ATE513250T1 - Prägeform, imprint lithographieverfahren, und verfahren für chipherstellung - Google Patents
Prägeform, imprint lithographieverfahren, und verfahren für chipherstellungInfo
- Publication number
- ATE513250T1 ATE513250T1 AT06120128T AT06120128T ATE513250T1 AT E513250 T1 ATE513250 T1 AT E513250T1 AT 06120128 T AT06120128 T AT 06120128T AT 06120128 T AT06120128 T AT 06120128T AT E513250 T1 ATE513250 T1 AT E513250T1
- Authority
- AT
- Austria
- Prior art keywords
- imprint lithography
- chip manufacturing
- mold
- embossing mold
- manufacturing process
- Prior art date
Links
- 238000004049 embossing Methods 0.000 title 1
- 238000001459 lithography Methods 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000000463 material Substances 0.000 abstract 7
- 239000011347 resin Substances 0.000 abstract 1
- 229920005989 resin Polymers 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C59/00—Surface shaping of articles, e.g. embossing; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C59/00—Surface shaping of articles, e.g. embossing; Apparatus therefor
- B29C59/02—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
- B29C59/022—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing characterised by the disposition or the configuration, e.g. dimensions, of the embossments or the shaping tools therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0017—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor for the production of embossing, cutting or similar devices; for the production of casting means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2012—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image using liquid photohardening compositions, e.g. for the production of reliefs such as flexographic plates or stamps
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7042—Alignment for lithographic apparatus using patterning methods other than those involving the exposure to radiation, e.g. by stamping or imprinting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005258034 | 2005-09-06 | ||
| JP2006194905A JP4330168B2 (ja) | 2005-09-06 | 2006-07-14 | モールド、インプリント方法、及びチップの製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE513250T1 true ATE513250T1 (de) | 2011-07-15 |
Family
ID=37076119
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06120128T ATE513250T1 (de) | 2005-09-06 | 2006-09-05 | Prägeform, imprint lithographieverfahren, und verfahren für chipherstellung |
Country Status (5)
| Country | Link |
|---|---|
| US (5) | US7510388B2 (enExample) |
| EP (1) | EP1760526B1 (enExample) |
| JP (1) | JP4330168B2 (enExample) |
| KR (1) | KR100840799B1 (enExample) |
| AT (1) | ATE513250T1 (enExample) |
Families Citing this family (63)
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| JP4330168B2 (ja) * | 2005-09-06 | 2009-09-16 | キヤノン株式会社 | モールド、インプリント方法、及びチップの製造方法 |
| JP4262267B2 (ja) * | 2005-09-06 | 2009-05-13 | キヤノン株式会社 | モールド、インプリント装置及びデバイスの製造方法 |
| US7690910B2 (en) | 2006-02-01 | 2010-04-06 | Canon Kabushiki Kaisha | Mold for imprint, process for producing minute structure using the mold, and process for producing the mold |
| KR100871812B1 (ko) * | 2006-03-29 | 2008-12-05 | 주식회사 에스앤에스텍 | 나노 임프린트 마스크 및 그 제조방법 |
| US8012395B2 (en) * | 2006-04-18 | 2011-09-06 | Molecular Imprints, Inc. | Template having alignment marks formed of contrast material |
| JP4926881B2 (ja) * | 2006-09-22 | 2012-05-09 | キヤノン株式会社 | インプリント装置およびアライメント方法 |
| US7776628B2 (en) * | 2006-11-16 | 2010-08-17 | International Business Machines Corporation | Method and system for tone inverting of residual layer tolerant imprint lithography |
| KR100790899B1 (ko) * | 2006-12-01 | 2008-01-03 | 삼성전자주식회사 | 얼라인 마크가 형성된 템플릿 및 그 제조 방법 |
| JP5188192B2 (ja) * | 2007-02-20 | 2013-04-24 | キヤノン株式会社 | モールド、モールドの製造方法、インプリント装置及びインプリント方法、インプリント方法を用いた構造体の製造方法 |
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| JP5032239B2 (ja) * | 2007-08-24 | 2012-09-26 | 財団法人神奈川科学技術アカデミー | インプリント用モールドおよびその製造方法 |
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-
2006
- 2006-07-14 JP JP2006194905A patent/JP4330168B2/ja not_active Expired - Fee Related
- 2006-08-31 US US11/468,876 patent/US7510388B2/en not_active Expired - Fee Related
- 2006-09-05 EP EP06120128A patent/EP1760526B1/en not_active Not-in-force
- 2006-09-05 AT AT06120128T patent/ATE513250T1/de not_active IP Right Cessation
- 2006-09-06 KR KR1020060085406A patent/KR100840799B1/ko not_active Expired - Fee Related
-
2009
- 2009-02-18 US US12/388,179 patent/US7981304B2/en not_active Expired - Fee Related
- 2009-02-18 US US12/388,194 patent/US8668484B2/en not_active Expired - Fee Related
-
2011
- 2011-07-01 US US13/175,071 patent/US8562846B2/en not_active Expired - Fee Related
-
2014
- 2014-01-06 US US14/148,426 patent/US20140120199A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20070187875A1 (en) | 2007-08-16 |
| US20090152753A1 (en) | 2009-06-18 |
| US8668484B2 (en) | 2014-03-11 |
| US20090152239A1 (en) | 2009-06-18 |
| US8562846B2 (en) | 2013-10-22 |
| JP2007103915A (ja) | 2007-04-19 |
| US20110278259A1 (en) | 2011-11-17 |
| KR20070027466A (ko) | 2007-03-09 |
| US7510388B2 (en) | 2009-03-31 |
| JP4330168B2 (ja) | 2009-09-16 |
| US20140120199A1 (en) | 2014-05-01 |
| US7981304B2 (en) | 2011-07-19 |
| KR100840799B1 (ko) | 2008-06-23 |
| EP1760526A1 (en) | 2007-03-07 |
| EP1760526B1 (en) | 2011-06-15 |
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