytic deposition, i.e. electroplating; Electroless plating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7602—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a robot blade or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3404—Storage means
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Engineering & Computer Science (AREA)
- Sustainable Development (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electroplating Methods And Accessories (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Electrodes Of Semiconductors (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
Applications Claiming Priority (17)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US37095602P | 2002-04-08 | 2002-04-08 | |
| US37092902P | 2002-04-08 | 2002-04-08 | |
| US37095502P | 2002-04-08 | 2002-04-08 | |
| US37091902P | 2002-04-08 | 2002-04-08 | |
| US60/370,929 | 2002-04-08 | ||
| US60/370,955 | 2002-04-08 | ||
| US60/370,956 | 2002-04-08 | ||
| US60/370,919 | 2002-04-08 | ||
| US37256702P | 2002-04-14 | 2002-04-14 | |
| US37254202P | 2002-04-14 | 2002-04-14 | |
| US37256602P | 2002-04-14 | 2002-04-14 | |
| US60/372,567 | 2002-04-14 | ||
| US60/372,566 | 2002-04-14 | ||
| US60/372,542 | 2002-04-14 | ||
| US39046002P | 2002-06-21 | 2002-06-21 | |
| US60/390,460 | 2002-06-21 | ||
| PCT/US2003/010725 WO2003087436A1 (en) | 2002-04-08 | 2003-04-08 | Electropolishing and/or electroplating apparatus and methods |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2003226319A1 true AU2003226319A1 (en) | 2003-10-27 |
Family
ID=29255769
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2003226319A Abandoned AU2003226319A1 (en) | 2002-04-08 | 2003-04-08 | Electropolishing and/or electroplating apparatus and methods |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US20050218003A1 (https=) |
| EP (1) | EP1492907A4 (https=) |
| JP (5) | JP2005522585A (https=) |
| KR (1) | KR20040099407A (https=) |
| CN (2) | CN101353810B (https=) |
| AU (1) | AU2003226319A1 (https=) |
| CA (1) | CA2479794A1 (https=) |
| SG (1) | SG159384A1 (https=) |
| TW (1) | TWI274393B (https=) |
| WO (1) | WO2003087436A1 (https=) |
Families Citing this family (70)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7323416B2 (en) | 2001-03-14 | 2008-01-29 | Applied Materials, Inc. | Method and composition for polishing a substrate |
| US7232514B2 (en) | 2001-03-14 | 2007-06-19 | Applied Materials, Inc. | Method and composition for polishing a substrate |
| US7128825B2 (en) | 2001-03-14 | 2006-10-31 | Applied Materials, Inc. | Method and composition for polishing a substrate |
| US6899804B2 (en) | 2001-04-10 | 2005-05-31 | Applied Materials, Inc. | Electrolyte composition and treatment for electrolytic chemical mechanical polishing |
| US7997288B2 (en) | 2002-09-30 | 2011-08-16 | Lam Research Corporation | Single phase proximity head having a controlled meniscus for treating a substrate |
| US7675000B2 (en) | 2003-06-24 | 2010-03-09 | Lam Research Corporation | System method and apparatus for dry-in, dry-out, low defect laser dicing using proximity technology |
| US8062471B2 (en) | 2004-03-31 | 2011-11-22 | Lam Research Corporation | Proximity head heating method and apparatus |
| CN100419121C (zh) * | 2004-05-12 | 2008-09-17 | 鸿富锦精密工业(深圳)有限公司 | 湿蚀刻设备 |
| JP5155517B2 (ja) * | 2005-04-21 | 2013-03-06 | 株式会社荏原製作所 | ウエハ受渡装置及びポリッシング装置 |
| US7928366B2 (en) | 2006-10-06 | 2011-04-19 | Lam Research Corporation | Methods of and apparatus for accessing a process chamber using a dual zone gas injector with improved optical access |
| CN101237027B (zh) * | 2006-08-04 | 2011-05-11 | E.I.内穆尔杜邦公司 | 用于在基底上沉积空气感光材料的方法 |
| US8474468B2 (en) * | 2006-09-30 | 2013-07-02 | Tokyo Electron Limited | Apparatus and method for thermally processing a substrate with a heated liquid |
| US20080107509A1 (en) * | 2006-11-07 | 2008-05-08 | Whitcomb Preston X | Vacuum end effector for handling highly shaped substrates |
| US20100183420A1 (en) * | 2006-11-27 | 2010-07-22 | Jakob Blattner | Transfer device for an overhead conveying system |
| US8146902B2 (en) | 2006-12-21 | 2012-04-03 | Lam Research Corporation | Hybrid composite wafer carrier for wet clean equipment |
| US7479463B2 (en) * | 2007-03-09 | 2009-01-20 | Tokyo Electron Limited | Method for heating a chemically amplified resist layer carried on a rotating substrate |
| US9383138B2 (en) * | 2007-03-30 | 2016-07-05 | Tokyo Electron Limited | Methods and heat treatment apparatus for uniformly heating a substrate during a bake process |
| US8464736B1 (en) | 2007-03-30 | 2013-06-18 | Lam Research Corporation | Reclaim chemistry |
| US20080241400A1 (en) * | 2007-03-31 | 2008-10-02 | Tokyo Electron Limited | Vacuum assist method and system for reducing intermixing of lithography layers |
| US8141566B2 (en) | 2007-06-19 | 2012-03-27 | Lam Research Corporation | System, method and apparatus for maintaining separation of liquids in a controlled meniscus |
| US8172989B2 (en) * | 2007-11-26 | 2012-05-08 | Sunpower Corporation | Prevention of substrate edge plating in a fountain plating process |
| KR101571180B1 (ko) | 2007-12-27 | 2015-11-23 | 램 리써치 코포레이션 | 위치 및 오프셋을 결정하는 장치 및 방법 |
| KR101590655B1 (ko) | 2007-12-27 | 2016-02-18 | 램 리써치 코포레이션 | 동적 정렬 빔 교정의 방법 및 시스템 |
| US8229496B2 (en) * | 2007-12-27 | 2012-07-24 | Nec Corporation | Mobile phone terminal |
| US8751047B2 (en) | 2007-12-27 | 2014-06-10 | Lam Research Corporation | Systems and methods for calibrating end effector alignment in a plasma processing system |
| US8954287B2 (en) | 2007-12-27 | 2015-02-10 | Lam Research Corporation | Systems and methods for calibrating end effector alignment using at least a light source |
| US7901475B2 (en) * | 2008-01-18 | 2011-03-08 | Gm Global Technology Operations, Inc. | Diesel particulate filter with zoned resistive heater |
| CN101580945B (zh) * | 2008-05-12 | 2012-12-05 | 盛美半导体设备(上海)有限公司 | 电沉积系统 |
| US8369978B2 (en) * | 2008-09-04 | 2013-02-05 | Applied Materials | Adjusting polishing rates by using spectrographic monitoring of a substrate during processing |
| KR101689550B1 (ko) | 2009-01-11 | 2016-12-26 | 어플라이드 머티어리얼스, 인코포레이티드 | 기판들을 운반하기 위한 정전기 엔드 이펙터 장치, 시스템들 및 방법들 |
| CN101851776B (zh) * | 2009-03-30 | 2011-10-05 | 昆山中辰矽晶有限公司 | 硅芯片边缘的处理方法 |
| CN102251268B (zh) * | 2010-05-19 | 2013-05-22 | 易生科技(北京)有限公司 | 电化学抛光中的支架抛光装置及抛光方法 |
| TWI410532B (zh) * | 2010-09-01 | 2013-10-01 | Grand Plastic Technology Co Ltd | 晶圓填孔垂直式電極電鍍設備 |
| CN102140669B (zh) * | 2011-03-17 | 2016-06-01 | 上海集成电路研发中心有限公司 | 硅片电镀铜后的清洗方法 |
| CN102427047B (zh) * | 2011-09-28 | 2014-03-12 | 上海华力微电子有限公司 | 晶圆背面清洁设备以及晶圆背面清洁方法 |
| SG194239A1 (en) | 2012-04-09 | 2013-11-29 | Semiconductor Tech & Instr Inc | End handler |
| CN102864486A (zh) * | 2012-10-24 | 2013-01-09 | 哈尔滨电机厂有限责任公司 | 电解抛光装置 |
| WO2014089731A1 (en) * | 2012-12-10 | 2014-06-19 | Acm Research (Shanghai) Inc. | Semiconductor wafer polishing method |
| JP6114060B2 (ja) * | 2013-02-27 | 2017-04-12 | 東京エレクトロン株式会社 | 基板搬送装置、基板受渡位置確認方法及び基板処理システム |
| CN103510149B (zh) * | 2013-10-14 | 2015-11-18 | 陈功 | 一种带电解抛光液的湿式自动抛光方法及其设备 |
| CN105316754B (zh) * | 2014-07-29 | 2019-08-16 | 盛美半导体设备(上海)有限公司 | 电化学加工工艺及电化学加工装置 |
| US9831110B2 (en) | 2015-07-30 | 2017-11-28 | Lam Research Corporation | Vision-based wafer notch position measurement |
| WO2017092029A1 (en) * | 2015-12-04 | 2017-06-08 | Acm Research (Shanghai) Inc. | Apparatus for holding substrate |
| CN105780101B (zh) * | 2016-01-27 | 2018-06-26 | 杨继芳 | 一种新型电解抛光设备 |
| FR3049940B1 (fr) * | 2016-04-06 | 2018-04-13 | Saint- Gobain Glass France | Dispositif de support pour feuille de verre notamment dans une installation de lavage |
| US10460960B2 (en) * | 2016-05-09 | 2019-10-29 | Applied Materials, Inc. | Gas panel apparatus and method for reducing exhaust requirements |
| JP6756540B2 (ja) | 2016-08-08 | 2020-09-16 | 株式会社荏原製作所 | めっき装置、めっき装置の制御方法、及び、めっき装置の制御方法をコンピュータに実行させるためのプログラムを格納した記憶媒体 |
| CN106191983B (zh) * | 2016-08-12 | 2018-06-29 | 厦门大学 | 一种用于电化学刻蚀加工的微流控装置及其应用方法 |
| CN106737805A (zh) * | 2016-12-13 | 2017-05-31 | 天津彼洋机器人系统工程有限公司 | 一种多功能机器人夹爪 |
| GB201701166D0 (en) | 2017-01-24 | 2017-03-08 | Picofluidics Ltd | An apparatus for electrochemically processing semiconductor substrates |
| CN111032923B (zh) * | 2017-08-30 | 2021-12-28 | 盛美半导体设备(上海)股份有限公司 | 电镀装置 |
| WO2019047086A1 (en) * | 2017-09-07 | 2019-03-14 | Acm Research (Shanghai) Inc. | PLATE CHUCK |
| CN109560029B (zh) * | 2017-09-26 | 2024-02-09 | Tcl环鑫半导体(天津)有限公司 | 一种自动圆形硅片倒片机构 |
| CN108406568B (zh) * | 2018-05-21 | 2023-08-22 | 浙江工业大学 | 一种使用液态金属抛光液对叶片边缘抛光的装置及方法 |
| CN108453651B (zh) * | 2018-05-24 | 2024-05-07 | 明峰医疗系统股份有限公司 | 一种pet探测器轴定位工装 |
| CN109652850B (zh) * | 2018-11-23 | 2021-01-26 | 铜陵蓝盾丰山微电子有限公司 | 多通道片式电镀装置 |
| CN109609996B (zh) * | 2018-12-12 | 2020-12-18 | 东华大学 | 经编机槽针批量镀硬铬用组合挂具 |
| CN109712923B (zh) * | 2018-12-26 | 2020-12-11 | 上海福赛特机器人有限公司 | 一种晶圆周转装置及晶圆周转方法 |
| CN109676274B (zh) * | 2018-12-27 | 2021-01-15 | 深圳市大族数控科技有限公司 | 一种释压机构及具有该释压机构的真空吸附和吸尘装置 |
| CN109759957A (zh) * | 2019-02-21 | 2019-05-17 | 中国工程物理研究院激光聚变研究中心 | 环抛中抛光液的循环供液装置及供液方法 |
| CN112017932B (zh) * | 2019-05-31 | 2022-11-29 | 中微半导体设备(上海)股份有限公司 | 等离子体处理装置中气体输送系统的耐腐蚀结构 |
| US11890718B2 (en) * | 2020-01-17 | 2024-02-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Removable tray assembly for CMP systems |
| EP3851916A1 (en) * | 2020-01-17 | 2021-07-21 | ASML Netherlands B.V. | Suction clamp, object handler, stage apparatus and lithographic apparatus |
| JP7422586B2 (ja) * | 2020-03-30 | 2024-01-26 | 東京エレクトロン株式会社 | 基板処理装置および基板処理方法 |
| CN111693852B (zh) * | 2020-06-23 | 2023-12-22 | 宏茂微电子(上海)有限公司 | 一种塑封装元器件开封方法及开封装置 |
| CN113881986B (zh) * | 2021-10-28 | 2025-03-18 | 惠州市本正智能设备有限公司 | 节能喷咀及电镀装置 |
| CN116263515A (zh) * | 2021-12-14 | 2023-06-16 | 盛美半导体设备(上海)股份有限公司 | 一种电镀腔漏镀预警方法及系统 |
| CN114473818B (zh) * | 2022-02-28 | 2023-05-02 | 南京尚吉增材制造研究院有限公司 | 用于义齿的组合式调节型抛光夹具 |
| CN114990549B (zh) * | 2022-05-30 | 2024-01-12 | 东莞海雅特汽车科技有限公司 | 一种汽车冲压模具铸件表面拉毛处理装置及方法 |
| KR102848411B1 (ko) * | 2022-05-31 | 2025-08-25 | (주)애니캐스팅 | S-ecam 프린팅 장치 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3517958A (en) * | 1968-06-17 | 1970-06-30 | Ibm | Vacuum pick-up with air shield |
| US4304641A (en) * | 1980-11-24 | 1981-12-08 | International Business Machines Corporation | Rotary electroplating cell with controlled current distribution |
| US4430178A (en) * | 1982-05-24 | 1984-02-07 | Cominco Ltd. | Method and apparatus for effecting current reversal in electro-deposition of metals |
| US4600229A (en) * | 1984-08-03 | 1986-07-15 | Oten Peter D | Vacuum cup |
| DE69133413D1 (de) * | 1990-05-07 | 2004-10-21 | Canon Kk | Substratträger des Vakuumtyps |
| JPH07136885A (ja) * | 1993-06-30 | 1995-05-30 | Toshiba Corp | 真空チャック |
| US5584746A (en) * | 1993-10-18 | 1996-12-17 | Shin-Etsu Handotai Co., Ltd. | Method of polishing semiconductor wafers and apparatus therefor |
| US5900103A (en) * | 1994-04-20 | 1999-05-04 | Tokyo Electron Limited | Plasma treatment method and apparatus |
| US6752584B2 (en) * | 1996-07-15 | 2004-06-22 | Semitool, Inc. | Transfer devices for handling microelectronic workpieces within an environment of a processing machine and methods of manufacturing and using such devices in the processing of microelectronic workpieces |
| US5937993A (en) * | 1997-01-14 | 1999-08-17 | Tamarac Scientific Co., Inc. | Apparatus and method for automatically handling and holding panels near and at the exact plane of exposure |
| US6439824B1 (en) * | 2000-07-07 | 2002-08-27 | Semitool, Inc. | Automated semiconductor immersion processing system |
| TW405158B (en) * | 1997-09-17 | 2000-09-11 | Ebara Corp | Plating apparatus for semiconductor wafer processing |
| US6187152B1 (en) * | 1998-07-17 | 2001-02-13 | Cutek Research, Inc. | Multiple station processing chamber and method for depositing and/or removing material on a substrate |
| US6183611B1 (en) * | 1998-07-17 | 2001-02-06 | Cutek Research, Inc. | Method and apparatus for the disposal of processing fluid used to deposit and/or remove material on a substrate |
| JP2002531702A (ja) * | 1998-11-28 | 2002-09-24 | エーシーエム リサーチ,インコーポレイティド | 半導体ワークの電気めっきおよび/または電解研磨中に半導体ワークを保持して位置決めする方法および装置 |
| US6610150B1 (en) * | 1999-04-02 | 2003-08-26 | Asml Us, Inc. | Semiconductor wafer processing system with vertically-stacked process chambers and single-axis dual-wafer transfer system |
| US6279976B1 (en) * | 1999-05-13 | 2001-08-28 | Micron Technology, Inc. | Wafer handling device having conforming perimeter seal |
| KR100773165B1 (ko) * | 1999-12-24 | 2007-11-02 | 가부시키가이샤 에바라 세이사꾸쇼 | 반도체기판처리장치 및 처리방법 |
-
2003
- 2003-04-07 TW TW092107906A patent/TWI274393B/zh not_active IP Right Cessation
- 2003-04-08 US US10/510,522 patent/US20050218003A1/en not_active Abandoned
- 2003-04-08 JP JP2003584368A patent/JP2005522585A/ja active Pending
- 2003-04-08 EP EP03746651A patent/EP1492907A4/en not_active Withdrawn
- 2003-04-08 WO PCT/US2003/010725 patent/WO2003087436A1/en not_active Ceased
- 2003-04-08 CN CN2008102128377A patent/CN101353810B/zh not_active Expired - Fee Related
- 2003-04-08 CN CNB038102064A patent/CN100430526C/zh not_active Expired - Fee Related
- 2003-04-08 CA CA002479794A patent/CA2479794A1/en not_active Abandoned
- 2003-04-08 KR KR10-2004-7015977A patent/KR20040099407A/ko not_active Ceased
- 2003-04-08 SG SG200606992-6A patent/SG159384A1/en unknown
- 2003-04-08 AU AU2003226319A patent/AU2003226319A1/en not_active Abandoned
-
2006
- 2006-06-08 JP JP2006159680A patent/JP2006319348A/ja active Pending
- 2006-07-10 JP JP2006189857A patent/JP2006328543A/ja active Pending
- 2006-08-24 JP JP2006227700A patent/JP2007077501A/ja active Pending
- 2006-10-17 JP JP2006282453A patent/JP2007051377A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006319348A (ja) | 2006-11-24 |
| CN100430526C (zh) | 2008-11-05 |
| CN101353810B (zh) | 2012-02-15 |
| JP2007051377A (ja) | 2007-03-01 |
| WO2003087436A1 (en) | 2003-10-23 |
| EP1492907A4 (en) | 2008-01-09 |
| CN101353810A (zh) | 2009-01-28 |
| EP1492907A1 (en) | 2005-01-05 |
| TW200402821A (en) | 2004-02-16 |
| JP2005522585A (ja) | 2005-07-28 |
| KR20040099407A (ko) | 2004-11-26 |
| US20050218003A1 (en) | 2005-10-06 |
| CA2479794A1 (en) | 2003-10-23 |
| JP2006328543A (ja) | 2006-12-07 |
| TWI274393B (en) | 2007-02-21 |
| JP2007077501A (ja) | 2007-03-29 |
| CN1653211A (zh) | 2005-08-10 |
| SG159384A1 (en) | 2010-03-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| AU2003226319A1 (en) | Electropolishing and/or electroplating apparatus and methods | |
| AU2003226367A1 (en) | Electropolishing and electroplating methods | |
| AU2003259925A1 (en) | Well treatment apparatus and method | |
| AU2003285491A1 (en) | Electropolishing system and process | |
| AU2003213711A1 (en) | Method and apparatus for electrolyzing water | |
| AU2003243534A1 (en) | Methods and devices for electrosurgical electrolysis | |
| AU2003248773A1 (en) | Ballast water treatment systems including related apparatus and methods | |
| GB0218587D0 (en) | Electrolysis process and apparatus | |
| EP1578257A4 (en) | FABRIC TRACTOR AND USE METHOD THEREFOR | |
| AU2003235890A1 (en) | Descaling method and descaling apparatus | |
| AU2002306804A1 (en) | Peeling apparatus and associated methods | |
| AU2002338191A1 (en) | Surface treatment system and surface treatment method | |
| AU2003227987A1 (en) | Machining apparatus and methods | |
| AU2003288387A8 (en) | Droplet - deposition related methods and apparatus | |
| AU2003276397A1 (en) | Patient support apparatus and method | |
| AU2003247584A1 (en) | Electrodeposition baths containing metal salts and methods related thereto | |
| AU2003211475A1 (en) | Receiving apparatus and receiving method | |
| AU2002359061A1 (en) | Surface treatment system and method thereof | |
| AU2003237994A1 (en) | Transmurality assessment apparatus and methods | |
| GB0224109D0 (en) | Deposition apparatus and methods | |
| GB0323788D0 (en) | Apparatus and method of using the same | |
| AU2003228176A1 (en) | Support apparatus and method of use | |
| GB0215699D0 (en) | Deposition methods and apparatus | |
| AU2003248058A1 (en) | Book-making equipment and book-making method using the equipment | |
| AU2002950240A0 (en) | Electrolytic process and apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |